Abstract: The present disclosure provides a substance identification device and a substance identification method. The substance identification device comprises: a classifier establishing unit configured to establish a classifier based on scattering density values reconstructed for a plurality of known sample materials, wherein the classifier comprises a plurality of feature regions corresponding to a plurality of characteristic parameters for the plurality of known sample materials, respectively; and an identification unit for a material to be tested, configured to match the characteristic parameter of the material to be tested with the classifier, and to identify a type of the material to be tested by obtaining a feature region corresponding to the characteristic parameter of the material to be tested.

Abstract: The present disclosure provides an image processing method, device, and computer readable storage medium, relating to the field of image processing technology, the method includes: acquiring a first undersampled image to be processed; and reconstructing, according to a mapping relationship between an undersampled image and a normally sampled original image, the first undersampled image to a corresponding first original image, wherein the mapping relationship is obtained by training a machine learning model with a second undersampled image and a normally sampled second original image corresponding to the second undersampled image as training samples.

Abstract: The present disclosure discloses a method of substance identification of an item to be inspected using a multi-energy-spectrum X-ray imaging system, the method comprising: acquiring a transparency related vector consisting of transparency values of the item to be inspected in N energy regions, wherein N is greater than 2; calculating distances between the transparency related vector and transparency related vectors stored in the system consisting of N transparency mean values of multiple kinds of items with multiple thicknesses in the N energy regions; and identifying the item to be inspected as the item corresponding to the minimum distance. The present disclosure is based on a multi-energy-spectrum X-ray imaging system, and proposes a method of substance identification by analyzing the multi-energy-spectrum substance identification issue.

Abstract: A semiconductor detector and a packaging method thereof. The semiconductor detector includes: a cathode circuit board including a read out chip, a high voltage side top layer of the cathode circuit board, a bottom connection layer of the cathode circuit board and a dielectric filled between the high voltage side top layer and the bottom connection layer, wherein the high voltage side top layer is connected to the bottom connection layer through a via hole; and a detector crystal including a crystal body, an anode and a cathode, the anode is connected to the read out chip of the cathode circuit board, the high voltage side top layer is connected to an input terminal of the semiconductor detector and the bottom connection layer directly contacts the cathode of the detector crystal to connect the cathode to the cathode circuit board.

Abstract: The present disclosure provides an apparatus for processing signals for a plurality of energy regions, and a system and method for detecting radiation of a plurality of energy regions. The apparatus for processing signals for a plurality of energy regions may comprise: a first processor, configured to receive a signal from a detector and process the received signal to generate a gated signal, wherein a turn-on period of the gated signal represents magnitude of the received signal; and a second processor, configured to receive the gated signal from the first processor, and determine one of the plurality of energy regions to which the received signal belongs according to the turn-on period of the gated signal, so as to count signals within the determined energy region.

Abstract: The present disclosure provides a method for recognizing an article using a multi-energy spectrum X-ray imaging system and a multi-energy spectrum X-ray imaging system. The method comprises: recognizing an application scenario and/or priori information of the article; selecting a parameter mode suitable for the article from a plurality of parameter modes stored in the multi-energy spectrum X-ray imaging system based on the recognized application scenario and/or priori information; and recognizing the article using the selected parameter mode, wherein the plurality of parameter modes are obtained by optimizing system parameters of the multi-energy spectrum X-ray imaging system under a specific condition using a training sample library for various articles.

Abstract: The present disclosure relates to a method, a device and a system for inspecting a moving object based on cosmic rays, pertaining to the field of radiation imaging and safety inspection techniques. The method includes: detecting whether a speed of the inspected moving object is within a preset range; recording a motion trajectory of the moving object with a monitoring device; acquiring information about charged particles in the cosmic rays with a position sensitive detector, the information about charged particles including track information of the charged particles; determining the moving object by matching positions of the motion trajectory and the track information; reconstructing the track of the charged particles according to the information about the charged particles; and recognizing the material inside the moving object based on the track reconstruction.

Abstract: The present application relates to a method, apparatus and system for inspecting an object based on a cosmic ray, pertaining to the technical field of radiometric imaging and safety inspection. The method includes: recording a movement trajectory of an inspected object by using a monitoring device; acquiring information of charged particles in the cosmic ray by using a position-sensitive detector, the information of charged particles comprising trajectory information of the charged particles; performing position coincidence for the movement trajectory and the trajectory information to determine the object; performing trajectory remodeling for the charged particles according to the information of charged particles; and identifying a material inside the moving object according to the trajectory remodeling.

Abstract: The present disclosure discloses an inspection device and a method for inspecting a container. Transmission scanning is performed on the inspected container using a scanning device including a sparse area array detector to obtain scan data. Digital focusing is performed at a specific depth position in a depth direction. Defocused pixel values are filtered out to obtain a slice image at the specific depth position. It is judged whether dangerous articles or suspicious articles are included in the slice image.

Abstract: The present disclosure provides a decomposition method based on basis material combination. In the present disclosure, a scanned object is divided into a plurality of regions, the basis material combinations used in each of the divided regions are different each other, and the scanned object is re-divided according to the re-determined equivalent atomic number of its each point until the change on decomposition coefficient meets certain conditions. Thereby, a decomposition method based on dynamic basis material combinations is realized, which reduces a decomposition error caused by improper selection of the basis material combination and improves the accuracy of the decomposition and substance identification of the multi-energy CT.

Abstract: The present disclosure provides a spiral Computed Tomography (CT) device and a three-dimensional image reconstruction method.

Abstract: There is provided a semiconductor detector. According to an embodiment, the semiconductor detector may include a semiconductor detection material including a first side and a second side opposite to each other. One of the first side and the second side is a ray incident side that receives incident rays. The detector may further include a plurality of pixel cathodes disposed on the first side and a plurality of pixel anodes disposed on the second side. The pixel anodes and the pixel cathodes correspond to each other one by one. The detector may further include a barrier electrode disposed on a periphery of respective one of the pixel cathodes or pixel anodes on the ray incident side. According to the embodiment of the present disclosure, it is possible to effectively suppress charge sharing between the pixels and thus to improve an imaging resolution of the detector.

Abstract: The present disclosure provides a decomposition method based on basis material combination. In the present disclosure, a scanned object is divided into a plurality of regions, the basis material combinations used in each of the divided regions are different each other, and the scanned object is re-divided according to the re-determined equivalent atomic number of its each point until the change on decomposition coefficient meets certain conditions. Thereby, a decomposition method based on dynamic basis material combinations is realized, which reduces a decomposition error caused by improper selection of the basis material combination and improves the accuracy of the decomposition and substance identification of the multi-energy CT.

Abstract: The present disclosure discloses a method, apparatus and system for assisting security inspection, and relates to the field of security inspection. The method includes: acquiring registration information of an inspected object; acquiring a standard scanned image corresponding to the registration information; displaying the standard scanned image in an AR manner to determine whether the inspected object is a suspicious object through comparing the standard scanned image with an actual scanned image, the actual scanned image comprising an image of the inspected object.

Abstract: The present disclosure provides an image processing method, device, and computer readable storage medium, relating to the field of image processing technology, the method includes: acquiring a first undersampled image to be processed; and reconstructing, according to a mapping relationship between an undersampled image and a normally sampled original image, the first undersampled image to a corresponding first original image, wherein the mapping relationship is obtained by training a machine learning model with a second undersampled image and a normally sampled second original image corresponding to the second undersampled image as training samples.

Abstract: A semiconductor may include a semiconductor detection material including a first side and a second side opposite to each other, a cathode disposed on the first side, and an anode disposed on the second side. The anode includes an array of pixel anodes defining detection pixels of the semiconductor detector, and intermediate anodes disposed between adjacent ones of the pixel anodes. According to an embodiment of the present disclosure, it is possible to achieve signal correction to improve the energy resolution and the signal-to-noise ratio of the detector.

Abstract: Provided is a dual-energy ray scanning system, which includes a ray source for alternately emitting a high energy ray and a low energy ray; a filter includes a low energy filtering element and a low energy transmitting element; a control device for synchronously controlling the ray source and the filter, and the low energy filtering element includes a plurality of filter sheets, the low energy transmitting element comprises a plurality of transmission sheets, the filter sheets and the transmission sheets are arranged alternately and surround the ray source to form a cavity, and the ray source is located on a central axis of the cavity.

Abstract: The present disclosure provides a semiconductor detector. The semiconductor detector comprises: a detector crystal including a crystal body, an anode and a cathode; a field enhance electrode for applying a voltage to the detector crystal; an insulating material disposed between the field enhanced electrode and a surface of the detector crystal. The semiconductor detector further comprises a field enhanced electrode circuit board having a bottom connection layer in contact with the surface of the detector crystal and a top layer opposite to the bottom connection layer, wherein the top layer is connected to a high voltage input terminal of the semiconductor detector, and an insulating material is provided between the bottom connection layer and the detector surface of the detector crystal.

Abstract: A method, a device and a security system for image data processing based on VR or AR are disclosed. In one aspect, an example image data processing method includes reconstructing, based on three-dimensional (3D) scanned data of a containing apparatus in which objects are contained, a 3D image of the containing apparatus and the objects contained in the containing apparatus. The reconstructed 3D image is stereoscopically displayed. Manipulation information is determined for at least one of the objects in the containing apparatus based on positioning information and action information of a user. At least a 3D image of the at least one object is reconstructed based on the determined manipulation information. The at least one reconstructed object is presented on the displayed 3D image.

Abstract: The present disclosure discloses an inspection device and a method for inspecting a container. Transmission scanning is performed on the inspected container using a scanning device including a sparse area array detector to obtain scan data. Digital focusing is performed at a specific depth position in a depth direction. Defocused pixel values are filtered out to obtain a slice image at the specific depth position. It is judged whether dangerous articles or suspicious articles are included in the slice image.