Abstract: A time shift circuit for changing a delay timing of a portion of a test pattern for testing a semiconductor device. The time shift circuit includes a multiplexer for selectively producing delay value data indicating a value of time shift in response to a shift command signal, a vernier delay unit for producing timing vernier data based on the delay value data selected by the multiplexer, and a timing generator for generating a timing edge for the specific portion of the test pattern based on the timing vernier data. The shift command signal sets either a normal mode where predetermined delay value data is selected by the multiplexer or a time shift mode where delay value data for shifting the timing edge in real time is selected by the multiplexer.

Abstract: A semiconductor test system for testing a semiconductor device under test (DUT) is able to store failure data in a data failure memory with small memory capacity. The semiconductor test system includes a pattern memory for storing pattern data therein to produce a test pattern to be supplied to the DUT, means for evaluating an output signal of the DUT and producing failure data when there is a fail therein, a data failure memory for storing the failure data, and compaction means for assigning a plurality of addresses of the pattern memory to a single address of the data failure memory in a first test operation so that failure data occurred for each group of addresses of the pattern memory is stored in a corresponding address of the data failure memory, and for executing a second test operation for only a group of addresses of the pattern memory in which the failure data is detected without an address compaction.

Abstract: A pneumatic radial ply tire with an aspect ratio of less than 50 has a ground contacting tread radially outward of a circumferential belt structure which in turn is radially ourtward of a carcass structure. The carcass structure has a pair of bead areas that include a bead foot compatible with a conventionally-shaped wheel rim having flanges with laterally extending portions. The carcass structure has a cord-reinforced elastomeric ply layer extend laterally between the two bead areas and radially inward of the belt structure. The tread area is directly connected to the bead areas without a sidewall. Rim flange protectors comprising a continuous circumferential elastomeric projection extend laterally outward from each bead/tread area and thereby radially outward of the rim flanges.

Abstract: An event based test system for testing semiconductor devices under test (DUT). The event based test system is freely configured to a plurality of groups of sin units where each group is able to perform test operations independently from the other. The start and end timings of the test in each group are independently made by generating multiple end of test signals. The event based test system includes a plurality of pin units to be assigned to pins of the DUT, a signal generator for generating an end of test signal for indicating an end of current test which is generated for each pin unit independently from other pin units, and a system controller for controlling an overall operation in the event based test system by communicating with each pin unit. The end of test signal for each pin unit is selected by condition specified by the system controller and the selected end of test signal is provided to the system controller and to the other pin units.

Abstract: A semiconductor test system has a glitch detection function for detecting glitches in an output signal from a device under test to accurately evaluate the device under test (DUT) . The semiconductor test system includes an event memory for storing event data, an event generator for producing test patterns, strobe signals and expected patterns based on the event data from the event memory, a pin electronics for transmitting the test pattern from the event generator to the DUT and receiving an output signal of the DUT and sampling the output signal by timings of the strobe signals, a pattern comparator for comparing sampled output data with the expected patterns, and a glitch detection unit for receiving the output signal from the DUT and detecting a glitch in the output signal by counting a number of edges in the output signal and comparing an expected number of edges.

Abstract: A pneumatic radial ply tire with an aspect ratio of less than 50 has a ground contacting tread radially outward of a circumferential belt structure which in turn is radially ourtward of a carcass structure. The carcass structure has a pair of bead areas that include a bead foot compatible with a conventionally-shaped wheel rim having flanges with laterally extending portions. The carcass structure has a cord-reinforced elastomeric ply layer extend laterally between the two bead areas and radially inward of the belt structure. The tread area is directly connected to the bead areas without a sidewall. Rim flange protectors comprising a continuous circumferential elastomeric projection extend laterally outward from each bead/tread area and thereby radially outward of the rim flanges.

Abstract: An event based test system for storing event data in a compressed form to reduce the size of a memory and decompressing the data to produce the events for testing a device under test (DUT). The event based test system includes a clock count memory for storing clock count data of each event wherein the clock count data is formed of one or more data words depending on the value of the integral part data, a vernier data memory for storing vernier data of each event wherein the vernier data memory stores vernier data for two or more events in the same memory location, an address sequencer for generating address data for accessing the clock count memory and the vernier data memory, a decompressor for reproducing the clock count data from the clock count memory and the vernier data from the vernier data memory corresponding to each event.