Patents by Inventor Chao Peng

Chao Peng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6905811
    Abstract: As feature sizes approach 0.1 ?m or smaller, reduction of line edge roughness (LER) becomes increasingly important. Significant reductions in edge roughness have been achieved by applying a second Ebeam exposure after the initial one that is used to define the pattern. After this second blanket exposure a longer heat treatment and a stronger development process than before are used. In addition to reducing edge roughness the disclosed treatment allows the CD to be reduced under tight control since the amount of CD reduction is proportional to the second Ebeam dosage.
    Type: Grant
    Filed: April 22, 2003
    Date of Patent: June 14, 2005
    Assignee: Headway Technologies, Inc.
    Inventors: Chao Peng Chen, Chunping Luo, Stuart Kao, Jei-Wei Chang
  • Publication number: 20050111143
    Abstract: A method for fabricating a current-perpendicular-to-plane (CPP) giant magnetoresistive (GMR) sensor of the synthetic spin valve type is provided, the method including an electron-beam lithographic process employing both primary and secondary electron absorption and first and second self-aligned lift-off processes for patterning the capped ferromagnetic free layer and the conducting, non-magnetic spacer layer. The sensor so fabricated has reduced resistance and increased sensitivity.
    Type: Application
    Filed: November 20, 2003
    Publication date: May 26, 2005
    Inventors: Jei-Wei Chang, Chao-Peng Chen, Min Li, Kochan Ju
  • Publication number: 20050102820
    Abstract: Conventional liftoff processes used to define track width in magnetic read heads can produce an uneven etch-depth of dielectric materials around the sensor and cause shorting to the overlay top lead layer. This problem has been overcome by printing the images of track width and stripe height onto an intermediate layer to form a hard mask. Through this hard mask, the GMR stack can be selectively etched and then back-filled with a high-resistivity material by using newly developed electroless plating processes.
    Type: Application
    Filed: November 17, 2003
    Publication date: May 19, 2005
    Inventors: Jei-Wei Chang, Chao-Peng Chen, Youfeng Zheng
  • Publication number: 20050106509
    Abstract: As the critical dimensions of liftoff patterns grow smaller, it becomes increasingly more difficult to make liftoff resists that have the required resolution. This problem has been overcome by use of a combination of ion beam processing and ozone slimming to form lift-off patterns with undercuts from a single layer of photoresist. The ion beam process serves to harden the top portion of the resist while the ozone is used to oxidize and erode the lower portion resist sidewall to form the undercut.
    Type: Application
    Filed: November 14, 2003
    Publication date: May 19, 2005
    Inventors: Jei-Wei Chang, Chao-Peng Chen, Chunping Luo, Shou-Chen Kao
  • Publication number: 20050058952
    Abstract: It is very difficult to produce a negative wall angle from either negative or positive-tone chemically amplified resists, especially by e-beam lithography. This problem has now been overcome by first forming a photoresist pedestal in the conventional way, followed by flood exposing with electrons. Then, a second development treatment is given. This results in removal of additional material from the sidewalls, said removal being greatest at the substrate and least at the pedestal's top surface, resulting in negatively sloping sidewalls. Application of this method to a process for forming a pole tip for a vertical magnetic writer is also discussed.
    Type: Application
    Filed: September 12, 2003
    Publication date: March 17, 2005
    Inventors: Chao-Peng Chen, Jei-Wei Chang, Xiaohong Yang
  • Publication number: 20040214109
    Abstract: As feature sizes approach 0.1 &mgr;m or smaller, reduction of line edge roughness (LER) becomes increasingly important. Significant reductions in edge roughness have been achieved by applying a second Ebeam exposure after the initial one thatis used to define the pattern. After this second blanket exposure a longer heat treatment and a stronger development process than before are used. In addition to reducing edge roughness the disclosed treatment allows the CD to be reduced under tight control since the amount of CD reduction is proportional to the second Ebeam dosage.
    Type: Application
    Filed: April 22, 2003
    Publication date: October 28, 2004
    Applicant: Headway Technologies, Inc.
    Inventors: Chao Peng Chen, Chunping Luo, Stuart Kao, Jei-Wei Chang
  • Publication number: 20030167626
    Abstract: A major problem in Lead Overlay design for GMR structures is that the magnetic read track width is wider than the physical read track width. This is due to high interfacial resistance between the leads and the GMR layer which is an unavoidable side effect of prior art methods. The present invention uses electroplating preceded by a wet etch to fabricate the leads. This approach requires only a thin protection layer over the GMR layer to ensure that interface resistance is minimal. Using wet surface cleaning avoids sputtering defects and plating is compatible with this so the cleaned surface is preserved Only a single lithography step is needed to define the track since there is no re-deposition involved.
    Type: Application
    Filed: March 7, 2002
    Publication date: September 11, 2003
    Applicant: Headway Technologies, Inc.
    Inventors: Chao-Peng Chen, Kevin Lin, Jei-Wei Chang, Kochan Ju, Hui-Chuan Wang
  • Patent number: 6476963
    Abstract: Photographic binoculars include binoculars and a tube with a camera detachably connected to the tube. A focus adjusting mechanism of the binoculars correspond to a focus adjusting mechanism of the tube so that the adjustment to the focal length of the binoculars simultaneously adjusts the focal length of the tube. The camera is able to record an image of a subject observed from the binoculars.
    Type: Grant
    Filed: October 16, 2001
    Date of Patent: November 5, 2002
    Assignee: Navitek Technology Inc.
    Inventor: Chao-Peng Chen
  • Patent number: 6156185
    Abstract: Disclosed is a method of reactivating a deactivated anode that has a coating of a noble metal or noble metal oxide on a substrate. A coating of a noble metal is deposited on the anode electrolessly. The noble metal in the deposited coating can be platinum, palladium, iridium, rhodium, ruthenium, osmium, or a mixture thereof.
    Type: Grant
    Filed: June 11, 1999
    Date of Patent: December 5, 2000
    Assignee: Occidental Chemical Corporation
    Inventors: Chao-Peng Chen, Tilak V. Bommaraju
  • Patent number: 5948222
    Abstract: Disclosed is a method of reactivating a deactivated anode that has a coating of a noble metal or noble metal oxide on a substrate. A coating of a noble metal is deposited on the anode either electrolessly or electrolytically. The noble metal in the deposited coating can be platinum, palladium, iridium, rhodium, ruthenium, osmium, or a mixture thereof.
    Type: Grant
    Filed: May 1, 1995
    Date of Patent: September 7, 1999
    Assignee: Occidental Chemical Corporation
    Inventors: Chao-Peng Chen, Tilak V. Bommaraju
  • Patent number: 5639422
    Abstract: Disclosed is a method of reducing the corrosion of a carbon steel reboiler in which a reboiler fluid containing nitrogen trichloride is heated to decompose the nitrogen trichloride. About 1 to about 100 ppm, based on the reboiler fluid weight, of a source of iodine, is added to the reboiler.
    Type: Grant
    Filed: August 2, 1996
    Date of Patent: June 17, 1997
    Assignee: Occidental Chemical Corporation
    Inventors: Chao-Peng Chen, Tilak V. Bommaraju, Paul C. Williams
  • Patent number: 5437711
    Abstract: Disclosed is a method to be practiced in a gas purification apparatus that is suitable for contacting a chlorine-containing mixture of gases with carbon tetrachloride in order to remove one of the gases from the mixture. The gas removed can be either chlorine or another gas such as nitrogen trichloride. In the method of the invention, one of the gases is removed from the mixture in that apparatus without using carbon tetrachloride by contacting the chlorine-containing gas mixture in the apparatus with a chlorinated organic liquid which can either be chloroform or ethylene dichloride.
    Type: Grant
    Filed: December 16, 1993
    Date of Patent: August 1, 1995
    Assignee: Occidental Chemical Corporation
    Inventors: Ronald B. Kaplin, Chao-Peng Chen, Tilak V. Bommaraju