Patents by Inventor Bryan J. Root
Bryan J. Root has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9024651Abstract: A test apparatus for testing a semiconductor device includes a circuit board having a contact pattern on one side and an opening therethrough, and a probe card supporting a probe needle array. The probe needle array is insertable into the opening of the circuit board and is configured to probe a device under test. The probe needle array is in electrical contact with the contact pattern of the circuit board, to allow signals through the probe card and circuit board to a test equipment. A holder supports the probe card and other probe cards. The holder has multiple sides, each of which is supportable of a probe card having a probe needle array. The holder is rotatable to manipulate and position the probe needle arrays of the probe cards relative to a device under test. The holder allows disconnection and replacement of the probe needle arrays from the holder.Type: GrantFiled: July 6, 2012Date of Patent: May 5, 2015Assignees: Celadon Systems, Inc., Intel CorporationInventors: Bryan J. Root, William A. Funk, Michael Palumbo, John L. Dunklee
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Patent number: 9018966Abstract: A probe apparatus has probe wires with a contact pattern on one side. The contact pattern is for contacting a respective contact pattern on another test equipment or component, such as a circuit board. The probe wires have tips that probe a device desired for testing. Signals are transmitted through the probe wires from the probe card, for example, through a circuit board to other diagnostic equipment. The contact of the probe card with the circuit board allows signals to be transferred through the probe wires to the other diagnostic equipment. On another side of the probe card is a connector structure. The connector structure includes a retainer that can allow the probe card to be replaced from a test system, such as allowing it to be connected and disconnected from a holder.Type: GrantFiled: July 6, 2012Date of Patent: April 28, 2015Assignee: Celadon Systems, Inc.Inventors: Bryan J. Root, William A. Funk, John L. Dunklee
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Patent number: 8994390Abstract: A probe apparatus has probe wires with a contact pattern on one side. The contact pattern is for contacting a respective contact pattern on another test equipment or component, such as a circuit board. The probe wires have tips that probe a device desired for testing. Signals are transmitted through the probe wires from the probe card, for example, through a circuit board to other diagnostic equipment. The contact of the probe card with the circuit board allows signals to be transferred through the probe wires to the other diagnostic equipment. On another side of the probe card is a connector structure. The connector structure includes a retainer that can allow the probe card to be replaced from a test system, such as allowing it to be connected and disconnected from a holder.Type: GrantFiled: July 6, 2012Date of Patent: March 31, 2015Assignee: Celadon Systems, Inc.Inventors: Bryan J. Root, William A. Funk, John L. Dunklee
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Publication number: 20150084662Abstract: A probe apparatus and method of terminating a probe that probes a semiconductor device with a signal cable from a tester site by site at a proximal end of the probe and a distal end of the signal cable. in one embodiment, the probe apparatus includes: a chassis; a dielectric block mounted in the chassis for retaining the probe, the probe extending on the chassis from a proximal end of the probe to the dielectric block, extending through the dielectric block, and projecting from the dielectric block towards the semiconductor device at a distal end of the probe; and a terminating apparatus, mounted in the chassis, for terminating the proximal end of the probe with a distal end of the signal cable side by side.Type: ApplicationFiled: October 2, 2014Publication date: March 26, 2015Inventors: Bryan J. Root, William A. Funk
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Patent number: 8860450Abstract: A probe apparatus and method of terminating a probe that probes a semiconductor device with a signal cable from a tester side by side at a proximal end of the probe and a distal end of the signal cable. In one embodiment, the probe apparatus includes: a chassis; a dielectric block mounted in the chassis for retaining the probe, the probe extending on the chassis from a proximal end of the probe to the dielectric block, extending through the dielectric block, and projecting from the dielectric block towards the semiconductor device at a distal end of the probe; and a terminating apparatus, mounted in the chassis, for terminating the proximal end of the probe with a distal end of the signal cable side by side.Type: GrantFiled: March 1, 2012Date of Patent: October 14, 2014Assignee: Celadon Systems, Inc.Inventors: Bryan J. Root, William A. Funk
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Publication number: 20140239996Abstract: A test apparatus for testing a semiconductor device includes a circuit board having a contact pattern on one side and an opening therethrough, and a probe card supporting a probe needle array. The probe needle array is insertable into the opening of the circuit board and is configured to probe a device under test. The probe needle array is in electrical contact with the contact pattern of the circuit board, to allow signals through the probe card and circuit board to a test equipment. A holder supports the probe card and other probe cards. The holder has multiple sides, each of which is supportable of a probe card having a probe needle array. The holder is rotatable to manipulate and position the probe needle arrays of the probe cards relative to a device under test. The holder allows disconnection and replacement of the probe needle arrays from the holder.Type: ApplicationFiled: July 6, 2012Publication date: August 28, 2014Applicants: INTEL CORPORATION, CELADON SYSTEMS, INC.Inventors: Bryan J. Root, William A. Funk, Michael Palumbo, John L. Dunklee
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Publication number: 20140225636Abstract: A probe apparatus has probe wires with a contact pattern on one side. The contact pattern is for contacting a respective contact pattern on another test equipment or component, such as a circuit board. The probe wires have tips that probe a device desired for testing. Signals are transmitted through the probe wires from the probe card, for example, through a circuit board to other diagnostic equipment. The contact of the probe card with the circuit board allows signals to be transferred through the probe wires to the other diagnostic equipment. On another side of the probe card is a connector structure. The connector structure includes a retainer that can allow the probe card to be replaced from a test system, such as allowing it to be connected and disconnected from a holder.Type: ApplicationFiled: July 6, 2012Publication date: August 14, 2014Applicant: CELADON SYSTEMS, INC.Inventors: Bryan J. Root, William A. Funk, John L. Dunklee
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Publication number: 20140210501Abstract: A probe apparatus has probe wires with a contact pattern on one side. The contact pattern is for contacting a respective contact pattern on another test equipment or component, such as a circuit board. The probe wires have tips that probe a device desired for testing. Signals are transmitted through the probe wires from the probe card, for example, through a circuit board to other diagnostic equipment. The contact of the probe card with the circuit board allows signals to be transferred through the probe wires to the other diagnostic equipment. On another side of the probe card is a connector structure. The connector structure includes a retainer that can allow the probe card to be replaced from a test system, such as allowing it to be connected and disconnected from a holder.Type: ApplicationFiled: July 6, 2012Publication date: July 31, 2014Applicant: CELADON SYSTEMS, INC.Inventors: Bryan J. Root, William A. Funk, John L. Dunklee
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Publication number: 20140139248Abstract: A probe core includes a frame, a wire guide connected to the frame, a probe tile, and a plurality of probe wires supported by the wire guide and probe tile. Each probe wire includes an end configured to probe a device, such as a semiconductor wafer. Each probe wire includes a signal transmitting portion and a guard portion. The probe core further includes a lock mechanism supported by the frame. The lock mechanism is configured to allow the probe core to be connected and disconnected to another test equipment or component, such as a circuit board. As one example, the probe core is configured to connect and disconnect from the test equipment or component in a rotatable lock and unlock operation or twist lock/unlock operation, where the frame is rotated relative to remainder of the core to lock/unlock the probe core.Type: ApplicationFiled: January 28, 2014Publication date: May 22, 2014Applicant: CELADON SYSTEMS, INC.Inventors: Bryan J. Root, William A. Funk
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Patent number: 8698515Abstract: A test apparatus is described that can be useful as test equipment in various applications, including for example testing a semiconductor device. The test apparatus has a circuit board, a probe card, and a card holder. The circuit board includes a contact layout that electrically connects with a probe card at one portion and electrically connects with a probe card holder at another portion. The probe card has probes for electrically contacting a device to be tested, and has a contact configuration that electrically connects with the circuit board. The apparatus allows for electrical signals to be sent to and from the probe card, through the probe card holder and circuit board, in testing a device such as for example a semiconductor device. The circuit board and probe card holder have an attachment structure, configured for example as a notch and catch finger attachment arrangement.Type: GrantFiled: August 16, 2011Date of Patent: April 15, 2014Assignee: Celadon Systems, Inc.Inventors: Bryan J. Root, William A. Funk
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Patent number: 8674715Abstract: A probe core includes a frame, a wire guide connected to the frame, a probe tile, and a plurality of probe wires supported by the wire guide and probe tile. Each probe wire includes an end configured to probe a device, such as a semiconductor wafer. Each probe wire includes a signal transmitting portion and a guard portion. The probe core further includes a lock mechanism supported by the frame. The lock mechanism is configured to allow the probe core to be connected and disconnected to another test equipment or component, such as a circuit board. As one example, the probe core is configured to connect and disconnect from the test equipment or component in a rotatable lock and unlock operation or twist lock/unlock operation, where the frame is rotated relative to remainder of the core to lock/unlock the probe core.Type: GrantFiled: January 20, 2011Date of Patent: March 18, 2014Assignee: Celadon Systems, Inc.Inventors: Bryan J. Root, William A. Funk
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Patent number: 8354856Abstract: A probe apparatus for probing a device on a semiconductor wafer to be tested by a testing equipment is provided. The probe apparatus includes a replaceable probe tile removably mounted in a probing location on a base plate. The probe tile is configured into a self-contained assembly which includes a chassis body containing a plurality of probes for probing devices on a wafer, a dielectric block for supporting the probes, and a wireguide for guiding a plurality of cables from the testing equipment into the chassis body. A wafer station having replaceable base plates and replaceable probe tiles are also provided.Type: GrantFiled: August 11, 2009Date of Patent: January 15, 2013Assignee: Celadon Systems, Inc.Inventors: Bryan J. Root, William A. Funk
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Publication number: 20120161804Abstract: A probe apparatus and method of terminating a probe that probes a semiconductor device with a signal cable from a tester side by side at a proximal end of the probe and a distal end of the signal cable. In one embodiment, the probe apparatus includes: a chassis; a dielectric block mounted in the chassis for retaining the probe, the probe extending on the chassis from a proximal end of the probe to the dielectric block, extending through the dielectric block, and projecting from the dielectric block towards the semiconductor device at a distal end of the probe; and a terminating apparatus, mounted in the chassis, for terminating the proximal end of the probe with a distal end of the signal cable side by side.Type: ApplicationFiled: March 1, 2012Publication date: June 28, 2012Applicant: CELADON SYSTEMS, INC.Inventors: Bryan J. Root, William A. Funk
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Patent number: 8149009Abstract: A probe apparatus and method of terminating a probe that probes a semiconductor device with a signal cable from a tester side by side at a proximal end of the probe and a distal end of the signal cable. In one embodiment, the probe apparatus includes: a chassis; a dielectric block mounted in the chassis for retaining the probe, the probe extending on the chassis from a proximal end of the probe to the dielectric block, extending through the dielectric block, and projecting from the dielectric block towards the semiconductor device at a distal end of the probe; and a terminating apparatus, mounted in the chassis, for terminating the proximal end of the probe with a distal end of the signal cable side by side.Type: GrantFiled: June 22, 2010Date of Patent: April 3, 2012Assignee: Celadon Systems, Inc.Inventors: Bryan J. Root, William A. Funk
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Publication number: 20120038380Abstract: A test apparatus is described that can be useful as test equipment in various applications, including for example testing a semiconductor device. The test apparatus has a circuit board, a probe card, and a card holder. The circuit board includes a contact layout that electrically connects with a probe card at one portion and electrically connects with a probe card holder at another portion. The probe card has probes for electrically contacting a device to be tested, and has a contact configuration that electrically connects with the circuit board. The apparatus allows for electrical signals to be sent to and from the probe card, through the probe card holder and circuit board, in testing a device such as for example a semiconductor device. The circuit board and probe card holder have an attachment structure, configured for example as a notch and catch finger attachment arrangement.Type: ApplicationFiled: August 16, 2011Publication date: February 16, 2012Applicant: CELADON SYSTEMS, INC.Inventors: Bryan J. Root, William A. Funk
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Patent number: 8082842Abstract: An offset printing apparatus for transferring a phase change ink onto a print medium, which includes a) a phase change ink component for applying a phase change ink in a phase change ink image; b) an imaging member for accepting the phase change ink image from the phase change ink component, and transferring the phase change ink image from the imaging member to the print medium, the imaging member having i) an imaging substrate, and thereover ii) an optional outer layer; and iii) iii) a release agent material coating, wherein the release agent material coating includes a perfluorinated polyether having a skeleton selected from the group consisting of Formulas I and II and mixtures thereof: CF3—(CF2CF2)m—O—(R1R2O)—(R3R3O)n—(R3O)p—(CF2)q—CF3??Formula I and R1—(CF2CF2)m—O—(R2R2O)n—(R2O)p—(CF2)q—CF3—R1??Formula II.Type: GrantFiled: May 31, 2006Date of Patent: December 27, 2011Assignee: Xerox CorporationInventors: David J. Gervasi, Bryan J. Root, Santokh S Badesha
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Publication number: 20110204912Abstract: A probe core includes a frame, a wire guide connected to the frame, a probe tile, and a plurality of probe wires supported by the wire guide and probe tile. Each probe wire includes an end configured to probe a device, such as a semiconductor wafer. Each probe wire includes a signal transmitting portion and a guard portion. The probe core further includes a lock mechanism supported by the frame. The lock mechanism is configured to allow the probe core to be connected and disconnected to another test equipment or component, such as a circuit board. As one example, the probe core is configured to connect and disconnect from the test equipment or component in a rotatable lock and unlock operation or twist lock/unlock operation, where the frame is rotated relative to remainder of the core to lock/unlock the probe core.Type: ApplicationFiled: January 20, 2011Publication date: August 25, 2011Applicant: CELADON SYSTEMS, INC.Inventors: Bryan J. Root, William A. Funk
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Patent number: D654033Type: GrantFiled: January 20, 2010Date of Patent: February 14, 2012Assignee: Celadon Systems, Inc.Inventors: Bryan J. Root, William A. Funk
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Patent number: D713363Type: GrantFiled: December 31, 2013Date of Patent: September 16, 2014Assignee: Celadon Systems, Inc.Inventors: William A. Funk, Dennis Flanders, John L. Dunklee, Bryan J. Root
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Patent number: D722031Type: GrantFiled: December 31, 2013Date of Patent: February 3, 2015Assignee: Celadon Systems, Inc.Inventors: John L. Dunklee, William A. Funk, Matthew Page, Dennis Flanders, Bryan J. Root