Abstract: A multiple-time programmable (MTP) structure is provided that can operate using a power supply with a supply voltage of 1.5 V to 5.5 V. When the supply voltage is above a first voltage, a first circuit is configured to induce a second constant voltage at a drain of a second transistor, and to induce the second constant voltage on a terminal in a third circuit. In some embodiments, the third circuit provides a third constant voltage on a gate of a third transistor. When the supply voltage is below the first voltage, a fifth circuit is configured to induce a fourth constant voltage on a terminal in the third circuit. The fourth constant voltage is substantially equal to the second constant voltage.

Abstract: A method and a system for memory cell programming and erasing with refreshing operation are disclosed. The system includes a selecting module, a processing module and a refresh module. In the method, at first, a target memory cell from a plurality of memory cells in a memory device is selected. Thereafter, the target memory cell belonging to a line of the matrix is programmed or erased by applying a selecting voltage on the target memory cell and a location-related memory cell belonging to the line of the matrix. Then, a refreshing operation to refresh the location-related cell is performed.

Abstract: Systems, devices and methods are provided for memory operations. An example system includes: a latch circuit shared by a plurality of memory blocks of a memory device and configured to provide one or more regulation signals for a memory operation; a source line circuit shared by the plurality of memory blocks and configured to provide a source line voltage to the plurality of memory blocks for the memory operation based at least in part on the one or more regulation signals; and a plurality of driver circuits configured to provide a plurality of drive signals to the plurality of memory blocks based at least in part on the one or more regulation signals.

Abstract: A multiple-time programmable (MTP) structure is provided that can operate using a power supply with a supply voltage of 1.5 V to 5.5 V. When the supply voltage is above a first voltage, a first circuit is configured to induce a second constant voltage at a drain of a second transistor, and to induce the second constant voltage on a terminal in a third circuit. In some embodiments, the third circuit provides a third constant voltage on a gate of a third transistor. When the supply voltage is below the first voltage, a fifth circuit is configured to induce a fourth constant voltage on a terminal in the third circuit. The fourth constant voltage is substantially equal to the second constant voltage.

Abstract: A memory includes a first memory cell, a second memory cell, a latch unit, and a switch unit. The latch unit has a true node and a complement node. The switch unit is responsive to a first control signal and a second control signal, and is configured to connect the first memory cell to the true node and to disconnect the second memory cell from the complement node in response to the first control signal and to connect the second memory cell to the complement node and to disconnect the first memory cell from the true node in response to the second control signal. A semiconductor device that includes the memory is also disclosed. A method for testing the memory is also disclosed.

Abstract: A device includes an error amplifier, a standby current source, a charging current source, a voltage divider, and a first switch. The error amplifier has a negative input terminal and a positive input terminal. The standby current source has a control terminal electrically connected to an output terminal of the error amplifier. The voltage divider has an input terminal electrically connected to an output terminal of the standby current source, and an output terminal electrically connected to the positive input terminal of the error amplifier. The charging current source has a control terminal electrically connected to the output terminal of the error amplifier. The first switch has a first terminal electrically connected to an input terminal of the charging current source, and a second terminal electrically connected to a first power supply node.

Abstract: A method and a system for memory cell programming and erasing with refreshing operation are disclosed. The system includes a selecting module, a processing module and a refresh module. In the method, at first, a target memory cell from a plurality of memory cells in a memory device is selected. Thereafter, the target memory cell belonging to a line of the matrix is programmed or erased by applying a selecting voltage on the target memory cell and a location-related memory cell belonging to the line of the matrix.

Abstract: Systems, devices and methods are provided for memory operations. An example system includes: a latch circuit shared by a plurality of memory blocks of a memory device and configured to provide one or more regulation signals for a memory operation; a source line circuit shared by the plurality of memory blocks and configured to provide a source line voltage to the plurality of memory blocks for the memory operation based at least in part on the one or more regulation signals; and a plurality of driver circuits configured to provide a plurality of drive signals to the plurality of memory blocks based at least in part on the one or more regulation signals.

Abstract: A memory includes a first memory cell, a second memory cell, a latch unit, and a switch unit. The latch unit has a true node and a complement node. The switch unit is responsive to a first control signal and a second control signal, and is configured to connect the first memory cell to the true node and to disconnect the second memory cell from the complement node in response to the first control signal and to connect the second memory cell to the complement node and to disconnect the first memory cell from the true node in response to the second control signal. A semiconductor device that includes the memory is also disclosed. A method for testing the memory is also disclosed.

Abstract: A circuit for generating an output voltage and method for setting an output voltage of a low dropout regulator are provided. A current source is configured to generate a reference current, and an error amplifier has a first input, a second input, and a single-ended output. The first input is connected to a reference voltage, and the second input is connected to an output node of the circuit via a feedback resistor. A pass transistor includes a control electrode connected to the single-ended output of the error amplifier, a first electrode connected to a power supply voltage, and a second electrode connected to the output node of the circuit. A first branch of a current mirror is connected to the current source, and a second branch of the current mirror is connected to the second terminal of the feedback resistor. The output node provides an output voltage of the circuit.

Abstract: A bandgap reference voltage circuit includes a bandgap reference voltage generator and a startup current generator. The bandgap reference voltage generator is configured to generate a first voltage and a second voltage. The startup current generator includes a voltage comparator and a switch. The voltage comparator is connected to the bandgap reference voltage generator and is configured to compare the first voltage with the sum of the second voltage and an offset voltage and to generate a comparison result. The switch is connected between the voltage comparator and the bandgap reference voltage generator and is configured to selectively connect a supply voltage to the bandgap reference voltage generator based on the comparison result. A device that includes the circuit is also disclosed. A method of operating the circuit is also disclosed.

Abstract: A nonvolatile memory device comprises a cell array including a memory cell. The nonvolatile memory device also includes a reference signal generator configured to generate a reference current for reading data stored in the memory cell. The reference signal generator includes a first circuit coupled to a current summation node and having a reference cell. The first circuit is configured to generate a first current that flows between drain and source terminals of a transistor in the reference cell. The reference signal generator also includes a second circuit coupled to the current summation node and configured to generate a second current that is a temperature-dependent current. The current summation node is configured to combine the first and second currents to generate the reference current that tracks a temperature trend of a current flowing through the memory cell.

Abstract: An integrated circuit that includes a generator unit connected to one or more pull-up units, one or more pull-up units connected to one or more source lines and an array of memory cells connected to the one or more source lines. The generator unit is configured to set a first voltage signal of each pull-up unit of the one or more pull-up units. Each pull-up unit of the one or more pull-up units is connected with the corresponding source line of the one or more source lines and is configured to set a current of the corresponding source line of the one or more source lines. The array of memory cells is electrically connected to the one or more source lines and one or more bit lines.

Abstract: A method and a system for memory cell programming and erasing with refreshing operation are disclosed. The system includes a selecting module, a processing module and a refresh module. In the method, at first, a target memory cell from a plurality of memory cells in a memory device is selected. Thereafter, the target memory cell belonging to a line of the matrix is programmed or erased by applying a selecting voltage on the target memory cell and a location-related memory cell belonging to the line of the matrix.

Abstract: A method and a system for memory cell programming and erasing with refreshing operation are disclosed. The system includes a selecting module, a processing module and a refresh module. In the method, at first, a target memory cell from a plurality of memory cells in a memory device is selected. Thereafter, the target memory cell belonging to a line of the matrix is programmed or erased by applying a selecting voltage on the target memory cell and a location-related memory cell belonging to the line of the matrix. Then, a refreshing operation to refresh the location-related cell is performed.

Abstract: An electronic device includes a first circuit, a second circuit, and a power on control (POC) circuit. The POC circuit includes an enable terminal electrically connected to a first output of the first circuit, a first input terminal electrically connected to a first voltage supply, a second input terminal electrically connected to a second voltage supply, and an output terminal. The second circuit includes a biasing-sensitive circuit, and a logic circuit including a first input terminal electrically connected to a second output of the first circuit, a second input terminal electrically connected to the output of the POC circuit, and an output terminal electrically connected to an enable terminal of the biasing-sensitive circuit.

Abstract: An integrated circuit that includes a generator unit connected to one or more pull-up units, one or more pull-up units connected to one or more source lines and an array of memory cells connected to the one or more source lines. The generator unit is configured to set a first voltage signal of each pull-up unit of the one or more pull-up units. Each pull-up unit of the one or more pull-up units is connected with the corresponding source line of the one or more source lines and is configured to set a current of the corresponding source line of the one or more source lines. The array of memory cells is electrically connected to the one or more source lines and one or more bit lines.

Abstract: A multiple-time programmable (MTP) structure is provided that can operate using a power supply with a supply voltage of 1.5 V to 5.5 V. When the supply voltage is above a first voltage, a first circuit is configured to induce a second constant voltage at a drain of a second transistor, and to induce the second constant voltage on a terminal in a third circuit. In some embodiments, the third circuit provides a third constant voltage on a gate of a third transistor. When the supply voltage is below the first voltage, a fifth circuit is configured to induce a fourth constant voltage on a terminal in the third circuit. The fourth constant voltage is substantially equal to the second constant voltage.

Abstract: A memory controller has a bit line driver configured to supply a selected bit line voltage to a selected bit line and an unselected bit line voltage to an unselected bit line. The selected bit line is coupled to a selected memory cell, and the unselected bit line is coupled to an unselected memory cell. The memory controller further has a word line driver configured to supply a selected word line voltage to a selected word line and an unselected word line voltage to an unselected word line. The selected word line is coupled to the selected memory cell, and the unselected word line is coupled to the unselected memory cell. The unselected bit line voltage is equal to or higher than a difference between the unselected word line voltage and a threshold voltage of the unselected memory cell.

Abstract: A method and a system for memory cell programming and erasing with refreshing operation are disclosed. The system includes a selecting module, a processing module and a refresh module. In the method, at first, a target memory cell from a plurality of memory cells in a memory device is selected. Thereafter, the target memory cell belonging to a line of the matrix is programmed or erased by applying a selecting voltage on the target memory cell and a location-related memory cell belonging to the line of the matrix. Then, a refreshing operation to refresh the location-related cell is performed.