Patents by Inventor Andrew P. Washabaugh

Andrew P. Washabaugh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7518360
    Abstract: Combined wound and micro-fabricated winding constructs are described for the inspection of materials and the detection and characterization of hidden features or flaws. These constructs can be configured as sensors or sensor arrays that are surface mounted or scanned over conducting and/or magnetizable test materials. The well-defined geometry obtained micro-fabricated windings and from carefully wound coils with known winding positions permits the use of model based inversions of sensed responses into material properties. In a preferred embodiment, the primary winding is a wound coil and the sense elements are etched or printed. The drive or sense windings can also be mounted under fasteners to improve sensitivity to hidden flaws. Ferrites and other means may be used to guide the magnetic flux and enhance the magnetic field in the test material.
    Type: Grant
    Filed: June 1, 2007
    Date of Patent: April 14, 2009
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh, Ian C. Shav, Mark D. Windoloski, Christopher Root, Vladimir A. Zilberstein, David C. Grundy, Vladimir Tsukernik
  • Publication number: 20090001974
    Abstract: An apparatus for the nondestructive measurement of materials that includes at least two layers of electrical conductors. Within each layer, a meandering primary winding is used to create a magnetic field for interrogating a test material while sense elements or conducting loops within each meander provide a directional measurement of the test material condition. In successive layers extended portions of the meanders are rotated so that the sense elements provide material condition in different orientations without requiring movement of the test circuit or apparatus. In a bidirectional implementation the angle is 90° while in a quadridirectional implementation the relative angles are ?45, 0, 45, and 90°. Multidirectional permeability measurements are used to assess the stress or torque on a component. These measurements are combined in a manner that removes temperature effects and hysteresis on the property measurements.
    Type: Application
    Filed: June 12, 2008
    Publication date: January 1, 2009
    Applicant: JENTEK Sensors, Inc.
    Inventors: Yanko K. Sheiretov, Neil J. Goldfine, Todd M. Dunford, Scott A. Denenberg, David C. Grundy, Darrell E. Schlicker, Andrew P. Washabaugh, Karen E. Walrath
  • Patent number: 7467057
    Abstract: Precomputed databases of sensor responses are used to convert measurement data into properties of interest, for example, conductivity or lift-off. These databases of responses may be generated prior to data acquisition and provide sensor response values that span appropriate ranges for the property values. After data acquisition, estimates for the property values are obtained from measurement values by minimizing the difference between the database of responses and the measurement values. The minimization can take the form of a least-squares minimization. Alternatively, iterative techniques can be used to minimize the difference between the database and measurement values.
    Type: Grant
    Filed: September 15, 2005
    Date of Patent: December 16, 2008
    Assignee: JENTEK Sensors, Inc.
    Inventors: Yanko Konstantinov Sheiretov, Neil J. Goldfine, Andrew P. Washabaugh, Darrell E. Schlicker
  • Patent number: 7451657
    Abstract: Methods are described for assessing material condition. These methods include the use of multiple source fields for interrogating and loading of a multicomponent test material. Source fields include electric, magnetic, thermal, and acoustic fields. The loading field preferentially changes the material properties of a component of the test material, which allows the properties of the component materials to be separated. Methods are also described for monitoring changes in material state using separate drive and sense electrodes with some of the electrodes positioned on a hidden or even embedded material surface. Statistical characterization of the material condition is performed with sensor arrays that provide multiple responses for the material condition during loading. The responses can be combined into a statistical population that permits tracking with respect to loading history.
    Type: Grant
    Filed: January 14, 2005
    Date of Patent: November 18, 2008
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Vladimir A. Zilberstein, Andrew P. Washabaugh, Volker Weiss, Christopher A. Craven, Ian C. Shay, David C. Grundy, Karen E. Walrath, Robert J. Lyons
  • Patent number: 7451639
    Abstract: A set of curved components, such as the dovetail region of engine blades, are inspected by mounting each component into a circular carousel in a vertical orientation and rotating the carousel to move each component toward and away from an inspection site. The inspection site clamps a flexible eddy current sensor array to the curved material surface, scans the array over the surface, records the sensor position. A rigid element having a surface geometry similar to the surface shape of the component can be attached to the component to facilitate scanning of the sensor array over a component edge. The response of each sense element in the array may be converted into an effective material property and sense element proximity to the component material surface to verify the quality of the inspection scan and the presence of a defect such as a crack.
    Type: Grant
    Filed: March 7, 2007
    Date of Patent: November 18, 2008
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J Goldfine, Mark D Windoloski, Vladimir B Tsukernik, Darrell E Schlicker, Todd M Dunford, Andrew P. Washabaugh
  • Publication number: 20080258720
    Abstract: Combined wound and micro-fabricated winding constructs are described for the inspection of materials and the detection and characterization of hidden features or flaws. These constructs can be configured as sensors or sensor arrays that are surface mounted or scanned over conducting and/or magnetizable test materials. The well-defined geometry obtained micro-fabricated windings and from carefully wound coils with known winding positions permits the use of model based inversions of sensed responses into material properties. In a preferred embodiment, the primary winding is a wound coil and the sense elements are etched or printed. The drive or sense windings can also be mounted under fasteners to improve sensitivity to hidden flaws. Ferrites and other means may be used to guide the magnetic flux and enhance the magnetic field in the test material.
    Type: Application
    Filed: June 1, 2007
    Publication date: October 23, 2008
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh, Ian C. Shav, Mark D. Windoloski, Christopher Root, Vladimir A. Zilberstein, David C. Grundy, Vladimir Tsukernik
  • Patent number: 7411390
    Abstract: For the inspection of materials and the detection and characterization of hidden objects, features, or flaws sensors and sensor arrays are used to image form two-dimensional images suitable for characterizing the hidden features. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and conducting materials, while capacitive sensors can be used for dielectric materials. Enhanced drive windings and electrode structures permit nulling or cancellation of local fields in the vicinity of the sense elements to increase sensor sensitivity. The addition of calibration windings, which are not energized during measurements, allows absolute impedance and material property measurements with nulled sensors. Sensors, sensor arrays, and support fixtures are described which permit relative motion between the drive and sense elements. This facilitates the volumetric reconstruction of hidden features and objects.
    Type: Grant
    Filed: June 3, 2003
    Date of Patent: August 12, 2008
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Ian C. Shay, Andrew P. Washabaugh
  • Patent number: 7348771
    Abstract: Sensor condition verification may be performed on electromagnetic sensors and sensor arrays mounted to a material surface. The sensors typically have a periodic winding or electrode structure that creates a periodic sensing field when driven by an electrical signal. The sensors can be thin and flexible so that they conform to the surface of the test material. Monitoring the conductivity changes of a test material, with changes in temperature, may provide a mechanism for testing the integrity of the sensor. Changes in the conductivity, due to changes in temperature, without significant lift-off changes may verify the calibration of the sensor and that the sensor elements themselves are intact.
    Type: Grant
    Filed: September 18, 2006
    Date of Patent: March 25, 2008
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Andrew P. Washabaugh, Vladimir A. Zilberstein, Vladimir Tsukemik
  • Patent number: 7289913
    Abstract: Local features such as cracks in materials are nondestructively characterized by measuring a response with an electromagnetic sensor and converting this response into a selected property using a database. The database is generated prior to data acquisition by using a model to generate a baseline response or field distribution for the sensor and combining these results with another model, which may be simpler than the first model or provide a local representation of the field perturbations around a feature, which is evaluated multiple times over a range of values of the selected property. In addition, the presence of a feature may be detected by converting the sensor response into a reference parameter, such as a lift-off factor that reflects the sensor position relative to a material edge, and using this parameter to determine a reference response that can be compared to the measured response.
    Type: Grant
    Filed: October 11, 2005
    Date of Patent: October 30, 2007
    Assignee: JENTEK Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Yanko K. Sheiretov, Mark D. Windoloski
  • Patent number: 7280940
    Abstract: The condition of insulating and semiconducting dielectric materials is assessed by a sensor array that uses electric fields to interrogate the test material. The sensor has a linear array of parallel drive conductors interconnected to form a single drive electrode and sense conductors placed on each side of and parallel to a drive conductor. Subsets of the sense conductors are interconnected to form at least two sense elements sensitive to different material regions. The sense conductors may be at different distances to the drive conductors, enabling measurement sensitivity to different depths into the test material. The material condition is assessed directly from the sense element responses or after conversion to an effective material property, such as an electrical conductivity or dielectric permittivity.
    Type: Grant
    Filed: March 7, 2006
    Date of Patent: October 9, 2007
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Yanko K Sheiretov, Andrew P. Washabaugh, David C. Grundy, Vladimir A. Zilberstein
  • Patent number: 7230421
    Abstract: Reference standards or articles having prescribed levels of damage are fabricated by monitoring an electrical property of the article material, mechanically loading the article, and removing the load when a change in electrical properties indicates a prescribed level of damage. The electrical property is measured with an electromagnetic sensor, such as a flexible eddy current sensor, attached to a material surface, which may be between layers of the article material. The damage may be in the form of a fatigue crack or a change in the mechanical stress underneath the sensor. The shape of the article material may be adjusted to concentrate the stress so that the damage initiates under the sensor. Examples adjustments to the article shape include the use of dogbone geometries with thin center sections, reinforcement ribs on the edges of the article, and radius cut-outs in the vicinity of the thin section.
    Type: Grant
    Filed: March 2, 2005
    Date of Patent: June 12, 2007
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Volker Weiss, Andrew P. Washabaugh, Vladimir A. Zilberstein
  • Patent number: 7188532
    Abstract: Observability of damage precursor, damage and usage states, or event occurrence may be enhanced by modifying component materials to include self-monitoring materials or by processing test material to alter the surface properties. The properties of the self monitoring materials, such as magnetic permeability or electrical conductivity, are monitored with electromagnetic sensors and provide greater property variations with component condition than the original component material. Processing includes shot peening or laser welding.
    Type: Grant
    Filed: September 8, 2004
    Date of Patent: March 13, 2007
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, David C. Grundy, Andrew P. Washabaugh, Darrell E. Schlicker, Ian C. Shay, Robert J. Lyons, Christopher A. Craven, Christopher Root, Mark D. Windoloski, Volker Weiss
  • Patent number: 7183764
    Abstract: Described are methods for pressurizing elastic support structures or balloons in sensor probes used for the inspection of components having areas of limited access. When inflated, the balloons press flexible sensors against the surface of the material under test. When deflated, the balloons permit easier insertion of the probes into the component and reduce the mechanical stresses on the sensors, thereby extending the sensor lifetime. By sequentially partially inserting the sensor into a limited access area from either side of the limited access area and scanning in opposite directions, the entire surface of the test material can be inspected.
    Type: Grant
    Filed: August 28, 2003
    Date of Patent: February 27, 2007
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Vladimir Tsukernik, Ian C. Shay, David C. Grundy, Andrew P. Washabaugh
  • Patent number: 7161350
    Abstract: Material condition monitoring may be performed by electromagnetic sensors and sensor arrays mounted to the material surface. The sensors typically have a periodic winding or electrode structure that creates a periodic sensing field when driven by an electrical signal. The sensors can be thin and flexible so that they conform to the surface of the test material. They can also be mounted such that they do not significantly modify the environmental exposure conditions for the test material, such as by creating stand-off gaps between the sensor and material surface or by perforating the sensor substrate.
    Type: Grant
    Filed: August 4, 2003
    Date of Patent: January 9, 2007
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, David C. Clark, Karen E. Walrath, Volker Weiss, William M. Chepolis, Andrew P. Washabaugh, Vladimir A. Zilberstein, Vladimir Tsukernik
  • Patent number: 7161351
    Abstract: Quasistatic sensor responses may be converted into multiple model parameters to characterize hidden properties of a material. Methods of conversion use databases of responses and, in some cases, databases that include derivatives of the responses, to estimate at least three unknown model parameters, such as the electrical conductivity, magnetic permeability, dielectric permittivity, thermal conductivity, and/or layer thickness. These parameter responses are then used to obtain a quantitative estimate of a property of a hidden feature, such as corrosion loss layer thicknesses, inclusion size and depth, or stress variation. The sensors can be single element sensors or sensor arrays and impose an interrogation electric, magnetic, or thermal field.
    Type: Grant
    Filed: September 3, 2004
    Date of Patent: January 9, 2007
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, Darrell E. Schlicker, David C. Grundy, Ian C. Shay, Robert J. Lyons, Andrew P. Washabaugh
  • Patent number: 7106055
    Abstract: Fabrication of samples having material conditions or damage representative of actual components inspected by nondestructive testing involves sensors placed near or mounted on the material surface, such as flexible eddy current sensors or sensor arrays, to monitor the material condition while the sample is being processed. These sample typically have real cracks in or around holes, on curved surfaces, in and under coatings, and on shot peened or otherwise preconditioned surfaces. Processing, such as mechanical or thermal loading to introduce fatigue damage, is stopped once the material condition reaches a predetermined level.
    Type: Grant
    Filed: November 15, 2004
    Date of Patent: September 12, 2006
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, David C. Grundy, Volker Weiss, Andrew P. Washabaugh
  • Patent number: 7095224
    Abstract: A process control method is described which uses measurements from magnetic field sensors to monitor the condition of material, such as from a heat treatment process. The sensors can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. The sensors can be exposed to the same process conditions as the material, such as elevated temperatures, or the shielding layers can be placed between the test material and the sensors to reduce sensor exposure to the processing conditions. Additional property measurements, such as sensor lift-off, can be used to ensure proper sensors operation.
    Type: Grant
    Filed: January 21, 2004
    Date of Patent: August 22, 2006
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Vladimir A. Zilberstein
  • Patent number: 7049811
    Abstract: A test circuit having a drive winding with parallel conducting segments and a plurality of sense elements used for the nondestructive measurement of materials. The drive winding segments have extended portions and are driven by a time varying electric current to impose a magnetic field in the test material. Sense elements are distributed in a direction parallel to the extended portions of these drive segments, with separate connections provided to each sense element. A second plurality of sense elements may also be distributed parallel to the extended portions of the drive windings, being either aligned or offset from a first plurality of sense elements.
    Type: Grant
    Filed: June 23, 2004
    Date of Patent: May 23, 2006
    Assignee: JENTEK Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Karen E. Walrath, Ian C. Shay, David C. Grundy, Mark Windoloski
  • Patent number: 6995557
    Abstract: A sensor that characterizes welds in materials. The sensor includes a meandering drive winding with at least three extended portions and at least one sensing element placed between an adjacent pair of extended portions. A time varying electric current is passed through the extended portions to form a magnetic field. The sensor is placed in proximity to the test material and translated over the weld region. An electrical property of the weld region is measured for each sensing element location. The weld quality is determined using a feature of the electrical property measurement and location.
    Type: Grant
    Filed: February 27, 2004
    Date of Patent: February 7, 2006
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, Darrell E. Schlicker, David C. Grundy, Ian Shay, Andrew P. Washabaugh
  • Patent number: RE39206
    Abstract: An instrument and method for providing accurate and reproducible measurement of absolute properties of a material under test without using conductivity or crack calibration standards. The instrument has a sensor designed to minimize unmodeled parasitic effects. To accomplish this, the sensor has one or more of the following features: dummy secondary elements located at the ends of a primary winding meandering, setting back of the sensing element from a connecting portion of the primary winding, or various grouping of secondary elements. The sensing elements of the sensor can be connected individually or in differential mode to gather absolute or differential sensitivity measurements. In addition, the instrumentation is configured such that a significant portion of the instrumentation electronics is placed as close to the sensor head to provide independently controllable amplification of the measurement signals therein reducing noise and other non-modeled effects.
    Type: Grant
    Filed: February 13, 2003
    Date of Patent: July 25, 2006
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh