Patents by Inventor Bryan J. Root
Bryan J. Root has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7999564Abstract: A probe apparatus is provided with a plurality of probe tiles, an interchangeable plate for receiving the probe tiles, a floating plate being disposed between the respective probe tile and a receiving hole on the interchangeable plate, and a control mechanism providing multi-dimensional freedom of motions to control a position of the probe tile relative to the respective receiving hole of the interchangeable plate. A method of controlling the floating plate is also provided by inserting a pair of joysticks into two respective adjustment holes disposed on the floating plate and moving the pair of joysticks to provide translational motions (X-Y) and rotational (theta) motion of the floating plate, and turning the pair of jack screws clockwise and counter-clockwise to provide a translational motion (Z) and two rotational (pitch and roll) motions of the floating plate.Type: GrantFiled: April 19, 2010Date of Patent: August 16, 2011Assignee: Celadon Systems, Inc.Inventors: Bryan J. Root, William A. Funk
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Patent number: 7956629Abstract: A tile used to hold one or more probes for testing a semiconductor wafer is disclosed. The tile has one or more sites for inserting one or more probes to test the semiconductor wafer. Each site has one or more holes. Each hole is coupled with a slot forming an angle. A probe is inserted into the tile from a top of the tile through the hole and seated on the slot. The probe has a probe tip. The probe top is in contact with the semiconductor wafer at one end of the slot at a bottom of the tile. The probe tip is aligned with an X and Y coordinate of a bond pad on the semiconductor wafer.Type: GrantFiled: July 22, 2010Date of Patent: June 7, 2011Assignee: Celadon Systems, Inc.Inventor: Bryan J. Root
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Publication number: 20100283494Abstract: A tile used to hold one or more probes for testing a semiconductor wafer is disclosed. The tile has one or more sites for inserting one or more probes to test the semiconductor wafer. Each site has one or more holes. Each hole is coupled with a slot forming an angle. A probe is inserted into the tile from a top of the tile through the hole and seated on the slot. The probe has a probe tip. The probe top is in contact with the semiconductor wafer at one end of the slot at a bottom of the tile. The probe tip is aligned with an X and Y coordinate of a bond pad on the semiconductor wafer.Type: ApplicationFiled: July 22, 2010Publication date: November 11, 2010Applicant: CELADON SYSTEMS, INC.Inventor: Bryan J. Root
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Publication number: 20100259288Abstract: A probe apparatus and method of terminating a probe that probes a semiconductor device with a signal cable from a tester side by side at a proximal end of the probe and a distal end of the signal cable. In one embodiment, the probe apparatus includes: a chassis; a dielectric block mounted in the chassis for retaining the probe, the probe extending on the chassis from a proximal end of the probe to the dielectric block, extending through the dielectric block, and projecting from the dielectric block towards the semiconductor device at a distal end of the probe; and a terminating apparatus, mounted in the chassis, for terminating the proximal end of the probe with a distal end of the signal cable side by side.Type: ApplicationFiled: June 22, 2010Publication date: October 14, 2010Applicant: CELADON SYSTEMS, INC.Inventors: Bryan J. Root, William A. Funk
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Patent number: 7786743Abstract: A tile used to hold one or more probes for testing a semiconductor wafer is disclosed. The tile has one or more sites for inserting one or more probes to test the semiconductor wafer. Each site has one or more holes. Each hole is coupled with a slot forming an angle. A probe is inserted into the tile from a top of the tile through the hole and seated on the slot. The probe has a probe tip. The probe top is in contact with the semiconductor wafer at one end of the slot at a bottom of the tile. The probe tip is aligned with an X and Y coordinate of a bond pad on the semiconductor wafer.Type: GrantFiled: October 30, 2007Date of Patent: August 31, 2010Assignee: Celadon Systems, Inc.Inventor: Bryan J. Root
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Publication number: 20100203758Abstract: A probe apparatus is provided with a plurality of probe tiles, an interchangeable plate for receiving the probe tiles, a floating plate being disposed between the respective probe tile and a receiving hole on the interchangeable plate, and a control mechanism providing multi-dimensional freedom of motions to control a position of the probe tile relative to the respective receiving hole of the interchangeable plate. A method of controlling the floating plate is also provided by inserting a pair of joysticks into two respective adjustment holes disposed on the floating plate and moving the pair of joysticks to provide translational motions (X-Y) and rotational (theta) motion of the floating plate, and turning the pair of jack screws clockwise and counter-clockwise to provide a translational motion (Z) and two rotational (pitch and roll) motions of the floating plate.Type: ApplicationFiled: April 19, 2010Publication date: August 12, 2010Applicant: CELADON SYSTEMS, INC.Inventors: Bryan J. Root, William A. Funk
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Patent number: 7768282Abstract: A probe apparatus and method of terminating a probe that probes a semiconductor device with a signal cable from a tester side by side at a proximal end of the probe and a distal end of the signal cable. In one embodiment, the probe apparatus includes: a chassis; a dielectric block mounted in the chassis for retaining the probe, the probe extending on the chassis from a proximal end of the probe to the dielectric block, extending through the dielectric block, and projecting from the dielectric block towards the semiconductor device at a distal end of the probe; and a terminating apparatus, mounted in the chassis, for terminating the proximal end of the probe with a distal end of the signal cable side by side.Type: GrantFiled: February 17, 2009Date of Patent: August 3, 2010Assignee: Celadon Systems, Inc.Inventors: Bryan J. Root, William A. Funk
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Patent number: 7728609Abstract: A probe apparatus is provided with a plurality of probe tiles, an interchangeable plate for receiving the probe tiles, a floating plate being disposed between the respective probe tile and a receiving hole on the interchangeable plate, and a control mechanism providing multi-dimensional freedom of motions to control a position of the probe tile relative to the respective receiving hole of the interchangeable plate. A method of controlling the floating plate is also provided by inserting a pair of joysticks into two respective adjustment holes disposed on the floating plate and moving the pair of joysticks to provide translational motions (X-Y) and rotational (theta) motion of the floating plate, and turning the pair of jack screws clockwise and counter-clockwise to provide a translational motion (Z) and two rotational (pitch and roll) motions of the floating plate.Type: GrantFiled: May 23, 2008Date of Patent: June 1, 2010Assignee: Celadon Systems, Inc.Inventors: Bryan J. Root, William A. Funk
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Patent number: 7659737Abstract: A probe needle apparatus and method provides a drive guard having the same potential as a probe needle for reducing signal noise in low current measurements. The probe needle apparatus includes a central conductive core covered with alternating layers of dielectric and conductive materials, a first layer of dielectric material applied to maintain electrical access to the conductive central core while providing continuous isolation of the conductive central core elsewhere, and a conductive drive guard layer applied around the first layer of dielectric material in electrical isolation from the conductive central core.Type: GrantFiled: August 9, 2007Date of Patent: February 9, 2010Assignee: Celadon Systems, Inc.Inventors: Bryan J. Root, William A. Funk
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Publication number: 20090295416Abstract: A probe apparatus for probing a device on a semiconductor wafer to be tested by a testing equipment is provided. The probe apparatus includes a replaceable probe tile removably mounted in a probing location on a base plate. The probe tile is configured into a self-contained assembly which includes a chassis body containing a plurality of probes for probing devices on a wafer, a dielectric block for supporting the probes, and a wireguide for guiding a plurality of cables from the testing equipment into the chassis body. A wafer station having replaceable base plates and replaceable probe tiles are also provided.Type: ApplicationFiled: August 11, 2009Publication date: December 3, 2009Applicant: Celadon Systems, Inc.Inventors: Bryan J. Root, William A. Funk
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Patent number: 7626404Abstract: A probe apparatus for probing a device on a semiconductor wafer to be tested by a testing equipment is provided. The probe apparatus includes a replaceable probe tile removably mounted in a probing location on a base plate. The probe tile is configured into a self-contained assembly which includes a chassis body containing a plurality of probes for probing devices on a wafer, a dielectric block for supporting the probes, and a wireguide for guiding a plurality of cables from the testing equipment into the chassis body. A wafer station having replaceable base plates and replaceable probe tiles are also provided.Type: GrantFiled: August 31, 2005Date of Patent: December 1, 2009Assignee: Celadon Systems, Inc.Inventors: Bryan J. Root, William A. Funk
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Publication number: 20090153166Abstract: A probe apparatus and method of terminating a probe that probes a semiconductor device with a signal cable from a tester side by side at a proximal end of the probe and a distal end of the signal cable. In one embodiment, the probe apparatus includes: a chassis; a dielectric block mounted in the chassis for retaining the probe, the probe extending on the chassis from a proximal end of the probe to the dielectric block, extending through the dielectric block, and projecting from the dielectric block towards the semiconductor device at a distal end of the probe; and a terminating apparatus, mounted in the chassis, for terminating the proximal end of the probe with a distal end of the signal cable side by side.Type: ApplicationFiled: February 17, 2009Publication date: June 18, 2009Inventors: Bryan J. Root, William A. Funk
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Patent number: 7545157Abstract: A shielded probe apparatus is provided with a shielded probe and a tri-axial cable that are electrically connected within a shielded chassis. The shielded probe apparatus is capable of electrically testing a semiconductor device at a sub 100 fA operating current and an operating temperature up to 300 C.Type: GrantFiled: July 18, 2007Date of Patent: June 9, 2009Assignee: Celadon Systems, Inc.Inventors: Bryan J. Root, William A. Funk
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Publication number: 20090096472Abstract: A probe apparatus is provided with a plurality of probe tiles, an interchangeable plate for receiving the probe tiles, a floating plate being disposed between the respective probe tile and a receiving hole on the interchangeable plate, and a control mechanism providing multi-dimensional freedom of motions to control a position of the probe tile relative to the respective receiving hole of the interchangeable plate. A method of controlling the floating plate is also provided by inserting a pair of joysticks into two respective adjustment holes disposed on the floating plate and moving the pair of joysticks to provide translational motions (X-Y) and rotational (theta) motion of the floating plate, and turning the pair of jack screws clockwise and counter-clockwise to provide a translational motion (Z) and two rotational (pitch and roll) motions of the floating plate.Type: ApplicationFiled: May 23, 2008Publication date: April 16, 2009Inventors: Bryan J. Root, William A. Funk
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Publication number: 20080204059Abstract: A tile used to hold one or more probes for testing a semiconductor wafer is disclosed. The tile has one or more sites for inserting one or more probes to test the semiconductor wafer. Each site has one or more holes. Each hole is coupled with a slot forming an angle. A probe is inserted into the tile from a top of the tile through the hole and seated on the slot. The probe has a probe tip. The probe top is in contact with the semiconductor wafer at one end of the slot at a bottom of the tile. The probe tip is aligned with an X and Y coordinate of a bond pad on the semiconductor wafer.Type: ApplicationFiled: October 30, 2007Publication date: August 28, 2008Inventor: Bryan J. Root
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Patent number: 7345494Abstract: A tile used to hold one or more probes for testing a semiconductor wafer. The tile has one or more sites for inserting one or more probes to test the semiconductor wafer. Each site has one or more holes. Each hole is coupled with a slot forming an angle. A probe is inserted into the tile from a top of the tile through the hole and seated on the slot. The probe has a probe tip. The probe tip is in contact with the semiconductor wafer at one end of the slot at a bottom of the tile. The probe tip is aligned with an X and Y coordinates of a bond pad on the semiconductor wafer.Type: GrantFiled: July 11, 2006Date of Patent: March 18, 2008Assignee: Celadon Systems, Inc.Inventor: Bryan J. Root
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Publication number: 20070277690Abstract: An offset printing apparatus for transferring a phase change ink onto a print medium, which includes a) a phase change ink component for applying a phase change ink in a phase change ink image; b) an imaging member for accepting the phase change ink image from the phase change ink component, and transferring the phase change ink image from the imaging member to the print medium, the imaging member having i) an imaging substrate, and thereover ii) an optional outer layer; and iii) iii) a release agent material coating, wherein the release agent material coating includes a perfluorinated polyether having a skeleton selected from the group consisting of Formulas I and II and mixtures thereof: CF3—(CF2CF2)m—O—(R1R2O)—(R3R3O)n—(R3O)p—(CF2)q—CF3Formula I wherein R1 is selected from the group consisting of CF2, CF—CF3 and —NR4R5; R2 is selected from the group consisting of CF2, CF—CF3, and —NR4R5; R3 is selected from the group consisting of CF2 and CF3; R4 is selected from the group consisting of hydrogen, alkylType: ApplicationFiled: May 31, 2006Publication date: December 6, 2007Inventors: David J. Gervasi, Bryan J. Root, Santokh S. Badesha
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Patent number: 7271607Abstract: A probe needle apparatus and method provides a drive guard having the same potential as a probe needle for reducing signal noise in low current measurements. The probe needle apparatus includes a conductive central core covered with alternating layers of dielectric and conductive materials, a first layer of dielectric material applied to maintain electrical access to the conductive central core while providing continuous isolation of the conductive central core elsewhere, and a conductive driven guard layer applied around the first layer of dielectric material in electrical isolation from the conductive central core.Type: GrantFiled: October 3, 2005Date of Patent: September 18, 2007Assignee: Celadon Systems, Inc.Inventors: Bryan J. Root, William A. Funk
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Patent number: D639755Type: GrantFiled: January 20, 2010Date of Patent: June 14, 2011Assignee: Celadon Systems, Inc.Inventors: Bryan J. Root, William A. Funk
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Patent number: D639757Type: GrantFiled: August 16, 2010Date of Patent: June 14, 2011Assignee: Celadon Systems, Inc.Inventors: Bryan J. Root, William A. Funk