Patents by Inventor Alexander H. Slocum

Alexander H. Slocum has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7671614
    Abstract: Probes of a probe card assembly can be adjusted with respect to an element of the probe card assembly, which can be an element of the probe card assembly that facilitates mounting of the probe card assembly to a test apparatus. The probe card assembly can then be mounted in a test apparatus, and an orientation of the probe card assembly can be adjusted with respect to the test apparatus, such as a structural part of the test apparatus or a structural element attached to the test apparatus.
    Type: Grant
    Filed: December 2, 2005
    Date of Patent: March 2, 2010
    Assignee: FormFactor, Inc.
    Inventors: Benjamin N. Eldridge, Eric D. Hobbs, Gaetan L. Mathieu, Makarand S. Shinde, Alexander H. Slocum
  • Publication number: 20100000080
    Abstract: A probe card assembly can include a probe head assembly having probes for contacting an electronic device to be tested. The probe head assembly can be electrically connected to a wiring substrate and mechanically attached to a stiffener plate. The wiring substrate can provide electrical connections to a testing apparatus, and the stiffener plate can provide structure for attaching the probe card assembly to the testing apparatus. The stiffener plate can have a greater mechanical strength than the wiring substrate and can be less susceptible to thermally induced movement than the wiring substrate. The wiring substrate may be attached to the stiffener plate at a central location of the wiring substrate. Space may be provided at other locations where the wiring substrate is attached to the stiffener plate so that the wiring substrate can expand and contract with respect to the stiffener plate.
    Type: Application
    Filed: June 3, 2009
    Publication date: January 7, 2010
    Inventors: Benjamin N. Eldridge, Gary W. Grube, Eric D. Hobbs, Gaetan L. Mathieu, Makarand S. Shinde, Alexander H. Slocum, A. Nicholas Sporck, Thomas N. Watson
  • Publication number: 20090315557
    Abstract: A system and method for determining the temporal resolution of a tomographic imaging device uses an apparatus to drive one or more dynamic phantoms composed of multiple materials. The apparatus is placed at or near the isocenter of the imaging device and the one or more phantoms are moved to produce a plurality of dynamic features, each having a specified frequency. The dynamic features are imaged with the device and the acquired image data corresponding to the dynamic features is analyzed to determine a temporal modulation transfer value at each of the known specified frequencies. The temporal resolution of the imaging device is determined using these temporal modulation transfer values.
    Type: Application
    Filed: September 8, 2008
    Publication date: December 24, 2009
    Inventors: Alexander H. Slocum, JR., Rajiv Gupta, Stephen E. Jones, Alexander H. Slocum, SR.
  • Patent number: 7622935
    Abstract: A probe card assembly can comprise a probe head assembly and a wiring substrate. The probe head assembly can comprise a plurality of probes disposed to contact an electronic device disposed on a holder in a test housing. The wiring substrate can include an electrical interface to a test controller and a plurality of electrical wiring composing electrical paths between the electrical interface and ones of the probes, and the wiring substrate can comprise a first portion on which the electrical interface is disposed and a second portion composing the probe head assembly. The second portion of the wiring substrate can be moveable with respect to the first portion of the wiring substrate.
    Type: Grant
    Filed: October 20, 2006
    Date of Patent: November 24, 2009
    Assignee: FormFactor, Inc.
    Inventors: Eric D. Hobbs, Alexander H. Slocum, Benjamin N. Eldridge, Keith J. Breinlinger, Shawn Powell
  • Patent number: 7592821
    Abstract: A probe card assembly can include a probe head assembly having probes for contacting an electronic device to be tested. The probe head assembly can be electrically connected to a wiring substrate and mechanically attached to a stiffener plate. The wiring substrate can provide electrical connections to a testing apparatus, and the stiffener plate can provide structure for attaching the probe card assembly to the testing apparatus. The stiffener plate can have a greater mechanical strength than the wiring substrate and can be less susceptible to thermally induced movement than the wiring substrate. The wiring substrate may be attached to the stiffener plate at a central location of the wiring substrate. Space may be provided at other locations where the wiring substrate is attached to the stiffener plate so that the wiring substrate can expand and contract with respect to the stiffener plate.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: September 22, 2009
    Assignee: FormFactor, Inc.
    Inventors: Benjamin N. Eldridge, Gary W. Grube, Eric D. Hobbs, Gaetan L. Mathieu, Makarand S. Shinde, Alexander H. Slocum, A. Nicholas Sporck, Thomas N. Watson
  • Publication number: 20090230962
    Abstract: An instrument and method using electron spin resonance spectrometry for measuring the concentration of airborne soot particles, and the like, that includes continuously passing a sample of exhaust gas through a resonating RF microwave cavity resonator during the application therethrough of a uniform slowly varying uniform magnetic field that is rapidly modulated and measuring the resulting phase modulation or amplitude modulation thereof to derive an electron spin resonance signal that directly senses the concentration of carbon free radicals produced as a result of inefficient combustion of hydrocarbons during operation of the vehicle or boiler. A further invention is the use of this signal for feedback control of the engine or boiler operating parameters to minimize or substantially eliminate particulate matter emissions.
    Type: Application
    Filed: May 6, 2009
    Publication date: September 17, 2009
    Inventors: James Robert White, Christopher John White, Colin T. Elliott, Alexander H. Slocum
  • Publication number: 20090158586
    Abstract: A probe card assembly comprises multiple probe substrates attached to a mounting assembly. Each probe substrate includes a set of probes, and together, the sets of probes on each probe substrate compose an array of probes for contacting a device to be tested. Adjustment mechanisms are configured to impart forces to each probe substrate to move individually each substrate with respect to the mounting assembly. The adjustment mechanisms may translate each probe substrate in an “x,” “y,” and/or “z” direction and may further rotate each probe substrate about any one or more of the forgoing directions. The adjustment mechanisms may further change a shape of one or more of the probe substrates. The probes can thus be aligned and/or planarized with respect to contacts on the device to be tested.
    Type: Application
    Filed: December 23, 2008
    Publication date: June 25, 2009
    Inventors: Eric D. Hobbs, Benjamin N. Eldridge, Lunyu Ma, Gaetan L. Mathieu, Steven T. Murphy, Makarand S. Shinde, Alexander H. Slocum
  • Publication number: 20090066352
    Abstract: Columns comprising a plurality of vertically aligned carbon nanotubes can be configured as electromechanical contact structures or probes. The columns can be grown on a sacrificial substrate and transferred to a product substrate, or the columns can be grown on the product substrate. The columns can be treated to enhance mechanical properties such as stiffness, electrical properties such as electrical conductivity, and/or physical contact characteristics. The columns can be mechanically tuned to have predetermined spring properties. The columns can be used as electromechanical probes, for example, to contact and test electronic devices such as semiconductor dies, and the columns can make unique marks on terminals of the electronic devices.
    Type: Application
    Filed: October 13, 2007
    Publication date: March 12, 2009
    Applicant: FormFactor, Inc.
    Inventors: John K. Gritters, Rodney Ivan Martens, Onnik Yaglioglu, Benjamin N. Eldridge, Alexander H. Slocum
  • Publication number: 20090014296
    Abstract: Micro-electromechanical (MEMS) contact configuration is disclosed, comprising a static contact with at least one contact surface and a movable contact with at least one corresponding contact surface. Particularly flat contact surfaces and correspondingly low contact resistance can be achieved, if at least one contact surface plane is formed by a crystal plane of the wafer. Furthermore a method for manufacturing such a contact configuration is proposed, wherein the contact surfaces are obtained by wet anisotropic etching of a silicon wafer, if need be preceded by appropriate masking to expose the to be edged regions only, if need be followed by coating with an electrically conductive layer, e.g., a metal layer.
    Type: Application
    Filed: May 28, 2008
    Publication date: January 15, 2009
    Applicant: ABB Research Ltd.
    Inventors: Alexis Christian Weber, Alexander H. Slocum, Jeffrey Lang, Sami Kotilainen, Jian Li
  • Patent number: 7471094
    Abstract: A probe card assembly comprises multiple probe substrates attached to a mounting assembly. Each probe substrate includes a set of probes, and together, the sets of probes on each probe substrate compose an array of probes for contacting a device to be tested. Adjustment mechanisms are configured to impart forces to each probe substrate to move individually each substrate with respect to the mounting assembly. The adjustment mechanisms may translate each probe substrate in an “x,” “y,” and/or “z” direction and may further rotate each probe substrate about any one or more of the forgoing directions. The adjustment mechanisms may further change a shape of one or more of the probe substrates. The probes can thus be aligned and/or planarized with respect to contacts on the device to be tested.
    Type: Grant
    Filed: June 24, 2005
    Date of Patent: December 30, 2008
    Assignee: FormFactor, Inc.
    Inventors: Eric D. Hobbs, Benjamin N. Eldridge, Lunyu Ma, Gaetan L. Mathieu, Steven T. Murphy, Makarand S. Shinde, Alexander H. Slocum
  • Publication number: 20080300507
    Abstract: A biopsy needle includes tissue capture elements within the needle lumen to help hold a tissue sample within the needle and maintain its integrity. According to one aspect, several flexible members form a structure that allows tissue to enter the lumen during advancement of the needle into tissue, and prevents the tissue sample from exiting the needle during retraction of the needle. The flexible members may, in some embodiments, include cutting edges configured to cut the tissue sample from the target tissue mass at the start of needle extraction.
    Type: Application
    Filed: January 30, 2006
    Publication date: December 4, 2008
    Applicant: The General Hospital Corporation
    Inventors: Stacy Figueredo, William J. Fienup, Barry Kudrowitz, Jacob A. Wronski, Alexander H. Slocum, William R. Brugge
  • Publication number: 20080224491
    Abstract: A gripper for use with a robot includes a support body for removably attaching the gripper to a moveable arm and a workpiece contact body having a groove extending along at least a portion of the contact body for engaging a curved outer edge of the workpiece. A coupling member connects the support body to the workpiece contact member and includes a flexure component that flexes to allow radial and/or tangential relative movement of the workpiece contact body with respect to the support body to diminish slippage between the workpiece and the contact body as the gripper engages the workpiece.
    Type: Application
    Filed: March 16, 2007
    Publication date: September 18, 2008
    Applicant: Axcelis Technologies, Inc.
    Inventors: Joseph Gillespie, Alexander H. Slocum, Allan Weed
  • Publication number: 20080203268
    Abstract: A probe card assembly can comprise a support structure to which a plurality of probes can be directly or indirectly attached. The probes can be disposed to contact an electronic device to be tested. The probe card assembly can further comprise actuators, which can be configured to change selectively an attitude of the support structure with respect to a reference structure. The probe card assembly can also comprise a plurality of lockable compliant structures. While unlocked, the lockable compliant structures can allow the support structure to move with respect to the reference structure. While locked, however, the compliant structures can provide mechanical resistance to movement of the support structure with respect to the reference structure.
    Type: Application
    Filed: May 6, 2008
    Publication date: August 28, 2008
    Inventors: Eric D. Hobbs, Christopher D. McCoy, James M. Porter, Alexander H. Slocum
  • Publication number: 20080196779
    Abstract: A flow control valve, comprising a flow controlling valve configured to deflect from a generally planar posture to an increasingly nonplanar posture responsive to a relative increase in pressure difference and flow across the valve element; and a support element including a support structure supporting the valve element in its undeflected state; at least a first contact surface recessed from the support structure and configured to engage the valve element only when the valve element is deflected; and a flow passage wherein an effective flow-through volume through the at least one opening and the flow passage decreases as deflection of the valve element increases.
    Type: Application
    Filed: April 30, 2008
    Publication date: August 21, 2008
    Applicants: FORD GLOBAL TECHNOLOGIES, LLC, MASSACHUSETTS INSTITUTE OF TECHNOLOGY
    Inventors: David C. Freeman, Alexander H. Slocum, Daniel Kabat
  • Patent number: 7370645
    Abstract: A flow control valve is provided. According to one aspect of this disclosure, the flow control valve includes a valve element and a support element. The valve element is configured to deflect responsive to a change in pressure difference across the valve element. The support element cooperates with the valve element to present an effective flow-through area that changes as the valve element deflects. The amount of relative engagement between the valve element and the support element changes as the valve element deflects. External vibration causes the valve element to vibrate to reduce stiction or ice buildup.
    Type: Grant
    Filed: May 24, 2005
    Date of Patent: May 13, 2008
    Assignee: Ford Global Technologies, LLC
    Inventors: David C. Freeman, Alexander H. Slocum, Daniel Kabat
  • Patent number: 7368930
    Abstract: A probe card assembly can comprise a support structure to which a plurality of probes can be directly or indirectly attached. The probes can be disposed to contact an electronic device to be tested. The probe card assembly can further comprise actuators, which can be configured to change selectively an attitude of the support structure with respect to a reference structure. The probe card assembly can also comprise a plurality of lockable compliant structures. While unlocked, the lockable compliant structures can allow the support structure to move with respect to the reference structure. While locked, however, the compliant structures can provide mechanical resistance to movement of the support structure with respect to the reference structure.
    Type: Grant
    Filed: August 15, 2006
    Date of Patent: May 6, 2008
    Assignee: FormFactor, Inc.
    Inventors: Eric D. Hobbs, Christopher D. McCoy, James M. Porter, Jr., Alexander H. Slocum
  • Publication number: 20080036480
    Abstract: A probe card assembly can comprise a support structure to which a plurality of probes can be directly or indirectly attached. The probes can be disposed to contact an electronic device to be tested. The probe card assembly can further comprise actuators, which can be configured to change selectively an attitude of the support structure with respect to a reference structure. The probe card assembly can also comprise a plurality of lockable compliant structures. While unlocked, the lockable compliant structures can allow the support structure to move with respect to the reference structure. While locked, however, the compliant structures can provide mechanical resistance to movement of the support structure with respect to the reference structure.
    Type: Application
    Filed: August 15, 2006
    Publication date: February 14, 2008
    Inventors: Eric D. Hobbs, Christopher D. McCoy, James M. Porter, Alexander H. Slocum
  • Publication number: 20070286537
    Abstract: A compact surface self-compensated hydrostatic bearing includes a rotor assembly including a rotor plate having upper and lower fluid restricting faces, a rotor top and bottom, each having bearing surfaces angled with respect to an axis of rotation of the rotor assembly; a stator assembly including a stator top and a stator bottom housing the rotor assembly therebetween, the stator top and bottom having bearing surfaces facing and spaced apart from the rotor top and bottom bearing surfaces forming upper and lower bearing gaps, respectively, therebetween; the stator top and bottom including a lower and an upper fluid restricting surface, respectively, facing and spaced apart from the rotor upper and rotor lower fluid restricting faces, respectively, forming upper and lower restricting gaps, respectively, therebetween; and a fluid supply system configured to supply pressurized fluid to the bearing gaps and into the upper and lower fluid restricting gaps.
    Type: Application
    Filed: June 13, 2007
    Publication date: December 13, 2007
    Inventors: Nathan R. Kane, Joachim Sihler, Alexander H. Slocum, Mark Walter
  • Patent number: 7285968
    Abstract: A probe card assembly can include a probe head assembly having probes for contacting an electronic device to be tested. The probe head assembly can be electrically connected to a wiring substrate and mechanically attached to a stiffener plate. The wiring substrate can provide electrical connections to a testing apparatus, and the stiffener plate can provide structure for attaching the probe card assembly to the testing apparatus. The stiffener plate can have a greater mechanical strength than the wiring substrate and can be less susceptible to thermally induced movement than the wiring substrate. The wiring substrate may be attached to the stiffener plate at a central location of the wiring substrate. Space may be provided at other locations where the wiring substrate is attached to the stiffener plate so that the wiring substrate can expand and contract with respect to the stiffener plate.
    Type: Grant
    Filed: December 30, 2005
    Date of Patent: October 23, 2007
    Assignee: FormFactor, Inc.
    Inventors: Benjamin N. Eldridge, Gary W. Grube, Eric D. Hobbs, Gaetan L. Mathieu, Makarand S. Shinde, Alexander H. Slocum, A. Nicholas Sporck, Thomas N. Watson
  • Patent number: 7040949
    Abstract: A structural connection device to be used primarily as a toy in conjunction with foam tubes, popularly known as “noodles” which are commonly used at swimming pools, wherein the connector is preferably made from foam and is configured as a longitudinal flexible member with a pattern of holes, each of which is slightly smaller than the diameter of a typical noodle, such that a noodle can be press-fit into a connector strip hole to act as a structural node; and because the connector may be made from foam, particularly for toy use, it can be bent and twisted, therefore enabling one simple element to act as a complex-shaped node into which many noodles can be inserted and used in conjunction with other connectors to build complex structures.
    Type: Grant
    Filed: August 2, 2004
    Date of Patent: May 9, 2006
    Assignee: AESOP, Inc.
    Inventor: Alexander H. Slocum