Patents Examined by Temilade S Rhodes-Vivour
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Patent number: 9091566Abstract: A differential amplifier generates an offset correction signal based on a rotation detection signal from a rotation detector apparatus and an offset signal. A comparator compares the offset correction signal with a threshold voltage, and outputs a binarized signal representing the comparison result. An average value signal generator circuit generates an average value signal representing the average value of the offset correction signal. The offset signal generator circuit generates the offset signal so that the signal voltage of the average value signal has a voltage value between a threshold voltage and a threshold voltage.Type: GrantFiled: November 29, 2010Date of Patent: July 28, 2015Assignee: Mitsubishi Electric CorporationInventors: Manabu Tsukamoto, Kazuyasu Nishikawa, Takashi Tokunaga, Hideki Shimauchi, Yoshinori Tatenuma, Yuji Kawano, Hiroshi Kobayashi
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Patent number: 9091709Abstract: A circuit arrangement detects a maximum in a profile of a measurement signal. The circuit arrangement has an operational amplifier with a non-inverting input connected to a reference potential and an output connected to an inverting input via a first resistor. The first resistor has an input connection, to which the measurement signal is applied and which is connected to the inverting input of the operational amplifier via a series circuit containing a capacitor and a second resistor. The connection point between the capacitor and the second resistor is connected to the negative supply potential of the operational amplifier via a third resistor and a first, reverse-biased diode. The connection point between the third resistor and the first diode is connected to the output of the operational amplifier via a second, forward-biased diode. The reference potential is a positive potential.Type: GrantFiled: April 29, 2011Date of Patent: July 28, 2015Assignee: Continental Automotive GmbHInventor: Stephan Bolz
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Patent number: 9086436Abstract: A high voltage detection device comprises a probe comprising an electrode for contacting a high voltage electrical line. The electrode is connected in series with a resistor. A meter comprises a housing enclosing an electrical circuit for measuring line voltage. The electrical circuit comprises an input circuit for connection to the probe. The input circuit is adapted to suppress high frequency noise pick up by the probe and develop a bipolar voltage representing measured line voltage. A voltage detection circuit comprises a differential amplifier circuit for converting the bipolar voltage to a proportionate voltage signal. A signal processing circuit receives the proportionate voltage signal and drives the display for displaying the measured line voltage.Type: GrantFiled: December 19, 2011Date of Patent: July 21, 2015Assignee: Honeywell International Inc.Inventor: Anil Nagpal
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Patent number: 9075022Abstract: A non-destructive test method for evaluating a synthetic rope made of strength member elements includes: treating at least one strength member element to be detectable by a magnetic NDT device, incorporating the at least one treated strength member element into the rope, scanning the synthetic rope with the magnetic NDT device, and obtaining magnetic flux leakage or eddy current output data from the magnetic NDT device, wherein the output data relates to a condition of the synthetic rope. A synthetic rope or cable is thereby made to be capable of being inspected by a magnetic flux leakage or eddy current non-destructive test (NDT) method.Type: GrantFiled: March 15, 2013Date of Patent: July 7, 2015Assignee: WHITEHILL MANUFACTURING CORPORATIONInventors: Elizabeth W. Huntley, Mark B. Huntley, A. Simeon Whitehill
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Patent number: 9076760Abstract: A junction field-effect transistor (JFET) includes a substrate having a first-type semiconductor surface including a topside surface, and a top gate of a second-type formed in the semiconductor surface. A first-type drain and a first-type source are formed on opposing sides of the top gate. A first deep trench isolation region has an inner first trench wall and an outer first trench wall surrounding the top gate, the drain and the source, and extends vertically to a deep trench depth from the topside surface. A second-type sinker formed in semiconductor surface extends laterally outside the outer first trench wall. The sinker extends vertically from the topside surface to a second-type deep portion which is both below the deep trench depth and laterally inside the inner first trench wall to provide a bottom gate.Type: GrantFiled: August 29, 2012Date of Patent: July 7, 2015Assignee: TEXAS INSTRUMENTS INCORPORATEDInventors: Binghua Hu, Pinghai Hao, Sameer Pendharkar
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Patent number: 9075093Abstract: The invention relates to gas-discharge electrical instrumentation technology. The device for measuring electromagnetic field intensity comprises a measuring instrument for recording the glow of a gas discharge and a gas-discharge chamber that is formed between electrodes 1 and 2 separated by a dielectric 3. The electrode 1 is cylindrical, while the electrode 2 is in the form of a disk. The electrodes 1 and 2 are coupled to an electrical voltage source, wherein a capacitive element in the form of a pair comprising an antenna 5 and a connection to ground 6 is incorporated into the line coupling the cylindrical electrode 1 to the electrical voltage source. A capacitor 7 with variable capacitance is incorporated into the line coupling the cylindrical electrode 1 to the antenna 5. The technical result consists in providing the possibility of detecting a useful signal in a wide frequency range.Type: GrantFiled: December 17, 2010Date of Patent: July 7, 2015Inventor: Konstantin G. Korotkov
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Patent number: 9069014Abstract: A wire probe assembly and forming process is described. In one example, a method includes inserting a plurality of wires through a probe former and a tip retainer to contact a probe head substrate, attaching the wires to a surface of the substrate, pulling the probe former laterally with respect to the substrate surface and the tip retainer to bend the wires into test probes with a resiliency to transverse movement, and removing the tip retainer to form a test probe head.Type: GrantFiled: June 30, 2012Date of Patent: June 30, 2015Assignee: Intel CorporationInventors: Todd P. Albertson, Michael T. Crocker, David Shia, Lothar R. Kress
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Patent number: 9057757Abstract: Forward voltage drift in a probe system for the characterization of a light-emitting wafer is virtually eliminated by directing compressed air to the probe so as to ensure that the exact same temperature conditions exist during repeated measurements of the wafer. In one embodiment of the invention, an air flow at room temperature is used, either continuously or intermittently. In another embodiment, the temperature of the probe is controlled by flowing a liquid or a gas through micro-channels built into the probe. In yet another embodiment, the probe is connected to a solid-state Peltier cell that is computer-controlled to maintain the probe's temperature at a predetermined set-point. A temperature-controlled chamber or a thermal reservoir enclosing the probe could be used as well. The results obtained showed remarkable repeatability.Type: GrantFiled: December 21, 2011Date of Patent: June 16, 2015Assignee: BRUKER NANO, INC.Inventor: Dong Chen
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Patent number: 9052350Abstract: A system configured to monitor an operating electrical device includes a testing channel coupled to the device. The device is coupled to an electric power source through at least one electric power transmission channel. The power source is configured to transmit electric power at a first frequency. The testing channel is coupled to the power transmission channel. The system also includes a signal generator coupled to the testing channel. The signal generator is configured to inject testing signals into the testing channel at a second frequency that is greater than the first frequency. The system further includes at least one apparatus magnetically coupled to the power transmission channel. The magnetically coupled apparatus is configured to present a first impedance to the electric power at the first frequency and present a second impedance to the test signals at the second frequency. The second impedance is greater than the first impedance.Type: GrantFiled: July 31, 2012Date of Patent: June 9, 2015Assignee: General Electric CompanyInventors: Prabhakar Neti, Pinjia Zhang, Manoj Ramprasad Shah
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Patent number: 9035657Abstract: The present disclosure relates to systems and methods for conducting an electromagnetic borehole-to-surface survey of a formation surrounding a borehole. Such methods include deploying a dipole transmitter into the borehole to a depth of investigation, deploying an array of electromagnetic receivers outside of the wellbore, and measuring a response of the formation at the array of electromagnetic receivers deployed outside of the wellbore, for example at the surface. From the response of the formation a property of the formation can be determined based on the response of the formation measured at the array of electromagnetic receivers. For the scenario of a cased well, a local reference receiver may be added at a location proximate the borehole to measure the effective magnetic moment of the transmitter inside the casing, and normalize the formation response in order for a more accurate determination of a formation characteristic, such as resistivity.Type: GrantFiled: February 15, 2010Date of Patent: May 19, 2015Assignee: Schlumberger Technology CorporationInventors: Hong Zhang, Richard A. Rosthal
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Patent number: 9030193Abstract: A system by which the proportion of ferromagnetic particles in a dielectric medium is measured. A magnetic field is generated by two signals in the medium: a low frequency feed and a relatively high frequency excitation. The feed magnetizes the ferromagnetic particles in the medium to the nonlinear range of the magnetization curve. The excitation is generated so that its spectrum is relatively wide and it is dense with frequency components. The level of the excitation is so high that the magnetic flux density in the medium corresponding to the excitation fluctuates nonlinearly, when the feed is at its peak value or near this. The magnetic field of the medium is measured by a secondary winding, and from the response signal produced by the sensor is detected the part resulting from the magnetic non-linearity, which part is the output signal. In the detection the response is multiplied by the signal, which arises magnetic field and includes the same random fluctuation as the response.Type: GrantFiled: January 19, 2011Date of Patent: May 12, 2015Assignee: HemeltronInventor: Arvi Kruusing
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Patent number: 9007078Abstract: A pixel array module with a self-test function including a test circuit unit, a plurality of test lines, and a pixel array is provided. The test circuit unit provides the self-test function. The test lines are connected between the test circuit unit and the pixel array. The pixel array is connected to the test circuit unit through the test lines and includes a plurality of pixels. Each pixel includes a transistor. Each transistor has a first terminal and a second terminal. Regarding each of the pixels, a driving signal of the transistor is transmitted from the first terminal to the second terminal thereof under a normal mode, and a test signal of the transistor is transmitted from the second terminal to the first terminal thereof under a test mode. Furthermore, a self-test method of the foregoing pixel array module is also provided.Type: GrantFiled: July 1, 2012Date of Patent: April 14, 2015Assignee: Industrial Technology Research InstituteInventors: Chih-Cheng Hsieh, Shang-Fu Yeh, Ka-Yi Yeh
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Patent number: 8994381Abstract: A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal combined with two (or more) higher frequency signals to test a dynamic change in frequency response, gain, and or phase of the lower frequency signal from an audio device. This dynamic test can reveal frequency modulation effects via the two higher frequency signals emulate a modulated signal that provides a phase or frequency modulation frequency related to the difference of the two higher frequency signals. Another embodiment may include the use of a higher frequency signal and pulsed waveform to dynamically induce a time varying phase or frequency distortion of the pulsed waveform or components of the pulsed waveform from the device that has differential phase distortion.Type: GrantFiled: July 24, 2012Date of Patent: March 31, 2015Inventor: Ronald Quan
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Patent number: 8975903Abstract: A vehicle proximity switch and method are provided having learned sensitivity control. The switch includes a proximity sensor, such as a capacitive sensor, installed in a vehicle and providing a sense activation field. Also included is sense control circuitry processing the activation field to sense user activation of the switch by comparing the activation field to a threshold. The switch further includes sensitivity control circuitry learning a user sensitivity based on user activation of a sensor and controlling the sensitivity of one or more proximity switches.Type: GrantFiled: June 9, 2011Date of Patent: March 10, 2015Assignee: Ford Global Technologies, LLCInventors: Stuart C. Salter, Pietro Buttolo, Cornel Lewis Gardner, Thomas Lee Goodson
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Patent number: 8975899Abstract: An inverter device for feeding electrical energy from a DC-power source into a power grid includes a pair of bus lines to be connected to the DC-power source; a plurality of capacitors connected in series between the bus lines; a surveying topology surveying an integrity of the plurality of capacitors, and to provide a signal indicating a loss of integrity of one capacitor of the plurality of capacitors; a voltmeter measuring a voltage drop over the plurality of capacitors; a DC/AC-inverter; and a controller. in case of the signal indicating a loss of integrity of one capacitor of the plurality of capacitors, the controller compares the voltage drop over the plurality of capacitors to a lost integrity threshold voltage value, and reduces a current load to the plurality of capacitors by reducing the power uptake of the DC/AC-inverter, when the voltage drop exceeds the lost integrity threshold voltage value.Type: GrantFiled: July 13, 2012Date of Patent: March 10, 2015Assignee: SMA Solar Technology AGInventors: Henrik Wolf, Thomas Wegener, Daniel Clemens, Harald Drangmeister
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Patent number: 8963545Abstract: The present invention relates to a magnetic sensor that provides the sensitivity adjustment on a wafer and that has a superior mass productiveness and a small characteristic variation. The magnetic sensor includes a magnetic sensitive portion provided on a substrate that is made of a compound semiconductor and that has a cross-shaped pattern. This magnetic sensitive portion includes input terminals and output terminals. At least one of input terminals of the input terminal is series-connected to a trimming portion having a compound semiconductor via a connection electrode. By performing laser trimming on the trimming portion series-connected via the connection electrode to the magnetic sensitive portion while performing a wafer probing (electric test), the adjustment of the constant voltage sensitivity is provided.Type: GrantFiled: June 29, 2010Date of Patent: February 24, 2015Assignee: Asahi Kasei Microdevices CorporationInventor: Satomi Watanabe
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Patent number: 8963554Abstract: A pulsed discharge helium ionization detector for gas chromatography with multiple combined bias/collecting electrodes.Type: GrantFiled: August 23, 2012Date of Patent: February 24, 2015Assignee: Valco Instruments Company, L.P.Inventors: Stanley D. Stearns, Huamin Cai
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Patent number: 8941402Abstract: An electromagnetic field measuring apparatus capable of measuring an electromagnetic field for a minuscule area in which electronic devices are densely packed with a high sensitivity is provided. In an electromagnetic field measuring apparatus according to the present invention, the amplitude level of signal light (pf) is adjusted by the analyzer (34) by adjusting its angle with respect to the plane of polarization of the signal light (pf) based on an amplitude level control signal (eb) supplied from the calculation control unit (40). An amplitude level control signal (eb) is supplied from the calculation control unit (40) to the analyzer (34) based on the spectrum (ea) of an electric signal (ed) measured by an RF spectrum analyzer (39). The amplitude level ration between the carrier and the sideband contained in the signal light (ph) incident on the optical receiver (38) is controlled to a fixed value.Type: GrantFiled: May 18, 2010Date of Patent: January 27, 2015Assignee: NEC CorporationInventors: Mizuki Iwanami, Hiroshi Fukuda, Risato Ohhira
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Patent number: 8907685Abstract: Disclosed is a circuit arrangement for determining a temporal change of an output voltage of a half-bridge circuit during a dead time. In one embodiment, the circuit arrangement includes a first input for applying the output voltage. A capacitive network includes a first and a second circuit node capacitively coupled to the input, and having a terminal for a reference potential. A recharging circuit during the switched-on phase of one of a first and second switching elements, adjusts electrical potentials of the first and second nodes, the electrical potentials each being different from the reference potential. A comparator arrangement, during the dead time, determines a time difference between such times at which the electrical potentials at the first and second node each assume a given potential value, the time difference being a measure for the change with time of the output voltage.Type: GrantFiled: August 23, 2012Date of Patent: December 9, 2014Assignee: Infineon Technologies Austria AGInventor: Martin Feldtkeller
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Patent number: 8901941Abstract: An instrument (1) and a method for detecting partial electric discharges involve acquiring a discharge signal (10), for example picked up by a direct-measuring impedance device (7) through a broadband HF acquisition channel (18), and acquiring the discharge signal (10) in a narrowband LF acquisition channel (180) complying with regulations, using on the LF acquisition channel (180) a trigger controlled in slave mode by a trigger of the broadband HF acquisition channel (18); they also involve acquiring another discharge signal (32) picked up by an indirect-measuring impedance device (8) through a second narrowband LF acquisition channel (180A) and comparing digital signals (34, 34A) generated in the first and second LF acquisition channels (180, 180A), in order to generate a balanced digital signal (36) without components representative of common mode electrical signals present in the measuring circuit.Type: GrantFiled: March 4, 2011Date of Patent: December 2, 2014Assignee: Techimp Technologies S.R.L.Inventors: Stefano Serra, Gian Carlo Montanari, Fabiano Bettio