Abstract: A semiconductor structure includes at least a fin-shaped structure, a gate, a source/drain region, an interdielectric layer and an epitaxial structure. At least a fin-shaped structure is located on a bottom substrate. The gate covers the fin-shaped structure. The source/drain region is located in the fin-shaped structure next to the gate. The interdielectric layer covers the gate and the fin-shaped structure, wherein the interdielectric layer has a plurality of contact holes, respectively exposing at least a part of the source/drain region. The epitaxial structure is located in each of the contact holes, directly contacts and is only located on the source/drain region. Additionally, a semiconductor process formed said semiconductor structure is also provided.

Abstract: A method for fabricating a semiconductor device comprises steps as follows: A first dummy gate having a first high-k gate insulator layer, a first composite sacrificial layer, and a first dummy gate electrode sequentially stacked on a substrate is firstly provided. The first dummy gate electrode is subsequently removed to expose the first composite sacrificial layer. The first composite sacrificial layer is then removed. Thereafter, a first work function layer is formed on the first high-k gate insulator layer, and a first metal gate electrode is formed on the first work function layer.

Abstract: A manufacturing method for a dual damascene structure first includes providing a substrate having at least a dielectric layer, a first hard mask layer, a first cap layer, a second hard mask layer, and a second cap layer sequentially formed thereon, performing a first double patterning process to form a plurality of first trench openings and second trench openings in the second cap layer and the second hard mask, and the first layer being exposed in bottoms of the first trench openings and the second trench openings, performing a second double patterning process to form a plurality of first via openings and second via openings in the first cap layer and the first hard mask layer, and transferring the first trench openings, the second trench openings, the first via openings, and the second via openings to the dielectric layer to form a plurality of dual damascene openings.

Abstract: A method for fabricating a semiconductor device includes providing a substrate sequentially having a polysilicon layer and an insulating layer formed thereon; patterning the polysilicon layer and the insulating layer to form at least a gate structure on the substrate; forming lightly doped regions in the substrate respectively at two side of the gate structure; forming a spacer on a sidewall of the gate structure; forming barrier layers respectively on a top surface of the gate structure and surfaces of the substrate at two sides of the spacer, and forming a source/drain in the substrate respectively at two sides of the spacer.

Abstract: A method of changing display settings of a device (5) for displaying a video signal includes generating new display settings by varying the value of a first display parameter defining the display settings, between a first limit and a second limit; displaying an image on a screen (6) according to the new display settings; and replacing the display settings by the new display settings upon a given command. The new display settings are generated by varying the value of at least one other display parameter defining the display settings simultaneously with the value of the first display parameter.

Abstract: A method of changing display settings of a device (5) for displaying a video signal comprises generating new display settings by varying the value of a first display parameter defining the display settings, between a first limit and a second limit; displaying an image on a screen (6) according to the new display settings; and replacing the display settings by the new display settings upon a given command. The new display settings are generated by varying the value of at least one other display parameter defining the display settings simultaneously with the value of the first display parameter.