Abstract: Embodiments of the present disclosure include a differential digital delay line analog-to-digital converter (ADC), comprising differential digital delay lines including series coupled delay cells, wherein a delay time of a first delay line is controlled by a first input of the ADC and a delay time of a second delay line is controlled by a second input of the ADC. The ADC includes a pair of bypass multiplexers coupled at a predefined node location in the series coupled delay cells, latches each coupled with the series coupled delay cells, a converter circuit coupled with the plurality of latches configured to convert data from the latches into an output value of the ADC, and logic circuits configured to select data from the series coupled delay cells to the latches depending on a selected resolution of the differential digital delay line analog-to-digital converter.

Abstract: Embodiments of the present disclosure include a microcontroller with a processor core, memory, and a plurality of peripheral devices including a differential digital delay line analog-to-digital converter (ADC). The ADC includes differential digital delay lines and circuit comprising a set of delay elements included in the differential digital delay lines configured to generate data representing an analog to digital conversion of an input. The microcontroller also includes a digital comparator coupled with an output of the ADC and an associated register, wherein at least one output of the digital comparator is configured to directly control another peripheral of the plurality of peripherals.

Abstract: Embodiments of the present disclosure include voltage comparators. The voltage comparators may include a first input configured to receive a first analog voltage, a second input configured to receive a second analog voltage, a first digital delay line configured to propagate the first analog voltage through a first delay circuit and the second analog voltage through a second circuit, and an output circuit configured to provide a comparator output based upon whether values representing the first analog voltage or the second analog voltage propagated faster through the first digital delay line. The comparator output may be configured to identify whether the first analog voltage or the second analog voltage is greater.

Abstract: A microcontroller device has a housing with a plurality of external pins having a plurality of input/output pins, a first microcontroller with a first central processing unit (CPU), a first system bus coupled with the first CPU, first memory coupled with the first system bus, and a first plurality of peripheral devices coupled with the first system bus, a second microcontroller with a second central processing unit (CPU), a second system bus coupled with the second CPU, second memory coupled with the second system bus, and a second plurality of peripheral devices coupled with the second system bus, and a pad ownership multiplexer unit being controllable to assign control of the input/output pins to either the first microcontroller or the second microcontroller, wherein the number of external pins is less than the sum of a data buswidth of the first and second microcontroller.

Abstract: Using a combination of frequency dithering of a PWM counter and a variable time delay circuit yields improved PWM frequency resolution with realizable circuit components and clock operating frequencies. A controllable time delay circuit lengthens a PWM signal during the first PWM cycle. During the second PWM cycle, the PWM period is increased beyond the desired amount, but the delay is reduced during this second PWM cycle to achieve the correct (desired) PWM signal period. The dithering of the PWM signal period enables the time delay circuit to be “reset” so that an infinite delay circuit is not required. The time delay circuit provides short term (one cycle) frequency adjustment so that the resulting PWM cycle is not dithered and has a period at the desired frequency resolution.

Abstract: A microcontroller device has a housing with a plurality of external pins a first microcontroller with a first central processing unit (CPU), a first system bus coupled with the first CPU, first memory coupled with the first system bus, and a first plurality of peripheral devices coupled with the first system bus, and a second microcontroller with a second central processing unit (CPU), a second system bus coupled with the second CPU, second memory coupled with the second system bus, and a second plurality of peripheral devices coupled with the second system bus, wherein first and second microcontroller communicate only via a dedicated interface.

Abstract: An analog-to-digital converter includes differential digital delay lines, a circuit including a set of delay elements included in the differential digital delay lines, and another circuit including another set of delay elements included in the differential digital delay lines. The first circuit is configured to generate data representing an analog to digital conversion of an input. The second circuit is configured to calibrate a source to the differential digital delay lines.

Abstract: Embodiments of the present disclosure include a differential digital delay line analog-to-digital converter (ADC), comprising differential digital delay lines including series coupled delay cells, wherein a delay time of a first delay line is controlled by a first input of the ADC and a delay time of a second delay line is controlled by a second input of the ADC. The ADC includes a pair of bypass multiplexers coupled at a predefined node location in the series coupled delay cells, latches each coupled with the series coupled delay cells, a converter circuit coupled with the plurality of latches configured to convert data from the latches into an output value of the ADC, and logic circuits configured to select data from the series coupled delay cells to the latches depending on a selected resolution of the differential digital delay line analog-to-digital converter.

Abstract: An embedded device has a plurality of processor cores, each with a plurality of peripheral devices, wherein each peripheral device has an output. Furthermore, a housing with a plurality of assignable external pins and a protected pin ownership logic for each assignable external pin is provided and configured to be programmable to assign an output function of an associated assignable external pin to only one of the plurality of processor cores.

Abstract: An embedded device has a plurality of processor cores, each with a plurality of peripheral devices, wherein each peripheral device may have an output, a housing with a plurality of assignable external pins, and a plurality of peripheral pin selection modules for each processing core, wherein each peripheral pin selection module is configured to be programmable to assign an assignable external pin to one of the plurality of peripheral devices of one of the processor cores.

Abstract: Embodiments of the present disclosure include a microcontroller with a processor core, memory, and a plurality of peripheral devices including a differential digital delay line analog-to-digital converter (ADC). The ADC includes differential digital delay lines and circuit comprising a set of delay elements included in the differential digital delay lines configured to generate data representing an analog to digital conversion of an input. The microcontroller also includes a digital comparator coupled with an output of the ADC and an associated register, wherein at least one output of the digital comparator is configured to directly control another peripheral of the plurality of peripherals.

Abstract: Embodiments of the present disclosure may include an ADC circuit including channel register sets, a conversion request flip-flop, a priority encoder circuit, and a controller circuit. The controller circuit may be configured to receive a conversion request signal, latch the conversion request signal into the conversion request flip-flop, determine by the priority encoder circuit a highest priority pending conversion request, and output an active channel identifier code. The channel identifier code may be configured to select the data channel register sets that are active by identifying received selection bits. The embodiments may include logic to store a converted value from a selected analog input to a data output register based on the channel identifier code.

Abstract: An integrated circuit amplifier configurable to be either a programmable gain amplifier or an operational amplifier comprises two output blocks, one output block is optimized for programmable gain amplifier operation, and the other output block is optimized for operational amplifier applications. A common single input stage, input offset calibration and bias generation circuits are used with either amplifier configuration. Thus duplication of the input stage, offset calibration and bias generation circuits are eliminated while still selectably providing for either a programmable gain amplifier or operational amplifier configuration.

Abstract: Embodiments of the present disclosure include voltage comparators. The voltage comparators may include a first input configured to receive a first analog voltage, a second input configured to receive a second analog voltage, a first digital delay line configured to propagate the first analog voltage through a first delay circuit and the second analog voltage through a second circuit, and an output circuit configured to provide a comparator output based upon whether values representing the first analog voltage or the second analog voltage propagated faster through the first digital delay line. The comparator output may be configured to identify whether the first analog voltage or the second analog voltage is greater.

Abstract: Embodiments of the present disclosure include a differential digital delay line analog-to-digital converter (ADC). The ADC includes differential digital delay lines, a circuit including a set of delay elements included in the differential digital delay lines, and another circuit including another set of delay elements included in the differential digital delay lines. The first circuit is configured to generate data representing an analog to digital conversion of an input. The second circuit is configured to calibrate a source to the differential digital delay lines.

Abstract: An integrated circuit having a plurality of selectable modes, functions and/or characteristics may be configured at the time of product manufacture by providing an appropriate resistance value pull-up resistor at an external connection (pin) of the integrated circuit package. At least one external connection (pin) may be used for such configuration of the integrated circuit. This is done without having to program the integrated circuit before placing on the product printed circuit board. The same integrated circuit may thus be used for a plurality of different products without requiring any pre-programming thereof. The integrated circuit's personality (desired characteristics) will be programmed automatically as soon as power is first applied to the finished product printed circuit board. Once the integrated circuit has been configured at power up, the external at least one connection (pin), initially used for configuration, can be used for either analog or digital input, output or input/output.

Abstract: Embodiments of the present disclosure include a differential digital delay line analog-to-digital converter (ADC), comprising differential digital delay lines including series coupled delay cells, wherein a delay time of a first delay line is controlled by a first input of the ADC and a delay time of a second delay line is controlled by a second input of the ADC. The ADC includes a pair of bypass multiplexers coupled at a predefined node location in the series coupled delay cells, latches each coupled with the series coupled delay cells, a converter circuit coupled with the plurality of latches configured to convert data from the latches into an output value of the ADC, and logic circuits configured to select data from the series coupled delay cells to the latches depending on a selected resolution of the differential digital delay line analog-to-digital converter.

Abstract: Embodiments of the present disclosure include a microcontroller with a processor core, memory, and a plurality of peripheral devices including a differential digital delay line analog-to-digital converter (ADC). The ADC includes differential digital delay lines and circuit comprising a set of delay elements included in the differential digital delay lines configured to generate data representing an analog to digital conversion of an input. The microcontroller also includes a digital comparator coupled with an output of the ADC and an associated register, wherein at least one output of the digital comparator is configured to directly control another peripheral of the plurality of peripherals.

Abstract: Embodiments of the present disclosure include a microcontroller with a processor, memory, and peripheral devices including a differential digital delay line analog-to-digital converter (ADC). The ADC includes differential digital delay lines, a circuit including a set of delay elements included in the differential digital delay lines, and another circuit including another set of delay elements included in the differential digital delay lines. The first circuit is configured to generate data representing an analog to digital conversion of an input. The second circuit is configured to calibrate a source to the differential digital delay lines.

Abstract: An integrated circuit amplifier configurable to be either a programmable gain amplifier or an operational amplifier comprises two output blocks, one output block is optimized for programmable gain amplifier operation, and the other output block is optimized for operational amplifier applications. A common single input stage, input offset calibration and bias generation circuits are used with either amplifier configuration. Thus duplication of the input stage, offset calibration and bias generation circuits are eliminated while still selectably providing for either a programmable gain amplifier or operational amplifier configuration.