Abstract: A system and method for performing production testing on high power semiconductor devices is disclosed. The system includes signal generators, RF meters, sockets, couplers and connectors which also function as switches when connected to an external cable. A calibration process is executed which allows the controller to create a correlation between measurements taken by the RF meter and the actual voltages, and power levels present at the device under test. By performing this calibration, it is possible to perform production testing of devices much more quickly and reliably.

Abstract: The present invention discloses an in-situ testing system for semiconductor device in aerospace irradiation environment. The present invention includes a static testing unit, a static testing channel, a dynamic testing unit, a dynamic testing channel, and a channel switching control unit; the static testing unit is connected to the device under test through the static testing channel, and is used to output static testing signals and display the static testing data of the device under test; the dynamic testing unit is connected to the device under test through the dynamic testing channel, and is used to output dynamic testing signals and display the dynamic testing data of the device under test; the channel switching control unit is connected to the static testing channel and the dynamic testing channel, respectively. This invention can achieve static, dynamic, and degradation testing of third-generation semiconductor device in aerospace irradiation environment.

Abstract: Systems, apparatuses and methods provide for technology that monitors a component. A monitoring apparatus includes a sensor to monitor a state of a component, a power circuit to convert an electromagnetic signal to electrical power, a capacitor bank coupled to the power circuit and to the sensor to receive electrical power from the power circuit and to supply electrical power to the sensor, and a wireless readout to convert data from the sensor into a wireless communication signal. A method of monitoring a component includes coupling a sensor to a component, the sensor configured to monitor a state of the component, applying power to the sensor from a capacitor bank, and storing data obtained from the sensor, where the data relates to a state of the component. The method can include charging the capacitor bank via a power circuit, where the power circuit converts an electromagnetic signal to electrical power.

Abstract: A current detection device includes a main busbar and a semiconductor chip. A detected current flows through the main busbar. The semiconductor chip is spaced apart from the main busbar. The semiconductor chip includes a branch busbar, a detection part, and an output part. The branch busbar is connected in parallel with the main busbar. The detection part is arranged adjacent to the branch busbar and detects a first magnetic field generated based on a branch current flowing from the main busbar to the branch busbar. The output part calculates and outputs a current value based on the first magnetic field detected by the detection part.

Abstract: Disclosed is a serial test circuit for controllable Chiplets, which belongs to the technical field of test or measurement of semiconductor devices during manufacturing or processing. The test circuit includes a master control test module, a slave control test module, a clock controlling module and an outputting module. The master control test module is composed of a test access port module, a segment insertion bit module and a test data register module. The test controlling signal is generated by the master control test module, and the test inputting signals of the slave Chiplets are respectively controlled by the slave control test module after receiving the test controlling signal. At the same time, the test controlling signal is inputted to the clock controlling module to obtain the clock signals of the slave Chiplets. The output signal of the test outputting module is determined by the test controlling signal.

Abstract: A current detection device includes a plurality of current detection units arranged in the current detection device. Each of the current detection units includes a bus bar that enables a current to be measured to flow therethrough, a magnetic sensor disposed at a position facing the bus bar, and a pair of shields disposed so as to sandwich the bus bar and the magnetic sensor in a facing direction in which the bus bar and the magnetic sensor face each other. The bus bars of the plurality of current detection units extend so as to be aligned to one another and, as viewed in the facing direction, the positions of the shield and the magnetic sensor of each of the current detection units in an extension direction of the bus bars differ from the positions of the shield and the magnetic sensor of the adjacent current detection unit.

Abstract: A semiconductor device includes a semiconductor die having a surface and sensing circuitry at a sensing region of the surface. A tubular wall of a metal material has an inner sidewall around the sensing region to provide a sensing cavity that extends from the surface of the semiconductor die to an opening at a distal edge thereof. The tubular wall includes a proximal portion and a distal flange portion. The proximal portion extends longitudinally from the surface. The distal flange portion extends radially outwardly from the proximal portion a first distance and radially inwardly from the proximal portion a second distance that is less than the first distance.

Abstract: A test apparatus includes: an electrical connection unit to be electrically connected to a terminal of each of a plurality of light emitting devices to be tested; a light source unit for collectively irradiating the plurality of light emitting devices with light; a measuring unit for measuring a photoelectric signal obtained by photoelectrically converting light irradiated by the light source unit and output via the electrical connection unit by each light emitting device; an acquisition unit for acquiring a correction map including a correction value for correcting a variation in intensity of light with which a position of each light emitting device is irradiated by the light source unit; and a determination unit for determining a quality of each light emitting device on a basis of a measurement result by the measuring unit and the correction map acquired by the acquisition unit.

Abstract: An apparatus for positioning and retaining a Rogowski coil around a conductor includes a first member configured to receive a first section of the Rogowski coil, a second member configured to receive a second section of the Rogowski coil, and a non-conductive securing structure configured to engage the conductor and retain the first member and the second member in fixed positions relative to the conductor. According to one exemplary embodiment, the apparatus may also include a coupling mechanism configured to permit at least one of the first member and the second member to be moved relative to each other and positioned around the conductor. According to another exemplary embodiment, the securing structure may include a pair of arched elements, wherein each arched element is configured to engage the conductor and retain a corresponding one of the first and second members in a respective fixed position relative to the conductor.

Abstract: Magnetic-based electronic valve readers for determining a location and orientation of magnets coupled to implantable medical devices to determine a setting of the device (e.g., setting of a fluid flow control valve of the medical device). The electronic valve readers include an orientation sensing mechanism that is provided and configured to enable the electronic valve reader to: 1) allow for internal offset calculation of an orientation change of the electronic valve reader during a reading process; and/or 2) during the reading process, provide an indication or warning to the clinician that the orientation of the electronic valve reader has changed to an extent at or exceeding a predetermined angular acceptance threshold or window. Systems including the disclosed electronic valve readers and methods of reading a setting of the device are also disclosed.

Abstract: A method and apparatus for detecting an internal short circuit in a battery are provided. The method includes acquiring values of one or more basic parameters of the battery, acquiring values of one or more degradation parameters used in a battery model indicating an internal state of the battery based on the values of the one or more basic parameters, determining whether the internal short circuit occurs in the battery based on a first value of a first degradation parameter and a second value of a second degradation parameter from among the one or more degradation parameters, and performing an operation in response to the internal short circuit occurring in the battery.

Abstract: A wafer inspection system is provided. The wafer inspection system includes: a transfer region in which a transfer device is arranged; an inspection region in which test heads for inspecting a substrate are arranged; and a maintenance region in which the test heads are maintained. The inspection region is located between the transfer region and the maintenance region, a plurality of inspection rooms accommodating the test heads are adjacent to each other in the inspection region, and the test heads are configured to be unloaded from the inspection region to the maintenance region.

Abstract: A method and system for measuring broadband impedance of a renewable energy power generation device. A voltage disturbance is injected into the renewable energy power generation device by using a disturbance injection device, and three-phase voltage and three-phase current of each of preset measurement points are acquired. Relevant variables before the renewable energy power generation device is decoupled from a measurement device and impedance of a power grid, are calculated according to the three-phase voltage and the three-phase current of each of the preset measurement points. Impedance of the renewable energy power generation device after being decoupled from the measurement device and the impedance of the power grid, is calculated.

Abstract: The invention provides a cable abnormality assessment system, a slave device, and a cable abnormality assessment method. A cable abnormality assessment system is provided with a diagnosis control unit for assessing a cable abnormality on the basis of link-up information between a communication unit and another machine connected to the other end of a cable, and first and second information that are the respective results of abnormality diagnosis by a signal line diagnosis unit with regard to one and the other of two pair signal lines of the cable.

Abstract: Provided are a sensor arrangement for a foreign object detection device for a wireless power transfer system, a foreign object detection and a primary part for a wireless power transfer system. The sensor arrangement includes multiple detection cells, each including a sense coil including a winding spirally wound in a plane and having multiple turns. Multiple input leads and one or more output leads are provided such that each detection cell may be connected to a current input and a current output. The sense coil of at least one detection cell includes an outer coil section and an inner coil section arranged inside the outer coil section, where a first distance between an outermost turn of the inner coil section and an innermost turn of the outer coil section is at least twice a largest distance between two turns of the outer coil section.

Abstract: A contact probe for electronic tests includes an upper part having an end portion for contacting a first electronic component; a lower part having an end for contacting a second electronic component; and an elongated and deformable central body interposed between the upper and lower parts. The lower part has an enlarged head with a lower surface intended to rest at least partially onto a horizontal surface, the lower surface having an inclination angle from the horizontal surface onto which it rests when the probe is unbuckled and, when the probe is buckled, it can assume a position in which the lower surface moves to rest entirely onto the horizontal surface, thereby eliminating the inclination angle.

Abstract: An electronic assembly has a host wafer having a first circuit including wafer transistors and passive, non-transistor devices. Chiplets have a second circuit including at least one radio frequency (RF) transistor device. Electrical interconnects are between the chiplets and wafer. The electrical interconnects electrically connect the first circuit to the second circuits. Oscillators that have the wafer transistor, the RF transistor and the electrical interconnects produce a signal for built-in self-test circuits for testing an assembly design of the electronic assembly and speeds of the RF chiplet transistors.

Abstract: Methods for determining the internal corrosion rate of steel pipelines. During the methods the calibration constant is determined under laboratory conditions then by using the calibration constant field conditions are modeled under laboratory conditions and the corrosion rate is determined, then in the same manner as under laboratory conditions the corrosion rate is determined under field conditions. Further, the invention is a measuring arrangement for determining the calibration constant and the corrosion rate for the internal corrosion rate of steel pipelines (1) the arrangement is applicable to carry out the methods under laboratory and field conditions. The arrangement consists of a polarizing and measuring unit (5) having a two-channel power output (2), a potential-measuring input (3), and a ground connection (4), a control and data storage unit (6), and three probes (8) with counter-electrodes (7). At least one probe (8) is also provided with a reference electrode (9).

Abstract: The present invention relates to a sensor suite comprising at least one sensor. More particularly, the present invention relates to a sensor suite for measuring absolute and/or relative position, location and orientation of an object on or in which the sensor suite is employed. The present invention further relates to improved, novel sensor types for use in the sensor suite. More particularly, the present invention relates to an improved, novel magnetometer that is self-calibrating and scalable. Still more particularly, the present invention relates to such a magnetometer that is miniaturized. Further embodiments of the present invention relate to systems and methods for providing location and guidance, and more particularly for providing location and guidance in environments where global position systems (GPS) are unavailable or unreliable (GPS denied and/or degraded environments).

Abstract: A clamp-type AC voltage probe includes: a clamp portion that clamps a cable to be measured; an electrode disposed to be opposed to the cable clamped by the clamp portion; a parallel circuit in which a capacitor and a resistance are connected in parallel, and one end of which is connected to the electrode; a resistance one end of which is connected to the other end of the parallel circuit and the other end of which is connected to a circuit ground; a capacitor one end of which is connected to the other end of the parallel circuit and the other end of which is connected to the circuit ground; and an amplifier an input terminal of which is connected to the one end or the other end of the parallel circuit, and that amplifies and outputs a signal input into the input terminal.