Abstract: Multi-step ADCs performs multi-step conversion by generating a residue for a subsequent stage to digitize. To generate a residue, a stage in the multi-step ADC would reconstruct the input signal to the stage using a feedforward digital to analog converter (DAC). Non-linearities in the DAC can directly affect the overall performance of the multi-step ADC. To reduce power consumption and complexity of analog circuit design, digital background calibration schemes are implemented to address the non-linearities. The non-linearities that the calibration schemes address can include reference, DAC, and quantization non-linearities.

Abstract: One embodiment is an apparatus including a detector circuit electrically coupled between a signal source and a second circuit, the signal source generating a first signal, the detector circuit detecting a level of the first signal and generating a first control signal when the detected level of the first signal exceeds a first threshold value, and a clamping switch electrically coupled to receive the first control signal from the detector circuit, the clamping switch including a multi-terminal active device. The first control signal controls a state of the clamping switch such that the clamping switch clamps a level of a signal applied to the second circuit when the level of the first signal exceeds the first threshold value.

Abstract: Background calibration techniques can effectively to correct for memory, kick-back, and order-dependent errors in interleaved switched-capacitor track-and-hold (T/H) circuits and amplifiers. The techniques calibrate for errors in both the track/sample phase and the hold-phase, and account for the effects of interleaving, buffer/amplifier sharing, incomplete resetting, incomplete settling, chopping, and randomization on the offset, gain, memory, and kick-back errors. Moreover, the techniques can account for order-dependent and state-dependent hold-phase non-linearities. By correcting for these errors, the proposed techniques improve the noise performance, linearity, gain/offset matching, frequency response (and bandwidth), and order-dependence errors. The techniques also help increase the speed (sample rate and bandwidth) and linearity of T/H circuits and amplifiers while simplifying the analog circuitry and clocking needed.

Abstract: Amplifiers can be found in pipelined ADCs and pipelined-SAR ADCs as inter-stage amplifiers. The amplifiers can in some cases implement and provide gains in high speed track and hold circuits. The amplifier structures can be open-loop amplifiers, and the amplifier structures can be used in MDACs and samplers of high speed ADCs. The amplifiers can be employed without resetting, and with incomplete settling, to maximize their speed and minimize their power consumption. The amplifiers can be calibrated to improve performance.

Abstract: Random chopping is an effective technique for data converters. Random chopping can calibrate offset errors, calibrate offset mismatch in interleaved ADCs, and dither even order harmonics. However, the non-idealities of the (analog) chopper circuit can limit its effectiveness. If left uncorrected, these non-idealities cause severe degradation in the noise floor that defeats the purpose of chopping, and the non-idealities may be substantially worse than the non-idealities that chopping is meant to fix. To address the non-idealities of the random chopper, calibration techniques can be applied, using correlators and calibrations that may already be present for the data converter. Therefore, the cost and digital overhead are negligible. Calibrating the chopper circuit can make the chopping more effective, while relaxing the design constraints imposed on the analog circuitry.

Abstract: One embodiment is an apparatus including a detector circuit electrically coupled between a signal source and a second circuit, the signal source generating a first signal, the detector circuit detecting a level of the first signal and generating a first control signal when the detected level of the first signal exceeds a first threshold value, and a clamping switch electrically coupled to receive the first control signal from the detector circuit, the clamping switch including a multi-terminal active device. The first control signal controls a state of the clamping switch such that the clamping switch clamps a level of a signal applied to the second circuit when the level of the first signal exceeds the first threshold value.

Abstract: Analog circuits are often non-linear, and the non-linearities can hurt performance. Designers would trade off power consumption to achieve better linearity. An efficient and effective calibration technique can address the non-linearities and reduce the overall power consumption. A dither signal injected to the analog circuit can be used to expose the non-linear behavior in the digital domain. To detect the non-linearities, a counting approach is applied to isolate non-linearities independent of the input distribution. The approach is superior to and different from other approaches in many ways.

Abstract: A multi-input analog-to-digital converter (ADC), i.e., a single ADC, can receive multiple analog input signals and generate multiple digital outputs. To combine multiple analog input signals into a single multi-input ADC, the multi-input ADC would typically include multiple track and hold (T/H) circuits and an adder, which can consume a significant amount of power and incur large cost overhead. An improved approach is to combine multiple inputs through a unique T/H circuit in the front-end of the ADC. The multiple analog input signals can be aggregated using code sequences, without requiring a significant amount of external circuits.

Abstract: Improved track and hold (T/H) circuits can help analog-to-digital converters (ADCs) achieve higher performance and lower power consumption. The improved T/H circuits can drive high speed and interleaved ADCs, and the design of the circuits enable additive and multiplicative pseudo-random dither signals to be injected in the T/H circuits. The dither signals can be used to calibrate (e.g., linearize) the T/H circuits and the ADC(s). In addition, the dither signal can be used to dither any remaining non-linearity, and to calibrate offset/gain mismatches in interleaved ADCs. The T/H circuit design also can integrate an amplifier in the T/H circuit, which can be used to improve the signal-to-noise ratio (SNR) of the ADC or to act as a variable gain amplifier (VGA) in front of the ADC.

Abstract: Multi-step ADCs performs multi-step conversion by generating a residue for a subsequent stage to digitize. To generate a residue, a stage in the multi-step ADC would reconstruct the input signal to the stage using a feedforward digital to analog converter (DAC). Non-linearities in the DAC can directly affect the overall performance of the multi-step ADC. To reduce power consumption and complexity of analog circuit design, digital background calibration schemes are implemented to address the non-linearities. The non-linearities that the calibration schemes address can include reference, DAC, and quantization non-linearities.

Abstract: A pipeline analog-to-digital converter (ADC) converts an analog input signal over several stages, where a stage generates a residue for the subsequent stage to digitize. The residue is generated by coarsely quantizing the analog input signal to generate a digital code, which is used to reconstruct the analog input signal, and the residue is the difference between the analog input signal and the reconstructed version of the analog input signal. The coarse quantization can have errors which are attributed to comparator offsets and bandwidth mismatch. To estimate the comparator offsets while being insensitive to bandwidth mismatch, peak and trough detectors are used to track maximum and minimum values of the residue or the output of the ADC over time, and an expected value estimating the comparator offset can be computed based on the maximum and minimum values. The expected value advantageously “averages” out the bandwidth mismatch contribution to the offset.

Abstract: A pipeline analog-to-digital converter (ADC) converts an analog input signal over several stages, where a stage generates a residue for the subsequent stage to digitize. The residue is generated by coarsely quantizing the analog input signal to generate a digital code, which is used to reconstruct the analog input signal, and the residue is the difference between the analog input signal and the reconstructed version of the analog input signal. The coarse quantization can have errors which are attributed to comparator offsets and bandwidth mismatch. To estimate the comparator offsets while being insensitive to bandwidth mismatch, peak and trough detectors are used to track maximum and minimum values of the residue or the output of the ADC over time, and an expected value estimating the comparator offset can be computed based on the maximum and minimum values. The expected value advantageously “averages” out the bandwidth mismatch contribution to the offset.

Abstract: In this disclosure, new structures for high-performance voltage buffers (source followers and emitter followers) are described. The structures achieve high performance (linearity) and reduce power consumption. In addition, they are reconfigurable to optimize the performance and power consumption depending on the input frequency range.

Abstract: Circuits for generating voltage references are common in electronics. For example, these circuits are used in analog-to-digital converters, which convert an analog signal into its digital representation by comparing analog input signals against one or more voltage references provided by those circuits. In many applications, the speed and accuracy of such voltage references are very important. The speed of the voltage references is related to the physical properties of the devices in the circuit. The accuracy of the voltage reference is directly related to the circuit's ability to trim the full-scale voltage output. The present disclosure describes a fast and efficient reference buffer with a wide trim range which is particular suitable for submicron processes and high speed applications. The reference buffer comprises a plurality of diode-connected transistors, which can be selected to turn on or off using a controller to provide a wide trim range.

Abstract: A circuit may include one or more transistors connected directly to an output, and an inductance network. The inductance network may connect to a source node of at least one of the transistors, to compensate capacitance of the output. Thus, the response time of the circuit may decrease, and a non-dominant frequency response pole frequency of the circuit may increase.

Abstract: A circuit may include one or more transistors connected directly to an output, and a biasing network connected to at least one of a substrate, a well, and a back-gate of at least one of the transistors. The biasing network may bias the at least one of the substrate, the well, and the back-gate to a virtual floating bias, such that the virtual floating bias shifts in voltage level based upon an AC input signal of the circuit, to reduce the parasitic capacitance of the output node of the circuit.

Abstract: An analog-to-digital converter system that includes a pipeline of successively-cascaded signal converters, each operating alternatively in a first circuit configuration and a second circuit configuration, an error estimator coupled to the pipeline to receive the digitized error for estimating an amplifier gain of the present signal converter stage, and a code aligner/corrector that temporally aligns and corrects the digital codes received from the successively-cascaded signal converters to provide a digital out of the ADC system.

Abstract: In this disclosure, new structures for high-performance voltage buffers (source followers and emitter followers) are described. The structures achieve high performance (linearity) and reduce power consumption. In addition, they are reconfigurable to optimize the performance and power consumption depending on the input frequency range.

Abstract: Circuits for generating voltage references are common in electronics. For example, these circuits are used in analog-to-digital converters, which convert an analog signal into its digital representation by comparing analog input signals against one or more voltage references provided by those circuits. In many applications, the speed and accuracy of such voltage references are very important. The speed of the voltage references is related to the physical properties of the devices in the circuit. The accuracy of the voltage reference is directly related to the circuit's ability to trim the full-scale voltage output. The present disclosure describes a fast and efficient reference buffer with a wide trim range which is particular suitable for submicron processes and high speed applications. The reference buffer comprises a plurality of diode-connected transistors, which can be selected to turn on or off using a controller to provide a wide trim range.

Abstract: A circuit may include one or more transistors connected directly to an output, and a biasing network connected to at least one of a substrate, a well, and a back-gate of at least one of the transistors. The biasing network may biase the at least one of the substrate, the well, and the back-gate to a virtual floating bias, such that the virtual floating bias shifts in voltage level based upon an AC input signal of the circuit, to reduce the parasitic capacitance of the output node of the circuit.