Abstract: A system and method for reducing cross-talk in complementary metal oxide semiconductor back side illuminated image sensors is provided. An embodiment comprises forming a grid around the pixel regions on an opposite side of the substrate than metallization layers. The grid may be formed of a material such as tungsten with a (110)-rich crystalline orientation. This orientation helps prevents defects that can occur during patterning of the grid.

Abstract: A semiconductor contact structure and method provide contact structures that extend through a dielectric material and provide contact to multiple different subjacent materials including a silicide material and a non-silicide material such as doped silicon. The contact structures includes a lower composite layer formed using a multi-step ionized metal plasma (IMP) deposition operation. A lower IMP film is formed at a high AC bias power followed by the formation of an upper IMP film at a lower AC bias power. The composite layer may be formed of titanium. A further layer is formed as a liner over the composite layer and the liner layer may advantageously be formed using CVD and may be TiN. A conductive plug material such as tungsten or copper fills the contact openings.

Abstract: Disclosed is a high thermally conductive composite, including a first composite and a second composite having a co-continuous and incompatible dual-phase manner. The first composite consists of glass fiber distributed into polyphenylene sulfide, and the second composite consists of carbon material distributed into polyethylene terephthalate. The carbon material includes graphite, graphene, carbon fiber, carbon nanotube, or combinations thereof.

Abstract: A lock device includes a tongue engaged in a housing, an anchoring device slidably disposed in the housing and movable with a moving device, the includes two sides each having a latch socket and an anchoring member, when one side of the anchoring device is directed toward the tongue, the lock device is locked when the moving device is turned off, and the lock device is locked when the moving device is turned on and when the other side of the anchoring device is directed toward the tongue, such that the electric lock device is adjustable and operatable when the electromagnetic mechanism of the moving device is either switched on or switched off.

Abstract: A semiconductor contact structure and method provide contact structures that extend through a dielectric material and provide contact to multiple different subjacent materials including a silicide material and a non-silicide material such as doped silicon. The contact structures includes a lower composite layer formed using a multi-step ionized metal plasma (IMP) deposition operation. A lower IMP film is formed at a high AC bias power followed by the formation of an upper IMP film at a lower AC bias power. The composite layer may be formed of titanium. A further layer is formed as a liner over the composite layer and the liner layer may advantageously be formed using CVD and may be TiN. A conductive plug material such as tungsten or copper fills the contact openings.

Abstract: Systems and methods for secure program execution are described. At least one embodiment includes a system for securely executing software comprising a host configured to accept a disc containing encrypted content to be accessed and store an encrypted program used to access the content on the disc. The system further comprises a secure coprocessor communicatively coupled to the host and configured to receive the encrypted program, decrypt and execute the encrypted program, and communicate an output generated by the program back to the host.

Abstract: An analysis method for a semiconductor device is described. The semiconductor device having an abnormal region is provided. Thereafter, a focused ion beam microscope analysis process is performed to the abnormal region, wherein the result of the focused ion beam microscope analysis process shows that the abnormal region has a defect therein. After the focused ion beam microscope analysis process, an electrical property measurement step is performed to the abnormal region, so as to determine whether the defect in the abnormal region is a device failure root cause or not.

Abstract: An decorated device including a first body, a second body, a first decoration layer, and a second decoration layer is provided. The second body is disposed beside the first body. The first decoration layer contacts with the first body. The second decoration layer contacts with the second body, wherein the first body contacts with at least two of the second body, the first decoration layer, and the second decoration layer.

Abstract: A lock device includes a tongue slidably engaged with a housing and extendible out of the housing, an anchoring device slidably disposed in the housing and having two anchoring members for selectively aligning with the tongue and having a compartment formed between the anchoring members, and a moving device for moving the anchoring device relative to the housing to selectively align either of the anchoring members with the tongue and for preventing the tongue from being engaged into the compartment of the anchoring device. The moving device includes an electromagnetic mechanism coupled to the anchoring device for moving the anchoring device relative to the housing.

Abstract: An analysis method for a semiconductor device is described. The semiconductor device having an abnormal region is provided. Thereafter, a focused ion beam microscope analysis process is performed to the abnormal region, wherein the result of the focused ion beam microscope analysis process shows that the abnormal region has a defect therein. After the focused ion beam microscope analysis process, an electrical property measurement step is performed to the abnormal region, so as to determine whether the defect in the abnormal region is a device failure root cause or not.

Abstract: A projection system and a method thereof are provided. The projection method includes the following steps. First, a processing module of an electronic device acquires a process ID of an application program via an operating system of the electronic device. Next, the processing module extracts display data corresponding to a window of the application program from a frame buffer of the electronic device stepwise with a predetermined frequency. Next, the processing module produces a plurality of pictures based on the extracted display data with the predetermined frequency. Next, the processing module transmits the pictures to a projector according to a predetermined transmission protocol. Finally, the projector projects the pictures sequentially.

Abstract: An electromagnetic lock includes a mounting plate for attaching to a supporting device and the mounting plate includes one or more protrusions each having a screw hole, a housing includes one or more passages aligned with the protrusions and the screw holes of the mounting plate for quickly anchoring and positioning the housing to the mounting plate, and a fastener is engaged through each passage of the housing and engaged with the screw hole of the mounting plate for easily and quickly securing the housing to the mounting plate and for preventing the housing from being held by the user for a long time.

Abstract: A carbon-containing metal-based composite material and a manufacturing method thereof are provided. The carbon-containing metal-based composite material includes a plurality of graphites, a plurality of heat-conducting reinforcements and a metal matrix. The graphites occupy 35%˜90% in volume. The heat-conducting reinforcements are distributed between the graphites. The heat-conducting reinforcements and the graphites are self-bonded. The heat-conducting reinforcements occupy 5%˜30% in volume and have a thermal conductivity larger than 200 W/mK. The metal matrix is filled between the heat-conducting reinforcements and the graphites, and the metal matrix occupies 5%˜35% in volume.

Abstract: A lock device includes a tongue slidably engaged with a housing and extendible out of the housing, an anchoring device slidably disposed in the housing and having two anchoring members for selectively aligning with the tongue and having a compartment formed between the anchoring members, and a moving device for moving the anchoring device relative to the housing to selectively align either of the anchoring members with the tongue and for preventing the tongue from being engaged into the compartment of the anchoring device. The moving device includes an electromagnetic mechanism coupled to the anchoring device for moving the anchoring device relative to the housing.

Abstract: Methods of preventing private information, which is hidden within data of a private domain reserved by an application program, from being easily accessed by a CPU and other devices, both where the data of the private domain is decrypted and the access to said data are restricted are disclosed, where the mentioned other devices do not include a decryption module utilized in the methods. Therefore, as long as agreements related to encryptions and decryptions are made in advance between the application program and the decryption module, private information can be well protected.

Abstract: A structure includes a surface and a non-equilibrium two-dimensional semiconductor micro structure on the surface.

Abstract: The present invention relates to a substrate and testing method thereof. The method of the invention comprises: (a) providing a substrate, the substrate having a first surface and a second surface, the first surface having a plurality of first testing pads and the second surface having a plurality of second testing pads; (b) forming a conductive material on the first surface to electrically connect at least two first testing pads; and (c) testing the substrate by utilizing a testing fixture, the testing fixture having at least one first testing probe unit and at least one second testing probe unit. Whereby, the first testing probe unit and the second testing probe unit can easily measure the electrical characteristics of the substrate, and the testing process and testing time can be reduced.

Abstract: Systems and methods for secure program execution are described. At least one embodiment includes a system for securely executing software comprising a host configured to accept a disc containing encrypted content to be accessed and store an encrypted program used to access the content on the disc. The system further comprises a secure coprocessor communicatively coupled to the host and configured to receive the encrypted program, decrypt and execute the encrypted program, and communicate an output generated by the program back to the host.

Abstract: Systems and methods for storing and accessing encrypted content are described. At least one embodiment includes a system for storing and accessing encrypted content comprising a secure hardware device coupled to a memory comprising a trusted module, wherein the hardware device is configured to receive content from a remote location, and wherein the hardware device is configured to encrypt content and generate a key for decrypting the content. The system further comprises logic stored within the memory configured to access the encrypted content, wherein the logic comprises a plurality of decryption modules and at least one decoder.

Abstract: A method for activating video-audio data in an optical disc includes determining whether a first activation signal is received or not, a program in the optical disc allowing access to partially-featured contents of the video-audio data when the first activation signal is not received, and the program in the optical disc allowing access to fully-featured contents of the video-audio data when the first activation signal is received.