Abstract: A fixed latency configurable tap or fixed-tap digital filter may filter a signal in a fixed amount of time, regardless of the number of taps. The filter may include one or more of a clock, a plurality of registers in a shift register, an adder, an accumulator, and/or a scaler. In at least one embodiment, a running average may be maintained as samples are received such that the latency remains fixed with a constant number of clock cycles.

Abstract: A method and system are provided for performing magnetic anomaly sensing. Each of two magnetometers generates magnetic field measurements. The magnetometers define a one-dimensional gradiometer having a baseline between them. A difference value is generated using the magnetic field measurements. The magnetometers are independently moved to maintain the baseline when the difference value is unchanging. Detection of a magnetic anomaly by a first magnetometer is indicated when the difference value deviates. The second magnetometer is then maneuvered until the magnetic field measurements generated thereby are indicative of detection of the magnetic anomaly by the second magnetometer. When this occurs, an adjusted baseline is defined between the magnetometers. At least one of the magnetometers is maneuvered to position the adjusted baseline in each of three orthogonal dimensions.

Abstract: Inductive Proximity Sensors are non-contact sensing devices used in manufacturing processes to sense metal targets. In practice, it is common for objects to contact the sensor causing the sensor to malfunction. An inductive sensor with improved durability is required. An inductive proximity sensor includes an exterior housing, an interior sensing coil and electronic circuit, and a connector. The Exterior housing is produced from one piece of metal bar, bored from one end to the tip of the other end, leaving the cylindrical tube open only on one end. The Exterior Housing is produced with an Inside Dimension that is smaller than previous proximity sensors and places the coil and electronic circuit further away from the Outside Dimension of the Exterior Housing. The interior sensing coil and electronic circuit are protected by the thick casing of the Exterior housing to improve structural rigidity and the longevity of operation in manufacturing processes.

Abstract: A circuit and method of measuring capacitance are disclosed. The capacitance measuring circuit includes an integrator circuit, a first control circuit, a second control circuit and a processor circuit. The capacitance measuring method includes steps of: using a current source and a charging/discharging time to generate a first charge amount related to a second charge amount of a capacitor to be detected; generating a third charge amount and generating a fourth charge amount according to the first charge amount and the third charge amount; generating a fifth charge amount and generating a remaining charge amount according to the fifth charge amount and fourth charge amount; using an integrator to convert the remaining charge amount into a first voltage and generating a judging result according to whether the first voltage meets a second voltage; and calculating the judging result to obtain a capacitance variation of the capacitor to be detected.

Abstract: A system for determining an accurate ohmic resistance value associated with a battery cell is provided. The system includes a microprocessor and a memory device. The memory device has a 3-D interpolation table with first, second, third, fourth, fifth, sixth, seventh, and eighth records, each having a respective SOC value, a respective temperature value, a respective current value, and a respective ohmic resistance value. The microprocessor performs a 3-D interpolation calculation based on a first SOC value, a first temperature value, and a first current value and each respective SOC value, each respective temperature value, and each respective current value in the records to determine the accurate ohmic resistance value associated with the battery cell.

Abstract: A circuit board testing system includes a testing fixture. The testing fixture is used for testing plural wires of a cable of a circuit board. The testing fixture includes a first contact element, a switch circuit, a second contact element, a voltage acquisition element and a control unit. The first contact element is connected with input terminals of the plural wires. The second contact element is connected with output terminals of the plural wires. When the control unit drives a switching action of the switch circuit, a testing voltage is provided to the odd-numbered wires or the even-numbered wires. The control unit reads the voltage values of the odd-numbered wires and the voltage values of the even-numbered wires from the voltage acquisition element so as to judge whether the plural wires of the cable are normal.

Abstract: A system for detecting a position of a dual solenoid device includes device configured to move between first and second positions, and a controller. The controller has first and second monitoring circuits in operable communication with first and second channels, respectively. The first and second channels are in operable communication with first and second solenoids, respectively. Each solenoid is configured to selectively operate as an active solenoid to move the device when the solenoid and its respective channel are in an active mode, and as a passive solenoid when the solenoid and its respective channel are in a passive mode to passively move with the active solenoid. Each of the monitoring circuits is configured to determine a position of the device when the channel the monitoring circuit is associated with is operating in the passive mode by monitoring an electrical parameter of the passive solenoid associated with that channel.

Abstract: The present invention concerns a system for determining if a deterioration occurs in an interface of a semiconductor die of an electric power module, the electric power module further comprising a substrate and at least one electromechanical transductor, the semiconductor die and the at least one electromechanical transductor being placed on or embedded within the substrate, wherein the system comprises: —means for transferring at least one electric signal to the at least one electromechanical transductor, —means for measuring the impedance of the at least one electromechanical transductor, —means for comparing the impedance of the at least one electromechanical transductor to a predetermined value, —means for deciding that the deterioration occurs in the interface of the semiconductor die according to the comparison result.

Abstract: An array test circuit is provided. The circuit includes: at least one first demultiplexer module, an enable signal input point, a plurality of measurement and control signal input points, a plurality of data lines, a plurality of enabling switches, a plurality of anti-floating switches, and an inverter. A control terminal of each anti-floating switch is electrically connecting to an inverted enable signal, an input terminal is accessed to an OFF signal of the measurement and control switch, an output terminal is electrically connected to a corresponding measurement and control signal input point. The anti-floating switch can be turned on and input the OFF signal to the measurement and control signal input point when the liquid crystal panel is displayed, it can ensure the demultiplexing switches are kept in OFF state, preventing the switches in floating state and improving the working stability of the liquid crystal display panel.

Abstract: A magnetic sensor includes a magnetic detection element circuit that includes first and second magnetic detection elements, which are connected in series, and an output terminal, which is positioned between the first and second magnetic detection elements; an impedance matching device, which has a prescribed input voltage range and is connected to an output terminal of the magnetic detection element circuit; a first current supply source, which supplies an electric current to the magnetic detection element circuit; and a second current supply source, which supplies an electric current to the impedance matching device. A resistor is provided between the output terminal of the magnetic detection element circuit and the first current supply source and/or a reference electric potential point.

Abstract: A failure determination apparatus includes an electricity storage, a state sensor, a data accumulator, and a controller. The state sensor is to detect a state of the electricity storage as data. The data accumulator is to accumulate the data acquired by the state sensor as accumulated data. The controller is to determine, based on the accumulated data, whether a failure occurs in at least one of the electricity storage and the state sensor.

Abstract: A circuit board testing device able to apply tests to the front and reverse surfaces of the circuit board includes a control unit, at least one testing unit, and a chassis. The chassis includes a bottom frame, a plug member slidably mounted to the bottom frame, a side frame connected to an edge of the bottom frame and a back plate which includes at least two installation parts. The back plate is fixed to the side frame, and the testing unit is installed to the chassis. A chassis is also disclosed.

Abstract: An electronic test apparatus is adapted for testing an electronic component which includes a circuit substrate and a plurality of contact electrodes disposed on the circuit substrate. The electronic test apparatus includes a test seat and a plurality of spring probes. The test seat includes a metallic main body that has a first side adapted to be in contact with the circuit substrate and a second side opposite to the first side, and that is formed with a plurality of spaced-apart probe holes extending through the first and second sides, and a temperature sensor disposed in the metallic main body. The spring probes are adapted to be electrically connected to the contact electrodes and each is positioned in a respective one of the probe holes.

Abstract: A varistor failure detector includes one or more surge detector in communication with a varistor, to detect surges shunted by the varistor and a processor, in communication with the at surge detector(s). The processor is programmed to count surges shunted by the varistor, as indicated by the surge detector(s) and store at least one count representing a cumulative count of surges shunted by the varistor. An indicator of the count may be provided to an operator to indicate that the varistor should be replaced, to avoid catastrophic failure of the varistor.

Abstract: A printed resistive gas detector configuration that is simple, inexpensive and compact, fabricated for incorporation into an electronic device, such as an electronic computing and/or communication device, the printed resistive gas detector configuration designed to continuously monitor for predetermined types of gasses. The printed resistive gas detector configuration manufactured by the use of printing technology to print on a flexible substrate.

Abstract: Damage preventing identification system for electrical conductors and coupling points including at least one identification unit arranged for arrangement to a surface, end cap or cable shoe of an electrical conductor, which identification unit is provided with an encapsulation for arrangement of the identification unit to the electrical conductor, and for housing means for visual and electronic tagging, which identification unit further includes means for measuring temperature and/or current.

Abstract: A device for monitoring a critical path of an integrated circuit includes a replica of the critical path formed by sequential elements mutually separated by delay circuits that are programmable though a corresponding main multiplexer. A control circuit controls delay selections made by each main multiplexer. A sequencing module operates to sequence each sequential element using a main clock signal by delivering, in response to a main clock signal, respectively to the sequential elements, secondary clock signals that are mutually time shifted in such a manner as to take into account the propagation time inherent to the main multiplexer.

Abstract: Provided is a magnet device for use with a position sensor. The magnet device has a magnetizing direction and has magnetic field intensity components in the magnetizing direction. The magnet device is formed with a groove recessed in the magnetizing direction, so that the magnetic field intensity components are substantially equal in the transverse direction of the magnetizing direction. The present invention further discloses a magnet assembly including the magnet device for use with a position sensor and a sensing system including the magnet assembly, particularly a neutral position sensor. The axial measuring length of a transmission shaft is prolonged with the length of the magnet device remains unchanged to meet the requirements of different customers, and the reliability of the sensing system is improved.

Abstract: An objective of the application is to provide a method for detecting a disturbance in a power system within a digital substation and an apparatus using the same. The method includes: sensing electrical parameters at an end of a transmission line; sampling the sensed electrical parameters; extracting traveling-wave information from high frequency component of the samples using a signal processing method; and if the extracted traveling-wave information indicating occurrence of the disturbance, transmitting the extracted traveling-wave information to an intelligent electronic device of the digital substation from a merging unit or non-conventional instrument transformer of the digital substation. As compared with the amount of the sample data of the sensed electrical parameters, the amount of the data representing the extracted traveling-wave information is reduced.

Abstract: A metal detection apparatus (9) is tested with a test device (7) having at least one test article (79), movable through a detection zone (60). The test article is moved through the detection zone along a first transfer axis (ca) and a first input signal is measured. A first threshold (th1) is determined, where an amplitude of the first input signal exceeds the first threshold (th1). Then, an identical test article is moved through the detection zone along a further transfer axis (ta; . . . ) and a further input signal is measured and a further threshold (th2; . . . ) is determined, where an amplitude of the further input signal exceeds the further threshold (th2; . . . ). The first or further threshold (th1; th2; . . . ) is selected in the signal processing path (4) whenever the test article is moved along the related transfer axis (ca; ta; . . . ).