Abstract: An alignment system includes a light source for emitting a light. An alignment mark is disposed on a substrate for receiving the light. The alignment mark includes a first pattern and a second pattern disposed on the substrate. The first pattern includes a first region and a second region. The second pattern includes a third region and a fourth region. The first region and the third region are symmetrical with respective to a symmetrical axis. The second region and the fourth region are symmetrical with respective to the symmetrical axis. The first region includes first mark lines parallel to each other. The second region includes second mark lines parallel to each other. A first pitch is disposed between the first mark lines adjacent to each other. A second pitch is disposed between the second mark lines adjacent to each other. The first pitch is different from the second pitch.

Abstract: A method and device of thin film spectroellipsometric imaging are disclosed. The device comprises an illuminator to direct light through a polarization generator system toward an extended area of a sample; an imaging system to form images; a detection system to record in a plurality of spectral channels; a computer to display and analyze the recorded images; and at least one reference phantom with known optical properties to replace the sample for calibration. The method comprises directing light from an illuminator through a polarization generator system toward an extended area of a sample having a geometrical shape; forming images with an imaging system; adjusting a polarization generator system and a polarization analyzer system to obtain a series of polarimetric setups; recording the images with a detection system in a plurality of spectral channels; replacing the sample with at least one reference phantom; and analyzing the recorded images with a computer.

Abstract: An ophthalmic imaging system including an ocular lens and an optical coherence tomography (OCT) imaging module is provided. The OCT imaging module is able to image both retina and anterior segment of eyes by switching a lens group into and out of the OCT light path. The OCT imaging module includes a retina imaging mode and an anterior segment imaging mode. In the retina imaging mode, there exists an intermediate image plane located between the ocular lens and the OCT imaging module. From the retina imaging mode, anterior segment imaging is achieved by inserting a switching lens group into the optical path inside the OCT imaging module or replacing the whole OCT imaging module of the retina mode, wherein, after the insertion, there exist a new intermediate image plane located inside the OCT imaging module and a conjugate of the entrance pupil of the OCT imaging module located between the ocular lens and the OCT imaging module.

Abstract: Systems and methods for bacterial load sensing devices are disclosed. An example contamination sensing device may comprise a body, a light emitter disposed on the body and configured to emit an excitation wavelength of light toward a surface, a sensor disposed on the body, configured to detect light, and directed toward the surface, and a filter adjuster configured to determine, based on the excitation wavelength of light, a filter configured to remove light outside of an emission wavelength range, wherein the emission wavelength range corresponds to wavelengths of light emitted by contamination upon exposure to the excitation wavelength of light, and adjustably move the filter in front of the sensor.

Abstract: An eyeglass frame shape measurement device includes an optical measurement unit, a probe unit, a holding unit that holds the optical measurement unit and the probe unit, a changing portion that integrally moves the optical measurement unit and the probe unit with respect to an eyeglass frame to change a measurement position with respect to a groove of a rim of the eyeglass frame, and a controller that controls an operation of the eyeglass frame shape measurement device. The controller controls an operation of the changing portion to measure the groove of the rim of the eyeglass frame, acquires a cross-sectional shape of the groove of the rim of the eyeglass frame based on a detection result detected by the optical measurement unit, and acquires a shape of the rim of the eyeglass frame based on a detection result detected by the probe unit.

Abstract: A shape of an object is measured with a high degree of accuracy. A shape measurement system comprises: a distance measuring head for irradiating an object with light and receiving light reflected from the object; a distance measuring device for generating a distance detection waveform on the basis of the reflected light; and a control device for analyzing the distance detection waveform and calculating a measured distance value to the object. The shape measurement system is characterized in that the control device calculates a feature amount of the distance detection waveform and performs at least one of a process of correcting an error in the measured distance value by substituting the feature amount into a correction formula and a process of performing a confidence weighting of an error in the measured distance value by substituting the feature amount into a confidence weighting formula.

Abstract: A method for fast extracting an organic pollutant in a complex system is disclosed, which includes following steps. A surface-enhanced Raman scattering (SERS) spectrum of an organic pollutant is divided to obtain P wavelength sub-intervals with overlapping regions. The P wavelength sub-intervals are screened to obtain ? wavelength sub-intervals. The ? wavelength sub-intervals are screened to obtain a required wavelength sub-interval. The required wavelength sub-interval is screened to obtain a required wavelength subset. A method and a system for fast detecting an organic pollutant in a complex system are also disclosed.

Abstract: A method for evaluating a structure is disclosed, the structure including a base material containing at least one kind of metal selected from the group consisting of hydrogen storage metals and hydrogen storage alloys, an intermediate layer provided on the base material and stacked alternately with a first layer containing low work function substances relatively lower in work function than the metal and a second layer containing the metal, and a surface layer provided on the intermediate layer and containing the metal, wherein the method includes measuring a change in polarization between incident light and reflected light by irradiating the surface layer with light, while holding the structure at a predetermined temperature, and comparing a measurement value of the change in polarization with a threshold of a change in polarization of a structure prepared in advance and evaluating a soundness of the structure based on comparison results.

Abstract: A system and method for detecting dynamic strain of a housing. The system includes an optical fiber linearly affixed along a surface of a length of the housing and an interrogator comprising a laser source and a photodetector. The optical fiber comprises at least one pair of fiber Bragg gratings (FBGs) tuned to reflect substantially identical wavelengths with a segment of the optical fiber extending between the FBGs. The segment of the optical fiber is linearly affixed along the surface of the housing. The interrogator is configured to perform interferometry by shining laser light along the optical fiber and detecting light reflected by the FBGs. The interrogator outputs dynamic strain measurements based on interferometry performed on the reflected light.

Abstract: A system includes a memory and at least one processing device operatively coupled to the memory to facilitate an etch recipe development process by performing a number of operations. The operations include receiving a request to initiate an iteration of an etch process using an etch recipe to etch a plurality of materials each located at a respective one of a plurality of reflectometry measurement points, obtaining material thickness data for each of the plurality of materials resulting from the iteration of the etch process, and determining one or more etch parameters based on the material thickness data.

Abstract: An optical path test system includes a return light test unit for emitting laser light to an optical path monitoring unit to simulate return light received by the optical path monitoring unit in a normal operation; a light path monitoring unit arranged on a light path of the return light testing unit for receiving the return light and normally emitting laser light; and a power detector for receiving the laser light emitted by the light path monitoring unit so as to monitor stability of output power of the chip when the light path monitoring unit receives the return light emitted by the return light testing unit. The technical solution in the present invention emits laser light to a tested laser chip to simulate return light received by the tested laser chip in a normal operation, and a return light resistance threshold of the laser chip can be accurately evaluated.

Abstract: A system including a first micro-retarder array, wherein the first micro-retarder array is configured to convert a purely polarized light of an incident light into two components. The system additionally includes an optical device, wherein the optical device is configured to collimate the two components to two foci planes. Moreover, the system includes a second micro-retarder array, wherein the second micro-retarder array is configured to combine a set of two components of the incident light, thereby producing a second purely polarized light. Further the system includes a detector, wherein the detector is configured to receive the second purely polarized light.

Abstract: The present description relates to a device for line-scanning optical coherence tomographic microscopy. The device comprises an interferometric microscope comprising a reference arm, an object arm configured to receive an object, a beam splitter coupling said object arm and reference arm to a light source and to a sensor, and a first microscope objective arranged on said object arm. It further comprises a one-dimensional confocal spatial filtering device configured to interact with said light source in order to illuminate said object along a focal line located in an object space of the first microscope objective, and a device for unidirectional scanning of said focal line, which device is arranged on said object arm upstream of said first microscope objective and is configured to scan the focal line in a lateral direction (y) substantially perpendicular to an optical axis (z) of said first microscope objective.

Abstract: The monitoring and control of bioprocesses is provided. The present disclosure provides the ability to generate generic calibration models, independent of cell line, using inline Raman probes to monitor changes in glucose, lactate, glutamate, ammonium, viable cell concentration (VCC), total cell concentration (TCC) and product concentration. Calibration models were developed from cell culture using two different CHOK1SV GS-KO™ cell lines producing different monoclonal antibodies (mAbs). Developed predictive models, qualified using an independent CHOK1SV GS-KO™ cell line not used in calibration, measured changes in glucose, lactate, ammonium, VCC, and TCC with minor prediction errors over the course of cell culture with minimal cell line dependence. The development of these generic models allows the application of spectroscopic PAT techniques in a clinical manufacturing environment, where processes are typically run once or twice in GMP manufacturing based on a common platform process.

Abstract: Examples of the disclosure relate to an apparatus (101), a wearable electronic device and an optical arrangement for optical coherence tomography. The apparatus comprises an optical coherence tomography system (103) and an optical arrangement (105). The optical arrangement comprises at least one means for beam shaping (109) configured to shape a beam of light from the optical coherence tomography system. The optical arrangement also comprises at least one mirror (111) positioned so that light from the means for beam shaping is incident on the at least one mirror. The at least one mirror is configured to move in at least one direction relative to the optical coherence tomography system.

Abstract: Embodiments of the disclosure are drawn to apparatuses and methods for a rotating optical reflector. Optical systems may have a limited field of view, and so in order to expand the area that the optical system collects data from, the field of view of the optical system may be scanned across a target area. The present disclosure is directed to a rotating optical reflector, which includes a transmissive layer which refracts light onto a reflective layer, which has a normal which is not parallel to the axis about which the optical reflector is rotated. The optical reflector may be both statically and dynamically balanced, which may allow an increased size of the optical reflector, which in turn may increase the aperture of an optical system (e.g., a lidar system) using the rotating optical reflector.

Abstract: Methods and apparatus, including computer program products, for determining a presence of an object located close to a lens (301) of a camera monitoring a scene. A first infrared illumination source (302) arranged to illuminate the scene from a first angle is activated. A first image (304) is acquired by the image capturing device (300). The first infrared illumination source (302) is deactivated, and a second infrared illumination source (306) arranged to illuminate the scene from a second angle is activated. A second image (308) is acquired by the image capturing device (300). Intensity information of the first image (304) and the second image (308) is compared to determine the presence of an object located close to the lens (301).

Abstract: A device for detecting (D) at least one predetermined particle (P) includes an interferometric element (EI) arranged so as to be illuminated by an incident radiation (Lin) and comprising at least one so-called thin layer (CM) disposed on top of a so-called substrate layer (Sub), the particle being attached to a surface (Sm) of the thin layer, the interferometric element (EI) forming a Fabry-Pérot cavity with or without attached particle P; a matrix sensor (Det) adapted to detect an image comprising a first portion (P1) deriving from the detection of the incident radiation transmitted (LTBG) by the interferometric element alone and a second portion (P2) deriving from the detection of the incident radiation transmitted (LTP) by the interferometric element and any particle (O, P) attached to a surface (Sm) of the thin layer; a processor (UT) linked to the sensor and configured: to calculate, as a function of wavelengths of the incident radiation ?i i?[1,m], the variation of intensity of at least one first pixel

Abstract: According to one embodiment, a monitoring device includes a detector unit including an image transfer element comprising an incident surface which allows light to enter from a light-transmissive base material on which a microbody is placed and an emission surface which emits the light entering from the incident surface, which transfers two-dimensional image data of the microbody to a semiconductor optical sensor, and the semiconductor optical sensor which receives light from the emission surface.

Abstract: An optical property evaluation apparatus evaluates an optical property of an evaluation object, and includes a light source, a polarization beam splitter, a polarization adjuster, a first detector, a second detector, and an analyzer. The analyzer obtains a reflectance when linearly polarized light in a specific direction is incident on the evaluation object based on the detection result by the first detector when the light with which the evaluation object is irradiated is set to be the linearly polarized light in the specific direction. The analyzer obtains a phase property at the reflection of the evaluation object based on the detection result by the first detector or the second detector when the light with which the evaluation object is irradiated is set to have a polarization state different from the linearly polarized light in the specific direction, and a Jones matrix.