Abstract: A security inspection device, a security inspection system and a security inspection method are provided, the device includes: a support frame defining an inspection channel; a first X-ray accelerator provided at a position of a top portion of the support frame and the position is offset from a centerline of the inspection channel, where the first X-ray accelerator is configured to radiate a first X-ray towards the inspection channel to inspect an object; a second X-ray accelerator configured to radiate a second X-ray to the inspection channel to inspect the object; and a detector apparatus, including: detector modules provided on the support frame and facing the first X-ray accelerator and the second X-ray accelerator, the detector modules receive the first X-ray and/or the second X-ray to form a transmission image of the object; the first X-ray, the second X-ray, and the detector modules are located in the same plane.

Abstract: A mobile radiation inspection apparatus includes a vehicle body, a traveling mechanism, a boom assembly, a first imaging device, and a second imaging device. The boom assembly is mounted on the vehicle body and is configured to switch between an inspection state and a transportation state. The first imaging device includes a first ray source and a first ray detector both mounted on the boom assembly. The first ray source is positioned at the top of an inspection channel. The second imaging device includes a second ray source and a second ray detector. The second ray detector cooperates with the second ray source to detect rays emitted by the second ray source, and the second ray source is positioned on a side surface of the inspection channel. The mobile radiation inspection apparatus implements multi-angle and multi-mode scanning.

Abstract: The present disclosure relates to an inspection system and method. The inspection system includes: a ray source, configured to generate rays having different energies; a detector, configured to detect a signal when a ray emitted by the ray source acts on at least one cross section of an inspected object; and a processor, in communication connection with the ray source, configured to adjust an energy of the ray emitted by the ray source according to information representing a material parameter of at least one cross section of the inspected object. The embodiments of the present disclosure is capable of being applicable to radiation inspection of multiple types of inspected objects.

Abstract: An inspection system includes: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on an inspected object; and a processor in communication connection with the radiation source and configured to select a periodic radiation combination corresponding to a type of the object according to the type of the object, and cause the radiation source to emit radiation to the object in the selected periodic radiation combination during the time that the object is scanned, and the periodic radiation combination is a chronological arrangement of radiation pulses output by the radiation source in each scanning period, and radiation pulses have at least two different radiation energies. The system is capable of improving adaptability and simplifying control. An inspection method is also provided.

Abstract: A radiation inspection system includes: a single ray source having a plurality of accelerating tubes, and the plurality of accelerating tubes respectively generate a plurality of rays having different energies, and beam exit directions of the plurality of accelerating tubes comprise at least two different beam exit directions; a plurality of detectors configured to detect a signal when rays emitted by the single ray source act on the inspected object; and a processor in communication connection with the single ray source and configured to respectively control the plurality of accelerating tubes. A radiation inspection method is also provided.

Abstract: An inspection system comprises: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on the inspected object; and a processor in communication connection with the radiation source and configured to determine at least one periodic radiation combination corresponding to a type of the object according to the type of the object, select periodic radiation combinations respectively corresponding to at least two different portions of the object in the at least one periodic radiation combination, and cause the radiation source to emit radiation to the at least two corresponding different portions in selected periodic radiation combinations during the time that the object is scanned, wherein a periodic radiation combination is a chronological arrangement of at least one radiation pulse output by the radiation source in each scanning period. An inspection method is also provided.

Abstract: The present disclosure provides a method and device for correcting a scanned image, and an image scanning system, and relates to the field of image scanning. The method includes obtaining a scanned image of a scanned object, detecting one or more reference objects from the scanned image, determining a deformation parameter of each reference object of the one or more reference objects based on preset a standard parameter of the each reference object, and correcting the scanned image based on the deformation parameters of the one or more reference objects.

Abstract: The present invention relates to a backscatter imaging device, a control method and an inspection system. The backscatter imaging device includes a ray source assembly configured to emit rays to a scanning area; a backscatter detector array including a plurality of backscattering detectors and configured to receive scattered photons when the rays are backscattered by an object within the scanning area; and a first collimator assembly including a plurality of first collimating channels corresponding to the plurality of backscatter detectors respectively, arranged on one side of the backscatter detector array adjacent to the scanning area, and configured to align the scattered photons when the rays are backscattered by the object, and the plurality of backscatter detectors receive scattered photons corresponding to a plurality of depths in the object respectively; and at least part of the plurality of first collimation channels have an adjustable collimation angle.

Abstract: A method, a device and a security system for image data processing based on VR or AR are disclosed. In one aspect, an example image data processing method includes reconstructing, based on three-dimensional (3D) scanned data of a containing apparatus in which objects are contained, a 3D image of the containing apparatus and the objects contained in the containing apparatus. The reconstructed 3D image is stereoscopically displayed. Manipulation information is determined for at least one of the objects in the containing apparatus based on positioning information and action information of a user. At least a 3D image of the at least one object is reconstructed based on the determined manipulation information. The at least one reconstructed object is presented on the displayed 3D image.

Abstract: It discloses a dexamethasone-loaded macrophage-derived microvesicle as well as a preparation method and application thereof. The dexamethasone-loaded macrophage-derived microvesicle is formed by entrapping dexamethasone with a microvesicle derived from a murine macrophage cell line 264.7 cell. The dexamethasone-loaded macrophage-derived microvesicle of the present invention can be taken up by an injured cell more effectively, and fulfills the aim of ameliorating the kidney inflammation by inhibiting the activation of a proinflammatory signal pathway and infiltration of inflammatory cells. Meanwhile, the preparation method of the present invention is simple, convenient and efficient, and the prepared microvesicle is derived from the RAW 264.7 cells which are sufficient and widespread, and can be produced in large-scale.

Abstract: The present disclosure provides a substance identification device and a substance identification method. The substance identification device comprises: a classifier establishing unit configured to establish a classifier based on scattering density values reconstructed for a plurality of known sample materials, wherein the classifier comprises a plurality of feature regions corresponding to a plurality of characteristic parameters for the plurality of known sample materials, respectively; and an identification unit for a material to be tested, configured to match the characteristic parameter of the material to be tested with the classifier, and to identify a type of the material to be tested by obtaining a feature region corresponding to the characteristic parameter of the material to be tested.

Abstract: The present disclosure provides a back scattering inspection system and a back scattering inspection method. The back scattering inspection system includes a frame and a back scattering inspection device. The rack includes a track arranged vertically or obliquely relative to the ground, and a space enclosed by the track forms an inspection channel; and the back scattering inspection device includes a back scattering ray emitting device and a back scattering detector, and the back scattering inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel. The back scattering inspection system can perform back scattering inspection on a plurality of surfaces of the inspected object.

Abstract: The present disclosure provides a spiral Computed Tomography (CT) device and a three-dimensional image reconstruction method. The spiral CT device includes: an inspection station operable to carry an object to be inspected and defining an inspection space; a rotational supporting apparatus disposed around the inspection space; a plurality of X-ray sources located on the rotational supporting apparatus; and a plurality of X-ray receiving apparatuses located on the rotational supporting apparatus and opposing to the plurality of X-ray sources respectively, wherein the plurality of X-ray sources and the plurality of X-ray receiving apparatuses are rotational synchronously with the rotational supporting apparatus, wherein the plurality of X-ray sources are closely disposed and fan-shaped X-ray beams provided by the plurality of X-ray sources cover the inspection space with a minimum degree of overlapping.

Abstract: The present disclosure provides a method and device for correcting a scanned image, and an image scanning system, and relates to the field of image scanning. The method includes obtaining a scanned image of a scanned object, detecting one or more reference objects from the scanned image, determining a deformation parameter of each reference object of the one or more reference objects based on preset a standard parameter of the each reference object, and correcting the scanned image based on the deformation parameters of the one or more reference objects.

Abstract: The present disclosure provides a back scattering inspection system and a back scattering inspection method. The back scattering inspection system includes a frame and a back scattering inspection device. The rack includes a track arranged vertically or obliquely relative to the ground, and a space enclosed by the track forms an inspection channel; and the back scattering inspection device includes a back scattering ray emitting device and a back scattering detector, and the back scattering inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel. The back scattering inspection system can perform back scattering inspection on a plurality of surfaces of the inspected object.

Abstract: The present disclosure discloses a method of substance identification of an item to be inspected using a multi-energy-spectrum X-ray imaging system, the method comprising: acquiring a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; calculating distances between the transparency related vector and transparency related vectors stored in the system consisting of N transparency mean values of multiple kinds of items with multiple thicknesses in the N energy regions; and identifying the item to be inspected as the item corresponding to the minimum distance. The present disclosure is based on a multi-energy-spectrum X-ray imaging system, and proposes a method of substance identification by analyzing the multi-energy-spectrum substance identification issue.

Abstract: The present disclosure discloses a method, apparatus and system for assisting security inspection, and relates to the field of security inspection. The method includes: acquiring registration information of an inspected object; acquiring a standard scanned image corresponding to the registration information; displaying the standard scanned image in an AR manner to determine whether the inspected object is a suspicious object through comparing the standard scanned image with an actual scanned image, the actual scanned image comprising an image of the inspected object.

Abstract: The present disclosure provides a substance identification device and a substance identification method. The substance identification device comprises: a classifier establishing unit configured to establish a classifier based on scattering density values reconstructed for a plurality of known sample materials, wherein the classifier comprises a plurality of feature regions corresponding to a plurality of characteristic parameters for the plurality of known sample materials, respectively; and an identification unit for a material to be tested, configured to match the characteristic parameter of the material to be tested with the classifier, and to identify a type of the material to be tested by obtaining a feature region corresponding to the characteristic parameter of the material to be tested.

Abstract: The present disclosure provides an image processing method, device, and computer readable storage medium, relating to the field of image processing technology, the method includes: acquiring a first undersampled image to be processed; and reconstructing, according to a mapping relationship between an undersampled image and a normally sampled original image, the first undersampled image to a corresponding first original image, wherein the mapping relationship is obtained by training a machine learning model with a second undersampled image and a normally sampled second original image corresponding to the second undersampled image as training samples.

Abstract: The present disclosure discloses a method of substance identification of an item to be inspected using a multi-energy-spectrum X-ray imaging system, the method comprising: acquiring a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; calculating distances between the transparency related vector and transparency related vectors stored in the system consisting of N transparency mean values of multiple kinds of items with multiple thicknesses in the N energy regions; and identifying the item to be inspected as the item corresponding to the minimum distance. The present disclosure is based on a multi-energy-spectrum X-ray imaging system, and proposes a method of substance identification by analyzing the multi-energy-spectrum substance identification issue.