Abstract: A phase-lock-loop (PLL) circuit includes a reference PLL circuit configured to generate a reference clock signal; a single clock tree circuit, coupled to the reference PLL circuit, and configured to distribute the reference clock signal; and a plurality of designated PLL circuits coupled to the clock tree circuit, wherein the designated PLL circuits are each configured to receive the distributed reference clock signal through the single clock tree circuit and provide a respective clock signal based on the reference clock signal.

Abstract: Hybrid phase lock loop (PLL) devices are provided that combine advantages of the digital controlled loop and the analog controlled loop. For example, a hybrid PLL includes a digital controlled loop that receives a reference input signal and an output signal of the hybrid PLL, and generates a digital tuning word. The hybrid PLL further includes an analog controlled loop that receives the reference input signal and the output signal of the hybrid PLL, and generates an output voltage. The hybrid PLL also includes a hybrid oscillator. An oscillator controller of the digital controlled loop controls the hybrid oscillator using the digital tuning word and disables the analog controlled loop during a frequency tracking operation mode of the hybrid PLL. The oscillator controller enables the analog controlled loop to control the hybrid oscillator during the phase tracking operation mode of the hybrid PLL.

Abstract: A phase lock loop (PLL), such as an all digital phase lock loop (ADPLL) to provide an example, of the present disclosure operates in a frequency tracking mode to adjust a frequency of the output signal to be proportional to a frequency of a reference input signal, or, in a phase tracking mode to adjust a phase of the output signal to match any variations in the reference input signal. The ADPLL includes a phase and/or frequency detector that provides an error signal representing a difference, in frequency and/or phase, between the output signal and the reference input signal. The ADPLL monitors a trend of the error signal, such as a positive trend, a negative trend, or a flat trend to provide some examples, and switches among the frequency tracking mode and the phase tracking mode upon detecting a change in the trend of the error signal.

Abstract: Disclosed herein are nanoparticles and method for manufacturing the same. The nanoparticle is essentially composed of albumin and polyethylene glycol, wherein the albumin is covalently crosslinked with the polyethylene glycol.

Abstract: A phase lock loop (PLL), such as an all digital phase lock loop (ADPLL) to provide an example, of the present disclosure operates in a frequency tracking mode to adjust a frequency of the output signal to be proportional to a frequency of a reference input signal, or, in a phase tracking mode to adjust a phase of the output signal to match any variations in the reference input signal. The ADPLL includes a phase and/or frequency detector that provides an error signal representing a difference, in frequency and/or phase, between the output signal and the reference input signal. The ADPLL monitors a trend of the error signal, such as a positive trend, a negative trend, or a flat trend to provide some examples, and switches among the frequency tracking mode and the phase tracking mode upon detecting a change in the trend of the error signal.

Abstract: An IC degradation sensor is disclosed. The IC degradation management sensor includes an odd number of first logic gates electrically connected in a ring oscillator configuration, each first logic gate having an input and an output. Each first logic gate further includes a first PMOS transistor, a first NMOS transistor and a second logic gate having an input and an output. The input of the second logic gate is the input of the first logic gate, and the drains of the first PMOS transistor and the first NMOS transistor are electrically connected to the output of the second logic gate, and the output of the second logic gate is the output of the first logic gate.

Abstract: Disclosed herein is a radioimmune complex comprising an epidermal growth factor receptor (EGFR)-targeted antibody and a radioactive isotope of rhenium labeled thereon. The EGFR-targeted antibody is cetuximab or panitumumab.

Abstract: A phase lock loop (PLL) such as an all digital phase lock loop (ADPLL) to provide an example, of the present disclosure operates in a frequency tracking mode to adjust a frequency of the output signal to be proportional to a frequency of a reference input signal, or, in a phase tracking mode to adjust a phase of the output signal to match any variations in the reference input signal. The ADPLL includes a phase and/or frequency detector that provides an error signal representing a difference, in frequency and/or phase, between the output signal and the reference input signal.

Abstract: An example circuit includes: a slew rate driver configured to provide an output voltage; a first voltage provider configured to provide a first input voltage to the slew rate driver in response to the output voltage being within a first range; and a second voltage provider configured to provide a second input voltage to the slew rate driver in response to the output voltage being within a second range. The slew rate driver is further configured to change the output voltage based at least in part on the first input voltage or the second input voltage.

Abstract: An automated test apparatus for risk and integrity testing for pharmaceutical filtration membranes, including at least the following components: a liquid injection inlet, a pump, a fluid pressure gauge, a gas pressure gauge, a plurality of solenoid valves, a plurality of membranes, a gas pressure regulator valve, a pharmaceutical product bottle, and a bubble generation bottle. The automated test apparatus of the present invention is controlled by computer software in connection with an automatic pharmaceutical synthesis apparatus for automated testing. In use of the automated test apparatus of the present invention, it needs only to start the operating system of the automated test apparatus for membrane risk and integrity test after the completion of the automatic pharmaceutical synthesis. The membrane risk and integrity test can be accomplished in a short time by measuring pressures of gas and liquid with pressure gauges deposed online concurrently.

Abstract: An example circuit includes: a slew rate driver configured to provide an output voltage; a first voltage provider configured to provide a first input voltage to the slew rate driver in response to the output voltage being within a first range; and a second voltage provider configured to provide a second input voltage to the slew rate driver in response to the output voltage being within a second range. The slew rate driver is further configured to change the output voltage based at least in part on the first input voltage or the second input voltage.

Abstract: A die stack comprises a first integrated circuit (IC) die having at least a first device comprising a first source, a first drain and a first gate electrode above a first channel region between the first source and the first drain. A second IC die has at least a second device comprising a second source, a second drain and a second gate electrode above a second channel region between the second source and the second drain. The second gate electrode is connected to the first gate electrode by a path including a first through substrate via (TSV), the second drain connected to the first source by a path including a second TSV.

Abstract: Disclosed herein are nanoparticles and method for manufacturing the same. The nanoparticle is essentially composed of albumin and polyethylene glycol, wherein the albumin is covalently crosslinked with the polyethylene glycol.

Abstract: A frequency scaling method is disclosed. The method is used for changing an output frequency of an all-digital phase-locked loop (ADPLL) from a first frequency to a second frequency different from the first frequency. The method includes: stopping a feeding of a first oscillator tuning word (OTW) to a digitally controlled oscillator (DCO) of the ADPLL, wherein the first OTW is generated based on a phase detecting result obtained with respect to the first frequency; feeding a second OTW to the DCO in order to change the output frequency from the first frequency to the second frequency; and performing a zero phase restart (ZPR) operation to produce the phase detecting result according to the second frequency. An associated ADPLL and a frequency scaling circuit are also disclosed.

Abstract: A frequency scaling method is disclosed. The method is used for changing an output frequency of an all-digital phase-locked loop (ADPLL) from a first frequency to a second frequency different from the first frequency. The method includes: stopping a feeding of a first oscillator tuning word (OTW) to a digitally controlled oscillator (DCO) of the ADPLL, wherein the first OTW is generated based on a phase detecting result obtained with respect to the first frequency; feeding a second OTW to the DCO in order to change the output frequency from the first frequency to the second frequency; and performing a zero phase restart (ZPR) operation to produce the phase detecting result according to the second frequency. An associated ADPLL and a frequency scaling circuit are also disclosed.

Abstract: A die stack comprises a first integrated circuit (IC) die having at least a first device comprising a first source, a first drain and a first gate electrode above a first channel region between the first source and the first drain. A second IC die has at least a second device comprising a second source, a second drain and a second gate electrode above a second channel region between the second source and the second drain. The second gate electrode is connected to the first gate electrode by a path including a first through substrate via (TSV), the second drain connected to the first source by a path including a second TSV.

Abstract: A system and method is disclosed for adaptively adjusting a duty cycle of a signal between a first and second chip in a 3D architecture/stack for adaptively calibrating a chip in a 3D architecture/stack. In one embodiment, the system includes a first chip and a second chip located within the 3D chip stack, wherein the first chip generates a calibration signal, the second chip receives the calibration signal and compares it to a reference signal to generate a comparison signal that further compared to a reference duty signal to generate a reference duty comparison signal, that is then provided to the first chip to generate a drive signal that adjusts a duty cycle of the calibration signal.

Abstract: A phase detector includes a plurality of sampling circuits, a logic circuit, a plurality of demultiplexers and a decision circuit, wherein the plurality of sampling circuits use a plurality of clock signals with different phases to sample a data signal respectively to generate a plurality of sampling results; the logic circuit generate N phase-leading signals and N phase-lagging signals according the plurality of sampling results; the plurality of demultiplexers perform demultiplex operations to the N phase-leading signals and the N phase-lagging signals respectively to generate M phase-leading output signals and M phase-lagging output signals respectively; and the decision circuit generates a final phase-leading signal and a final phase-lagging signal according the M phase-leading output signals and the M phase-lagging output signals.

Abstract: A voltage controlled oscillator (VCO) includes a sensing circuit, where the sensing circuit is configured to generate a plurality of compensation control signals. The VCO further includes a voltage-to-current converter comprising a plurality of current sources which are configured to generate a current signal in response to the plurality of compensation control signals. Additionally, the VCO includes a plurality of switching circuits, each of the plurality of switching circuits being configured to selectively enable or disable a corresponding one of the plurality of current sources in response to a corresponding one of the plurality of compensation control signals. Furthermore, the VCO includes a current controlled oscillator configured to generate an oscillating signal in response to the current signal.

Abstract: Systems and methods are disclosed for aligning multiple data bits by adjusting the timing of input lines for those data bits. Embodiments include a hierarchical structure for comparing the timing of multiple sets of bits. Other embodiments include aligning data bits from multiple chips in a 3D die stacking architecture.