Abstract: The illustrative embodiments pertain to a test fixture having low insertion inductance for large bandwidth monitoring of current signals. In one exemplary embodiment, the test fixture includes a baseplate with each resistor of a set of resistors embedded inside a respective non-plated through slot in the baseplate. A first terminal of each resistor is soldered to a top metallic zone of the baseplate and a second terminal soldered to a first of two bottom metallic zones of the baseplate. The top metallic zone is connected by plated-through holes to a second of the two bottom metallic zones. When mounted upon a PCB, the test fixture allows current flow from the first bottom metallic zone, upwards through the set of resistors to the top metallic zone, and downwards to the second bottom metallic zone. An observation instrument may be coupled to a coaxial connector that is mounted on the baseplate.

Abstract: A semiconductor device, a semiconductor system, and a control method of a semiconductor device are capable of accurately monitoring the lowest operating voltage of a circuit to be monitored. According to one embodiment, a monitor unit of a semiconductor system includes a voltage monitor that is driven by a second power supply voltage different from a first power supply voltage supplied to an internal circuit that is a circuit to be monitored and monitors the first power supply voltage, and a delay monitor that is driven by the first power supply voltage and monitors the signal propagation period of time of a critical path in the internal circuit.

Abstract: An electronic component handler that transports an electronic component to an electronic component placement unit on which the electronic component is placed includes: a transport unit that transports the electronic component; a light irradiation unit that irradiates the electronic component placement unit with light; and a vertical direction moving mechanism unit that has a guide that supports the light irradiation unit and guides the light irradiation unit in a vertical direction.

Abstract: A voltage determination device includes: a printed wiring board on which first to third substrate terminals are arranged in substantially one line; first and second voltage determination circuits mounted on the printed wiring board and disposed on a first side of the printed wiring board divided by a line passing through the first to third substrate terminals; a first printed wiring connecting the first substrate terminal and the first voltage determination circuit; a second printed wiring connecting the second substrate terminal and the first voltage determination circuit; a third printed wiring connecting the third substrate terminal and the second voltage determination circuit; and a fourth printed wiring connecting the second substrate terminal and the second voltage determination circuit, in which the first to fourth printed wirings are provided without intersecting each other and without bypassing a second side of the printed wiring board divided by the first arrangement line.

Abstract: A light emitting diode (LED) lighting system for an automobile includes a switch block, a capacitor, a charge pump, and a capacitor detector. The charge pump includes an output to provide power to a gate driver of the switch block at a nominal voltage level. The capacitor detector circuit includes a detector input and a detector output. The detector input is connected to the charge pump output and to the charge pump capacitor to detect a voltage level on the charge pump capacitor. The capacitor detector circuit provides a first indication on the detector output that the charge pump capacitor is present and undamaged when the voltage level is greater than the nominal voltage level. The capacitor detector circuit further provides a second indication on the detector output that the charge pump capacitor is not present or is damaged when the voltage level is less than the nominal voltage level.

Abstract: A method and system for detecting a source of noise in an electrical grid distributing network implementing Power Line Communications, the method including, at each meter, disposing an element behaving as a resistive element within the frequency band of the PLC, and behaving as a nonresistive element at the frequency of the electrical grid, between a first cable belonging to the distributing network and a second cable belonging to the enduser network; measuring the difference in electric potential between the two ends of each element disposed between the first cable belonging to the distributing network and the second cable belonging to the enduser network; and from the one measurement, determining whether a device belonging to the enduser network and connected to the meter is causing a noise disturbance or not.

Abstract: An apparatus includes a capacitor, a reference voltage, an input signal to be measured, and a frequency calculation circuit. The frequency calculation circuit is configured to select a capacitance value for the capacitor, charge the capacitor with the reference voltage, discharge the capacitor to a threshold voltage, and, based on a comparison of time to discharge the capacitor to the threshold voltage with a clock cycle of the input signal, determine a frequency of the input signal.

Abstract: The present disclosure provides a technique capable of improving an SN ratio of a current signal which is superimposed on a power line in a photovoltaic string and transmitted and efficiently specifying a failure location. A current source 151 is connected to a power line 11 in parallel with each of photovoltaic elements 14. A controller 152 controls a current value of the current source 151 such that a current signal is generated. A bypass capacitor 153 is connected to the power line 11 to be parallel to the each of the photovoltaic elements 14 and the current source 151. Accordingly, the bypass capacitor 153 can transmit a current signal transmitted through the bypass capacitor 153 from a negative electrode side in a photovoltaic string to a positive electrode side.

Abstract: An integrated wafer probe card with a light source facing a device under test (DUT) side and enabling methodology are provided.

Abstract: According to one embodiment, a semiconductor integrated circuit includes a signal supply controller to supply a signal, which allows a level of a resistance value of one of the first and second switching elements to be a predetermined level, to the elements via shared signal wire, and to set a current flowing through the higher-potential side terminal in the one of the first and second switching elements to a value which causes the level of the resistance value to be the predetermined level. In a state where the level of the resistance value of the one of the first and second switching elements is set to the predetermined level, another of the first and second switching elements is brought into a conducting state.

Abstract: A quantum interference device includes a superconducting loop interrupted by a normal conductor segment, and an interferometer connected to the normal conductor segment, wherein the superconducting loop includes a plurality of turns. The turns can be a plurality of adjacent lobes. A coil can be located within a lobe of the superconducting loop. Optionally, a bridge layer (e.g., of gold) is formed above the substrate to make an electrical contact between a superconducting layer (e.g., of niobium) formed above the bridge layer and a normal conducting layer (e.g., of titanium) formed above the bridge layer. The bridge layer allows the device to be formed of superconducting and normal conducting material that are otherwise incompatible. A titanium normal conducting layer can be allowed to oxidize over a period of years.

Abstract: A differential protection method monitors a line of an electrical energy supply network. Current signals are generated at the ends of the line using inductive current transformers, which current signals are proportional to a current flowing at the respective end. For each end, current measurement values are formed from the respective current signal using measuring devices, which current measurement values indicate a profile of the current flowing at the respective end. For each end, a respective charge value is determined from the current measurement values. The charge values of all the ends are summed to form a charge sum, and a fault signal that indicates an internal fault on the line is generated when the charge sum exceeds a charge threshold value. To perform line differential protection in the case of current transformer saturation, when transformer saturation of a current transformer is present, an estimated charge value is ascertained.

Abstract: A secondary battery system includes a secondary battery, an electric circuit, and an electronic control unit. The electronic control unit is configured to execute first calculation control, second calculation control, and estimation control when a predetermined condition is satisfied. The first calculation control is control for calculating a first impedance of the secondary battery based on a voltage value of the secondary battery at a time when a current value of the secondary battery is fluctuated on a first cycle. The second calculation control is control for calculating a second impedance of the secondary battery based on the voltage value of the secondary battery at a time when the current value of the secondary battery is fluctuated on a second cycle. The estimation control is control for estimating a reaction resistance of the secondary battery from a difference between the first impedance and the second impedance.

Abstract: An electrostatic capacitance measuring device includes: a base substrate; a first sensor having a first electrode, one or more second sensors each having a second electrode, and a circuit board mounted on the base substrate. The first sensor is provided along an edge of the base substrate. The second sensors are fixed on the base substrate. The circuit board is connected to the first sensor and the second sensors, and configured to output high frequency signals to the first electrode and the one or more second electrodes and obtain a first measurement value indicating an electrostatic capacitance from a voltage amplitude at the first electrode and one or more second measurement values indicating electrostatic capacitances obtained from voltage amplitudes at the one or more second electrodes. The measuring device has one or more reference surfaces fixed on the measuring device and facing the one or more second electrodes.

Abstract: A method for detecting an electrically conductive target in soil using a metal detector including the steps of: generating a transmit magnetic field for transmission into the soil based on the transmit signal; receiving a receive magnetic field; providing a receive signal induced by the receive magnetic field; determining a noise in the receive signal or a signal to noise ratio of the receive signal; and estimating, based on either the noise in the receive signal, or the signal to noise ratio of the received signal, or both, at least one effective detection depth of one or more types of electrically conductive targets in the soil.

Abstract: The present application provides devices, systems and methods for detecting the presence and/or length of an analyte. More specifically, the present application is directed to a structure and system that includes a micro-capacitive sensor array for detecting the presence of an analyte in a sample and determining the length and/or composition of an analyte, such as a nucleic acid, as well as methods for using the same.

Abstract: A casing has a plurality of joints of pipe joined by a plurality of casing collars, and an outer surface. A high-frequency alternating current (AC) source electrically is coupled to the casing. A coating of insulating material covers the entire outer surface of the casing. The coating has an opening that exposes a casing portion. The casing and the coating of insulating material define a capacitive electrode having an impedance Zf with a magnitude |Zf| at the frequency of operation f of the high-frequency AC source. Zf is low enough to allow current from the high-frequency AC source to be injected from the casing through the coating of insulating material into a surrounding formation. The casing portion has a resistance R to direct current (DC) with a magnitude that is very large compared to |Zf|.

Abstract: A sensor apparatus for a magnetic bearing apparatus includes a motion sensor and a sensor ring which has the shape of a hollow cylinder and is intended to be connected to a shaft of an electrical rotating machine in a force-fitting manner, wherein the motion sensor is separated from the sensor ring by an air gap. In order to achieve a greater degree of reliability at high rotation speeds and ratings in comparison to the prior art, the sensor ring has a carrier ring composed of a first material and a sensor target composed of a second material.

Abstract: A shoe degradation sensor assembly includes a first sensor disposed in or proximate to a material layer of a shoe between a foot space and an outer surface of the shoe, and an electrical contact assembly operable to removably electrically connect the shoe degradation sensor assembly to a reader. The material layer changes in at least one physical property with degradation to the shoe, and the first sensor is configured to indicate the changing physical property of the material layer thereby indicating a degree of degradation to the shoe.

Abstract: Examples herein describe techniques for testing a receiver interface on a die. In one embodiment, the die includes tester circuitry which includes a digital to analog convertor (DAC) which outputs an analog test signal to a selector circuit (e.g., a multiplexer) which forwards the analog test signal to a receiver. By varying the analog test signal, the tester circuitry can identify one or more trip points corresponding to the receiver. That is, by monitoring the output of the receiver, a testing application can determine when the output of the receiver switches states thereby indicating that the analog test signal at the input of the receiver corresponds to the trip point of the receiver. In this manner, internal circuitry (e.g., the tester circuitry) can be used to test a receiver interface that may otherwise be inaccessible.