Abstract: An apparatus is disclosed which includes a converter circuit and a noise suppression circuit. The converter circuit has a dynamic logic input, and is configured to generate a static logic output on an output node responsive to the dynamic logic input. The noise suppression circuit is coupled to receive a clock signal and is coupled to the output node. Responsive to a first phase of the clock signal, a precharge of a dynamic logic circuit generating the dynamic logic input occurs. The noise suppression circuit is configured to actively drive the static logic output on the output node responsive to the first phase. In some embodiments, the noise suppression circuit may reduce the noise sensitivity of the static logic output during the precharge phase, and may not impede operation of the converter circuit during the evaluate phase.

Abstract: A first dynamic logic circuit has an output node on which a scan value is provided during scan, a second dynamic logic circuit, and one or more third dynamic logic circuits. The first dynamic logic circuit and the second dynamic logic circuit are in a first dynamic phase during functional operation. The third dynamic logic circuits are in a second dynamic phase during functional operation, and an output of the third dynamic circuits is sampled in response to the scan value during scan. In one embodiment, a first clock controls evaluation of the second dynamic logic circuit, and the second clock controls evaluation of the third dynamic logic circuits. The clocks may be generated responsive to a scan clock and/or a scan mode signal to generate at least one evaluate pulse on the first clock and the second clock prior to sampling the output of the third dynamic circuits.

Abstract: A scan interface for an integrated circuit includes a scan clock and a scan mode signal. The scan mode signal is indicative of whether or not scan is active, and may be used by dedicated scan circuitry in integrated circuit. Such circuitry may be inactive if the scan mode indicates that scan is inactive, and active if the scan mode indicates that scan is active. For example, the scan circuitry may not toggle is scan is inactive. The scan circuitry may present a reduced load to functional circuitry if scan is inactive. In some embodiments, static and dynamic scan circuits are included for use with static and dynamic logic circuits, respectively.

Abstract: An apparatus may include at least a first transistor, a second transistor, and a circuit. The first transistor has a first control terminal coupled to receive a first dynamic data signal, and is coupled to a first node. The first transistor drives a first state on the first node responsive to an assertion of the first dynamic data signal. The second transistor is coupled to the first node and has a second control terminal. The second transistor is drives a second state on the first node responsive to a signal on the second control terminal. The circuit is coupled to generate the signal on the second control terminal and is coupled to receive a second dynamic data signal. The second dynamic data signal is a complement of the first dynamic data signal, wherein the circuit is activates the second transistor responsive to an assertion of the second dynamic data signal.

Abstract: A first dynamic logic circuit has an output node on which a scan value is provided during scan. One of one or more second dynamic logic circuits has an input coupled to the output node of the first dynamic logic circuit, and an output of the second dynamic logic circuits is sampled in response to the scan value during scan. In one embodiment, clock generation circuitry may be included which generates a first clock, a second clock, and a third clock. At least one evaluate pulse on the first clock prior is generated prior to sampling the output of the second dynamic logic circuits, the first clock controlling at least the evaluation of the second dynamic logic circuits. The second and third clocks are generated to isolate the output node from inputs to the first dynamic logic circuit responsive to the scan mode signal indicating that scan is active.

Abstract: A conditional clock buffer circuit includes a clock output and is coupled to receive a clock input and a condition signal. The conditional clock buffer circuit includes a first circuit coupled to receive the clock input and a second circuit coupled to receive the clock input and the condition signal. The first circuit is configured to generate a first state on the clock output responsive to a first phase of the clock input. The second circuit is configured to conditionally generate a second state on the clock output responsive to the condition signal during a first portion of a second phase of the clock input. In one implementation, one or more of the conditional clock buffer circuits may be included in a clock tree. The clock tree may also include one or more levels of buffering.

Abstract: An apparaus is disclosed which includes a converter circuit and a noise suppression circuit. The converter circuit has a dynamic logic input, and is configured to generate a static logic output on an output node responsive to the dynamic logic input. The noise suppression circuit is coupled to receive a clock signal and is coupled to the output node. Responsive to a first phase of the clock signal, a precharge of a dynamic logic circuit generating the dynamic logic input occurs. The noise suppression circuit is configured to actively drive the static logic output on the output node responsive to the first phase. In some embodiments, the noise suppression circuit may reduce the noise sensitivity of the static logic output during the precharge phase, and may not impede operation of the converter circuit during the evaluate phase.

Abstract: A conditional clock buffer circuit includes a clock output and is coupled to receive a clock input and a condition signal. The conditional clock buffer circuit includes a first circuit coupled to receive the clock input and a second circuit coupled to receive the clock input and the condition signal. The first circuit is configured to generate a first state on the clock output responsive to a first phase of the clock input. The second circuit is configured to conditionally generate a second state on the clock output responsive to the condition signal during a first portion of a second phase of the clock input. In one implementation, one or more of the conditional clock buffer circuits may be included in a clock tree. The clock tree may also include one or more levels of buffering.

Abstract: An apparatus may include at least a first transistor, a second transistor, and a circuit. The first transistor has a first control terminal coupled to receive a first dynamic data signal, and is coupled to a first node. The first transistor drives a first state on the first node responsive to an assertion of the first dynamic data signal. The second transistor is coupled to the first node and has a second control terminal. The second transistor is drives a second state on the first node responsive to a signal on the second control terminal. The circuit is coupled to generate the signal on the second control terminal and is coupled to receive a second dynamic data signal. The second dynamic data signal is a complement of the first dynamic data signal, wherein the circuit is activates the second transistor responsive to an assertion of the second dynamic data signal.

Abstract: A first dynamic logic circuit has an output node on which a scan value is provided during scan. One of one or more second dynamic logic circuits has an input coupled to the output node of the first dynamic logic circuit, and an output of the second dynamic logic circuits is sampled in response to the scan value during scan. In one embodiment, clock generation circuitry may be included which generates a first clock, a second clock, and a third clock. At least one evaluate pulse on the first clock prior is generated prior to sampling the output of the second dynamic logic circuits, the first clock controlling at least the evaluation of the second dynamic logic circuits. The second and third clocks are generated to isolate the output node from inputs to the first dynamic logic circuit responsive to the scan mode signal indicating that scan is active.

Abstract: An apparatus is disclosed which includes a converter circuit and a noise suppression circuit. The converter circuit has a dynamic logic input, and is configured to generate a static logic output on an output node responsive to the dynamic logic input. The noise suppression circuit is coupled to receive a clock signal and is coupled to the output node. Responsive to a first phase of the clock signal, a precharge of a dynamic logic circuit generating the dynamic logic input occurs. The noise suppression circuit is configured to actively drive the static logic output on the output node responsive to the first phase. In some embodiments, the noise suppression circuit may reduce the noise sensitivity of the static logic output during the precharge phase, and may not impede operation of the converter circuit during the evaluate phase.

Abstract: A first dynamic logic circuit has an output node on which a scan value is provided during scan. One of one or more second dynamic logic circuits has an input coupled to the output node of the first dynamic logic circuit, and an output of the second dynamic logic circuits is sampled in response to the scan value during scan. In one embodiment, clock generation circuitry may be included which generates a first clock, a second clock, and a third clock. At least one evaluate pulse on the first clock prior is generated prior to sampling the output of the second dynamic logic circuits, the first clock controlling at least the evaluation of the second dynamic logic circuits. The second and third clocks are generated to isolate the output node from inputs to the first dynamic logic circuit responsive to the scan mode signal indicating that scan is active.

Abstract: An apparatus may include at least a first transistor, a second transistor, and a circuit. The first transistor has a first control terminal coupled to receive a first dynamic data signal, and is coupled to a first node. The first transistor drives a first state on the first node responsive to an assertion of the first dynamic data signal. The second transistor is coupled to the first node and has a second control terminal. The second transistor is drives a second state on the first node responsive to a signal on the second control terminal. The circuit is coupled to generate the signal on the second control terminal and is coupled to receive a second dynamic data signal. The second dynamic data signal is a complement of the first dynamic data signal, wherein the circuit is activates the second transistor responsive to an assertion of the second dynamic data signal.

Abstract: A conditional clock buffer circuit includes a clock output and is coupled to receive a clock input and a condition signal. The conditional clock buffer circuit includes a first circuit coupled to receive the clock input and a second circuit coupled to receive the clock input and the condition signal. The first circuit is configured to generate a first state on the clock output responsive to a first phase of the clock input. The second circuit is configured to conditionally generate a second state on the clock output responsive to the condition signal during a first portion of a second phase of the clock input. In one implementation, one or more of the conditional clock buffer circuits may be included in a clock tree. The clock tree may also include one or more levels of buffering.

Abstract: A first dynamic logic circuit has an output node on which a scan value is provided during scan. One of one or more second dynamic logic circuits has an input coupled to the output node of the first dynamic logic circuit, and an output of the second dynamic logic circuits is sampled in response to the scan value during scan. In one embodiment, clock generation circuitry may be included which generates a first clock, a second clock, and a third clock. At least one evaluate pulse on the first clock prior is generated prior to sampling the output of the second dynamic logic circuits, the first clock controlling at least the evaluation of the second dynamic logic circuits. The second and third clocks are generated to isolate the output node from inputs to the first dynamic logic circuit responsive to the scan mode signal indicating that scan is active.

Abstract: A conditional clock buffer circuit includes a clock output and is coupled to receive a clock input and a condition signal. The conditional clock buffer circuit includes a first circuit coupled to receive the clock input and a second circuit coupled to receive the clock input and the condition signal. The first circuit is configured to generate a first state on the clock output responsive to a first phase of the clock input. The second circuit is configured to conditionally generate a second state on the clock output responsive to the condition signal during a first portion of a second phase of the clock input. In one implementation, one or more of the conditional clock buffer circuits may be included in a clock tree. The clock tree may also include one or more levels of buffering.

Abstract: A first dynamic logic circuit has an output node on which a scan value is provided during scan, a second dynamic logic circuit, and one or more third dynamic logic circuits. The first dynamic logic circuit and the second dynamic logic circuit are in a first dynamic phase during functional operation. The third dynamic logic circuits are in a second dynamic phase during functional operation, and an output of the third dynamic circuits is sampled in response to the scan value during scan. In one embodiment, a first clock controls evaluation of the second dynamic logic circuit, and the second clock controls evaluation of the third dynamic logic circuits. The clocks may be generated responsive to a scan clock and/or a scan mode signal to generate at least one evaluate pulse on the first clock and the second clock prior to sampling the output of the third dynamic circuits.

Abstract: A scan interface for an integrated circuit includes a scan clock and a scan mode signal. The scan mode signal is indicative of whether or not scan is active, and may be used by dedicated scan circuitry in integrated circuit. Such circuitry may be inactive if the scan mode indicates that scan is inactive, and active if the scan mode indicates that scan is active. For example, the scan circuitry may not toggle is scan is inactive. The scan circuitry may present a reduced load to functional circuitry if scan is inactive. In some embodiments, static and dynamic scan circuits are included for use with static and dynamic logic circuits, respectively.

Abstract: An apparatus is disclosed which includes a converter circuit and a noise suppression circuit. The converter circuit has a dynamic logic input, and is configured to generate a static logic output on an output node responsive to the dynamic logic input. The noise suppression circuit is coupled to receive a clock signal and is coupled to the output node. Responsive to a first phase of the clock signal, a precharge of a dynamic logic circuit generating the dynamic logic input occurs. The noise suppression circuit is configured to actively drive the static logic output on the output node responsive to the first phase. In some embodiments, the noise suppression circuit may reduce the noise sensitivity of the static logic output during the precharge phase, and may not impede operation of the converter circuit during the evaluate phase.

Abstract: A high-speed bank select multiplexer latch may be coupled to a pair of differential output nodes and configured to capture and retain an output on the pair of differential output nodes responsive to two or more pairs of differential data inputs being active. A first subcircuit including a first N-channel transistor and a second N-channel transistor is configured to receive at least a first input signal and a second input signal and to drive a first output on a first output node responsive to either of the first input signal or the second input signal being active. Additionally, a second subcircuit including a third N-channel transistor and a fourth N-channel transistor is configured to receive at least a third input signal and a fourth input signal and to drive a second output on a second output node responsive to either of the third input signal or the fourth input signal being active.