Abstract: A transformer-based anomaly detection apparatus includes: an encoder unit including n encoding blocks having a pyramid structure, and extracting respective multi-scale feature maps having the pyramid structure through respective encoding blocks; a spatio-temporal transformer unit having n spatio-temporal transformers, and generating each multi-scale spatio-temporal attention map in which a temporal feature and a spatial feature for the feature map extracted from each encoding block are emphasized through each spatio-temporal transformer; and a decoder unit including n decoders having a reverse pyramid structure, and generating a prediction frame by using outputs of the multi-scale spatio-temporal attention map and a previous layer decoder through n decoders, and an abnormal event is detected by using the prediction frame.

Abstract: A method for protecting, controlling, and monitoring electrical medium range switchgear comprising use of a Rogowski coil embedded in the outside of a cylinder or bottle of a switchgear and surrounding the Mains providing voltage and current and a capacitive or similar voltage divider, also surrounding the Mains and extending around the cylinder or bottle, and providing analog signals from those devices to an integrated circuit for conversion to digital signals, and then transmitting as output the digital signals to a data accumulator where the same are optionally time stamped and compared to one another, to a standard or to themselves at a different time.

Abstract: A chip-on-film test board on which a chip-on-film is mounted according to an embodiment of the present disclosure includes a main board in which a test circuit configured to output a test pattern signal is formed, and a chip-on-film fixing part that fixes a position of the chip-on-film.

Abstract: Apparatuses, systems, methods, and computer program products for massively independent testers systems are disclosed. An apparatus includes a controller, a substrate, a device interface board, multiple tester modules mounted on the substrate, and/or one or more interface buses. One or more components for tester modules are mounted on a device interface board. Tester modules are configured to perform both independent functional and parametric tests. One or more interface buses are in communication with a controller, multiple tester modules, and/or a device interface board to provide one or more of power and a communication link.

Abstract: In one example, an integrated circuit comprises a die. The die has a first surface and a second surface, the second surface opposite to the first surface. The die also includes: a first contact on the first surface and a second contact on the second surface; a through silicon via having a first end and a second end, the first end coupled to the first contact and the second end coupled to the second contact; and a scan cell having a control input, a response input, and a stimulus output, the response input coupled to the first end and the stimulus output coupled to the second end.

Abstract: A sensor device includes: a sensor element, outputting a signal; a first determination circuit, outputting an initialization signal containing a signal level corresponding to a determination result as to whether detection of a physical quantity has matched two consecutive times; a second determination circuit, including a counter which is able to, while initializing a count value if the detection of the physical quantity does not occur two consecutive times, continue counting if the detection of the physical quantity occurs two consecutive times until a set number of times is reached, the second determination circuit outputting an output latch signal containing a signal level corresponding to whether a consecutive match occurs until the set number of times is reached; and an output register, switching a signal level of an output signal supplied to an output terminal according to a change in the signal level of the output latch signal.

Abstract: A system and method for performing production testing on high power semiconductor devices is disclosed. The system includes signal generators, RF meters, sockets, couplers and connectors which also function as switches when connected to an external cable. A calibration process is executed which allows the controller to create a correlation between measurements taken by the RF meter and the actual voltages, and power levels present at the device under test. By performing this calibration, it is possible to perform production testing of devices much more quickly and reliably.

Abstract: The present invention discloses an in-situ testing system for semiconductor device in aerospace irradiation environment. The present invention includes a static testing unit, a static testing channel, a dynamic testing unit, a dynamic testing channel, and a channel switching control unit; the static testing unit is connected to the device under test through the static testing channel, and is used to output static testing signals and display the static testing data of the device under test; the dynamic testing unit is connected to the device under test through the dynamic testing channel, and is used to output dynamic testing signals and display the dynamic testing data of the device under test; the channel switching control unit is connected to the static testing channel and the dynamic testing channel, respectively. This invention can achieve static, dynamic, and degradation testing of third-generation semiconductor device in aerospace irradiation environment.

Abstract: A current detection device includes a main busbar and a semiconductor chip. A detected current flows through the main busbar. The semiconductor chip is spaced apart from the main busbar. The semiconductor chip includes a branch busbar, a detection part, and an output part. The branch busbar is connected in parallel with the main busbar. The detection part is arranged adjacent to the branch busbar and detects a first magnetic field generated based on a branch current flowing from the main busbar to the branch busbar. The output part calculates and outputs a current value based on the first magnetic field detected by the detection part.

Abstract: Systems, apparatuses and methods provide for technology that monitors a component. A monitoring apparatus includes a sensor to monitor a state of a component, a power circuit to convert an electromagnetic signal to electrical power, a capacitor bank coupled to the power circuit and to the sensor to receive electrical power from the power circuit and to supply electrical power to the sensor, and a wireless readout to convert data from the sensor into a wireless communication signal. A method of monitoring a component includes coupling a sensor to a component, the sensor configured to monitor a state of the component, applying power to the sensor from a capacitor bank, and storing data obtained from the sensor, where the data relates to a state of the component. The method can include charging the capacitor bank via a power circuit, where the power circuit converts an electromagnetic signal to electrical power.

Abstract: Disclosed is a serial test circuit for controllable Chiplets, which belongs to the technical field of test or measurement of semiconductor devices during manufacturing or processing. The test circuit includes a master control test module, a slave control test module, a clock controlling module and an outputting module. The master control test module is composed of a test access port module, a segment insertion bit module and a test data register module. The test controlling signal is generated by the master control test module, and the test inputting signals of the slave Chiplets are respectively controlled by the slave control test module after receiving the test controlling signal. At the same time, the test controlling signal is inputted to the clock controlling module to obtain the clock signals of the slave Chiplets. The output signal of the test outputting module is determined by the test controlling signal.

Abstract: A semiconductor device includes a semiconductor die having a surface and sensing circuitry at a sensing region of the surface. A tubular wall of a metal material has an inner sidewall around the sensing region to provide a sensing cavity that extends from the surface of the semiconductor die to an opening at a distal edge thereof. The tubular wall includes a proximal portion and a distal flange portion. The proximal portion extends longitudinally from the surface. The distal flange portion extends radially outwardly from the proximal portion a first distance and radially inwardly from the proximal portion a second distance that is less than the first distance.

Abstract: A current detection device includes a plurality of current detection units arranged in the current detection device. Each of the current detection units includes a bus bar that enables a current to be measured to flow therethrough, a magnetic sensor disposed at a position facing the bus bar, and a pair of shields disposed so as to sandwich the bus bar and the magnetic sensor in a facing direction in which the bus bar and the magnetic sensor face each other. The bus bars of the plurality of current detection units extend so as to be aligned to one another and, as viewed in the facing direction, the positions of the shield and the magnetic sensor of each of the current detection units in an extension direction of the bus bars differ from the positions of the shield and the magnetic sensor of the adjacent current detection unit.

Abstract: An apparatus for positioning and retaining a Rogowski coil around a conductor includes a first member configured to receive a first section of the Rogowski coil, a second member configured to receive a second section of the Rogowski coil, and a non-conductive securing structure configured to engage the conductor and retain the first member and the second member in fixed positions relative to the conductor. According to one exemplary embodiment, the apparatus may also include a coupling mechanism configured to permit at least one of the first member and the second member to be moved relative to each other and positioned around the conductor. According to another exemplary embodiment, the securing structure may include a pair of arched elements, wherein each arched element is configured to engage the conductor and retain a corresponding one of the first and second members in a respective fixed position relative to the conductor.

Abstract: A test apparatus includes: an electrical connection unit to be electrically connected to a terminal of each of a plurality of light emitting devices to be tested; a light source unit for collectively irradiating the plurality of light emitting devices with light; a measuring unit for measuring a photoelectric signal obtained by photoelectrically converting light irradiated by the light source unit and output via the electrical connection unit by each light emitting device; an acquisition unit for acquiring a correction map including a correction value for correcting a variation in intensity of light with which a position of each light emitting device is irradiated by the light source unit; and a determination unit for determining a quality of each light emitting device on a basis of a measurement result by the measuring unit and the correction map acquired by the acquisition unit.

Abstract: A method and apparatus for detecting an internal short circuit in a battery are provided. The method includes acquiring values of one or more basic parameters of the battery, acquiring values of one or more degradation parameters used in a battery model indicating an internal state of the battery based on the values of the one or more basic parameters, determining whether the internal short circuit occurs in the battery based on a first value of a first degradation parameter and a second value of a second degradation parameter from among the one or more degradation parameters, and performing an operation in response to the internal short circuit occurring in the battery.

Abstract: Magnetic-based electronic valve readers for determining a location and orientation of magnets coupled to implantable medical devices to determine a setting of the device (e.g., setting of a fluid flow control valve of the medical device). The electronic valve readers include an orientation sensing mechanism that is provided and configured to enable the electronic valve reader to: 1) allow for internal offset calculation of an orientation change of the electronic valve reader during a reading process; and/or 2) during the reading process, provide an indication or warning to the clinician that the orientation of the electronic valve reader has changed to an extent at or exceeding a predetermined angular acceptance threshold or window. Systems including the disclosed electronic valve readers and methods of reading a setting of the device are also disclosed.

Abstract: A wafer inspection system is provided. The wafer inspection system includes: a transfer region in which a transfer device is arranged; an inspection region in which test heads for inspecting a substrate are arranged; and a maintenance region in which the test heads are maintained. The inspection region is located between the transfer region and the maintenance region, a plurality of inspection rooms accommodating the test heads are adjacent to each other in the inspection region, and the test heads are configured to be unloaded from the inspection region to the maintenance region.

Abstract: A method and system for measuring broadband impedance of a renewable energy power generation device. A voltage disturbance is injected into the renewable energy power generation device by using a disturbance injection device, and three-phase voltage and three-phase current of each of preset measurement points are acquired. Relevant variables before the renewable energy power generation device is decoupled from a measurement device and impedance of a power grid, are calculated according to the three-phase voltage and the three-phase current of each of the preset measurement points. Impedance of the renewable energy power generation device after being decoupled from the measurement device and the impedance of the power grid, is calculated.

Abstract: Provided are a sensor arrangement for a foreign object detection device for a wireless power transfer system, a foreign object detection and a primary part for a wireless power transfer system. The sensor arrangement includes multiple detection cells, each including a sense coil including a winding spirally wound in a plane and having multiple turns. Multiple input leads and one or more output leads are provided such that each detection cell may be connected to a current input and a current output. The sense coil of at least one detection cell includes an outer coil section and an inner coil section arranged inside the outer coil section, where a first distance between an outermost turn of the inner coil section and an innermost turn of the outer coil section is at least twice a largest distance between two turns of the outer coil section.