Patents Examined by Thien D Nguyen
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Patent number: 9362951Abstract: A decoding method, a memory storage device, a memory controlling circuit unit and a decoding circuit for low density parity code (LDPC) are provided. The decoding method includes: reading a data bit of each memory cell; performing a parity check procedure on the data bits to generate a plurality of checks; in an iterative decoding of LDPC, obtaining a reliability message of each data bit according to the checks and deciding an index of an error bit from the data bits according to the reliability messages; determining whether the index of the error bit and the checks comply with a parity criteria; and if the index of the error bit and the checks comply with the parity criteria, stopping the iterative decoding and outputting the index of the error bit. Accordingly, a decoding latency is decreased.Type: GrantFiled: January 1, 2014Date of Patent: June 7, 2016Assignee: PHISON ELECTRONICS CORP.Inventor: Chien-Fu Tseng
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Patent number: 9349489Abstract: A data storage device includes non-volatile memory and a controller. The controller is configured to, at a first time, determine a first count of storage elements having threshold voltages within a voltage range that corresponds to a first reference voltage. The controller is further configured to, at a second time, determine a second count of storage elements having threshold voltages within the voltage range. The controller is further configured to calculate an updated first reference voltage at least partially based on the first reference voltage, the first count, and the second count.Type: GrantFiled: February 20, 2013Date of Patent: May 24, 2016Assignee: SANDISK TECHNOLOGIES INC.Inventors: Sateesh Desireddi, Jayaprakash Naradasi, Anand Venkitachalam, Manuel Antonio D'Abreu, Stephen Skala
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Patent number: 9337955Abstract: A method includes accepting an input code word, which was produced by encoding data with an Error Correction Code (ECC), for decoding by a hardware-implemented ECC decoder. The input code word is pre-processed to produce a pre-processed code word, such that a first number of bit transitions that occur in the hardware-implemented ECC decoder while decoding the pre-processed code word is smaller than a second number of the bit transitions that would occur in the ECC decoder in decoding the input code word. The pre-processed code word is decoded using the ECC decoder, and the data is recovered from the decoded pre-processed code word.Type: GrantFiled: August 13, 2013Date of Patent: May 10, 2016Assignee: Apple Inc.Inventors: Micha Anholt, Naftali Sommer
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Patent number: 9329928Abstract: A method of bandwidth optimization in a non-volatile memory system includes: retrieving hard data bits; generating soft information from the hard data bits; applying a lossless compression to the soft information for calculating syndrome bits; and executing a low density parity check (LDPC) iterative decode on the hard data bits and the syndrome bits.Type: GrantFiled: November 8, 2013Date of Patent: May 3, 2016Assignee: SANDISK ENTERPRISE IP LLC.Inventors: James Fitzpatrick, Amirhossein Rafati
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Patent number: 9316690Abstract: An Automated Test Equipment (ATE) system is configured to test a Device Under Test (DUT). The ATE system stores a Procedure Description Language program. The ATE system interprets the program, thereby causing a configured scan path to be set up in the DUT and causing bit values to be loaded into that scan path. During testing, it is sometimes desirable to change only bit values in certain scan path bit locations. In a data recirculation operation, the ATE system shifts bit values, on a bit-by-bit basis, out of the configured scan path via the TDO terminal of the DUT and shifts back in either the shifted out bit value or a replacement bit value. The shift back into the configured scan path occurs via the TDI terminal of the DUT so that each bit value in the scan path is replaced with its previous value or a replacement value.Type: GrantFiled: March 9, 2011Date of Patent: April 19, 2016Assignee: QUALCOMM IncorporatedInventors: Songlin Zuo, Michael Laisne
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Patent number: 9319178Abstract: System, methods and apparatus are described that facilitate transmission of data over a multi-wire data communications link, particularly between two devices within an electronic apparatus. A data payload may be converted to a set of transition numbers, the transition numbers may be converted to a sequence of symbols and an error correction code (ECC) may be calculated from symbols in the sequence of symbols. The ECC corresponds to the data payload and the ECC may be appended to the data payload such that the set of transition numbers includes transition numbers corresponding to the ECC. The sequence of symbols is then transmitted on a plurality of signal wires. Clock information is encoded in the sequence of symbols. The clock information may be encoded by ensuring that each pair of consecutive symbols in the sequence of symbols includes two symbols that produce different signaling states on the plurality of signal wires.Type: GrantFiled: March 14, 2014Date of Patent: April 19, 2016Assignee: QUALCOMM IncorporatedInventor: Shoichiro Sengoku
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Patent number: 9291676Abstract: We report methods relating to scan warmup of integrated circuit devices. One such method may comprise loading a scan test stimulus to and unloading a scan test response from a first set of logic elements of an integrated circuit device at a scan clock first frequency equal to a test clock frequency; adjusting the scan clock from the first frequency to a second frequency by a scan warmup unit, wherein the scan clock second frequency is equal to a system clock frequency; and capturing the scan test response by a shift logic at the scan clock second frequency. We also report processors containing components configured to implement the method, and fabrication of such processors. The methods and their implementation may reduce di/dt events otherwise commonly occurring when testing logic elements of integrated circuit devices.Type: GrantFiled: February 21, 2013Date of Patent: March 22, 2016Assignee: Advanced Micro Devices, Inc.Inventors: Atchyuth K Gorti, Aditya Jagirdar, Bikash Kumar Agarwal, Eric Quinnell
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Patent number: 9294221Abstract: A method and arrangement for retransmission control. A method in a sending system entity for controlling retransmissions of data to a sending system entity is provided. Initial data encoded with a first forward error correction code is sent 200 to the receiving system entity. When transmitted initial data is determined to be affected by errors at the receiving system entity, the sending system entity receives 202 a request to retransmit the initial data combined 204 by new data encoded with a second forward error correction code in a combined data stream which is encoded 206 with a third forward error correction code before being sent 208 to the receiving system entity. By combining initial data and encoded new data in a combined data stream when resending, an effective and flexible procedure for retransmissions is achieved, which doesn't introduce any substantial delay of the data.Type: GrantFiled: November 8, 2010Date of Patent: March 22, 2016Assignee: Telefonaktiebolaget L M Ericsson (Publ)Inventors: Jawad Manssour, Afif Osseiran
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Patent number: 9280416Abstract: An improved data storage technique achieves a desired level of reliability by providing sufficient redundancy in erasure coded data to maintain the data, without repair, for a prescribed period of time. The improved technique employs a newly devised, continuous-time Markov chain model. The model can be applied in computerized systems to establish erasure coding parameters for storing and reliably maintaining data for a designated period of time, without any need to repair the data to reestablish an original or previous level of erasure coding redundancy.Type: GrantFiled: January 30, 2014Date of Patent: March 8, 2016Assignee: EMC CorporationInventors: Qin Xin, Feng Zhang, Qi Bao
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Patent number: 9280412Abstract: A non-volatile memory array storing data and ECCs includes error correcting logic. A data set can be read by performing iterations including sensing data using a read bias, and producing an indication of errors in the sensed data. A first iteration uses a first read bias. In each iteration, if the indication in a current iteration is less than a threshold, then the data is output from the selected cells sensed in the present iteration. If the indication in the current iteration exceeds the threshold, then another iteration is performed using a moved read bias, unless the indication in the current iteration shows an increase in errors relative to a previous iteration, in which case then sensed data from the previous iteration is output. Double buffering logic can be used to store sensed data during a current and a previous iteration.Type: GrantFiled: May 9, 2013Date of Patent: March 8, 2016Assignee: Macronix International Co., Ltd.Inventors: Wen-Feng Hsueh, Ming-Chao Lin
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Patent number: 9274887Abstract: This can relate to non-regular parity distribution of a non-volatile memory (“NVM”), such as flash memory, and detection of the non-regular parity via a metadata tag. For example, each codeword of the NVM can include one or more parity pages that may be distributed at random through the NVM. To identify the page as a parity page, a parity page marker can be included in the metadata of that page. During power-up of the NVM, an address table including the logical-to-physical address mapping of the pages can be created. Pages including a parity page marker, however, can be skipped during the creation of this address table. Additionally, by having two or more parity pages associated with a codeword, an additional layer of protection can be provided for repairing errors in that codeword.Type: GrantFiled: January 28, 2014Date of Patent: March 1, 2016Assignee: APPLE INC.Inventor: Daniel J. Post
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Patent number: 9270415Abstract: Methods and systems for encoding frames while maintaining bounded running disparity, including: encoding the headers of the frames utilizing a first line-code; selecting the first line-code and a second line code for encoding first and second payloads of first and second frames, respectively, based on first and second data types of first and second data comprised in the first and second payloads, respectively; encoding the first and second payloads utilizing the first and second line-codes, respectively; and transmitting the first and second frames over a communication channel characterized by first and second channel conditions, respectively. The second line-code has a minimal Hamming distance lower than that of the first line-code, and the differences between the first and second channel conditions are not enough for selecting the second line-code instead of the first line-code for encoding the second payload.Type: GrantFiled: February 3, 2014Date of Patent: February 23, 2016Assignee: Valens Semiconductor Ltd.Inventors: Aviv Salamon, Eyran Lida
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Patent number: 9262270Abstract: A packet is identified at a port of a serial data link, and it is determined that the packet is associated with an error. Entry into an error recovery mode is initiated based on the determination that the packet is associated with the error. Entry into the error recovery mode can cause the serial data link to be forced down. In one aspect, forcing the data link down causes all subsequent inbound packets to be dropped and all pending outbound requests and completions to be aborted during the error recovery mode.Type: GrantFiled: May 13, 2013Date of Patent: February 16, 2016Assignee: Intel CorporationInventors: Prahladachar Jayaprakash Bharadwaj, Alexander Brown, Debendra Das Sharma, Junaid Thaliyil
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Patent number: 9252813Abstract: A method includes accepting modulated symbols, which carry bits of a code word of a Low Density Parity Check (LDPC) code, and computing respective soft input metrics for the bits. The code word is decoded using an iterative LDPC decoding process that includes selecting, based on a predefined criterion, a number of internal iterations to be performed by an LDPC decoder (84) in the process, performing the selected number of the internal iterations using the LDPC decoder so as to estimate decoded bits and soft output metrics indicative of the input bits based on the soft input metrics, performing an external iteration that updates one or more of the soft input metrics based on one or more of the soft output metrics produced by the LDPC decoder, and repeating at least one of the internal iterations using the updated soft input metrics.Type: GrantFiled: May 16, 2010Date of Patent: February 2, 2016Assignee: NOVELSAT LTD.Inventors: Daniel Wajcer, Mor Miller
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Patent number: 9246634Abstract: Modulation and coding schemes are provided for improved performance of wireless communications systems to support services and applications for terminals with operational requirements at relatively low Es/N0 ratios. The new modulation and coding schemes provide new BCH codes, low density parity check (LDPC) codes and interleaving methods.Type: GrantFiled: May 9, 2013Date of Patent: January 26, 2016Assignee: Hughes Network Systems, LLCInventors: Mustafa Eroz, Lin-Nan Lee
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Patent number: 9225357Abstract: A method and apparatus are provided for recovering data efficiently even when data loss has occurred over a channel or network. The packet transmission method includes arranging a first transmission packet in a source symbol in a first region of a source block; arranging a second transmission packet in a space starting with an empty space of a last source symbol where the first transmission packet is arranged, remaining after arranging the first transmission packet; arranging information related to the second transmission packet in a second region of the source block; performing Forward Error Correction (FEC) encoding on the source block; and transmitting the encoded source block.Type: GrantFiled: February 19, 2013Date of Patent: December 29, 2015Assignee: Samsung Electronics Co., Ltd.Inventors: Seho Myung, Hyunkoo Yang, Sunghee Hwang
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Patent number: 9224012Abstract: A computer system includes a security processor, a first scan chain coupled to the security processor, a non-secure element, and a second scan chain coupled to the non-secure element. The computer system also includes one or more test access port controllers to control operation of the first and second scan chains, and further includes debug control logic, coupled to the one or more test access port controllers, to enable the one or more test access port controllers to activate debug functionality on the second scan chain but not the first scan chain in response to a predefined condition being satisfied.Type: GrantFiled: May 20, 2013Date of Patent: December 29, 2015Assignee: ADVANCED MICRO DEVICES, INC.Inventor: Winthrop J. Wu
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Patent number: 9214965Abstract: A method for improving data integrity in a non-volatile memory system includes: accessing a non-volatile memory cell for retrieving hard data bits; generating soft information by capturing a reliability of the hard data bits; calculating syndrome bits by applying a lossy compression to the soft information; and generating a host data by executing a low density parity check (LDPC) iterative decode on the hard data bits and the syndrome bits.Type: GrantFiled: November 8, 2013Date of Patent: December 15, 2015Assignee: SANDISK ENTERPRISE IP LLCInventors: James Fitzpatrick, Amirhossein Rafati
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Patent number: 9214959Abstract: The present inventions are related to systems and methods for data processing, and more particularly to systems and methods for performing data decoding including skipping one or more codeword blocks in the data decoding process. In one embodiment a data processing system includes a skip control circuit operable to skip re-application of a data decode algorithm to a portion of a codeword where at least the number of unsatisfied checks for the portion is zero.Type: GrantFiled: February 19, 2013Date of Patent: December 15, 2015Assignee: Avago Technologies General IP (Singapore) pte. Ltd.Inventors: Shaohua Yang, Fan Zhang, Chung-Li Wang, Shu Li
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Patent number: 9213063Abstract: A reset generation circuit of an integrated circuit uses a scan data input pin as a scan mode exit control, which is enabled only when the IC reset pin of the device is active. The reset generation circuit allows a TAP controller to be scan testable yet at the same time the circuit provides a method to exit scan mode without requiring a power-up sequence or an extra pin.Type: GrantFiled: March 26, 2014Date of Patent: December 15, 2015Assignee: FREESCALE SEMICONDUCTOR, INC.Inventor: Anurag Jindal