Patents by Inventor Chan Lim

Chan Lim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20120282736
    Abstract: In a method of manufacturing a semiconductor device, a front end of line (FEOL) process may be performed on a semiconductor substrate to form a semiconductor structure. A back end of line (BEOL) process may be performed on the semiconductor substrate to form a wiring structure electrically connected to the semiconductor structure, thereby formed a semiconductor chip. A hole may be formed through a part of the semiconductor chip. A preliminary plug may have a dimple in the hole. The preliminary plug may be expanded into the dimple by a thermal treatment process to form a plug. Thus, the plug may not have a protrusion protruding from the upper surface of the semiconductor chip, so that the plug may be formed by the single CMP process.
    Type: Application
    Filed: April 30, 2012
    Publication date: November 8, 2012
    Inventors: Kwang-Jin MOON, Byung-Lyul PARK, Do-Sun LEE, Gil-Heyun CHOI, Suk-Chul BANG, Dong-Chan LIM, Deok-Young JUNG
  • Patent number: 8293617
    Abstract: Among various methods, devices, and apparatuses, a number of methods are provided for forming a gap between circuitry. One such method includes depositing a first oxide precursor material on at least two conductive lines having at least one gap between the at least two conductive lines, and forming a breadloaf configuration with the first oxide precursor material on a top of each of the at least two conductive lines that leaves a space between a closest approach of at least two adjacent breadloaf configurations. The method also includes depositing a second oxide precursor material over the first oxide precursor material, where depositing the second oxide precursor material results in closing the space between the closest approach of the at least two adjacent breadloaf configurations.
    Type: Grant
    Filed: October 27, 2011
    Date of Patent: October 23, 2012
    Assignee: Micron Technology, Inc.
    Inventors: Arthur J. McGinnis, Sachin Joshi, Chan Lim
  • Publication number: 20120255616
    Abstract: The present invention relates to a metal-oxide/carbon-nanotube composite membrane to be used as a P-type conductive membrane for an organic solar cell, to a method for preparing same, and to an organic solar cell having improved photovoltaic conversion efficiency using the same. More particularly, the present invention relates to a metal-oxide/carbon-nanotube composite membrane to be used as a P-type conductive membrane for an organic solar cell, wherein said composite membrane is prepared by dispersing single-walled carbon nanotubes in an organic solvent, adding metal oxides to the mixed solution, dispersing the mixed solution to obtain a composite solution, and depositing the thus-obtained composite solution onto a substrate.
    Type: Application
    Filed: December 20, 2010
    Publication date: October 11, 2012
    Applicant: KOREA INSTITUTE OF MACHINERY AND MATERIALS
    Inventors: Dong Chan Lim, Kyu Hwan Lee, Yong Soo Jeong, Jae Wook Kang, Sun Young Park, Mi Yeong Park, Yeong-Tae Kim, Won Hyun Shim, Kang Ho Choi
  • Publication number: 20120231561
    Abstract: Methods of removing metal from a portion of a substrate are useful in integrated circuit fabrication. Methods include exposing the substrate to an oxidizing environment comprising at least one oxidizing agent and at least one reducing agent, and exposing the substrate to a reducing environment comprising at least one reducing agent and at least one oxidizing agent.
    Type: Application
    Filed: March 9, 2011
    Publication date: September 13, 2012
    Inventors: Brian Dolan, Robert J. Hanson, Chan Lim
  • Publication number: 20120196985
    Abstract: The present description relates to olefin block copolymers having excellent elasticity and processability in conjunction with enhanced heat resistance, and to a preparation method thereof. The olefin block copolymers comprise a plurality of blocks or segments that comprise ethylene or propylene repeating units and ?-olefin repeating units at different mole fractions from one another, wherein the block copolymer shows peaks at the 2? of 21.5±0.5° and 23.7±0.5° in a wide-angle x-ray diffraction (WAXD) pattern, and the peak ratio defined by (the peak area at 21.5±0.5°)/(the peak area at 23.7±0.5°) is no more than 3.0.
    Type: Application
    Filed: January 26, 2012
    Publication date: August 2, 2012
    Inventors: Yong-Ho LEE, Manseong Jeon, Heon-Yong Kwon, Min-Seok Cho, Seon Kyoung Kim, Dae-Sik Hong, Se Hui Sohn, Ki-Soo Lee, Kyoung-Chan Lim
  • Patent number: 8203567
    Abstract: A graphics processing method and apparatus described herein is capable of converting graphics processing of a window system into a vector-based application program interface (API) format usable in the GPU and performing the converted graphics processing in the GPU. For example, the vector-based API may be based on an OpenVG standard or an EGL standard.
    Type: Grant
    Filed: July 3, 2009
    Date of Patent: June 19, 2012
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Dong-kyun Jeong, Soo-chan Lim, Na-min Kim
  • Publication number: 20120142185
    Abstract: In methods of manufacturing a semiconductor device, a substrate having a first surface and a second surface opposite to the first surface is prepared. A sacrificial layer pattern is formed in a region of the substrate that a through electrode will be formed. The sacrificial layer pattern extends from the first surface of the substrate in a thickness direction of the substrate. An upper wiring layer is formed on the first surface of the substrate. The upper wiring layer includes a wiring on the sacrificial layer pattern. The second surface of the substrate is partially removed to expose the sacrificial layer pattern. The sacrificial layer pattern is removed from the second surface of the substrate to form an opening that exposes the wiring. A through electrode is formed in the opening to be electrically connected to the wiring.
    Type: Application
    Filed: September 22, 2011
    Publication date: June 7, 2012
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Byung-Lyul Park, Gil-Heyun Choi, Suk-Chul Bang, Kwang-Jin Moon, Dong-Chan Lim, Deok-Young Jung
  • Publication number: 20120132986
    Abstract: A semiconductor device includes a substrate having a plurality of horizontal channel transistors formed thereon, an insulation layer structure on the substrate and covering the horizontal transistors, and a plurality of vertical channel transistors on the insulation layer structure.
    Type: Application
    Filed: October 3, 2011
    Publication date: May 31, 2012
    Inventors: Pil-Kyu Kang, Dae-Lok Bae, Gil-Heyun Choi, Suk-Chul Bang, Byung-Lyul Park, Kwang-Jin Moon, Dong-Chan Lim, Deok-Young Jung
  • Publication number: 20120119376
    Abstract: Provided are a semiconductor chip and a method of manufacturing the same.
    Type: Application
    Filed: November 4, 2011
    Publication date: May 17, 2012
    Inventors: Dong-Chan Lim, Gilheyun Choi, Kwangjin Moon, Deok-Young Jung, Byung-Lyul Park, Dosun Lee
  • Patent number: 8173507
    Abstract: Methods include forming a charge storage transistor gate stack over semiconductive material. One such stack includes a tunnel dielectric, charge storage material over the tunnel dielectric, a high-k dielectric over the charge storage material, and conductive control gate material over the high-k dielectric. The stack is etched at least to the tunnel dielectric to form a plurality of charge storage transistor gate lines over the semiconductive material. Individual of the gate lines have laterally projecting feet which include the high-k dielectric. After etching the stack to form the gate lines, ions are implanted into an implant region which includes the high-k dielectric of the laterally projecting feet. The ions are chemically inert to the high-k dielectric. The ion implanted high-k dielectric of the projecting feet is etched selectively relative to portions of the high-k dielectric outside of the implant region.
    Type: Grant
    Filed: June 22, 2010
    Date of Patent: May 8, 2012
    Assignee: Micron Technology, Inc.
    Inventors: Chan Lim, Jennifer Lequn Liu, Brian Dolan, Saurabh Keshav, Hongbin Zhu
  • Publication number: 20120071615
    Abstract: The present invention relates to a binuclear metallocene compound having a new structure that is able to offer various selectivities and activities for copolymers, a preparation method thereof, and a method for preparing a polyolefin using the binuclear metallocene compound.
    Type: Application
    Filed: September 9, 2011
    Publication date: March 22, 2012
    Applicant: LG Chem, Ltd.
    Inventors: Kyoung-Chan Lim, Ki-Soo Lee, Heon-Yong Kwon, Min-Seok Cho
  • Publication number: 20120043666
    Abstract: For forming a semiconductor device, a via structure is formed through at least one dielectric layer and at least a portion of a substrate. In addition, a protective buffer layer is formed onto the via structure. Furthermore, a conductive structure for an integrated circuit is formed over the substrate after forming the via structure and the protective buffer layer, with the conductive structure not being formed over the via structure. Thus, deterioration of the conductive and via structures is minimized.
    Type: Application
    Filed: November 2, 2011
    Publication date: February 23, 2012
    Inventors: Byung-Lyul Park, Gil-Heyun Choi, Suk-Chul Bang, Kwang-Jin Moon, Dong-Chan Lim, Deok-Young Jung
  • Publication number: 20120039564
    Abstract: A photoelectric integrated circuit device may include a substrate including an electronic device region and an on die optical input/output device region, the substrate having a trench in the on die optical input/output device region; a lower clad layer provided in the trench, the lower clad layer having an upper surface lower than a surface of the substrate; a core provided on the lower clad layer; an insulating pattern provided on the core; an optical detection pattern provided on the insulating pattern, the optical detection pattern having at least a portion provided in the trench; and at least one transistor provided on the substrate of the electronic device region.
    Type: Application
    Filed: July 27, 2011
    Publication date: February 16, 2012
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Pil-Kyu Kang, GilHeyun Choi, Sukchul Bang, Daelok Bae, Byung-Lyul Park, KwangJin Moon, Dong-Chan Lim, Deok-Young Jung
  • Publication number: 20120040534
    Abstract: Among various methods, devices, and apparatuses, a number of methods are provided for forming a gap between circuitry. One such method includes depositing a first oxide precursor material on at least two conductive lines having at least one gap between the at least two conductive lines, and forming a breadloaf configuration with the first oxide precursor material on a top of each of the at least two conductive lines that leaves a space between a closest approach of at least two adjacent breadloaf configurations. The method also includes depositing a second oxide precursor material over the first oxide precursor material, where depositing the second oxide precursor material results in closing the space between the closest approach of the at least two adjacent breadloaf configurations.
    Type: Application
    Filed: October 27, 2011
    Publication date: February 16, 2012
    Applicant: MICRON TECHNOLOGY, INC.
    Inventors: Arthur J. McGinnis, Sachin Joshi, Chan Lim
  • Publication number: 20110318922
    Abstract: The methods include forming a semiconductor substrate pattern by etching a semiconductor substrate. The semiconductor pattern has a first via hole that exposes side walls of the semiconductor substrate pattern, and the side walls of the semiconductor substrate pattern exposed by the first via hole have an impurity layer pattern. The methods further include treating upper surfaces of the semiconductor substrate pattern, the treated upper surfaces of the semiconductor substrate pattern being hydrophobic; removing the impurity layer pattern from the side walls of the semiconductor substrate pattern exposed by the first via hole; forming a first insulating layer pattern on the side walls of the semiconductor substrate pattern exposed by the first via hole; and filling a first conductive layer pattern into the first via hole and over the first insulating layer pattern.
    Type: Application
    Filed: June 23, 2011
    Publication date: December 29, 2011
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Deok-young Jung, Gil-heyun Choi, Suk-chul Bang, Byung-lyul Park, Kwang-jin Moon, Dong-chan Lim
  • Publication number: 20110316168
    Abstract: A semiconductor device includes a via structure and a conductive structure. The via structure has a surface with a planar portion and a protrusion portion. The conductive structure is formed over at least part of the planar portion and not over at least part of the protrusion portion of the via structure. For example, the conductive structure is formed only onto the planar portion and not onto any of the protrusion portion for forming high quality connection between the conductive structure and the via structure.
    Type: Application
    Filed: October 27, 2010
    Publication date: December 29, 2011
    Inventors: Kwang-Jin Moon, Pil-Kyu Kang, Dae-Lok Bae, Gil-Heyun Choi, Byung-Lyul Park, Dong-Chan Lim, Deok-Young Jung
  • Publication number: 20110318923
    Abstract: For forming a semiconductor device, a via structure is formed through at least one dielectric layer and at least a portion of a substrate. In addition, a protective buffer layer is formed onto the via structure. Furthermore, a conductive structure for an integrated circuit is formed over the substrate after forming the via structure and the protective buffer layer, with the conductive structure not being formed over the via structure. Thus, deterioration of the conductive and via structures is minimized.
    Type: Application
    Filed: October 27, 2010
    Publication date: December 29, 2011
    Inventors: Byung-Lyul Park, Gil-Heyun Choi, Suk-Chul Bang, Kwang-Jin Moon, Dong-Chan Lim, Deok-Young Jung
  • Publication number: 20110312171
    Abstract: Methods include forming a charge storage transistor gate stack over semiconductive material. One such stack includes a tunnel dielectric, charge storage material over the tunnel dielectric, a high-k dielectric over the charge storage material, and conductive control gate material over the high-k dielectric. The stack is etched at least to the tunnel dielectric to form a plurality of charge storage transistor gate lines over the semiconductive material. Individual of the gate lines have laterally projecting feet which include the high-k dielectric. After etching the stack to form the gate lines, ions are implanted into an implant region which includes the high-k dielectric of the laterally projecting feet. The ions are chemically inert to the high-k dielectric. The ion implanted high-k dielectric of the projecting feet is etched selectively relative to portions of the high-k dielectric outside of the implant region.
    Type: Application
    Filed: June 22, 2010
    Publication date: December 22, 2011
    Inventors: Chan Lim, Jennifer Lequn Liu, Brian Dolan, Saurabh Keshav, Hongbin Zhu
  • Patent number: 8076234
    Abstract: For forming a semiconductor device, a via structure is formed through at least one dielectric layer and at least a portion of a substrate. In addition, a protective buffer layer is formed onto the via structure. Furthermore, a conductive structure for an integrated circuit is formed over the substrate after forming the via structure and the protective buffer layer, with the conductive structure not being formed over the via structure. Thus, deterioration of the conductive and via structures is minimized.
    Type: Grant
    Filed: October 27, 2010
    Date of Patent: December 13, 2011
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Byung-Lyul Park, Gil-Heyun Choi, Suk-Chul Bang, Kwang-Jin Moon, Dong-Chan Lim, Deok-Young Jung
  • Patent number: 8065366
    Abstract: Disclosed are a system and method for distributing a blog post based on personal networking, and a server to be applied thereto. The system includes a writer terminal unit, which makes a series of settings for forming a blog post containing contents posted by a writer through the writer's blog registered with an online community service, and then distributes the blog post to at least one or more acquaintances blogs registered to personal networking with the writer, sharer/distributor terminal units, which make setting for posting the blog post on the acquaintances blogs, or distributing the blog post to at least one or more other acquaintances blogs registered to personal networking with sharers/distributors, and a service management server, which differentially provides management authority for the blog post to each of the writer and the sharers/distributors, and integrally manages the blog post distributed to a plurality of blogs, based on a path along which the blog post is distributed.
    Type: Grant
    Filed: October 17, 2008
    Date of Patent: November 22, 2011
    Assignee: SK Telecom Co., Ltd.
    Inventors: Chang-Su Lee, Dong-Chan Lim, Su-Kyung Kim, Sung Kim, Sil-Keun Hwang