Abstract: A hub based computer system having a central hub that communicates with a plurality of satellite devices over respective link buses. Each link bus is substantially the same and adheres to a predefined link bus protocol. The satellite devices are also connected to industry standard buses/devices. The central hub also communicates with a processor and system memory over additional buses. Each link bus includes a status line that allows each device connected to the same link bus to request control of the bus. The link bus protocol establishes a window in which the status signal may convey arbitration request information in a time-multiplexed manner. The protocol further includes a method of determining whether control of the bus can be transferred to a different device. Each device takes part in the decision process and thus, the arbitration method of the invention is decentralized.

Abstract: A method and system for partial scan testing of integrated circuits is disclosed. The invention includes determining at least one failed functional block during testing of the integrated circuit. The failed functional block is then logically isolated from the remaining non-failing functional blocks. Scan testing of the remainder of the non-failing functional blocks then occurs to determine the integrity of the remainder of the integrated circuit. The data coming out of the failing functional block is not allowed into the other functional blocks as input data. The invention allows the integrated circuit to be used and sold at a reduced functionality for applications not requiring the failed functional block(s).

Abstract: A hub based computer system having a central hub that communicates with a plurality of satellite devices over respective link buses. Each link bus is substantially the same and adheres to a predefined link bus protocol. The link bus protocol establishes a method in which data receiving circuitry of a target device can be put into a known state during a final stage of a source strobe event such as e.g., a data transfer. Once in the known state, the source strobes are stopped on the link bus. The target device uses internal logic clocked by a system clock rather than the source strobe to continuously sample the state of the receiving circuitry to see if the state has deviated from the known state. A change detect circuit determines if the receiving circuitry has deviated from the known state and if so, detects a new source strobe event. The change detect circuit detects the new event in the less stringent clock domain, which allows greater control of the skew and asymmetry of the source strobe.

Abstract: A method and system for partial scan testing of integrated circuits is disclosed. The invention includes determining at least one failed functional block during testing of the integrated circuit. The failed functional block is then logically isolated from the remaining non-failing functional blocks. Scan testing of the remainder of the non-failing functional blocks then occurs to determine the integrity of the remainder of the integrated circuit. The data coming out of the failing functional block is not allowed into the other functional blocks as input data. The invention allows the integrated circuit to be used and sold at a reduced functionality for applications not requiring the failed functional block(s).

Abstract: A hub based computer system having a central hub that communicates with a plurality of satellite devices over respective link buses. Each link bus is substantially the same and adheres to a predefined link bus protocol. The satellite devices are also connected to industry standard buses/devices. All components within the system are capable of communicating with each other through the hub. Each link bus includes a status line that allows each device connected to the same link bus to accept, deny, or delay a data transfer on the link bus. If accepted, the same status line can be used by the transferor and target of a data transfer, if necessary, to stall or pace the transfer as needed. The link bus protocol establishes a window in which the status line may convey data transfer disconnecting or pacing status information. The protocol further includes a method of retrying or aborting transfers based on the disconnecting status information.

Abstract: A method for expanding the number of configuration registers available in a computer system. Unused configuration registers that correspond to non-existent functions are used for other purposes. Memory is configured to allow enumeration software to conclude that the non-existent functions do not in fact exist.

Abstract: A hub based computer system having a central hub that communicates with a plurality of satellite devices over respective link buses. Each link bus is substantially the same and adheres to a predefined link bus protocol. The satellite devices are also connected to industry standard buses/devices and the central hub also communicates with a processor cluster and system memory over respective processor and memory buses. Thus, all components within the system are capable of communicating with each other through the hub. By communicating over the link buses via the link bus protocol, satellite devices can report events to other devices without dedicated wiring/pins between the devices as is currently performed in the prior art. In addition, the flushing of data buffers is governed by the protocol such that only targeted data buffers are flushed, which improves overall system performance.

Abstract: A method is provided in which repeater cells are automatically inserted within a sub-micron design before the physical design of the die has been started. The method automatically inserts a predetermined number of repeater cells within the interconnect lines that couple functional blocks on a semiconductor die. In a preferred embodiment, the repeater cell insertion is carried out during the logical design stage by adding a series of commands within a commercially available synthesis tool. A placement tool optimizes the physical placement of the repeater cells within the die.

Abstract: A hub based computer system having a central hub that communicates with a plurality of satellite devices over respective link buses. Each link bus is substantially the same and adheres to a predefined link bus protocol. The link bus protocol establishes a method in which data receiving circuitry of a target device can be put into a known state during a final stage of a source strobe event such as e.g., a data transfer. Once in the known state, the source strobes are stopped on the link bus. The target device uses internal logic clocked by a system clock rather than the source strobe to continuously sample the state of the receiving circuitry to see if the state has deviated from the known state. A change detect circuit determines if the receiving circuitry has deviated from the known state and if so, detects a new source strobe event. The change detect circuit detects the new event in the less stringent clock domain, which allows greater control of the skew and asymmetry of the source strobe.

Abstract: A method and system for partial scan testing of integrated circuits is disclosed. The invention includes determining at least one failed functional block during testing of the integrated circuit. The failed functional block is then logically isolated from the remaining non-failing functional blocks. Scan testing of the remainder of the non-failing functional blocks then occurs to determine the integrity of the remainder of the integrated circuit. The data coming out of the failing functional block is not allowed into the other functional blocks as input data. The invention allows the integrated circuit to be used and sold at a reduced functionality for applications not requiring the failed functional block(s).

Abstract: A hub based computer system having a central hub that communicates with a plurality of satellite devices over respective link buses. Each link bus is substantially the same and adheres to a predefined link bus protocol. The link bus protocol establishes a method in which data receiving circuitry of a target device can be put into a known state during a final stage of a source strobe event such as e.g., a data transfer. Once in the known state, the source strobes are stopped on the link bus. The target device uses internal logic clocked by a system clock rather than the source strobe to continuously sample the state of the receiving circuitry to see if the state has deviated from the known state. A change detect circuit determines if the receiving circuitry has deviated from the known state and if so, detects a new source strobe event. The change detect circuit detects the new event in the less stringent clock domain, which allows greater control of the skew and asymmetry of the source strobe.

Abstract: A method is provided in which repeater cells are automatically inserted within a sub-micron design before the physical design of the die has been started. The method automatically inserts a predetermined number of repeater cells within the interconnect lines that couple functional blocks on a semiconductor die. In a preferred embodiment, the repeater cell insertion is carried out during the logical design stage by adding a series of commands within a commercially available synthesis tool. A placement tool optimizes the physical placement of the repeater cells within the die.

Abstract: A system for implementing a graphics address remapping table as a virtual register in system memory. The remappinig table includes virtual registers that each store a target index that references a block of the system memory that stores graphics data using an indirect addressing scheme that enables the individual virtual registers of the remapping table to be accessed in response to a transaction request. Accessing a selected virtual register indirectly requested by the transaction request enables the access to the graphics data pointed to by the selected virtual register.

Abstract: A method of configuring a computer system having a processor coupled by a host bus to first and second bus devices causes the processor to transmit on the host bus one or more configuration write commands that include configuration data representing a range of addresses assigned to the second bus device. The configuration data is stored on the first and second bus devices. The processor transmits on the host bus a transaction request directed to an address within a range of addresses assigned to the second bus device. The first bus device determines that it should not transmit a response to the transaction request based on the configuration data stored in the first bus device. The first bus device may include a set of configuration registers for storing configuration data regarding the first bus device and a set of shadow configuration registers for storing configuration data regarding the second bus device.

Abstract: A method is provided in which repeater cells are automatically inserted within a sub-micron design before the physical design of the die has been started. The method automatically inserts a predetermined number of repeater cells within the interconnect lines that couple functional blocks on a semiconductor die. In a preferred embodiment, the repeater cell insertion is carried out during the logical design stage by adding a series of commands within a commercially available synthesis tool. A placement tool optimizes the physical placement of the repeater cells within the die.

Abstract: A method of configuring a computer system having a processor coupled by a host bus to first and second bus devices causes the processor to transmit on the host bus one or more configuration write commands that include configuration data representing a range of addresses assigned to the second bus device. The configuration data is stored on the first and second bus devices. The processor transmits on the host bus a transaction request directed to an address within a range of addresses assigned to the second bus device. The first bus device determines that it should not transmit a response to the transaction request based on the configuration data stored in the first bus device. The first bus device may include a set of configuration registers for storing configuration data regarding the first bus device and a set of shadow configuration registers for storing configuration data regarding the second bus device.

Abstract: A method and system for partial scan testing of integrated circuits is disclosed. The invention includes determining at least one failed functional block during testing of the integrated circuit. The failed functional block is then logically isolated from the remaining non-failing functional blocks. Scan testing of the remainder of the non-failing functional blocks then occurs to determine the integrity of the remainder of the integrated circuit. The data coming out of the failing functional block is not allowed into the other functional blocks as input data. The invention allows the integrated circuit to be used and sold at a reduced functionality for applications not requiring the failed functional block(s).

Abstract: A method and system for partial scan testing of integrated circuits is disclosed. The invention includes determining at least one failed functional block during testing of the integrated circuit. The failed functional block is then logically isolated from the remaining non-failing functional blocks. Scan testing of the remainder of the non-failing functional blocks then occurs to determine the integrity of the remainder of the integrated circuit. The data coming out of the failing functional block is not allowed into the other functional blocks as input data. The invention allows the integrated circuit to be used and sold at a reduced functionality for applications not requiring the failed functional block(s).

Abstract: A method and system for partial scan testing of integrated circuits is disclosed. The invention includes determining at least one failed functional block during testing of the integrated circuit. The failed functional block is then logically isolated from the remaining non-failing functional blocks. Scan testing of the remainder of the non-failing functional blocks then occurs to determine the integrity of the remainder of the integrated circuit. The data coming out of the failing functional block is not allowed into the other functional blocks as input data. The invention allows the integrated circuit to be used and sold at a reduced functionality for applications not requiring the failed functional block(s).

Abstract: A method and system for partial scan testing of integrated circuits is disclosed. The invention includes determining at least one failed functional block during testing of the integrated circuit. The failed functional block is then logically isolated from the remaining non-failing functional blocks. Scan testing of the remainder of the non-failing functional blocks then occurs to determine the integrity of the remainder of the integrated circuit. The data coming out of the failing functional block is not allowed into the other functional blocks as input data. The invention allows the integrated circuit to be used and sold at a reduced functionality for applications not requiring the failed functional block(s).