Patents by Inventor David Davies
David Davies has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11950884Abstract: Embodiments of the present disclosure are configured to assess the severity of a blockage in a vessel and, in particular, a stenosis in a blood vessel. In some particular embodiments, the devices, systems, and methods of the present disclosure are configured to assess the severity of a stenosis in the coronary arteries without the administration of a hyperemic agent.Type: GrantFiled: February 5, 2021Date of Patent: April 9, 2024Assignees: PHILIPS IMAGE GUIDED THERAPY CORPORATION, IMPERIAL COLLEGE OF SCIENCE, TECHNOLOGY & MEDICINE, MEDSOLVE LIMITEDInventors: Justin Davies, Joseph Burnett, Neil Hattangadi, David Anderson, Helen Davies
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Publication number: 20230333482Abstract: A method for categorizing a substrate subject to a semiconductor manufacturing process including multiple operations, the method including: obtaining values of functional indicators derived from data generated during one or more of the multiple operations on the substrate, the functional indicators characterizing at least one operation; applying a decision model including one or more threshold values to the values of the functional indicators to obtain one or more categorical indicators; and assigning a category to the substrate based on the one or more categorical indicators.Type: ApplicationFiled: June 21, 2023Publication date: October 19, 2023Applicant: ASML NETHERLANDS B.V.Inventors: Arnaud HUBAUX, Johan Franciscus Maria Beckers, Dylan John David Davies, Johan Gertrudis Cornelis Kunnen, Willem Richard Pongers, Ajinkya Ravindra Daware, Chung-Hsun Li, Georgios Tsirogiannis, Hendrik Cornelis Anton Borger, Frederik Eduard De Jong, Juan Manuel Gonzalez Huesca, Andriy Hlod, Maxim Pisarenco
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Patent number: 11687007Abstract: A method for categorizing a substrate subject to a semiconductor manufacturing process including multiple operations, the method including: obtaining values of functional indicators derived from data generated during one or more of the multiple operations on the substrate, the functional indicators characterizing at least one operation; applying a decision model including one or more threshold values to the values of the functional indicators to obtain one or more categorical indicators; and assigning a category to the substrate based on the one or more categorical indicators.Type: GrantFiled: January 9, 2020Date of Patent: June 27, 2023Assignee: ASML NETHERLANDS B.V.Inventors: Arnaud Hubaux, Johan Franciscus Maria Beckers, Dylan John David Davies, Johan Gertrudis Cornelis Kunnen, Willem Richard Pongers, Ajinkya Ravindra Daware, Chung-Hsun Li, Georgios Tsirogiannis, Hendrik Cornelis Anton Borger, Frederik Eduard De Jong, Juan Manuel Gonzalez Huesca, Andriy Hlod, Maxim Pisarenco
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Patent number: 11387636Abstract: A system for configuring an environment to provide mobile computing, the system including: one or more booms suspended from a soffit of the environment, each of the booms including a moveable arm moveable at least in part in a plane parallel to the soffit and the moveable arm having a proximal end connected to power and data cables attached to the soffit and a distal end where the power and data cables are suspended therefrom; and one or more switching hubs, each of the switching hubs are arranged to be removably mounted to a mobile station moveable within the environment, to be removably connected to the power and data cables suspended from the distal end of the moveable arm of one of the booms, and to be removably connected to at least one computer in the environment to distribute power and data to the at least one computer.Type: GrantFiled: July 29, 2019Date of Patent: July 12, 2022Assignee: BVN Architecture Pty LtdInventors: Ninotschka Anna Titchkosky, Marc Edward Sirl, Ross William Seymour, Elynda Naru, Marco Montevecchi, Abbie Renee Lewis, Victoria Hey, Benjamin John Doherty, Haydn David Davies, Matthew Charles Francis Blair, Christopher James Bickerton
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Publication number: 20220082949Abstract: A method for categorizing a substrate subject to a semiconductor manufacturing process including multiple operations, the method including: obtaining values of functional indicators derived from data generated during one or more of the multiple operations on the substrate, the functional indicators characterizing at least one operation; applying a decision model including one or more threshold values to the values of the functional indicators to obtain one or more categorical indicators; and assigning a category to the substrate based on the one or more categorical indicators.Type: ApplicationFiled: January 9, 2020Publication date: March 17, 2022Applicant: ASML NETHERLANDS B.V.Inventors: Arnaud HUBAUX, Johan Franciscus Maria BECKERS, Dylan John David DAVIES, Johan Gertrudis Cornelis KUNNEN, Willem Richard PONGERS, Ajinkya Ravindra DAWARE, Chung-Hsun LI, Georgios TSIROGIANNIS, Hendrik Cornelis Anton BORGER, Frederik Eduard DEJONG, Juan Manuel GONZALEZ HUESCA, Andriy HLOD, Maxim PISARENCO
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Patent number: 11239886Abstract: MIMO antenna modules and antenna units for a wireless communication system are provided. In one embodiment, a remote unit comprises: a controller module, comprising: a first substrate having a first ground plane, control circuitry and interface circuitry on the first substrate, a first connection region formed in the first substrate; and at least one antenna module coupled to the controller module, the antenna module comprising: a second substrate having a second ground plane, antennas on the second substrate, a second connection region on the second substrate and coupled to the interface circuitry via the first connection region, wherein the second connection region communicates data between the interface circuitry and the antennas, and a set of ground-plane contacts on the second substrate that electrically couple the first ground plane to the second ground plane of the second substrate when the second connector region is engaged with the first connector region.Type: GrantFiled: February 16, 2021Date of Patent: February 1, 2022Assignee: CommScope Technologies LLCInventors: Michael Pollman, Kevin E. Craig, David Davies
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Publication number: 20210167818Abstract: MIMO antenna modules and antenna units for a wireless communication system are provided. In one embodiment, a remote unit comprises: a controller module, comprising: a first substrate having a first ground plane, control circuitry and interface circuitry on the first substrate, a first connection region formed in the first substrate; and at least one antenna module coupled to the controller module, the antenna module comprising: a second substrate having a second ground plane, antennas on the second substrate, a second connection region on the second substrate and coupled to the interface circuitry via the first connection region, wherein the second connection region communicates data between the interface circuitry and the antennas, and a set of ground-plane contacts on the second substrate that electrically couple the first ground plane to the second ground plane of the second substrate when the second connector region is engaged with the first connector region.Type: ApplicationFiled: February 16, 2021Publication date: June 3, 2021Applicant: CommScope Technologies LLCInventors: Michael Pollman, Kevin E. Craig, David Davies
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Patent number: 10970754Abstract: An Application Programming Interface (API) exposes real-time service status information from a service backend system to a mobile application of a mobile device. Interactive, dynamic, and real-time service status information is rendered to the mobile device for managing and/or rating services rendered to a customer who operates the mobile device.Type: GrantFiled: December 12, 2016Date of Patent: April 6, 2021Assignee: NCR CorporationInventors: David Eric Malone, Mark David Davies
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Patent number: 10958312Abstract: An embodiment of an antenna module includes a substrate, a first antenna, and a second antenna. The first antenna is disposed on the substrate and is configured to radiate a first signal having a wavelength and a first polarization. And the second antenna is disposed on the substrate and is configured to radiate a second signal having the wavelength and a second polarization that is approximately orthogonal to the first polarization. For example, such an antenna module can include, as the first antenna, a T antenna configured to transmit and receive data that forms a first part of a MIMO-OFDM data symbol, and can include, as the second antenna, an F antenna configured to transmit and receive data that forms a second part of the MIMO-OFDM data symbol.Type: GrantFiled: February 27, 2019Date of Patent: March 23, 2021Assignee: CommScope Technologies LLCInventors: Michael Pollman, Kevin E. Craig, David Davies, Stephen Ledingham
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Patent number: 10833734Abstract: An embodiment of an antenna module includes a substrate, a first antenna, and a second antenna. The first antenna is disposed on the substrate and is configured to radiate a first signal having a wavelength and a first polarization. And the second antenna is disposed on the substrate and is configured to radiate a second signal having the wavelength and a second polarization that is approximately orthogonal to the first polarization. For example, such an antenna module can include, as the first antenna, a T antenna configured to transmit and receive data that forms a first part of a MIMO-OFDM data symbol, and can include, as the second antenna, an F antenna configured to transmit and receive data that forms a second part of the MIMO-OFDM data symbol.Type: GrantFiled: February 27, 2019Date of Patent: November 10, 2020Assignee: CommScope Technologies LLCInventors: Michael Pollman, Kevin E. Craig, David Davies
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Patent number: 10613445Abstract: A diagnostic apparatus monitors a lithographic manufacturing system. First measurement data representing local deviations of some characteristic across a substrate is obtained using sensors within a lithographic apparatus, and/or a separate metrology tool. Other inspection tools perform substrate backside inspection to produce second measurement data. A high-resolution backside defect image is processed into a form in which it can be compared with lower resolution information from the first measurement data. Cross-correlation is performed to identify which of the observed defects are correlated spatially with the deviations represented in the first measurement data. A correlation map is used to identify potentially relevant clusters of defects in the more detailed original defect map. The responsible apparatus can be identified by pattern recognition as part of an automated root cause analysis. Alternatively, reticle inspection data may be used as second measurement data.Type: GrantFiled: March 25, 2019Date of Patent: April 7, 2020Assignee: ASML Netherlands B.V.Inventors: Marc Hauptmann, Dylan John David Davies, Paul Janssen, Naoko Tsugama, Richard Joseph Bruls, Kornelis Tijmen Hoekerd, Edwin Johannes Maria Janssen, Petrus Johannes Van Den Oever, Ronald Van Der Wilk, Antonius Hubertus Van Schijndel, Jorge Alberto Vieyra Salas
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Publication number: 20200044424Abstract: A system for configuring an environment to provide mobile computing, the system including: one or more booms suspended from a soffit of the environment, each of the booms including a moveable arm moveable at least in part in a plane parallel to the soffit and the moveable arm having a proximal end connected to power and data cables attached to the soffit and a distal end where the power and data cables are suspended therefrom; and one or more switching hubs, each of the switching hubs are arranged to be removably mounted to a mobile station moveable within the environment, to be removably connected to the power and data cables suspended from the distal end of the moveable arm of one of the booms, and to be removably connected to at least one computer in the environment to distribute power and data to the at least one computer.Type: ApplicationFiled: July 29, 2019Publication date: February 6, 2020Inventors: Ninotschka Anna Titchkosky, Marc Edward Sirl, Ross William Seymour, Elynda Naru, Marco Montevecchi, Abbie Renee Lewis, Victoria Hey, Benjamin John Doherty, Haydn David Davies, Matthew Charles Francis Blair, Christopher James Bickerton
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Publication number: 20190268045Abstract: An embodiment of an antenna module includes a substrate, a first antenna, and a second antenna. The first antenna is disposed on the substrate and is configured to radiate a first signal having a wavelength and a first polarization. And the second antenna is disposed on the substrate and is configured to radiate a second signal having the wavelength and a second polarization that is approximately orthogonal to the first polarization. For example, such an antenna module can include, as the first antenna, a T antenna configured to transmit and receive data that forms a first part of a MIMO-OFDM data symbol, and can include, as the second antenna, an F antenna configured to transmit and receive data that forms a second part of the MIMO-OFDM data symbol.Type: ApplicationFiled: February 27, 2019Publication date: August 29, 2019Applicant: CommScope Technologies LLCInventors: Michael Pollman, Kevin E. Craig, David Davies
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Publication number: 20190219929Abstract: A diagnostic apparatus monitors a lithographic manufacturing system. First measurement data representing local deviations of some characteristic across a substrate is obtained using sensors within a lithographic apparatus, and/or a separate metrology tool. Other inspection tools perform substrate backside inspection to produce second measurement data. A high- resolution backside defect image is processed into a form in which it can be compared with lower resolution information from the first measurement data. Cross-correlation is performed to identify which of the observed defects are correlated spatially with the deviations represented in the first measurement data. A correlation map is used to identify potentially relevant clusters of defects in the more detailed original defect map. The responsible apparatus can be identified by pattern recognition as part of an automated root cause analysis. Alternatively, reticle inspection data may be used as second measurement data.Type: ApplicationFiled: March 25, 2019Publication date: July 18, 2019Applicant: ASML NETHERLANDS B.V.Inventors: Marc Hauptmann, Dylan John David Davies, Paul Janssen, Naoko Tsugama, Richard Joseph Bruls, Kornelis Tijmen Hoekerd, Edwin Johannes Maria Janssen, Petrus Johannes Van Den Oever, Ronald Van Der Wilk, Antonius Hubertus Van Schijndel, Jorge Alberto Vieyra Salas
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Patent number: 10241418Abstract: A diagnostic apparatus monitors a lithographic manufacturing system. First measurement data representing local deviations of some characteristic across a substrate is obtained using sensors within a lithographic apparatus, and/or a separate metrology tool. Other inspection tools perform substrate backside inspection to produce second measurement data. A high-resolution backside defect image is processed into a form in which it can be compared with lower resolution information from the first measurement data. Cross-correlation is performed to identify which of the observed defects are correlated spatially with the deviations represented in the first measurement data. A correlation map is used to identify potentially relevant clusters of defects in the more detailed original defect map. The responsible apparatus can be identified by pattern recognition as part of an automated root cause analysis. Alternatively, reticle inspection data may be used as second measurement data.Type: GrantFiled: September 21, 2015Date of Patent: March 26, 2019Assignee: ASML Netherlands B.V.Inventors: Marc Hauptmann, Dylan John David Davies, Paul Janssen, Naoko Tsugama, Richard Joseph Bruls, Kornelis Tijmen Hoekerd, Edwin Johannes Maria Janssen, Petrus Johannes Van Den Oever, Ronald Van Der Wilk, Antonius Hubertus Van Schijndel, Jorge Alberto Vieyra Salas
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Publication number: 20180165721Abstract: An Application Programming Interface (API) exposes real-time service status information from a service backend system to a mobile application of a mobile device. Interactive, dynamic, and real-time service status information is rendered to the mobile device for managing and/or rating services rendered to a customer who operates the mobile device.Type: ApplicationFiled: December 12, 2016Publication date: June 14, 2018Inventors: David Eric Malone, Mark David Davies
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Patent number: 9914712Abstract: Compounds of general formula (I): wherein R1, R11, Y, R2, n and A are as defined herein are useful as inhibitors or metallo-?-lactamase (MBL) enzymes and can be used for reducing or removing antibiotic resistance in bacteria.Type: GrantFiled: June 12, 2014Date of Patent: March 13, 2018Assignee: ANTABIO SASInventors: Marc Lemonnier, David Davies, Thomas David Pallin
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Publication number: 20170363969Abstract: A diagnostic apparatus monitors a lithographic manufacturing system. First measurement data representing local deviations of some characteristic across a substrate is obtained using sensors within a lithographic apparatus, and/or a separate metrology tool. Other inspection tools perform substrate backside inspection to produce second measurement data. A high-resolution backside defect image is processed into a form in which it can be compared with lower resolution information from the first measurement data. Cross-correlation is performed to identify which of the observed defects are correlated spatially with the deviations represented in the first measurement data. A correlation map is used to identify potentially relevant clusters of defects in the more detailed original defect map. The responsible apparatus can be identified by pattern recognition as part of an automated root cause analysis. Alternatively, reticle inspection data may be used as second measurement data.Type: ApplicationFiled: September 21, 2015Publication date: December 21, 2017Applicant: ASML NETHERLANDS B.V.Inventors: Marc HAUPTMANN, Dylan John David DAVIES, Paul JANSSEN, Naoko TSUGAMA, Richard Joseph BRULS, Kornelis Tijmen HOEKERD, Edwin Johannes Maria JANSSEN, Petrus Johannes VAN DEN OEVER, Ronald VAN DER WILK, Antonius Hubertus VAN SCHIJNDEL, Jorge Alberto VIEYRA SALAS
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Publication number: 20170260178Abstract: The present invention provides a compound of the following formula, salts, racemates, diastereomers, enantiomers, esters, carbamates, phosphates, sulfates, deuterated forms and prodrugs thereof. Also provided is the use of these compounds as antibacterials, compositions comprising them and processes for their manufacture.Type: ApplicationFiled: March 27, 2017Publication date: September 14, 2017Inventors: Christopher James Lunniss, James T. Palmer, Gary Robert William Pitt, Lorraine Claire Axford, David Davies
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Publication number: 20170175444Abstract: A clamping system for supporting an extension ladder on a gutter utilizes at least one and, more preferably, a pair of identical, clamp(s) to capture the ladder preventing movement laterally or horizontally away from the gutter. The clamp includes a clamp body with a latch pivotably mounted thereto which is spring biased to the gutter-clamping position. A lock screw may be utilized to prevent the latch from releasing the gutter preventing the ladder from moving. A pair of ears extends from each side of the clamp body and have slots which engage the channels on a forward face of the ladder leg.Type: ApplicationFiled: December 22, 2015Publication date: June 22, 2017Inventor: David (Davy) L. Durfee, III