Abstract: An x-ray tube source is disclosed that allows differential phase shift, attenuation, and x-ray scattering features of an object to be acquired in a single exposure. Such multiplexed x-ray tube source includes multiple x-ray spot origins controlled in such a way that each slightly separated spot is temporally modulated “ON and OFF” at differing frequencies. In an x-ray interferometer system, such x-ray tube source forms multiple illumination beams of a single angular view of an object's feature but each with different interference fringe locations. A composite image can be acquired with a high frame-rate digital detector as a component element in such x-ray interferometer system. Such composite image can be subsequently de-multipexed and separately presented according to each spot-source illumination beam.

Abstract: An inspection position identification method that allows accurate inspection to be performed without in-advance identification of the position of an inspection plane in an inspected target. A three-dimensional image generation method that allows generation of a three-dimensional image for inspection without in-advance identification of the position of an inspection plane in an inspected target and then allows inspection to be performed. An inspection device including the methods. An inspection device includes a storage unit, which stores a radiation transmission image of an inspected object and a three-dimensional image generated from the radiation transmission image, and a control unit.

Abstract: The present disclosure relates to a medical imaging system having an X-ray source, a detector and a processing system. The the X-ray source is collimated to produce a diverging beam of radiation and transmits X-rays through an object. The detector includes detector pixels arranged in at least one row and is operative to receive the X-ray energy of the X-rays after having passed through the object. The processing system is programmed to select an initial height of the object with respect to the X-ray source plane and determine an initial time delayed summation (TDS) shift frequency based on the initial height. The processing system performs a first scan of the object based on the TDS shift frequency and determines a new height of the object based on a beam angle and an overlap of adjacent images. A new TDS shift frequency is determined based on the new height of the object if the initial height and the new height are not substantially same.

Abstract: Disclosed herein is an x-ray interferometer for x-ray phase contrast imaging including an x-ray source, an x-ray source grating, two x-ray phase gratings, an x-ray analyzer grating and an x-ray detector. An alternative interferometer includes a periodically structured x-ray source, two x-ray phase gratings, an x-ray analyzer grating and an x-ray detector. The phase gratings are placed much closer to the x-ray detector than to the x-ray source and the image object is positioned upstream and close to the phase gratings to achieve high sensitivity and large field-of-view simultaneously.

Abstract: A spectroscopic element and a detector are disposed along a circumference of one Rowland circle. The spectroscopic element has a spectral surface whose length, measured along the Rowland circle, is shorter than a length in the Rowland circle plane, of an irradiation surface irradiated with excitation beams emitted to a sample holder. The spectroscopic element and the sample holder are disposed to separate a group of characteristic X-rays within a common spectral range of the spectroscopic element.

Abstract: An analysis apparatus comprises: a moveable stage assembly; a sample holder on a top surface of the stage assembly; a first photon source and a first photon detector or detector array, the first photon source being configured to emit a first beam of photons that intercepts the surface of a sample at a first location on the sample and the first photon detector or detector array being configured to detect photons that are emitted from the first location; and a second photon source and a second photon detector or detector array, the second photon source being configured to emit a second beam of photons that intercepts the surface of the sample at a second location on the sample, the second location being spaced apart from the first location, and the second photon detector or detector array being configured to detect photons that are emitted from the second location.

Abstract: The present invention is related to technologies used to inspect flexible undersea pipes, in particular to detect flooding of the annular space in said pipes. The present invention discloses a device for detecting annular flooding with gamma transmission in a flexible pipe, comprising a structure (07), in which said structure (07) contains in its interior, a first pressure vessel (10) containing an encapsulated radioactive source (03) in its interior, a second pressure vessel (11) containing radiation sensors (04) in its interior, and a third pressure vessel (12), containing electronic means for collecting and amplifying signals (05) in its interior, in which said radiation sensors (04) are connected to the electronic means (05) for collecting and amplifying signals using an internal cable (13).

Abstract: An interface module to connect a collimator to an X-ray generator, includes: a base plate, which forms a support area for an X-ray tube unit flange of the X-ray generator; an adjustment plate, which is rotatably connected to the base plate; and at least one swivel element movably connected to the base plate and adjustment plate such that, upon rotation of the adjustment plate, the at least one swivel element pivots between a clamping position and an open position.

Abstract: The present disclosure relates to a lifting apparatus. The lifting apparatus may include a base column, a mobile column, a sliding component, a supporting arm, a lifting system, and a move-coordination system. The mobile column connected to the base column may be vertically movable relative to the base column. The lifting system may be configured to cause the movement of the mobile column. The sliding component connected to the mobile column may be vertically movable relative to the mobile column. The mobile column and the sliding component may be connected via the move-coordination system, which enables the sliding component and the mobile column to move simultaneously according to a predetermined relative motion relationship. The supporting arm may be connected to the sliding component.

Abstract: A diffraction analysis device and a method for a full-field X-ray fluorescence imaging analysis are disclosed. The device includes a switching assembly, collimation assemblies, an X-ray source, an X-ray detector, a laser indicator, and a computer control system. The switching assembly combines with the collimation assemblies to achieve a functional effect that is previously achieved by two different types of devices through only one device by changing the positioning layout of the X-ray source and the X-ray detector. The full-field X-ray fluorescence imaging analysis can be realized, and the crystal phase composition information and the element distribution imaging information of the sample can be quickly obtained through the same device without scanning, which not only greatly improves the utilization rate of each assembly in the device, reduces the assemblies cost of the device, makes the device structure more compact, but also greatly improves the analysis efficiency and detection accuracy.

Abstract: A breast support platform for an x-ray imaging system includes a housing having a compression plate and a front wall, and a heating system disposed at least partially within the housing. The heating system is configured to heat at least a portion of the compression plate, at least a portion of the front wall, or at least a portion of the compression plate and the front wall. In an example, the heating system includes a transparent conducting film coupled to an inner surface of the housing. In another example, the heating system includes a blower disposed at least partially within the housing, and the blower is configured to channel hot air across an inner surface of the housing.

Abstract: This application disclosures a method for calibrating filament current data of an X-ray tube. The method includes obtaining a first value of tube current to be calibrated and a value of filament current to be calibrated, the tube current to be calibrated and the filament current to be calibrated corresponding to a first calibration point; performing an emission operation based on the first value of the tube current to be calibrated and the value of the filament current to be calibrated; determining an actual value of the tube current during the emission operation; determining a difference between the actual value of the tube current and the first value of the tube current to be calibrated; and calibrating, based on the difference, the first calibration point.

Abstract: An extra-oral dental imaging apparatus for obtaining an image from a patient has a radiation source; a first digital imaging sensor that provides, for each of a plurality of image pixels, at least a first digital value according to a count of received photons that exceed at least a first energy threshold; a mount that supports the radiation source and the first digital imaging sensor on opposite sides of the patient's head; a computer in signal communication with the digital imaging sensor for acquiring a first two-dimensional image from the first digital imaging sensor; and a second digital imaging sensor that is alternately switched into place by the mount and that provides image data according to received radiation.

Abstract: An image quality indicator (IQI) system includes a crack IQI. The crack IQI includes a penetrameter having a first body and a second body disposed in the first body. The first body has a first body inner surface defining a first body hole. The second body has a second body outer surface disposed adjacent the first body inner surface to form an interface having an interface gap. The IQI system also includes a radiation source spaced from the penetrameter and configured to transmit radiation rays to the penetrameter. The IQI system also includes a radiation detector disposed adjacent the penetrameter and configured to generate an IQI radiographic image indicative of an interface gap characteristic of the interface gap.

Abstract: The present invention concerns an apparatus for irradiating goods with X-rays, comprising a first source of X-rays configured for emitting X-rays along a first irradiation volume centered on a longitudinal axis (X), and a conveyor configured for driving goods such as to expose a first portion of the goods through the first irradiation volume, wherein, the conveyor is configured for driving the target products through the irradiation volume along a vertical axis (Z).

Abstract: The present disclosure provides a system and method for X-ray imaging. The method of calculating scatter in an X-ray image may include forming a modulated X-ray image. The method of forming the modulated X-ray image may include acquiring X-rays through a collimator module and an imaged object in sequence to generate an X-ray image group; the acquisition may be performed during a movement of the collimator module in a first direction and the X-ray image group may include a plurality of X-ray images acquired at different times during the movement of the collimator; extracting sub-zones from the plurality of X-ray images in the X-ray image group; combining the sub-zones in the first direction to form the modulated X-ray image. In the present disclosure, an intensity distribution of the X-rays may be adjusted flexibly using a collimator without adding any extra hardware. In addition, scatter components in the X-ray images may be calculated to eliminate the scatter in the X-ray images finally.

Abstract: Methods and systems for realizing a high radiance x-ray source based on a high density electron emitter array are presented herein. The high radiance x-ray source is suitable for high throughput x-ray metrology and inspection in a semiconductor fabrication environment. The high radiance X-ray source includes an array of electron emitters that generate a large electron current focused over a small anode area to generate high radiance X-ray illumination light. In some embodiments, electron current density across the surface of the electron emitter array is at least 0.01 Amperes/mm2, the electron current is focused onto an anode area with a dimension of maximum extent less than 100 micrometers, and the spacing between emitters is less than 5 micrometers. In another aspect, emitted electrons are accelerated from the array to the anode with a landing energy less than four times the energy of a desired X-ray emission line.

Abstract: An anode for an X-ray tube is provided. The anode has a shape configured such that, in use: an electron beam impinges upon the anode at a focal spot on the surface of the anode, and the anode is heated by the electron beam from a first state to a predetermined second state and undergoes resulting thermal expansion causing a change in the location of the focal spot on the surface of the anode, wherein the configured shape of the anode is such that the spatial position of the focal spot with respect to the X-ray tube is substantially the same for the first state and the second state. A method of producing an anode for an X-ray tube is also provided.

Abstract: A medical or dental imaging system for generating an image of a part of the head, comprising: an x-ray source and an x-ray detector which move around the head to generate x-ray images at different positions, a tracking device which provides sensor data indicative of any movement of the head during the acquisition of the x-ray images and a computer which generates tracking data based on the sensor data and calculates an x-ray image of the head part based on the x-ray images and on the tracking data to compensate for any movement of the head part during the acquisition of the x-ray images, wherein the tracking device comprises at least one camera and an attachment device for detachable attachment of the camera to the patient.

Abstract: An apparatus for inspecting a semiconductor device according to an embodiment includes an X-ray irradiation unit configured to make monochromatic X-rays obliquely incident on the semiconductor device, which is an object at a predetermined angle of incidence, a detection unit configured to detect observed X-rays observed from the object using a plurality of two-dimensionally disposed photodetection elements, an analysis apparatus configured to generate X-ray diffraction images obtained by photoelectrically converting the observed X-rays, and a control unit configured to change an angle of incidence and a detection angle of the X-rays, in which the analysis apparatus acquires an X-ray diffraction image every time the angle of incidence is changed, extracts a peak X-ray diffraction image, X-ray intensity of which becomes maximum for each of pixels and compares the peak X-ray diffraction image among the pixels to thereby estimate a stress distribution of the object.