Patents by Inventor Chan Hwang

Chan Hwang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20180241790
    Abstract: A transmitting apparatus is provided. The transmitting apparatus includes: an L1 signaling generator configured to generate L1 signaling including first information and second information; a frame generator configured to generate a frame including a payload including a plurality of sub frames; and a signal processor configured to insert a preamble including the L1 signaling in the frame and transmit the frame. The first information includes information required for decoding a first sub frame among the plurality of sub frames. Therefore, a processing delay in a receiving apparatus is reduced.
    Type: Application
    Filed: April 23, 2018
    Publication date: August 23, 2018
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jung-hyun PARK, Min-ho KIM, Sung-woo PARK, Sung-kyu JUNG, Chang-hoon CHOI, Doo-chan HWANG
  • Publication number: 20180231471
    Abstract: The present disclosure relates to a fluorogenic pH-sensitive dye including an aryl compound having a sulfonyl group (—SO2); and an agarose compound covalently bonded to the sulfonyl group (—SO2) of the aryl compound.
    Type: Application
    Filed: January 12, 2018
    Publication date: August 16, 2018
    Inventors: Moon-Chan Hwang, Jong-Tae Je
  • Publication number: 20180203015
    Abstract: The present invention relates to dye compounds represented by Formulae I and II, which are described in the specification. The dye compounds of the present invention have markedly improved quantum yields and emit strong fluorescence compared to existing cyanine dyes. Due to these advantages, the dye compounds of the present invention can find applications in various fields, for example, as probes for various biological systems where optical imaging is required. Particularly, the dye compounds of the present invention can be used as mitotrackers capable of labeling and tracking mitochondria. Therefore, the dye compounds of the present invention can be used to quantitatively image mitochondria in live tissues and cells. Furthermore, the dye compounds of the present invention can be applied as pH probes for measuring the pH of live cells.
    Type: Application
    Filed: July 18, 2016
    Publication date: July 19, 2018
    Inventors: Ju-man SONG, Seon-Gi MIN, Seung-Soo LEE, Do-min LEE, Kyung-Hwa PARK, Moon-Chan HWANG, Bong-Ki SHIN, Jong-Tae JE
  • Patent number: 10021447
    Abstract: A receiving apparatus is provided. The receiving apparatus includes: a receiver configured to receive an input signal including a transmission frame which includes a bootstrap, a preamble, and a payload; a bootstrap detector configured to detect the bootstrap based on a correlation between the input signal and a reference signal which is pre-stored; and a signal processor configured to signal-process the preamble based on the detected bootstrap and signal-process the payload based on the signal-processed preamble, and the bootstrap detector is configured to determine the correlation by quantizing at least one of the input signal and the reference signal and then multiplexing the input signal and the reference signal at least one of which is quantized. Accordingly, an area occupied by hardware and cost can be reduced and loss of performance can be minimized.
    Type: Grant
    Filed: July 22, 2016
    Date of Patent: July 10, 2018
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Min-ho Kim, Jung-hyun Park, Sung-kyu Jung, Doo-chan Hwang
  • Publication number: 20180175043
    Abstract: A method of forming a micro-pattern including forming a mold layer and a supporting material layer on a substrate, patterning the mold layer and the supporting material layer to form recess patterns, forming conductor patterns in the recess patterns, removing a portion of an upper portion of the supporting material layer for causing upper portions of the conductor patterns to protrude, forming a block copolymer layer on the supporting material layer, processing the block copolymer layer to phase-separate the block copolymer layer into a plurality of block parts, selectively removing some of the phase-separated plurality of block parts, and removing the supporting material layer to expose the mold layer at a position corresponding to each of the removed block parts may be provided.
    Type: Application
    Filed: November 30, 2017
    Publication date: June 21, 2018
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Soon-mok HA, Jae-hee KIM, Chan HWANG, Jong-hyuk KIM
  • Patent number: 9954917
    Abstract: A transmitting apparatus is provided. The transmitting apparatus includes: an L1 signaling generator configured to generate L1 signaling including first information and second information; a frame generator configured to generate a frame including a payload including a plurality of sub frames; and a signal processor configured to insert a preamble including the L1 signaling in the frame and transmit the frame. The first information includes information required for decoding a first sub frame among the plurality of sub frames. Therefore, a processing delay in a receiving apparatus is reduced.
    Type: Grant
    Filed: July 22, 2016
    Date of Patent: April 24, 2018
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jung-hyun Park, Min-ho Kim, Sung-woo Park, Sung-kyu Jung, Chang-hoon Choi, Doo-chan Hwang
  • Publication number: 20170261317
    Abstract: A method for measuring wafer alignment is provided. The method includes providing a plurality of first mark patterns extending in a first direction on a wafer, providing at least one second mark pattern on the first mark patterns such that it overlaps and intersects the first mark patterns, irradiating an optical signal onto the first mark patterns and the second mark pattern and obtaining coordinates of the second mark pattern by detecting signals from the second mark pattern.
    Type: Application
    Filed: March 2, 2017
    Publication date: September 14, 2017
    Inventors: Seung Yoon LEE, Chan HWANG, Jeong Jin LEE
  • Patent number: 9747682
    Abstract: A method for measuring overlay includes receiving a first image of a first overlay mark captured using light having a first wavelength. The method includes receiving a second image of a second overlay mark captured using light having a second wavelength different from the first wavelength. The method includes measuring a displacement between a central portion of the first image and a central portion of the second image, wherein the first and second overlay marks are disposed on different levels.
    Type: Grant
    Filed: November 13, 2015
    Date of Patent: August 29, 2017
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jeongjin Lee, Chan Hwang, Seungyoon Lee
  • Publication number: 20170214964
    Abstract: A receiving apparatus is provided. The receiving apparatus includes: a receiver configured to receive an input signal including a transmission frame which includes a bootstrap, a preamble, and a payload; a bootstrap detector configured to detect the bootstrap based on a correlation between the input signal and a reference signal which is pre-stored; and a signal processor configured to signal-process the preamble based on the detected bootstrap and signal-process the payload based on the signal-processed preamble, and the bootstrap detector is configured to determine the correlation by quantizing at least one of the input signal and the reference signal and then multiplexing the input signal and the reference signal at least one of which is quantized. Accordingly, an area occupied by hardware and cost can be reduced and loss of performance can be minimized.
    Type: Application
    Filed: July 22, 2016
    Publication date: July 27, 2017
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Min-ho KIM, Jung-hyun PARK, Sung-kyu JUNG, Doo-chan HWANG
  • Patent number: 9662442
    Abstract: The present invention relates to a linear flow regulating apparatus for intravenous infusion, and more particularly, to a flow regulating apparatus which is used in an infusion set for intravenous infusion to regulate the flow rate of a solution injected into a body. To eliminate the difficulties caused by the nonlinearity of conventional flow regulating apparatuses, which regulate flow rates by pressing a solution flow tube to adjust the flow passage area, the linear flow regulating apparatus has a control unit to be put in or taken out along the width of a flow channel unit through which the solution flows when the height and length of the flow channel unit are fixed, and is capable of linearly regulating the flow rate by varying the flow passage area of the flow channel unit by adjusting the width of a flow channel unit.
    Type: Grant
    Filed: November 16, 2012
    Date of Patent: May 30, 2017
    Assignee: KOREA INSTITUTE OF MACHINERY & MATERIALS
    Inventors: Eui-Soo Yoon, Moo-Ryong Park, Bum Seog Choi, Jun Young Park, Il-Su Yoo, Jeong Min Seo, Soon-Chan Hwang
  • Publication number: 20170026432
    Abstract: A transmitting apparatus is provided. The transmitting apparatus includes: an L1 signaling generator configured to generate L1 signaling including first information and second information; a frame generator configured to generate a frame including a payload including a plurality of sub frames; and a signal processor configured to insert a preamble including the L1 signaling in the frame and transmit the frame. The first information includes information required for decoding a first sub frame among the plurality of sub frames. Therefore, a processing delay in a receiving apparatus is reduced.
    Type: Application
    Filed: July 22, 2016
    Publication date: January 26, 2017
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jung-hyun PARK, Min-ho KIM, Sung-woo PARK, Sung-kyu JUNG, Chang-hoon CHOI, Doo-chan HWANG
  • Publication number: 20160152175
    Abstract: A light source module includes a light source, a reflector reflecting light emitted by the light source, and a display on which the light reflected by the reflector is incident, spreading the light in a location on which the light is incident. A position of the location of the display on which light is incident continuously moves in at least one direction according to a motion of the reflector.
    Type: Application
    Filed: September 1, 2015
    Publication date: June 2, 2016
    Inventors: Hyung Chan HWANG, Sun Ki KIM
  • Publication number: 20160071255
    Abstract: A method for measuring overlay includes receiving a first image of a first overlay mark captured using light having a first wavelength. The method includes receiving a second image of a second overlay mark captured using light having a second wavelength different from the first wavelength. The method includes measuring a displacement between a central portion of the first image and a central portion of the second image, wherein the first and second overlay marks are disposed on different levels.
    Type: Application
    Filed: November 13, 2015
    Publication date: March 10, 2016
    Inventors: JEONGJIN LEE, Chan Hwang, Seungyoon Lee
  • Patent number: 9281250
    Abstract: A method of detecting an asymmetric portion of an overlay mark includes forming a plurality of virtual overlay marks having a plurality of virtual asymmetric portions. The virtual asymmetric portions may have different sizes with respect to a reference model profile of a reference overlay mark. Virtual information with respect to each virtual overlay mark may be obtained. The virtual information of the virtual overlay marks may be compared with actual information of an actual overlay mark to identify virtual information of the virtual overlay mark corresponding to the actual information of the actual overlay mark. Thus, measuring the overlay of the actual overlay mark may be performed under than the actual asymmetric portion may be excluded from the actual overlay mark, so that the overlay may be accurately measured. As a result, errors may not be generated in a correcting process to a layer using the accurate overlay.
    Type: Grant
    Filed: November 12, 2014
    Date of Patent: March 8, 2016
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Seung-Hwa Oh, Jeong-Jin Lee, Chan Hwang
  • Publication number: 20150294455
    Abstract: Provided are methods of testing pattern reliability and methods of testing a semiconductor device using the same. A method of testing pattern reliability may include acquiring an optical image of a wafer on which a plurality of patterns are formed, evaluating degrees of damage of ones of the plurality of patterns based on the optical image, determining a respective reliability of the ones of the plurality of patterns according to the evaluated respective degrees of damage, and mapping the reliability of the ones of the plurality of patterns based on locations of the respective patterns on the wafer.
    Type: Application
    Filed: December 23, 2014
    Publication date: October 15, 2015
    Inventors: Jeong-Jin LEE, Seung-Hwa OH, Chan HWANG
  • Publication number: 20150294916
    Abstract: A method of detecting an asymmetric portion of an overlay mark includes forming a plurality of virtual overlay marks having a plurality of virtual asymmetric portions. The virtual asymmetric portions may have different sizes with respect to a reference model profile of a reference overlay mark. Virtual information with respect to each virtual overlay mark may be obtained. The virtual information of the virtual overlay marks may be compared with actual information of an actual overlay mark to identify virtual information of the virtual overlay mark corresponding to the actual information of the actual overlay mark. Thus, measuring the overlay of the actual overlay mark may be performed under than the actual asymmetric portion may be excluded from the actual overlay mark, so that the overlay may be accurately measured.
    Type: Application
    Filed: November 12, 2014
    Publication date: October 15, 2015
    Inventors: SEUNG-HWA OH, JEONG-JIN LEE, CHAN HWANG
  • Publication number: 20150096536
    Abstract: Disclosed is a pulse damper using a composite spring device for eliminating pulse waves in a plunger pump for supplying fuel, which includes a spring body, and a body for receiving an O-ring spacer supported by an internal O-ring cap, wherein a low pressure coil spring and a high pressure disc spring are arranged in a line inside the spring body so that the low pressure oil spring primarily works and then stops by making a low pressure spring cover and a low pressure spring pad contact a low pressure spring stopper, and secondarily the high pressure disc spring works and then stops by making a high pressure spring pad mounted on one end of a spring guide shaft connected to a piston contact a high pressure spring stopper.
    Type: Application
    Filed: April 12, 2013
    Publication date: April 9, 2015
    Inventor: Byoung-Chan Hwang
  • Patent number: 8995605
    Abstract: A lid frame for a nuclear fuel assembly shipping container and a shipping container for nuclear fuel assemblies are provided. The shipping container can include a lower container in which a cradle is installed, an upper container detachably coupled to the lower container, and a base frame coupled to the cradle with at least one nuclear fuel assembly placed thereon. The lid frame can include a plurality of supports installed apart from each other so as to surround the nuclear fuel assembly placed on the base frame, and a plurality of clamps separated from each other, coupled to the plurality of supports perpendicular to the plurality of supports, rotatably hinged to the base frame, and configured to clamp the nuclear fuel assembly. The lid frame safely protects the nuclear fuel assembly that is being transported.
    Type: Grant
    Filed: December 27, 2010
    Date of Patent: March 31, 2015
    Assignee: Kepco Nuclear Fuel Co., Ltd.
    Inventors: Hung Soon Chang, Chang Hwan Hwang, Deuk Yeon Kim, Jae Soon Choi, Weon Chan Hwang, Se Yong Shin, Young Hoon Kim, Jong Sung Hong
  • Publication number: 20140254916
    Abstract: A method for measuring overlay includes receiving a first image of a first overlay mark captured using light having a first wavelength. The method includes receiving a second image of a second overlay mark captured using light having a second wavelength different from the first wavelength. The method includes measuring a displacement between a central portion of the first image and a central portion of the second image, wherein the first and second overlay marks are disposed on different levels.
    Type: Application
    Filed: February 18, 2014
    Publication date: September 11, 2014
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jeongjin Lee, Chan Hwang, Seungyoon Lee
  • Publication number: 20140243759
    Abstract: The present invention relates to a linear flow regulating apparatus for intravenous infusion, and more particularly, to a flow regulating apparatus which is used in an infusion set for intravenous infusion to regulate the flow rate of a solution injected into a body. To eliminate the difficulties caused by the nonlinearity of conventional flow regulating apparatuses, which regulate flow rates by pressing a solution flow tube to adjust the flow passage area, the linear flow regulating apparatus has a control unit to be put in or taken out along the width of a flow channel unit through which the solution flows when the height and length of the flow channel unit are fixed, and is capable of linearly regulating the flow rate by varying the flow passage area of the flow channel unit by adjusting the width of a flow channel unit.
    Type: Application
    Filed: November 16, 2012
    Publication date: August 28, 2014
    Applicant: KOREA INSTITUTE OF MACHINERY & MATERIALS
    Inventors: Eui-Soo Yoon, Moo-Ryong Park, Bum Seog Choi, Jun Young Park, Il-Su Yoo, Jeong Min Deo, Soon-Chan Hwang