Abstract: A system and method are provided for loading a sample into an analytical instrument using acoustic droplet ejection (“ADE”) in combination with a continuous flow sampling probe. An acoustic droplet ejector is used to eject small droplets of a fluid sample containing an analyte into the sampling tip of a continuous flow sampling probe, where the acoustically ejected droplet combines with a continuous, circulating flow stream of solvent within the flow probe. Fluid circulation within the probe transports the sample through a sample transport capillary to an outlet that directs the analyte away from the probe to an analytical instrument, e.g., a device that detects the presence, concentration quantity, and/or identity of the analyte. When the analytical instrument is a mass spectrometer or other type of device requiring the analyte to be in ionized form, the exiting droplets pass through an ionization region, e.g.

Abstract: Depositing a side slab structure on a cladding layer before etching a supporting dielectric prevents tapering of a silicon waveguide during etching of the supporting dielectric and a substrate. For example, the side slab structure may be deposited over the silicon waveguide and the cladding layer after etching the cladding layer. As a result, when an electronic device is integrated ex situ on the substrate, wave intensity and/or total internal reflection is improved, which improves an efficiency of the electronic device.

Abstract: This application provides a signal transmission method. The method includes: transmitting an SRS of the first network from three antennas: a third antenna, a fourth antenna, and a fifth antenna in turn; and inputting the SRS and a second signal of the second network to a combiner, where the combiner combines the two signals and then transmits a combined signal from a multiplexed first antenna. In this way, the SRS is transmitted by using four paths in turn. This can ensure that transmission of the second signal is not interrupted in a process of transmitting the SRS of the first network by using the four paths in turn, so that a service of the second network is not interrupted.

Abstract: Disclosed are methods and systems that provide for the analysis of one or more analytes of interest in an acoustic ejection mass spectrometer (AEMS) system that incorporates an open port interface (OPI) and differentiation mass spectrometry (DMS) that allows for operation of the system in a pseudo-continuous mode to scan and determine optimal DMS settings for the one or more analytes of interest, and for operation of the system in a discontinuous mode to analyze for the presence of the one or more analytes of interest in a sample.

Abstract: A method for fabricating a semiconductor memory device is provided. The method includes: etching a first region of the semiconductor memory device to expose a first capping layer; forming a second capping layer on the first capping layer; etching a portion of the first capping layer and a portion of the second capping layer to form a first trench reaching a first metal line; and forming a second metal line in the first trench to contact the first metal line.

Abstract: An intrinsically safe circuit includes energy input ports and energy output ports, and a first power line and a second power line connected in parallel between the energy input ports and energy output ports. The power lines are configured to deliver energy from the energy input ports to the energy output ports. The circuit can also include signal input ports and signal output ports, and a first signal line and a second signal line connected in parallel between the signal input ports and signal output ports. The signal lines are configured to deliver signals between the signal input ports and signal output ports. The circuit can also include a voltage clamping unit connected between the first power line, the second power line, the first signal line, and the second signal line. The circuit can also include a current limiting unit.

Abstract: An image rendering method in this application includes S1: performing ray tracing-based intersection calculation based on space information of a reflective object and space information of a reflected object to obtain M intersecting points on the reflected object, where the reflected object corresponds to at least one piece of material information, and M?1; and S2: determining, in the M intersecting points, a plurality of intersecting points corresponding to target material information, and performing shading based on the target material information and space information of the plurality of intersecting points corresponding to the target material information, to obtain an image of a reflection that is of the reflected object and that is in the reflective object, where the target material information is the at least one piece of material information.

Abstract: Methods and systems for spectral comparison and quality assessment are disclosed. In one example, a method for assessing quality of a mass spectrum (MS) of a sample is provided. The method comprises: predefining one or more features or attributes indicative of the sample quality with reference to a target compound; and calculating a quality score for the MS with respect to the selected features or attributes.

Abstract: Some embodiments pertain to a semiconductor device. The semiconductor device includes a semiconductor substrate including a trench extending downward into an upper surface of the semiconductor substrate. The trench includes a bottom surface and a plurality of scallops along sidewalls of the trench. An oxide layer lines the bottom surface and the sidewalls of the trench. The oxide layer has varying thicknesses along the sidewalls of the trench at different depths. The varying thicknesses step down at discrete increments as a depth into the trench increases.

Abstract: A fluid processing system that can include a sample container having a sample chamber for containing a fluid and a plurality of magnetic particles and at least one movable magnetic assembly configured to be movably inserted into or out of the sample chamber. The movable magnetic assembly can include a plurality of electromagnets that generate a magnetic field within at least a portion of the sample chamber when the assembly is inserted at least partially into the sample chamber. The fluid processing system can also include a signal generator that applies electrical signals, e.g., AC electrical signals, to the electromagnets of the magnetic assembly and a controller coupled to the signal generator that is configured to control phases of the electrical signals applied to the electromagnets to generate magnetic field gradients within the portion of the sample chamber effective to magnetically influence the plurality of the magnetic particles.

Abstract: A method for a three-dimensional temperature and salinity field, including: based on multi-source marine environmental data, analyzing the spatiotemporal distribution characteristics of marine dynamic environmental elements, and studying the characteristics of the temperature-salinity relation; on the basis of analysis of the spatiotemporal characteristics and study of the characteristics of the temperature-salinity relation, establishing a statistical prediction model of marine environmental dynamic elements by a spatiotemporal empirical orthogonal function method; based on the observation data of temperature and salinity obtained by the marine transportation platform, correcting a marine environment forecast field around the marine transportation platform by using a realtime analysis technology of a marine environment field; and adjusting the salinity using a temperature-salinity relation curve after the temperature and salinity are forecasted.

Abstract: Various embodiments of the present disclosure are directed towards a method for forming a memory cell. In some embodiments, a memory film is deposited over a substrate and comprises a bottom electrode layer, a top electrode layer, and a data storage film between the top and bottom electrode layers. A hard mask film is deposited over the memory film and comprises a conductive hard mask layer. The top electrode layer and the hard mask film are patterned to respectively form a top electrode and a hard mask over the top electrode. A trimming process is performed to decrease a sidewall angle between a sidewall of the hard mask and a bottom surface of the hard mask. An etch is performed into the data storage film with the hard mask in place after the trimming process to form a data storage structure underlying the top electrode.

Abstract: Electromagnetic systems and corresponding methods for assembling the electromagnetic systems are described. The electromagnetic systems can be used in fluid processing systems that include a plurality of fluid containers, each configured to define a fluid chamber that receives a fluid and a plurality of magnetic particles, and a plurality of electromagnets configured to generate a magnetic field within at least one of the plurality of the fluid containers. The fluid processing system can also include a PCB board that supplies the electromagnets with electrical current by establishing an electrical connection between electrical contact terminals included on the PCB board and spring loaded connections included on each electromagnet.

Abstract: A method of forming a semiconductor device includes the following operations. A substrate is provided with a device and an insulating layer disposed over the device. A silicon-containing heterocyclic compound precursor and a first oxygen-containing compound precursor are introduced to the substrate, so as to form a zeroth dielectric layer on the insulating layer. A zeroth metal layer is formed in the zeroth dielectric layer. A silicon-containing linear compound precursor and a second oxygen-containing compound precursor are introduced to the substrate to form a first dielectric layer on the zeroth dielectric layer. A first metal layer is formed in the first dielectric layer.

Abstract: A method for processing a semiconductor wafer is provided. The method includes polishing the semiconductor wafer with a chemical mechanical polishing (CMP) tool. The method includes transferring the polished semiconductor wafer to an interface tool from the CMP tool. The method includes discharging a mist spray over the polished semiconductor wafer in the interface tool. The method includes transferring the semiconductor wafer form the interface tool to a cleaning tool for a cleaning process.

Abstract: The present disclosure provides a semiconductor structure, including an Nth metal layer over a transistor region, where N is a natural number, and a bottom electrode over the Nth metal layer. The bottom electrode comprises a bottom portion having a first width, disposed in a bottom electrode via (BEVA), the first width being measured at a top surface of the BEVA, and an upper portion having a second width, disposed over the bottom portion. The semiconductor structure also includes a magnetic tunneling junction (MTJ) layer having a third width, disposed over the upper portion, a top electrode over the MTJ layer and an (N+1)th metal layer over the top electrode. The first width is greater than the third width.

Abstract: Disclosed are methods for separating target and non-target analytes in a sample. The methods can utilize an acoustic droplet ejector (ADE) and an open port interface (OPI) to achieve liquid chromatography (LC)-like separation for an analytical instrument such as, for example, a mass spectrometer.

Abstract: Methods and systems for delivering a liquid sample to an ion source for the generation of ions and subsequent analysis by mass spectrometry are provided herein. In accordance with various aspects of the present teachings, MS-based systems and methods are provided in which the flow of desorption solvent within a sampling probe fluidly coupled to an ion source can be selectively controlled such that one or more analyte species can be desorbed from a sample substrate inserted within the sampling probe within a decreased volume of desorption solvent for subsequently delivery to the ion source. In various aspects, sensitivity can be increased due to higher desorption efficiency (e.g., due to increased desorption time) and/or decreased dilution of the desorbed analytes.