Patents by Inventor David Davies

David Davies has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11950884
    Abstract: Embodiments of the present disclosure are configured to assess the severity of a blockage in a vessel and, in particular, a stenosis in a blood vessel. In some particular embodiments, the devices, systems, and methods of the present disclosure are configured to assess the severity of a stenosis in the coronary arteries without the administration of a hyperemic agent.
    Type: Grant
    Filed: February 5, 2021
    Date of Patent: April 9, 2024
    Assignees: PHILIPS IMAGE GUIDED THERAPY CORPORATION, IMPERIAL COLLEGE OF SCIENCE, TECHNOLOGY & MEDICINE, MEDSOLVE LIMITED
    Inventors: Justin Davies, Joseph Burnett, Neil Hattangadi, David Anderson, Helen Davies
  • Publication number: 20230333482
    Abstract: A method for categorizing a substrate subject to a semiconductor manufacturing process including multiple operations, the method including: obtaining values of functional indicators derived from data generated during one or more of the multiple operations on the substrate, the functional indicators characterizing at least one operation; applying a decision model including one or more threshold values to the values of the functional indicators to obtain one or more categorical indicators; and assigning a category to the substrate based on the one or more categorical indicators.
    Type: Application
    Filed: June 21, 2023
    Publication date: October 19, 2023
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Arnaud HUBAUX, Johan Franciscus Maria Beckers, Dylan John David Davies, Johan Gertrudis Cornelis Kunnen, Willem Richard Pongers, Ajinkya Ravindra Daware, Chung-Hsun Li, Georgios Tsirogiannis, Hendrik Cornelis Anton Borger, Frederik Eduard De Jong, Juan Manuel Gonzalez Huesca, Andriy Hlod, Maxim Pisarenco
  • Patent number: 11687007
    Abstract: A method for categorizing a substrate subject to a semiconductor manufacturing process including multiple operations, the method including: obtaining values of functional indicators derived from data generated during one or more of the multiple operations on the substrate, the functional indicators characterizing at least one operation; applying a decision model including one or more threshold values to the values of the functional indicators to obtain one or more categorical indicators; and assigning a category to the substrate based on the one or more categorical indicators.
    Type: Grant
    Filed: January 9, 2020
    Date of Patent: June 27, 2023
    Assignee: ASML NETHERLANDS B.V.
    Inventors: Arnaud Hubaux, Johan Franciscus Maria Beckers, Dylan John David Davies, Johan Gertrudis Cornelis Kunnen, Willem Richard Pongers, Ajinkya Ravindra Daware, Chung-Hsun Li, Georgios Tsirogiannis, Hendrik Cornelis Anton Borger, Frederik Eduard De Jong, Juan Manuel Gonzalez Huesca, Andriy Hlod, Maxim Pisarenco
  • Patent number: 11387636
    Abstract: A system for configuring an environment to provide mobile computing, the system including: one or more booms suspended from a soffit of the environment, each of the booms including a moveable arm moveable at least in part in a plane parallel to the soffit and the moveable arm having a proximal end connected to power and data cables attached to the soffit and a distal end where the power and data cables are suspended therefrom; and one or more switching hubs, each of the switching hubs are arranged to be removably mounted to a mobile station moveable within the environment, to be removably connected to the power and data cables suspended from the distal end of the moveable arm of one of the booms, and to be removably connected to at least one computer in the environment to distribute power and data to the at least one computer.
    Type: Grant
    Filed: July 29, 2019
    Date of Patent: July 12, 2022
    Assignee: BVN Architecture Pty Ltd
    Inventors: Ninotschka Anna Titchkosky, Marc Edward Sirl, Ross William Seymour, Elynda Naru, Marco Montevecchi, Abbie Renee Lewis, Victoria Hey, Benjamin John Doherty, Haydn David Davies, Matthew Charles Francis Blair, Christopher James Bickerton
  • Publication number: 20220082949
    Abstract: A method for categorizing a substrate subject to a semiconductor manufacturing process including multiple operations, the method including: obtaining values of functional indicators derived from data generated during one or more of the multiple operations on the substrate, the functional indicators characterizing at least one operation; applying a decision model including one or more threshold values to the values of the functional indicators to obtain one or more categorical indicators; and assigning a category to the substrate based on the one or more categorical indicators.
    Type: Application
    Filed: January 9, 2020
    Publication date: March 17, 2022
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Arnaud HUBAUX, Johan Franciscus Maria BECKERS, Dylan John David DAVIES, Johan Gertrudis Cornelis KUNNEN, Willem Richard PONGERS, Ajinkya Ravindra DAWARE, Chung-Hsun LI, Georgios TSIROGIANNIS, Hendrik Cornelis Anton BORGER, Frederik Eduard DEJONG, Juan Manuel GONZALEZ HUESCA, Andriy HLOD, Maxim PISARENCO
  • Patent number: 11239886
    Abstract: MIMO antenna modules and antenna units for a wireless communication system are provided. In one embodiment, a remote unit comprises: a controller module, comprising: a first substrate having a first ground plane, control circuitry and interface circuitry on the first substrate, a first connection region formed in the first substrate; and at least one antenna module coupled to the controller module, the antenna module comprising: a second substrate having a second ground plane, antennas on the second substrate, a second connection region on the second substrate and coupled to the interface circuitry via the first connection region, wherein the second connection region communicates data between the interface circuitry and the antennas, and a set of ground-plane contacts on the second substrate that electrically couple the first ground plane to the second ground plane of the second substrate when the second connector region is engaged with the first connector region.
    Type: Grant
    Filed: February 16, 2021
    Date of Patent: February 1, 2022
    Assignee: CommScope Technologies LLC
    Inventors: Michael Pollman, Kevin E. Craig, David Davies
  • Publication number: 20210167818
    Abstract: MIMO antenna modules and antenna units for a wireless communication system are provided. In one embodiment, a remote unit comprises: a controller module, comprising: a first substrate having a first ground plane, control circuitry and interface circuitry on the first substrate, a first connection region formed in the first substrate; and at least one antenna module coupled to the controller module, the antenna module comprising: a second substrate having a second ground plane, antennas on the second substrate, a second connection region on the second substrate and coupled to the interface circuitry via the first connection region, wherein the second connection region communicates data between the interface circuitry and the antennas, and a set of ground-plane contacts on the second substrate that electrically couple the first ground plane to the second ground plane of the second substrate when the second connector region is engaged with the first connector region.
    Type: Application
    Filed: February 16, 2021
    Publication date: June 3, 2021
    Applicant: CommScope Technologies LLC
    Inventors: Michael Pollman, Kevin E. Craig, David Davies
  • Patent number: 10970754
    Abstract: An Application Programming Interface (API) exposes real-time service status information from a service backend system to a mobile application of a mobile device. Interactive, dynamic, and real-time service status information is rendered to the mobile device for managing and/or rating services rendered to a customer who operates the mobile device.
    Type: Grant
    Filed: December 12, 2016
    Date of Patent: April 6, 2021
    Assignee: NCR Corporation
    Inventors: David Eric Malone, Mark David Davies
  • Patent number: 10958312
    Abstract: An embodiment of an antenna module includes a substrate, a first antenna, and a second antenna. The first antenna is disposed on the substrate and is configured to radiate a first signal having a wavelength and a first polarization. And the second antenna is disposed on the substrate and is configured to radiate a second signal having the wavelength and a second polarization that is approximately orthogonal to the first polarization. For example, such an antenna module can include, as the first antenna, a T antenna configured to transmit and receive data that forms a first part of a MIMO-OFDM data symbol, and can include, as the second antenna, an F antenna configured to transmit and receive data that forms a second part of the MIMO-OFDM data symbol.
    Type: Grant
    Filed: February 27, 2019
    Date of Patent: March 23, 2021
    Assignee: CommScope Technologies LLC
    Inventors: Michael Pollman, Kevin E. Craig, David Davies, Stephen Ledingham
  • Patent number: 10833734
    Abstract: An embodiment of an antenna module includes a substrate, a first antenna, and a second antenna. The first antenna is disposed on the substrate and is configured to radiate a first signal having a wavelength and a first polarization. And the second antenna is disposed on the substrate and is configured to radiate a second signal having the wavelength and a second polarization that is approximately orthogonal to the first polarization. For example, such an antenna module can include, as the first antenna, a T antenna configured to transmit and receive data that forms a first part of a MIMO-OFDM data symbol, and can include, as the second antenna, an F antenna configured to transmit and receive data that forms a second part of the MIMO-OFDM data symbol.
    Type: Grant
    Filed: February 27, 2019
    Date of Patent: November 10, 2020
    Assignee: CommScope Technologies LLC
    Inventors: Michael Pollman, Kevin E. Craig, David Davies
  • Patent number: 10613445
    Abstract: A diagnostic apparatus monitors a lithographic manufacturing system. First measurement data representing local deviations of some characteristic across a substrate is obtained using sensors within a lithographic apparatus, and/or a separate metrology tool. Other inspection tools perform substrate backside inspection to produce second measurement data. A high-resolution backside defect image is processed into a form in which it can be compared with lower resolution information from the first measurement data. Cross-correlation is performed to identify which of the observed defects are correlated spatially with the deviations represented in the first measurement data. A correlation map is used to identify potentially relevant clusters of defects in the more detailed original defect map. The responsible apparatus can be identified by pattern recognition as part of an automated root cause analysis. Alternatively, reticle inspection data may be used as second measurement data.
    Type: Grant
    Filed: March 25, 2019
    Date of Patent: April 7, 2020
    Assignee: ASML Netherlands B.V.
    Inventors: Marc Hauptmann, Dylan John David Davies, Paul Janssen, Naoko Tsugama, Richard Joseph Bruls, Kornelis Tijmen Hoekerd, Edwin Johannes Maria Janssen, Petrus Johannes Van Den Oever, Ronald Van Der Wilk, Antonius Hubertus Van Schijndel, Jorge Alberto Vieyra Salas
  • Publication number: 20200044424
    Abstract: A system for configuring an environment to provide mobile computing, the system including: one or more booms suspended from a soffit of the environment, each of the booms including a moveable arm moveable at least in part in a plane parallel to the soffit and the moveable arm having a proximal end connected to power and data cables attached to the soffit and a distal end where the power and data cables are suspended therefrom; and one or more switching hubs, each of the switching hubs are arranged to be removably mounted to a mobile station moveable within the environment, to be removably connected to the power and data cables suspended from the distal end of the moveable arm of one of the booms, and to be removably connected to at least one computer in the environment to distribute power and data to the at least one computer.
    Type: Application
    Filed: July 29, 2019
    Publication date: February 6, 2020
    Inventors: Ninotschka Anna Titchkosky, Marc Edward Sirl, Ross William Seymour, Elynda Naru, Marco Montevecchi, Abbie Renee Lewis, Victoria Hey, Benjamin John Doherty, Haydn David Davies, Matthew Charles Francis Blair, Christopher James Bickerton
  • Publication number: 20190268045
    Abstract: An embodiment of an antenna module includes a substrate, a first antenna, and a second antenna. The first antenna is disposed on the substrate and is configured to radiate a first signal having a wavelength and a first polarization. And the second antenna is disposed on the substrate and is configured to radiate a second signal having the wavelength and a second polarization that is approximately orthogonal to the first polarization. For example, such an antenna module can include, as the first antenna, a T antenna configured to transmit and receive data that forms a first part of a MIMO-OFDM data symbol, and can include, as the second antenna, an F antenna configured to transmit and receive data that forms a second part of the MIMO-OFDM data symbol.
    Type: Application
    Filed: February 27, 2019
    Publication date: August 29, 2019
    Applicant: CommScope Technologies LLC
    Inventors: Michael Pollman, Kevin E. Craig, David Davies
  • Publication number: 20190219929
    Abstract: A diagnostic apparatus monitors a lithographic manufacturing system. First measurement data representing local deviations of some characteristic across a substrate is obtained using sensors within a lithographic apparatus, and/or a separate metrology tool. Other inspection tools perform substrate backside inspection to produce second measurement data. A high- resolution backside defect image is processed into a form in which it can be compared with lower resolution information from the first measurement data. Cross-correlation is performed to identify which of the observed defects are correlated spatially with the deviations represented in the first measurement data. A correlation map is used to identify potentially relevant clusters of defects in the more detailed original defect map. The responsible apparatus can be identified by pattern recognition as part of an automated root cause analysis. Alternatively, reticle inspection data may be used as second measurement data.
    Type: Application
    Filed: March 25, 2019
    Publication date: July 18, 2019
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Marc Hauptmann, Dylan John David Davies, Paul Janssen, Naoko Tsugama, Richard Joseph Bruls, Kornelis Tijmen Hoekerd, Edwin Johannes Maria Janssen, Petrus Johannes Van Den Oever, Ronald Van Der Wilk, Antonius Hubertus Van Schijndel, Jorge Alberto Vieyra Salas
  • Patent number: 10241418
    Abstract: A diagnostic apparatus monitors a lithographic manufacturing system. First measurement data representing local deviations of some characteristic across a substrate is obtained using sensors within a lithographic apparatus, and/or a separate metrology tool. Other inspection tools perform substrate backside inspection to produce second measurement data. A high-resolution backside defect image is processed into a form in which it can be compared with lower resolution information from the first measurement data. Cross-correlation is performed to identify which of the observed defects are correlated spatially with the deviations represented in the first measurement data. A correlation map is used to identify potentially relevant clusters of defects in the more detailed original defect map. The responsible apparatus can be identified by pattern recognition as part of an automated root cause analysis. Alternatively, reticle inspection data may be used as second measurement data.
    Type: Grant
    Filed: September 21, 2015
    Date of Patent: March 26, 2019
    Assignee: ASML Netherlands B.V.
    Inventors: Marc Hauptmann, Dylan John David Davies, Paul Janssen, Naoko Tsugama, Richard Joseph Bruls, Kornelis Tijmen Hoekerd, Edwin Johannes Maria Janssen, Petrus Johannes Van Den Oever, Ronald Van Der Wilk, Antonius Hubertus Van Schijndel, Jorge Alberto Vieyra Salas
  • Publication number: 20180165721
    Abstract: An Application Programming Interface (API) exposes real-time service status information from a service backend system to a mobile application of a mobile device. Interactive, dynamic, and real-time service status information is rendered to the mobile device for managing and/or rating services rendered to a customer who operates the mobile device.
    Type: Application
    Filed: December 12, 2016
    Publication date: June 14, 2018
    Inventors: David Eric Malone, Mark David Davies
  • Patent number: 9914712
    Abstract: Compounds of general formula (I): wherein R1, R11, Y, R2, n and A are as defined herein are useful as inhibitors or metallo-?-lactamase (MBL) enzymes and can be used for reducing or removing antibiotic resistance in bacteria.
    Type: Grant
    Filed: June 12, 2014
    Date of Patent: March 13, 2018
    Assignee: ANTABIO SAS
    Inventors: Marc Lemonnier, David Davies, Thomas David Pallin
  • Publication number: 20170363969
    Abstract: A diagnostic apparatus monitors a lithographic manufacturing system. First measurement data representing local deviations of some characteristic across a substrate is obtained using sensors within a lithographic apparatus, and/or a separate metrology tool. Other inspection tools perform substrate backside inspection to produce second measurement data. A high-resolution backside defect image is processed into a form in which it can be compared with lower resolution information from the first measurement data. Cross-correlation is performed to identify which of the observed defects are correlated spatially with the deviations represented in the first measurement data. A correlation map is used to identify potentially relevant clusters of defects in the more detailed original defect map. The responsible apparatus can be identified by pattern recognition as part of an automated root cause analysis. Alternatively, reticle inspection data may be used as second measurement data.
    Type: Application
    Filed: September 21, 2015
    Publication date: December 21, 2017
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Marc HAUPTMANN, Dylan John David DAVIES, Paul JANSSEN, Naoko TSUGAMA, Richard Joseph BRULS, Kornelis Tijmen HOEKERD, Edwin Johannes Maria JANSSEN, Petrus Johannes VAN DEN OEVER, Ronald VAN DER WILK, Antonius Hubertus VAN SCHIJNDEL, Jorge Alberto VIEYRA SALAS
  • Publication number: 20170260178
    Abstract: The present invention provides a compound of the following formula, salts, racemates, diastereomers, enantiomers, esters, carbamates, phosphates, sulfates, deuterated forms and prodrugs thereof. Also provided is the use of these compounds as antibacterials, compositions comprising them and processes for their manufacture.
    Type: Application
    Filed: March 27, 2017
    Publication date: September 14, 2017
    Inventors: Christopher James Lunniss, James T. Palmer, Gary Robert William Pitt, Lorraine Claire Axford, David Davies
  • Publication number: 20170175444
    Abstract: A clamping system for supporting an extension ladder on a gutter utilizes at least one and, more preferably, a pair of identical, clamp(s) to capture the ladder preventing movement laterally or horizontally away from the gutter. The clamp includes a clamp body with a latch pivotably mounted thereto which is spring biased to the gutter-clamping position. A lock screw may be utilized to prevent the latch from releasing the gutter preventing the ladder from moving. A pair of ears extends from each side of the clamp body and have slots which engage the channels on a forward face of the ladder leg.
    Type: Application
    Filed: December 22, 2015
    Publication date: June 22, 2017
    Inventor: David (Davy) L. Durfee, III