Abstract: An apparatus for generating a DBI signal in a semiconductor integrated circuit includes a full adder that includes data input terminals and a carry terminal, each of which receives data, performs an operation on the received data, and outputs a sum and a carry. A DBI determining unit determines a logic value of each of the data on the basis of the sum and the carry that are transmitted from the full adder, and generates a DBI signal.

Abstract: A write circuit of a semiconductor memory device includes a global data input/output (I/O) line; an amplifying block for receiving and amplifying write data and transmitting the amplified write data as global data onto the global data I/O line; and a control block for comparing the write data with the global data to thereby disable the amplifying block when the write data and the global data have substantially the same data value.

Abstract: A delayed locked loop supports increased operation frequency in a semiconductor memory device. An output driver for use in a delay locked loop includes a first driving block for receiving an output from the delay locked loop to generate a first DLL clock for outputting read data corresponding to a read command, and a second driving block for receiving an output from the delay locked loop to generate a second DLL clock for reducing current consumption during a write operation, wherein the first driving block has larger delay amount than the second driving block.

Abstract: Provided is a pipe latch circuit of a multi-bit pre-fetch type semiconductor memory device with an advanced structure. The pipe latch circuit includes: a first latch circuit for simultaneously latching K-bit input data (K is an integer), which is received by simultaneously pre-fetching from an internal core circuit through global input/output lines, in response to an input latch control signal; a first multiplexing circuit for selecting K/2-bit input data among K-bit input data in response to a first selection control signal; a second multiplexing circuit for selecting 2-bit input data among the K/2-bit input data in response to a second selection control signal; and a second latch circuit for alternately latching the 2-bit data to sequentially output the latch data as output data in response to output latch control signals.

Abstract: A write circuit of a semiconductor memory device includes a global data input/output (I/O) line; an amplifying block for receiving and amplifying write data and transmitting the amplified write data as global data onto the global data I/O line; and a control block for comparing the write data with the global data to thereby disable the amplifying block when the write data and the global data have substantially the same data value.

Abstract: The present invention relates to an apparatus and a method for detecting a failure of data in the semiconductor memory device. The semiconductor memory device according to the present invention includes: a global I/O line for transferring data between an external circuit and a local I/O line; an I/O sense amplifier for controlling a data transmission between the local I/O line and the global I/O line; and an I/O sense amplifier control unit for controlling the I/O sense amplifier in response to a test mode signal in order to test the semiconductor memory device, independent of the data outputted from a memory cell.

Abstract: A semiconductor memory device wherein, in order to control the current consumed in a column address counter and latch block in a read operation, delay units disposed in the column address counter and latch block perform a shifting operation according to a signal CASP6, which is enabled in the write and read operations, and a signal WT6RD5Z, which is enabled in the write operation and disabled in the read operation. Accordingly, unnecessary current consumed in the read operation can be reduced.

Abstract: A semiconductor memory device including a write multiplexer unit that multiplexes write data transmitted to a global I/O bus disposed in front of a write driver. The semiconductor memory device further includes a memory core region including an array of memory cells, a data input path that receives data to be written into the memory cells from the outside, a first bus that receives the data through the data input path, a multiplexing unit that multiplexes the data received from the first bus, and a driving unit that selects and drives the multiplexed data.

Abstract: There is provided an input/output multiplexer capable of reducing a layout area in designing a device by disposing first and second multiplexers at either side of a specific data input/output (I/O) pad. An apparatus for multiplexing data inputted or outputted to a global input/output (I/O) line includes a first multiplexer for multiplexing the data and supplying a first multiplexed data to the global I/O line and a second multiplexer for multiplexing the first multiplexed data supplied to the global I/O line, wherein the first and second multiplexers are formed at either side of the global I/O line.

Abstract: A delayed locked loop supports increased operation frequency in a semiconductor memory device. An output driver for use in a delay locked loop includes a first driving block for receiving an output from the delay locked loop to generate a first DLL clock for outputting read data corresponding to a read command, and a second driving block for receiving an output from the delay locked loop to generate a second DLL clock for reducing current consumption during a write operation, wherein the first driving block has larger delay amount than the second driving block.

Abstract: A semiconductor memory device of the claimed invention, having an active state for performing a read or write operation and an inactive state except for the active state includes a data input/output (I/O) line; a pull-up latch unit for pulling-up the data I/O line when the semiconductor memory device is in the inactive state; a pull-down latch unit for pulling-down the data I/O line when the semiconductor memory device is in the inactive state; and a selection unit for selectively driving one of the pull-up latch unit and the pull-down latch unit.

Abstract: A semiconductor memory device includes a pipe latch unit having a plurality of pipe latches, each of which latches an external address in response to the activation of an external command and outputs an internal address in response to the activation of an internal command corresponding to the external command. A pipe latch control unit is configured to control the pipe latch unit to sequentially enable the plurality of pipe latches. An output drive unit is configured to selectively output the internal address or the external address. The internal command is activated after a predetermined latency from an activation timing of the external command.

Abstract: A write circuit of a semiconductor memory device includes a global data input/output (I/O) line; an amplifying block for receiving and amplifying write data and transmitting the amplified write data as global data onto the global data I/O line; and a control block for comparing the write data with the global data to thereby disable the amplifying block when the write data and the global data have substantially the same data value.

Abstract: A data input device for use in a semiconductor memory device includes a synchronization control unit for receiving a data strobe signal with which a data is synchronized in order to generate a synchronization signal in response to a driving signal; and a synchronization unit for storing internal data input sequentially one-bit by one-bit into a plurality of synchronous storing elements and asynchronous storing elements and for outputting the stored data as parallel-typed aligned data all at once in synchronization with the synchronization signal.

Abstract: An internal signal generator for use in a semiconductor memory device includes an internal read address generation unit and an internal write address generation unit. The internal read address generation unit generates a plurality of read delay addresses by delaying an external address for a predetermined latency shorter than an additive latency set by the semiconductor memory device and selects one of the read delay addresses to thereby output an internal read address. The internal write address generation unit generates a plurality of write delay addresses by delaying the internal read address for a preset latency shorter than a column address strobe (CAS) latency set by the semiconductor memory device and selects one of the write delay addresses to thereby output an internal write address.

Abstract: There is provided a semiconductor memory design technique, specifically a bus connection circuit for a read operation of a multi-port memory device. The bus connection circuit is adapted to a current sensing type bus transmission/reception structure. The bus connection circuit includes: a read data sensing/latching unit for sensing/latching a read data applied on a local data bus in response to a read data strobe signal; and a read data driving unit for driving the data latched in the read data sensing/latching unit to a global data bus in response to a read data driving pulse, and for connecting or disconnecting a path of current flowing the global data bus according to a logic level of the latched data.

Abstract: A data arrangement control signal generation circuit for use in a semiconductor memory device includes a plurality of data arrangement control signal generation units connected in series, each for selectively generating a data arrangement control signal according to a column address strobe (CAS) latency.

Abstract: A multi-port memory device includes a plurality of banks arranged at an upper and a lower portion of a core area as many as a fixed number in a row direction, a multiplicity of ports located at edges of the upper and the lower portions of the core area, wherein respective ports perform independent communication with respective different target devices, a first global data bus, located in a row direction between the ports and the banks arranged at the upper portion of the core area, for performing the parallel data transmission, a second global data bus, located in a row direction between the ports and the banks arranged at the lower portion of the core area, for performing the parallel data transmission, many local data buses, arranged in a column direction of each bank, for executing data transmission within the banks, and a majority of local data bus connection units, located between two banks adjacent to each other in a column direction, for selectively connecting the local data buses corresponding to the

Abstract: A synchronous memory device and a synchronous multi-port memory device preventing a skew between data and data strobe signal according to data transmission path is disclosed. In order to eliminate such a position dependence, the synchronous memory device and the synchronous multi-port memory device adopt a scheme of transmitting the data strobe signal together with the data. If a data driving block transmits the data capture pulse together with the data, the data and the data capture pulse pass the same delay without regard to the data transmission/reception blocks, thus preventing the occurrence of the skew. In other words, the present invention adopts a source synchronization scheme, which is used at an outside of the conventional synchronous DRAM, into the memory device. Specifically, the present invention can be applied to a synchronous multi-port memory device having a plurality of independent ports.

Abstract: A synchronous memory device and a synchronous multi-port memory device preventing a skew between data and data strobe signal according to data transmission path is disclosed. In order to eliminate such a position dependence, the synchronous memory device and the synchronous multi-port memory device adopt a scheme of transmitting the data strobe signal together with the data. If a data driving block transmits the data capture pulse together with the data, the data and the data capture pulse pass the same delay without regard to the data transmission/reception blocks, thus preventing the occurrence of the skew. In other words, the present invention adopts a source synchronization scheme, which is used at an outside of the conventional synchronous DRAM, into the memory device. Specifically, the present invention can be applied to a synchronous multi-port memory device having a plurality of independent ports.