Abstract: A system and method for predecoding memory addresses by generating a sequence of predecode signals based on the memory address, providing the sequence of predecode signals as a first set of activation signals, and based on the value of the memory address, either resequencing the sequence of predecode signals and providing the resequenced predecode signals as a second set of activation signals or providing the sequence of predecode signals as the second set of activation signals.

Abstract: A delay-locked loop adjusts a delay of a clock signal that is generated in response to an external clock signal. The clock signal is applied to an output buffer to clock the buffer so that data or clock signals from the buffer are synchronized with the external clock signal. The output buffer operates in a full-drive and reduced-drive mode in response to an output drive strength bit having first and second logic states, respectively. The delay-locked loop adjusts the delay of the clock signal in response to the state of the output drive strength bit to keep the data or clock signals from the buffer synchronized during both modes of operation.

Abstract: A delay-locked loop adjusts a delay of a clock signal that is generated in response to an external clock signal. The clock signal is applied to an output buffer to clock the buffer so that data or clock signals from the buffer are synchronized with the external clock signal. The output buffer operates in a full-drive and reduced-drive mode in response to an output drive strength bit having first and second logic states, respectively. The delay-locked loop adjusts the delay of the clock signal in response to the state of the output drive strength bit to keep the data or clock signals from the buffer synchronized during both modes of operation.

Abstract: A system and method for predecoding memory addresses by generating a sequence of predecode signals based on the memory address, providing the sequence of predecode signals as a first set of activation signals, and based on the value of the memory address, either resequencing the sequence of predecode signals and providing the resequenced predecode signals as a second set of activation signals or providing the sequence of predecode signals as the second set of activation signals.

Abstract: A delay-locked loop adjusts a delay of a clock signal that is generated in response to an external clock signal. The clock signal is applied to an output buffer to clock the buffer so that data or clock signals from the buffer are synchronized with the external clock signal. The output buffer operates in a full-drive and reduced-drive mode in response to an output drive strength bit having first and second logic states, respectively. The delay-locked loop adjusts the delay of the clock signal in response to the state of the output drive strength bit to keep the data or clock signals from the buffer synchronized during both modes of operation.

Abstract: A method and apparatus for programmable column segmentation of a memory device is disclosed. The method and apparatus provide different programmable selected column segmentation arrangements to provide more flexibility in primary column repair of a memory device.

Abstract: A system and method for predecoding memory addresses by generating a sequence of predecode signals based on the memory address, providing the sequence of predecode signals as a first set of activation signals, and based on the value of the memory address, either resequencing the sequence of predecode signals and providing the resequenced predecode signals as a second set of activation signals or providing the sequence of predecode signals as the second set of activation signals.

Abstract: A method and apparatus for programmable column segmentation of a memory device is disclosed. The method and apparatus provide different programmable selected column segmentation arrangements to provide more flexibility in primary column repair of a memory device.

Abstract: A delay-locked loop adjusts a delay of a clock signal that is generated in response to an external clock signal. The clock signal is applied to an output buffer to clock the buffer so that data or clock signals from the buffer are synchronized with the external clock signal. The output buffer operates in a full-drive and reduced-drive mode in response to an output drive strength bit having first and second logic states, respectively. The delay-locked loop adjusts the delay of the clock signal in response to the state of the output drive strength bit to keep the data or clock signals from the buffer synchronized during both modes of operation.

Abstract: A delay-locked loop adjusts a delay of a clock signal that is generated in response to an external clock signal. The clock signal is applied to an output buffer to clock the buffer so that data or clock signals from the buffer are synchronized with the external clock signal. The output buffer operates in a full-drive and reduced-drive mode in response to an output drive strength bit having first and second logic states, respectively. The delay-locked loop adjusts the delay of the clock signal in response to the state of the output drive strength bit to keep the data or clock signals from the buffer synchronized during both modes of operation.

Abstract: A method and apparatus for programmable column segmentation of a memory device is disclosed. The method and apparatus provide different programmable selected column segmentation arrangements to provide more flexibility in primary column repair of a memory device.

Abstract: An integrated memory circuit is provided having at least one subtractor coupled to each redundant fuse set for subtracting a predetermined value from a known redundant address value, thereby calculating a comparison value. Once the comparison value is calculated, it is forwarded to a redundant compare circuit where it is compared to the address of a primary circuit element specified by the user. If a match is found, the primary circuit element sought to be accessed is bypassed and a redundant circuit element is activated to carry out the desired operation.

Abstract: An integrated memory circuit is provided having at least one subtractor coupled to each redundant fuse set for subtracting a predetermined value from a known redundant address value, thereby calculating a comparison value. Once the comparison value is calculated, it is forwarded to a redundant compare circuit where it is compared to the address of a primary circuit element specified by the user. If a match is found, the primary circuit element sought to be accessed is bypassed and a redundant circuit element is activated to carry out the desired operation.

Abstract: A circuit is designed with a delay circuit (300) coupled to receive a clock input signal (CLK) and a control signal (DFT). The control signal has a first logic state and a second logic state. The delay circuit produces a clock control signal (*CLK) at a first time in response to the first logic state and at a second time in response to the second logic state. A clock circuit (200) is coupled to receive the clock input signal and is enabled by the clock control signal. The clock circuit produces a first clock pulse signal having a predetermined width in response to a first transition of the clock input signal and produces a second clock pulse signal having the predetermined width in response to a second transition of the clock input signal.

Abstract: A device is discussed that enables an input buffer to recognize the first rising edge of a strobe so as to validate data. In one embodiment, a method for enabling recognition of valid data in a DDR SDRAM is discussed. The method includes analyzing memory commands before a setup time is expired, and validating the data to input into the DDR SDRAM when the act of analyzing memory commands enables a circuit to recognize the first rising edge of a strobe so as to validate the data. In another embodiment, a device for enabling validation of data in a DDR SDRAM is discussed. The device includes an analyzer to analyze commands to produce a write signal, and an enabling circuit to produce an enabling signal before the write signal is confirmed to recognize a first rising edge of a strobe so as to validate the data.

Abstract: An integrated memory circuit is provided having at least one subtractor coupled to each redundant fuse set for subtracting a predetermined value from a known redundant address value, thereby calculating a comparison value. Once the comparison value is calculated, it is forwarded to a redundant compare circuit where it is compared to the address of a primary circuit element specified by the user. If a match is found, the primary circuit element sought to be accessed is bypassed and a redundant circuit element is activated to carry out the desired operation.

Abstract: A redundancy circuit (300) for generating a standard column access signal (STD) and a redundant column access signal (RED) is disclosed. A modified NOR-type decoder (310) determines if an applied address is the same as a defective address. In the event the applied address is the same as the defective address, a match indication is activated. In the event the applied address is different than the defective address, a no match indication is generated. The match indication activates the RED signal and the no match indication activates the STD signal, according to the timing of a "mimic" circuit (312). The mimic circuit (312) emulates the slowest resolution of the match/no match indication by the modified NOR-type decoder (310).

Abstract: Testing of an integrated circuit having arrays of memory cells occurs by writing to all of the arrays at the same time. Normal writing occurs only to one array. Additional test data bus leads on the chip carry test data signals from selected arrays to comparison circuits. The outputs of the comparison circuits flow to the output circuits of the chip. This achieves writing test data to four times the number of arrays as in a normal write and reading test data from twice the number of arrays as in a normal read operation.