Abstract: A high voltage control circuit of a semiconductor device includes an output node control circuit configured to set an initial potential of an output terminal or to discharge the potential of the output terminal, in response to an input signal and a high voltage supply circuit comprising an acceleration unit and a potential control unit coupled in series between the output terminal and a supply terminal for supplying a high voltage. The acceleration unit is operated in response to the potential of the output terminal, and the potential control unit is operated in response to the input signal.

Abstract: A non-volatile memory device comprises a voltage supplier comprising memory cells in which the voltage supplier supplies a positive set voltage to a bulk of a memory cell array at the time of a read operation of the memory cells and a controller for controlling the voltage supplier to set and supply a bulk voltage depending on a number of erase/program cycles of the memory cell array.

Abstract: A high voltage switch circuit of a semiconductor device includes a buffer circuit configured to output a control signal in response to an input signal and a boost circuit configured to output a block selection signal to an output terminal by connecting a current path between a voltage supply node and the output terminal in response to the control signal, and to block the current path in case where the control signal falls from a high voltage level to a low voltage level.

Abstract: A nonvolatile memory device includes a comparison unit configured to compare a reference voltage and a voltage of each of a plurality of nodes of a sample memory cell string, a state storage unit configured to store state information of each of memory cells depending on the corresponding comparison result of the comparison unit, and a high voltage generation unit configured to change a program start voltage depending on data stored in the state storage unit.

Abstract: An apparatus includes a plurality of first driving signal driving units, and generates a first driving signal by driving an input signal, a plurality of second driving signal driving units, each of which drives an input signal and generates a second driving signal, a timing control unit that controls each of the first driving signal driving units such that a predetermined time difference is generated between an enable timing of the first driving signal and an enable timing of the second driving signal, a plurality of sense amplifier driving units, each of which generates a first driving level and a second driving level according to the first driving signal and the second driving signal, and a plurality of sense amplifiers that are provided for respective bit line pairs, and each include first type switching elements operating according to the first driving level and second type switching elements operating according to the second driving level.

Abstract: An apparatus includes a plurality of first driving signal driving units, and generates a first driving signal by driving an input signal, a plurality of second driving signal driving units, each of which drives an input signal and generates a second driving signal, a timing control unit that controls each of the first driving signal driving units such that a predetermined time difference is generated between an enable timing of the first driving signal and an enable timing of the second driving signal, a plurality of sense amplifier driving units, each of which generates a first driving level and a second driving level according to the first driving signal and the second driving signal, and a plurality of sense amplifiers that are provided for respective bit line pairs, and each include first type switching elements operating according to the first driving level and second type switching elements operating according to the second driving level.

Abstract: A flash memory device includes a main cell array configured to have main memory cells for storing data and a redundancy cell array configured to have redundancy memory cells for repairing a failed memory cell of the main cell array. A page buffer circuit is configured to perform a program operation, a verifying operation and a read operation on the main cell array and the redundancy cell array. A repair circuit includes fuse circuits having fuse memory cells each of which is programmed in response to address information. The repair circuit is operated in response to a program state of the fuse memory cells and output a repair signal. A data input/output controller is configured to control input/output of data to/from the main memory cell or the redundancy memory cell in accordance with the repair signal outputted by the repair circuit.

Abstract: A voltage supply circuit includes a voltage generator and a controller. The voltage generator is configured to pump an externally input voltage and store the pumped external voltage as a first voltage having a set voltage level, before power-up begins, or pump the external voltage, add the pumped voltage to the stored voltage, and output the added voltage as an operating voltage. The controller is configured to output a first control signal to drive the voltage generator or stop operation of the voltage generator, according to an operating state.

Abstract: Program voltages of a non-volatile memory device are controlled variably according to a program/erase operation count. The non-volatile memory device includes a program voltage supply unit for applying a program voltage to a memory cell, a program/erase count storage unit for storing a total program/erase operation count of the non-volatile memory device, a program start voltage storage unit for storing levels of program start voltages to be differently supplied according to the program/erase operation count, and a program voltage controller for controlling the program start voltage according to the program/erase operation count.

Abstract: A fuse circuit in a flash memory device is disclosed. The fuse circuit includes a plurality of memory cells turned on/off by a first voltage in accordance with program state, a switching circuit configured to switch in response to a control signal, thereby transmitting a verifying signal for verifying program of the memory cell to the memory cell, and a cell controller configured to output the verifying signal for controlling program, verification and erase of the memory cells and the control signal.

Abstract: A leakage current control device of a semiconductor memory device is provided to effectively remove leakage current flowing from a bit line to a word line when a process defect is generated by gate residues of the semiconductor memory device, thereby reducing unnecessary current consumption. In the leakage current control device, the bit line boosted to a voltage level of core voltage/2 is controlled at a ground voltage level during a precharge period to remove unnecessary leakage current flowing from the bit line to a word line bridge.

Abstract: A nonvolatile memory device includes a comparison unit configured to compare a reference voltage and a voltage of each of a plurality of nodes of a sample memory cell string, a state storage unit configured to store state information of each of memory cells depending on the corresponding comparison result of the comparison unit, and a high voltage generation unit configured to change a program start voltage depending on data stored in the state storage unit.

Abstract: A semiconductor memory device is provided. Especially, there is disclosed a technique capable of increasing a net die by employing a cell capacitor as a reservoir capacitor according to a set mode. The semiconductor memory device of the present invention uses the cell capacitor as the reservoir capacitor in a normal mode, and prevents each voltage from being applied to the cell capacitor in a burn-in test mode. The voltage applied to the cell capacitor or MOS transistor can be adjusted according to the set mode.

Abstract: An apparatus includes a plurality of first driving signal driving units, and generates a first driving signal by driving an input signal, a plurality of second driving signal driving units, each of which drives an input signal and generates a second driving signal, a timing control unit that controls each of the first driving signal driving units such that a predetermined time difference is generated between an enable timing of the first driving signal and an enable timing of the second driving signal, a plurality of sense amplifier driving units, each of which generates a first driving level and a second driving level according to the first driving signal and the second driving signal, and a plurality of sense amplifiers that are provided for respective bit line pairs, and each include first type switching elements operating according to the first driving level and second type switching elements operating according to the second driving level.

Abstract: An apparatus includes a plurality of first driving signal driving units, and generates a first driving signal by driving an input signal, a plurality of second driving signal driving units, each of which drives an input signal and generates a second driving signal, a timing control unit that controls each of the first driving signal driving units such that a predetermined time difference is generated between an enable timing of the first driving signal and an enable timing of the second driving signal, a plurality of sense amplifier driving units, each of which generates a first driving level and a second driving level according to the first driving signal and the second driving signal, and a plurality of sense amplifiers that are provided for respective bit line pairs, and each include first type switching elements operating according to the first driving level and second type switching elements operating according to the second driving level.

Abstract: A method of supplying an operating voltage of a flash memory device includes supplying an operating voltage to a word line selected according to an input address, and changing a pass voltage according to a change of the operating voltage level. The pass voltage is supplied to unselected word lines other than the selected word line.

Abstract: A semiconductor memory over-driving scheme for a semiconductor memory device makes it possible to secure a high-speed sensing operation of a memory sense amplifier, regardless of a change of a power supply voltage. Over-driving efficiency is improved by controlling the discharging time and the drivability using different sized the drivers when the power supply voltage fluctuates while the bit line over-driving operation is performed.

Abstract: Methods for performing a fail test, block management, erase operations and program operations are used in a nonvolatile memory device having a block switch devoid of a fuse and a PMOS transistor. A method for performing a fail test in a nonvolatile memory device includes performing a fail test for a memory cell block; storing good block information in a block information store associated with the corresponding block when the memory cell block is a good block; and repeating the performing and storing steps for all memory cell blocks.

Abstract: A circuit for testing a fail in a memory device is disclosed. The memory device includes a memory cell array, a page buffer section, a current controller, and a current measuring section. The memory cell array has memory cells coupled to pairs of bit lines and word lines. The page buffer section has page buffers for programming data to a memory cell selected in accordance with each of the pairs of the bit lines or reading data from the memory cell. The current controller has switching sections coupled to each of the page buffers in the page buffer section and for outputting a current passing through the page buffer selected in accordance with control signals. The current measuring section converts values of currents passing through the switching sections of the current controller into digital values, and outputs the digital values.

Abstract: A threshold voltage of a non-volatile memory device is compensated by a voltage supplier and a controller. The voltage supplier supplies a set voltage to a bulk of a memory cell array, including memory cells, at the time of a read operation of the memory cells. The controller controls the voltage supplier to set and supply a bulk voltage depending on a threshold voltage change of the memory cells.