Abstract: A method for factory analysis and/or maintenance, preferably including receiving factory information and/or associating defects with factory components, and optionally including acting based on defect associations and/or operating factory machines. The method is preferably associated with one or more manufacturing systems and/or elements thereof.

Abstract: An encoder (10) for determining an angular position, the encoder (10) comprising a shaft (14, 16), a housing (18) and a transition region (32), the shaft (14, 16) projecting outwards from the housing (18) into the transition region (32), a measuring element (20) connected to the shaft (14), a sensor (22) for detecting the measuring element (20), and a control and evaluation unit (28) for generating, from the signals of the sensor (22), an angle signal in dependence on the angular position of the measuring element (20), wherein a protective cap (34) is arranged in the transition region (32) for protection against fluids (12) directed with pressure onto the transition region (32).

Abstract: The invention is a cost effective multisite parallel wafer tester that has an array of stationary wafer test sites; a single mobile wafer handling and alignment carriage that holds a wafer handling robot, a wafer rotation pre-alignment assembly, a wafer alignment assembly, a wafer front opening unified pod (FOUP), and a wafer camera assembly; and a robot that moves the wafer handling and alignment carriage to and from each test site. Each test site contains a wafer probe card assembly and a floating chuck. In use, wafers are loaded from a front opening FOUP into a wafer buffer FOUP from which wafers are retrieved by the wafer handling and alignment assembly.

Abstract: An apparatus includes a near-field probe having loops or coils of electrically-conductive material, where the near-field probe is configured to generate a magnetic field. The apparatus also includes a power amplifier configured to drive the near-field probe. The apparatus further includes a shunt capacitance coupled in parallel across the loops or coils of the near-field probe. The shunt capacitance and an inductance of the loops or coils of the near-field probe form part of a resistive-inductive-capacitive (RLC) network. The RLC network is configured to transform a smaller resistance of the near-field probe into a larger resistance. In some cases, the apparatus may include multiple near-field probes coupled in series, and the power amplifier may be configured to drive the multiple near-field probes. For each near-field probe, the apparatus may include a shunt capacitance coupled in parallel across the loops or coils of the near-field probe.

Abstract: Microfluidic method and device that can be used for sensing and measurement of properties of liquids, gases, solutions, and particles is proposed, wherein the measurable liquid or gas (with or without particles) flow in at least one channel through a measurement chamber (cell) formed between at least two isolated electrodes is used for electrical impedance measurement. The proposed solution is characterized in that the cross-section of at least one pair of similar spatial electrodes decreases smoothly towards the tiny measurement chamber (cell) in order to increase the sensitivity and accuracy of the measurement. Typically, a device with multiple similar channels is advantageous to use for comparative measurement and differential measurement schemes.

Abstract: A detection circuit for open, close and suspension states of a high and low level effective switch in a vehicle. The circuit includes an optocoupler circuit module, a low-level active path module, a high-level active path module, a filtering and debouncing module, a transient suppression module, and a wiring terminal. The optocoupler circuit module is connected to the low-level active path module, the high-level active path module and the low-level active path module are connected in parallel to the filtering and debouncing module, and the filtering and debouncing module is connected to the transient suppression module, and then connected to the external high-level active switch or low-level active switch through the wiring terminal. Whether it is a high-level active switch or a low-level active switch, the detection circuit can distinguish whether the switch is in the closed or suspended state, and the strong and weak voltages are isolated.

Abstract: An anechoic chamber and test system that is adapted for installation in or to a vehicle. The chamber includes an outer structure that is durable enough to withstand the effects of transportation. The anechoic chamber and test system may also include an inner faraday shield, a transmission antenna, and a controller that can introduce GNSS, alternative navigation signals, jamming, or spoofing signals into the anechoic chamber along with vehicle sensor signals. The controller is adapted to monitor a GNSS system's ability to resist the jamming or spoofing signals using, at least in part, the vehicle sensor signals.

Abstract: The disclosed exemplary apparatuses, systems and methods provide at least two realizations of synchronized antenna probe arrays. These antenna probe arrays may be used to generate and receive RF signals in a compact anechoic chamber for over the air antenna testing, or other applications such as far-field antenna test chambers. A compact anechoic chamber for over-the-air antenna testing may include at least: a chamber housing; an interchangeable irradiating test panel, integral to the chamber; a plurality of absorbing material at least partially lining an interior of the chamber and capable of directing the irradiating; at least one moveable cart suitable for moving and removing the antenna from the chamber; at least one panel interface for interconnecting the antenna and equipment for the testing, wherein a response of the antenna to the irradiating is communicated through the panel interface to the testing equipment; and at least one switch matrix for multiplexed switching of ones of signals of the testing.

Abstract: According to one embodiment, an insulation diagnostic system comprising: a peak-value acquisition circuit configured to acquire at least one peak value of a section corresponding to local discharge of a voltage signal acquired by at least one sensor that detects the voltage signal in a non-contact manner; a function acquisition circuit configured to acquire a calculation function for calculating charge amount related to the discharge based on at least two peak values acquired from the voltage signal that is detected by the sensor by applying a test voltage to a rotating electrical machine while the rotating electrical machine is stopped; and a charge-amount calculation circuit configured to calculate the charge amount related to partial discharge of the rotating electrical machine based on the calculation function and the peak value obtained from the voltage signal that is detected by the sensor during operation of the rotating electrical machine.

Abstract: Provided are a semiconductor device and a method of operating the same. A semiconductor includes a test circuit which comprises: a test transistor to be tested for time-dependent dielectric breakdown (TDDB) characteristics using a stress voltage; an input switch disposed between a voltage application node to which the stress voltage is applied and an input node which transmits the stress voltage to the test transistor; and a protection switch disposed between the input node and a ground node.

Abstract: A system for the automated validation of a semi-anechoic chamber (SAC) is disclosed. The system includes a receive assembly and a transmit assembly, each configured to autonomously relocate within the SAC. The system also includes a local client communicatively coupled to the transmit assembly. The local client is configured to send a validation arrangement to the transmit assembly describing a validation location and a distance. The transmit assembly is configured to receive the validation arrangement, move the transmit assembly to the validation location and send an instruction to the receive assembly, the instruction describing the distance. The receive assembly is communicatively coupled to the transmit assembly and configured to receive the instruction and move the receive assembly such that a separation between the transmit and receive assemblies is restored to the distance. Each validation arrangement corresponds to a validation point. A plurality of validation points defines a test volume.

Abstract: A device includes a control circuit, a scope circuit, and a time-to-current converter. The control circuit is configured to receive a voltage signal from a voltage-controlled oscillator, delay the voltage signal for a delay time to generate a first control signal, and to generate a second control signal according to the first control signal and the voltage signal. The scope circuit is configured to generate a first current signal in response to the second control signal and the voltage signal. The time-to-current converter is configured generate a second current signal according to the first control signal, the voltage signal, a first switch signal, and a test control signal.

Abstract: A semiconductor sensor-based near-patient diagnostic system and related methods.

Abstract: An apparatus and method for the non-destructive determination of the content of the magnetizable and/or non-magnetizable portion of a sample, in which the sample is provided in an air gap of a magnetically conductive yoke, an alternating magnetic field is generated by an alternating magnetic field strength of an excitation coil in the yoke, and first measurement data relating to the sample are collected using a measuring device which is inductively coupled to the yoke, and comparing the first measurement data to second measurement data relating to a reference sample, wherein the same alternating magnetic field strength or the same alternating magnetic field is applied to both the reference sample and the sample and the difference between the two collected sets of measurement data is included as a measure in the determination of the content for the magnetizable and/or non-magnetizable content portion of the sample.

Abstract: In a meter for performing a measurement of an electrical parameter, an output from a sensor is sampled to produce at least one sample, and an iterative method is performed comprising: producing further samples; holding in memory a stored array of samples comprising the at least one sample and each of the further samples from each iteration; determining a measure of statistical variability of a mean for the respective iteration from a measure of statistical variability and from the number of samples used to generate the measure of statistical variability; comparing the measure of statistical variability of the mean with a pre-determined threshold; and generating an electrical signal indicating a state of the measurement if the measure of statistical variability of the mean of the samples taken during the measurement is less than or equal to the pre-determined threshold.

Abstract: Systems and methods are provided for detecting and analyzing changes in a body. For example, a system includes an electric field generator configured to produce an electric field. The system includes an external sensor device configured to detect physical changes in the electric field, where the physical changes affect amplitude and frequency of the electric field. The system includes a quadrature demodulator configured to detect changes of the frequency of the output of the electric field generator. The system includes an amplitude reference source and an amplitude comparison switch configured to detect changes of the amplitude of the output of the electric field generator. The system includes a signal processor configured to analyze the changes of the amplitude and frequency of the output of the electric field generator.

Abstract: In one aspect, a magnetic field sensor includes a plurality of tunneling magnetoresistance (TMR) elements that includes a first TMR element, a second TMR element, a third TMR element and a fourth TMR element. The first and second TMR elements are connected to a voltage source and the third and fourth TMR elements are connected to ground. Each TMR element has a pillar count of more than one pillar and the pillar count is selected to reduce the angle error below 1.0°.

Abstract: A temperature test apparatus 1 includes a test antenna 6 configured to transmit or receive a radio signal to or from the antennas 110 in order to measure reception characteristics or transmission characteristics of the DUT 100, a heat-insulating housing 70 made of heat-insulating material surrounding a space region 71 including a quiet zone QZ, and a measuring device 20 configured to measure the transmission characteristics or the reception characteristics of the DUT 100. The heat-insulating housing 70 has a flat plate shaped part 70a in a region through which radio waves of a radio signal transmitted from the test antenna 6 passes before entering the quiet zone QZ. The flat plate shaped part 70a is perpendicular to the traveling direction of the radio waves of the radio signal entering the quiet zone QZ.

Abstract: Aspects of the disclosure provide a sensing apparatus including a sensing device, a memory, and processing circuitry. The sensing device includes resonators having respective resonant frequencies. The resonators include an array of inductive coils positioned on a surface of the apparatus. The sensing device can output a signal indicating changes of the resonant frequencies caused by presence of an object proximate to the surface. The memory stores reference signals corresponding to reference objects. Each reference signal indicates changes of the resonant frequencies caused by the respective reference object proximate to the surface. The processing circuitry can receive, from the sensing device, a particular signal indicating changes of the resonant frequencies caused by presence of a particular object proximate to the surface. The processing circuitry compares the particular signal with the stored reference signals of the reference objects to determine an identity of the particular object.

Abstract: A system detects cracks in solder joints on a printed circuit board (PCB). The system includes a device, a signal generator, a termination resistor, and a detector. The device includes a first contact and a second contact coupled to the first contact. The device is soldered to the PCB by a first solder joint at the first contact and by a second solder joint at the second contact. The signal generator has a test signal output coupled to the first solder joint. The termination resistor has a first terminal coupled to the second solder joint, and a second terminal coupled to a ground plane of the PCB. The detector receives a reflected signal that is a reflection of the test signal from at least one of the first solder joint, the second solder joint, and the termination resistor. The detector provides an indication as to whether or not at least one of the first solder joint and the second solder joint is cracked based upon a magnitude of the reflected signal.