Abstract: Accumulators for reducing frequency of samples and related apparatuses, systems, and methods are disclosed. An apparatus includes a first accumulator and a second accumulator. The first accumulator provides a first total. The first total corresponds to a sum of a current sample value of an input signal and a previous value of the first total. The second accumulator provides a second total. The second total corresponds to a sum of the first total and a previous value of the second total.

Abstract: An integrated circuit has a master processing core with a central processing unit coupled with a non-volatile memory and a slave processing core operating independently from the master processing core and having a central processing unit coupled with volatile program memory, wherein the master central processing unit is configured to transfer program instructions into the non-volatile memory of the slave processing core and wherein a transfer of the program instructions is performed by executing a dedicated instruction within the central processing unit of the master processing core.

Abstract: A temperature-compensating clock frequency monitor circuit may be provided to detect a clock pulse frequency in an electronic device that may cause erratic or dangerous operation of the device, as a function of an operating temperature of the device. The temperature-compensating clock frequency monitor circuit include a temperature sensor configured to measure a temperature associated with an electronic device, a clock having an operating frequency, and a frequency monitoring system. The frequency monitoring system may be configured to determine the operating frequency of the clock, and based at least on (a) the operating frequency of the clock and (b) the measured temperature associated with the electronic device, generate a corrective action signal to initiate a corrective action associated with the electronic device or a related device. The temperature sensor, clock, and frequency monitoring system may, for example, be provided on a microcontroller.

Abstract: An analog to digital converter (ADC) includes voltage inputs, a transconductor configured to convert the voltage inputs into currents, current-controlled oscillators, a counter, and digital logic. The current-controlled oscillators propagate respect currents from the transconductor. The counter is configured to count repeated traversal of one or more oscillators. The digital logic is configured to, based upon results from the counter, provide a code configured to indicate a value of associated voltage input.

Abstract: A clock monitor includes a test clock input, as a reference clock input, another clock input, a measurement circuit, and control logic. The measurement circuit generates a measurement of a frequency or a duty cycle of the test clock input using the reference clock input, which is compared to a threshold. The control logic determines whether the measurement exceeded the threshold and, based on the measurement exceeding the threshold, cause generation of another measurement of a frequency or a duty cycle using the third clock input in combination with the first clock input or the reference clock input. The control logic may determine whether the other measurement exceeded a threshold and, based on such a determination, further determine that the test clock input or the reference clock input are faulty.

Abstract: An integrated circuit has a master processing core with a central processing unit coupled with a non-volatile memory and a slave processing core operating independently from the master processing core and having a central processing unit coupled with volatile program memory, wherein the master central processing unit is configured to transfer program instructions into the non-volatile memory of the slave processing core and wherein a transfer of the program instructions is performed by executing a dedicated instruction within the central processing unit of the master processing core.

Abstract: An analog to digital converter (ADC) includes voltage inputs, a transconductor configured to convert the voltage inputs into currents, current-controlled oscillators, a counter, and digital logic. The current-controlled oscillators propagate respect currents from the transconductor. The counter is configured to count repeated traversal of one or more oscillators. The digital logic is configured to, based upon results from the counter, provide a code configured to indicate a value of associated voltage input.

Abstract: Embodiments of the present disclosure include a microcontroller with a processor core, memory, and a plurality of peripheral devices including a differential digital delay line analog-to-digital converter (ADC). The ADC includes differential digital delay lines and circuit comprising a set of delay elements included in the differential digital delay lines configured to generate data representing an analog to digital conversion of an input. The microcontroller also includes a digital comparator coupled with an output of the ADC and an associated register, wherein at least one output of the digital comparator is configured to directly control another peripheral of the plurality of peripherals.

Abstract: An integrated circuit has a master processing core with a central processing unit coupled with a non-volatile memory and a slave processing core operating independently from the master processing core and having a central processing unit coupled with volatile program memory, wherein the master central processing unit is configured to transfer program instructions into the non-volatile memory of the slave processing core and wherein a transfer of the program instructions is performed by executing a dedicated instruction within the central processing unit of the master processing core.

Abstract: A clock monitor includes a test clock input, as a reference clock input, another clock input, a measurement circuit, and control logic. The measurement circuit generates a measurement of a frequency or a duty cycle of the test clock input using the reference clock input, which is compared to a threshold. The control logic determines whether the measurement exceeded the threshold and, based on the measurement exceeding the threshold, cause generation of another measurement of a frequency or a duty cycle using the third clock input in combination with the first clock input or the reference clock input. The control logic may determine whether the other measurement exceeded a threshold and, based on such a determination, further determine that the test clock input or the reference clock input are faulty.

Abstract: A temperature-compensating clock frequency monitor circuit may be provided to detect a clock pulse frequency in an electronic device that may cause erratic or dangerous operation of the device, as a function of an operating temperature of the device. The temperature-compensating clock frequency monitor circuit include a temperature sensor configured to measure a temperature associated with an electronic device, a clock having an operating frequency, and a frequency monitoring system. The frequency monitoring system may be configured to determine the operating frequency of the clock, and based at least on (a) the operating frequency of the clock and (b) the measured temperature associated with the electronic device, generate a corrective action signal to initiate a corrective action associated with the electronic device or a related device. The temperature sensor, clock, and frequency monitoring system may, for example, be provided on a microcontroller.

Abstract: An integrated circuit amplifier configurable to be either a programmable gain amplifier or an operational amplifier comprises two output blocks, one output block is optimized for programmable gain amplifier operation, and the other output block is optimized for operational amplifier applications. A common single input stage, input offset calibration and bias generation circuits are used with either amplifier configuration. Thus duplication of the input stage, offset calibration and bias generation circuits are eliminated while still selectably providing for either a programmable gain amplifier or operational amplifier configuration.

Abstract: A differential digital delay line analog-to-digital converter (ADC) includes differential digital delay lines, a circuit including a set of delay elements included in the differential digital delay lines, and another circuit including another set of delay elements included in the differential digital delay lines. The first circuit is configured to generate data representing an analog to digital conversion of an input. The second circuit is configured to calibrate a source to the differential digital delay lines.

Abstract: A single chip microcontroller has a master core and at least one slave core. The master core is clocked by a master system clock and the slave core is clocked by a slave system clock and wherein each core is associated with a plurality of peripheral devices to form a master microcontroller and a slave microcontroller, respectively. A communication interface is provided between the master microcontroller and the slave microcontroller, wherein the communication interface has a plurality of configurable directional data registers coupled with a flow control logic which is configurable to assign a direction to each of the plurality of configurable data registers.

Abstract: Embodiments of the present disclosure include a differential digital delay line analog-to-digital converter (ADC), comprising differential digital delay lines including series coupled delay cells, wherein a delay time of a first delay line is controlled by a first input of the ADC and a delay time of a second delay line is controlled by a second input of the ADC. The ADC includes a pair of bypass multiplexers coupled at a predefined node location in the series coupled delay cells, latches each coupled with the series coupled delay cells, a converter circuit coupled with the plurality of latches configured to convert data from the latches into an output value of the ADC, and logic circuits configured to select data from the series coupled delay cells to the latches depending on a selected resolution of the differential digital delay line analog-to-digital converter.

Abstract: In a debugging method for an integrated circuit device which has multiple processing cores, a debugging breakpoint is activated at a first processor core in the integrated circuit device. Upon activation, the debugging breakpoint stops execution of instructions in the first processor core and the debugging breakpoint is communicated to a second processor core in the integrated circuit device.

Abstract: Embodiments of the present disclosure include a microcontroller with a processor, memory, and peripheral devices including a differential digital delay line analog-to-digital converter (ADC). The ADC includes differential digital delay lines, a circuit including a set of delay elements included in the differential digital delay lines, and another circuit including another set of delay elements included in the differential digital delay lines. The first circuit is configured to generate data representing an analog to digital conversion of an input. The second circuit is configured to calibrate a source to the differential digital delay lines.

Abstract: Embodiments of the present disclosure include a differential digital delay line analog-to-digital converter (ADC). The ADC includes differential digital delay lines, a circuit including a set of delay elements included in the differential digital delay lines, and another circuit including another set of delay elements included in the differential digital delay lines. The first circuit is configured to generate data representing an analog to digital conversion of an input. The second circuit is configured to calibrate a source to the differential digital delay lines.

Abstract: Embodiments of the present disclosure may include an ADC circuit including channel register sets, a conversion request flip-flop, a priority encoder circuit, and a controller circuit. The controller circuit may be configured to receive a conversion request signal, latch the conversion request signal into the conversion request flip-flop, determine by the priority encoder circuit a highest priority pending conversion request, and output an active channel identifier code. The channel identifier code may be configured to select the data channel register sets that are active by identifying received selection bits. The embodiments may include logic to store a converted value from a selected analog input to a data output register based on the channel identifier code.

Abstract: The average of a complex waveform measured over a time period may be determined by first converting the complex waveform to a voltage, then converting this voltage to a current and using this current to charge a capacitor. At the end of the measurement time period the voltage charge (sample voltage) on the capacitor may be sampled by a sample and hold circuit associated with an analog-to-digital converter (ADC). Then the voltage charge on the sample capacitor may be removed, e.g., capacitor plates shorted by a dump switch in preparation for the next average of the complex waveform sample measurement cycle. The ADC then converts this sampled voltage charge to a digital representation thereof and a true average of the complex waveform may be determined, e.g., calculated therefrom in combination with the measurement time period.