Abstract: An interface element connected to a device and a security die-chip are fabricated in a single package. The security die-chip may provide a security authentication function to the interface element that does not have the security authentication function. The security die-chip may include a physically unclonable function (PUF) to provide a private key, and a hardware security module to perform encryption and decryption using the private key.

Abstract: Provided is an information processing apparatus including a physical unclonable function (PUF) to generate a unique key using a process variation in a semiconductor manufacturing process, and an encryption unit to encrypt a password and/or bio-information received from a user using the unique key.

Abstract: A vehicle security network design device may comprise: a level assigning unit for assigning an automobile safety integrity level (ASIL) which provides a risk management standard for each of a plurality of functional elements in a vehicle that is at least temporarily implemented by a processor; a calculation unit for calculating device's controllability with respect to each of the plurality of functional elements on the basis of a connection structure between the plurality of functional elements and a difference value of the ASIL; and a management unit for generating a risk analysis model of a plurality of functional elements.

Abstract: Provided is an apparatus for testing randomness of a digital value and processing the digital value. The digital value may include first bit sequences generated by a physically unclonable function (PUF). A grouping unit may generate a plurality of groups by segmenting the first bit sequence, and a processing unit may calculate a second bit sequence from the plurality of groups by performing a logical operation.

Abstract: Provided is an information processing apparatus including a physical unclonable function (PUF) to generate a unique key using a process variation in a semiconductor manufacturing process, and an encryption unit to encrypt a password and/or bio-information received from a user using the unique key.

Abstract: Provided are a security apparatus and an operation method thereof. The security apparatus comprises a core circuit which performs a security function by using an authentication key such as a secret key provided by a physically unclonable function (PUF). The security apparatus may receive event information indicating that the security apparatus is in a security-vulnerable state such as a case where the security apparatus is stolen or lost. In such case, a power management circuit can apply at least one electrical shock of overvoltage and overcurrent to the security apparatus to cause physical damage to the security apparatus, so that the core circuit does not perform the security function normally.

Abstract: Provided is an apparatus for generating an identification key by a probabilistic determination of a short occurring between nodes constituting a circuit, by violating a design rule provided during a semiconductor manufacturing process. The identification key generating apparatus may include an identification key generator to generate an identification key based on whether a contact or a via used to electrically connect conductive layers in a semiconductor chip shorts the conductive layers, and an identification key reader to read the identification key by reading whether the contact or the via shorts the conductive layers.

Abstract: A vehicle security network design device may comprise: a level assigning unit for assigning an automobile safety integrity level (ASIL) which provides a risk management standard for each of a plurality of functional elements in a vehicle that is at least temporarily implemented by a processor; a calculation unit for calculating device's controllability with respect to each of the plurality of functional elements on the basis of a connection structure between the plurality of functional elements and a difference value of the ASIL; and a management unit for generating a risk analysis model of a plurality of functional elements.

Abstract: A semiconductor chip comprises at least one data bus to transmit data processed by the semiconductor chip, an electric potential generator block packaged together with the at least one data bus to be blocked from external light by a package, the electric potential generator block to detect an event in which the package is unable to block the external light, and a switch configured to block a transmission of at least some data in the at least one data bus if the event is detected. A semiconductor chip comprises an energy harvesting element inside a package. The energy harvesting element may comprise an on-chip photodiode. A depackaging attack causes the generation of a voltage of a photodiode, and thus a change in physical state of the packaging can be detected.

Abstract: Provided is an apparatus for generating digital values to provide a random digital value. The apparatus may generate the digital value based on a semiconductor process variation. The apparatus may include a generating unit to generate a plurality of digital values, based on the semiconductor process variation, and a processing unit to process the digital values and to provide a first digital value. The generating unit may include a plurality of physically unclonable functions (PUFs). A parameter may be differently applied to the PUFs, and the PUFs may generate the digital values.

Abstract: Provided is an apparatus for generating an identification key by a probabilistic determination of a short occurring between nodes constituting a circuit, by violating a design rule provided during a semiconductor manufacturing process. The identification key generating apparatus may include an identification key generator to generate an identification key based on whether a contact or a via used to electrically connect conductive layers in a semiconductor chip shorts the conductive layers, and an identification key reader to read the identification key by reading whether the contact or the via shorts the conductive layers.

Abstract: Disclosed is an authentication apparatus using a public key encryption algorithm. An apparatus according to an embodiment generates a first instant public key through a random number generation process in response to an electronic signature generation request corresponding to a message. Further, the apparatus calculates and uses a first instant private key making a pair with the first instant public key, using the first instant public key.

Abstract: Provided is a device for generating an identification key using a process variation during a manufacturing process of a conductive layer. The device for generating an identification key may include a plurality of conductive layers designed so as to be formed in a first region within a semiconductor chip, the density in which the plurality of conductive layers are disposed in the first region being at least a first threshold value and not more than a second threshold value, the first and second threshold values being less than a minimum density according to the design rules for ensuring that all of the plurality of conductive layers are formed in the first region; and a reader which provides an identification key by identifying if, among the plurality of conductive layers, a previously designated first conductive layer has been formed.

Abstract: Provided are a device and method for generating an identification key using process variation during a bipolar junction transistor (BJT) process. A BJT may be produced by designing such that the effective base width of the BJT is at least a first threshold value but not more than a second threshold value, or, such that the total of the width of a second depletion region formed by connection with a collector region and the width of a first depletion region formed by connection with an emitter region, within a base region, differs from the width of the base region by a value that is at least the first threshold value but not more than the second threshold value. Whether or not there is a short circuit between the emitter region and the collector region is stochastically generated by means of process variation, and if ordinary turn-on voltage is not applied to the base in the produced BJT, whether or not there is a short circuit is identified by means of a reader and an identifier is provided.

Abstract: Provided are a device and method for generating an identification key using process variation during a bipolar junction transistor (BJT) process. A BJT may be produced by designing such that the effective base width of the BJT is at least a first threshold value but not more than a second threshold value, or, such that the total of the width of a second depletion region formed by connection with a collector region and the width of a first depletion region formed by connection with an emitter region, within a base region, differs from the width of the base region by a value that is at least the first threshold value but not more than the second threshold value. Whether or not there is a short circuit between the emitter region and the collector region is stochastically generated, and if ordinary turn-on voltage is not applied, whether or not there is a short circuit is identified.

Abstract: Disclosed is a method of generating a physical unclonable function (PUF) by causing unpredictable partial process failure for a semiconductor process. In a designing process, a second mask pattern may be printed by distorting a size and/or shape of at least one mask window included in a designed first mask pattern, without violating semiconductor design rules. A PUF may be generated using a photomask including the printed second mask pattern for photolithography.

Abstract: Disclosed is a method of generating a physical unclonable function (PUF) by causing unpredictable partial process failure for a semiconductor process. In a designing process, a second mask pattern may be printed by distorting a size and/or shape of at least one mask window included in a designed first mask pattern, without violating semiconductor design rules. A PUF may be generated using a photomask including the printed second mask pattern for photolithography.

Abstract: Provided are a device and method for generating an identification key using process variation during a bipolar junction transistor (BJT) process. A BJT may be produced by designing such that the effective base width of the BJT is at least a first threshold value but not more than a second threshold value, or, such that the total of the width of a second depletion region formed by connection with a collector region and the width of a first depletion region formed by connection with an emitter region, within a base region, differs from the width of the base region by a value that is at least the first threshold value but not more than the second threshold value. Whether or not there is a short circuit between the emitter region and the collector region is stochastically generated by means of process variation, and if ordinary turn-on voltage is not applied to the base in the produced BJT, whether or not there is a short circuit is identified by means of a reader and an identifier is provided.

Abstract: Provided is an apparatus for generating an identification key by a probabilistic determination of a short occurring between nodes constituting a circuit, by violating a design rule provided during a semiconductor manufacturing process. The identification key generating apparatus may include an identification key generator to generate an identification key based on whether a contact or a via used to electrically connect conductive layers in a semiconductor chip shorts the conductive layers, and an identification key reader to read the identification key by reading whether the contact or the via shorts the conductive layers.

Abstract: Provided is a device for generating an identification key using a process variation during a manufacturing process of a conductive layer. The device for generating an identification key may include a plurality of conductive layers designed so as to be formed in a first region within a semiconductor chip, the density in which the plurality of conductive layers are disposed in the first region being at least a first threshold value and not more than a second threshold value, the first and second threshold values being less than a minimum density according to the design rules for ensuring that all of the plurality of conductive layers are formed in the first region; and a reader which provides an identification key by identifying if, among the plurality of conductive layers, a previously designated first conductive layer has been formed.