Abstract: A circuit assembly for monitoring a sinusoidal alternating voltage signal having a comparing element receiving at an input the signal with period T and generating a first output signal at an output based upon the signal exceeding a threshold; a zero crossing detector receives at its input the signal and generates a output signal at its output; a timing element connected to zero crossing detector generates a clock signal dependent on the second output signal; and a flip-flop. The comparing element output is connected to a state-controlled input of the flip-flop and the timing element output is connected to an edge-controlled input of the flip-flop. The flip-flop generates a state signal at its output. The timing element specifies a state change of the clock signal at an instant that differs from the instant at T/4 after a zero crossing of the signal.

Abstract: A measurement system for testing a device under test includes a signal generation and/or analysis equipment, several antennas, several reflectors and a test location for the device under test. The antennas are connected with the signal generation and/or analysis equipment in a signal-transmitting manner Each of the antennas is configured to transmit and/or receive an electromagnetic signal so that a beam path is provided between the respective antenna and the test location. The electromagnetic signal is reflected by the respective reflector so that the electromagnetic signal corresponds to a planar wave. Each antenna and the corresponding reflector together are configured to provide a corresponding quiet zone at the test location. At least one of the quiet zones provided is larger than the at least one other quiet zone and/or at least one of the antennas is configured to operate at a different frequency compared to the at least one other antenna.

Abstract: A magnetic field measuring device that can measure a weaker magnetic field is provided. A magnetic field measuring device is provided, the magnetic field measuring device including: a sensor unit that has at least one magnetoresistive element; a reference voltage generating unit that outputs a reference voltage; a magnetic field generating unit that generates a magnetic field to be applied to the sensor unit; a feedback current generating unit that supplies, according to a difference between an output voltage of the sensor unit and the reference voltage, the magnetic field generating unit with a feedback current that generates a feedback magnetic field to diminish an input magnetic field to the sensor unit; a magnetic field measuring unit that outputs a measurement value corresponding to the feedback current; and an adjusting unit that uses the output voltage of the sensor unit to adjust the reference voltage.

Abstract: Systems, methods, and apparatus for corona detection using audio data are provided. In one example embodiment, the method includes obtaining, by one or more computing devices, audio data indicative of audio associated with an electrical system for at least one time interval. The method includes partitioning, by the one or more computing devices, the audio data for the time interval into a plurality of time windows. The method includes determining, by the one or more computing devices, a signal indicative of a presence of corona based at least in part on audio data collected within an identified time window of the plurality of time windows relative to audio data collected for a remainder of the time interval.

Abstract: A chip test device and a chip test method are provided. The chip test device may include a chip socket and an interface card comprising a signal synthesizer, a plurality of first interfaces and a second interface. The signal synthesizer may be configured to synthesize a plurality of low-frequency first signals output from a plurality of testers into a high-frequency second signal and transmit the second signal to the chip socket. The plurality of first interfaces may be arranged in a plurality of inputs of the signal synthesizer for connecting the testers, and the second interface may be arranged in an output of the signal synthesizer for connecting the chip socket. By synthesizing the low-frequency first signals into the high-frequency second signal, a high-frequency test may be conducted using a plurality of low-frequency testers.

Abstract: A test and measurement device measures an insertion loss of a material under test. The test and measurement device includes a reference device in contact with a first surface of a material under test, the reference device including a reflective component and an absorbing component. A testing device is in contact with a second surface of the material under test, opposite the first surface. The testing device includes a first transmitter to output a first signal at a predetermined frequency to the reflective component of the reference device through the material under test, a first receiver to receive a first reflected signal from the reflective component, a second transmitter output a second signal at the predetermined frequency to the absorbing component of the reference device through the material under test, and a second receiver to receive a second reflected signal from the material under test.

Abstract: A capacitive voltage sensor that has particular application to be molded into an insulating body of a switch. The voltage sensor includes an annular electrode assembly having a grounded electrode including an inner ring and an outer ring defining a space therebetween, and a sensing electrode positioned in the space and being substantially surrounded by the inner and outer rings. The body is formed around the electrode assembly and a cylindrical center conductor extends through the electrode assembly. Capacitive coupling is provided between the sensing electrode and the center conductor by one or more openings in the inner ring, such as a single round hole, a slot or a plurality of symmetrically disposed round holes or slots. The inner and outer rings can be attached at one end so that the grounded electrode is a single piece or the rings can be separate rings electrically coupled together by conductive screws.

Abstract: In described examples, one or more devices include: apparatus including a lens element and a transducer to vibrate the lens element at an operating frequency when operating in an activated state; and controller circuitry. The controller circuitry is arranged to measure an impedance of the apparatus, to determine an estimated temperature of the apparatus in response to the measured impedance, to compare the estimated temperature against a temperature threshold for delineating an operating temperature range of the apparatus, and to toggle an activation state of the transducer in response to comparing the estimated temperature against the temperature threshold.

Abstract: An integrated circuit (IC) includes functional logic therein that can be enabled by application of a predefined thermal cycle. The IC includes an enabling fuse operatively coupled to the functional logic, the functional logic being disabled unless enabled by activation of the enabling fuse. A set of thermal sensors are arranged in a physically distributed manner through at least a portion of the IC. A test control macro operatively couples to the set of thermal sensors and the enabling fuse for activating the enabling fuse to enable the functional logic in response to application of a thermal cycle that causes the set of thermal sensors to sequentially experience a thermal condition matching a thermal sequence enabling test. A related method and system for applying the predefined thermal cycle are also provided.

Abstract: A digital circuit robustness verification method is provided that includes the following steps. An internal storage circuit and an external storage circuit corresponding to a circuit under test are set to store a plurality of random values and a configuration of the circuit under test for performing a predetermined function is set by a processing circuit. A driving signal corresponding to the predetermined function is transmitted to the circuit under test by a previous stage circuit, such that the circuit under test executes the predetermined function to further generate an output signal. The determination as to whether the output signal is correct or not is made by a next stage circuit, and the circuit under test is determined to pass a robustness verification when the output signal is correct.

Abstract: Disclosed is herein an antenna performance tester including: a horizontal rotor 200 rotatable about a shaft part 110 to which a DUT holder 300 is detachably coupled; and a vertical rotor 500 to which a reference antenna holder 400 is detachably fixed and which is spaced apart from a side surface of the DUT holder 300, is installed perpendicular to the horizontal rotor 200, and is rotatable about a virtual central point lying at the center. The antenna performance tester is advantageous in that: a reference antenna measures an RF while performing transmission and reception with respect to a DUT in all directions at a constant distance from the DUT; extension and replacement are possible depending on a frequency to be measured; and an influence of reflected waves is minimized at RF measurement, antenna performance can be simply tested in an anechoic chamber or even in a semi-anechoic chamber.

Abstract: An electronic determination device is configured for determining at least one characteristic parameter of an electric machine with P phases, P?3, connected to an electric starter and including at least P-1 switching arms, each switching arm being connected to a respective phase of the electric machine. The determination device comprises a control module configured to control respective switching arm(s) to close and the other switching arm(s) to open, so as to generate a current injection on two phases of the electric machine; an acquisition module configured to acquire measurements of respective current(s) and voltage(s) for said two phases, further to the generation of the current injection; and a calculation module configured to calculate at least one characteristic parameter of the electric machine according to the respective current(s) and voltage(s) measurements.

Abstract: An overhead power line insulator is provided including a device for detecting and measuring a leakage current and for transmitting data, the device being arranged in such a manner as to perform: measuring a leakage current of an insulator during a first measurement period and during a second measurement period in a measurement circuit; comparing two values of the current that are obtained during respective ones of the two measurement periods; and stopping the measurement circuit for a certain sleep period of time if the second value of the current is less than or equal to the first value of the current, and then starting the measurement circuit again after the certain sleep period of time.

Abstract: A monitoring device and a method for monitoring an insulation resistance for an ungrounded electric system includes a liquid cooling operated to ground and having refrigerant flowing in tubes. For this purpose, the measuring signal is supplied in series in the tube system via the refrigerant resistance. The monitoring device is realized having a current measurement or a voltage measurement at the tube sections in order to detect the insulation resistance and can be enhanced for monitoring a shared insulation resistance of several ungrounded electric subsystems fed by a shared transformer.

Abstract: A flexible electric probe can include: a flexible substrate; and probe line conductors on the flexible substrate, the probe line conductors being essentially parallel to each other and having separations of about 5-50 microns. The flexible electric probe can further include connection conductors on the flexible substrate, the connection conductors and the probe line conductors electrically connected to each other, the probe line conductors positioned in first and second offset patterns with regard to the connection conductors.

Abstract: Various examples are provided related to anisotropic constitutive parameters (ACPs) that can be used to launch Zenneck surface waves. In one example, among others, an ACP system includes an array of ACP elements distributed over a medium such as, e.g., a terrestrial medium. The array of ACP elements can include one or more horizontal layers of radial resistive artificial anisotropic dielectric (RRAAD) elements positioned in one or more orientations over the terrestrial medium. The ACP system can include vertical lossless artificial anisotropic dielectric (VLAAD) elements distributed over the terrestrial medium in a third orientation perpendicular to the horizontal layer or layers. The ACP system can also include horizontal artificial anisotropic magnetic permeability (HAAMP) elements distributed over the terrestrial medium. The array of ACP elements can be distributed about a launching structure, which can excite the ACP system with an electromagnetic field to launch a Zenneck surface wave.

Abstract: A portable device comprises a magnetometer for detecting a magnetic field. When the portable device is at or near a portal, the portable device may detect data from the portal, such as beacon data or a connection message. Responsive to the data from the portal, the portable device operates the magnetometer to detect and characterize a magnetic field generated by the portal, such as by characterizing the magnitude, polarity, and direction of the magnetic field. The portable device generates magnetometer data to indicate the magnetic field strength detected by the magnetometer. The magnetometer data is then transmitted to the portal, along with a device identifier. The portal compares the received magnetometer data to expected magnetic field data to determine presence of the portable device at the portal. The portable device is associated with an account, providing information about entry of a user of that account entering the portal.

Abstract: The disclosure generally relates to a failure indicator for providing an indicator that a failure has occurred on a capacitor unit of a capacitor bank. In some embodiments, the failure indicator may include a magnetic element, and the failure indicator may be configured to move from a first orientation to a second orientation based on a mechanical or electromagnetic impulse in the capacitor unit resulting from a failure of the first capacitor unit. In some embodiments, the magnetic element may maintain the first failure indicator in the second orientation to indicate the failure of the first capacitor unit.

Abstract: A probe card in an automated test equipment (ATE) is disclosed. The probe card may be a portion of a vertical-type probe card assembly in which pads on a circuit board are contacted by probe pins, with vertical vias in the circuit board interconnecting various conductive elements. Disclosed herein is a transposed via arrangement within a circuit board for a probe card, where adjacent vias are offset towards each other such that the inductance between the adjacent vias may be reduced to provide a desirable impedance during high frequency signal and/or power transmission.

Abstract: A current supply device includes a multiplexed digital bus, an output terminal, and a group of power supplies connected in parallel between the multiplexed digital bus and the output terminal. The group of power supplies are controlled via the multiplexed digital bus such that a combined output current of the group of power supplies is applied to the output terminal.