Patents by Inventor David He

David He has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6285741
    Abstract: The present invention, in one form, is a system which, in one embodiment, adjusts the x-ray source current to reduce image noise to better accommodate different scanning parameters. Specifically, in one embodiment, the x-ray source current is adjusted as a function of image slice thickness, scan rotation time, collimation mode, table speed, scan mode, and filtration mode. Particularly, a function is stored in a CT system computer to determine an x-ray source current adjustment factor so that the appropriate x-ray source current is supplied to the x-ray source for the determined parameters. After adjusting the x-ray source current, an object is scanned.
    Type: Grant
    Filed: August 25, 1998
    Date of Patent: September 4, 2001
    Assignee: General Electric Company
    Inventors: Sholom M. Ackelsberg, Gary R. Strong, Holly A. McDaniel, Carlos F. Guerra, Hui Hu, Hui David He, Robert Senzig
  • Patent number: 6275562
    Abstract: A scalable multislice system which, in one embodiment, includes a scalable multi-slice detector, a scalable data acquisition system (SDAS), scalable scan management, control, and image reconstruction processes, and scalable image display and analysis, is described. In the axial multi-slice scan mode, multiple rows of scan data can be processed before image reconstruction, and the data can be used to produce either multiple thin slices or a reduced number of thicker slices with reduced image artifact. In addition, images with thicker slice thicknesses can be later reconstructed retrospectively into thinner slices of images based on clinical diagnosis needs. As a result, the number of unwanted images for viewing, filming, and archiving is reduced. In addition, high z-axis resolution images can be later reconstructed for patient diagnosis.
    Type: Grant
    Filed: November 17, 1998
    Date of Patent: August 14, 2001
    Assignee: General Electric Company
    Inventors: H. David He, Hui Hu, Holly A. McDaniel, Gary R. Strong
  • Patent number: 6246743
    Abstract: The present invention, in one form, is an imaging system which, in one embodiment, alters the configuration of a detector array and a data acquisition system to determine degraded component performance and generate fault isolation information. More specifically, by altering the configuration to include different combinations of detector array cells, interconnections, and one or more data acquisition channels, fault isolation information is generated.
    Type: Grant
    Filed: August 25, 1998
    Date of Patent: June 12, 2001
    Assignee: General Electric Company
    Inventors: Rudolph T. Kopp, III, Hui David He, George E. Seidenschnur, Paul C. Schanen
  • Patent number: 6198791
    Abstract: The present invention is, in one aspect, an imaging system having a detector that has multiple detector cells extending along a z-axis, the detector being configured to collect multiple slices of data; and a scalable data acquisition system configured to convert signals from the detector to digital form, the scalable data acquisition system having a plurality of converter boards each with a plurality of channels, the channels and detector cells having an interweaved coupling to reduce susceptibility to band artifact.
    Type: Grant
    Filed: August 25, 1998
    Date of Patent: March 6, 2001
    Assignee: General Electric Company
    Inventors: Hui David He, Hui Hu, Robert F. Senzig, Gary R. Strong, Guy M. Besson, David M. Hoffman, George E. Seidenschnur, Armin H. Pfoh, Jonathan A. Murray, Thomas L. Toth, Willi W. Hampel
  • Patent number: 6173031
    Abstract: A multislice detector module producing an alterable quantity of slices and slice resolutions. In one embodiment, the detector module includes a plurality of photodiodes arranged in an array of rows and columns, a switch apparatus electrically coupled to photodiode output signals, and a decoder. The decoder is configured to enable or prevent each photodiode from being transmitted through the switch apparatus. The configuration of the decoder determines how many slices of data are transmitted and the resolution of each slice.
    Type: Grant
    Filed: November 26, 1997
    Date of Patent: January 9, 2001
    Assignee: General Electric Company
    Inventors: David M. Hoffman, Brian D. Johnston, Francois Kotian, Hui David He
  • Patent number: 6141398
    Abstract: A scalable multislice system configured to generate multiple streams of image data with different image quality characteristics prospectively and simultaneously is described. Such capability enables improving existing clinical diagnosis and also enables use of clinical application protocol driven method for image reconstruction and display as well as image analysis. More specifically, with the scalable multislice imaging system, multiple rows (>2) of x-ray scan data along the patient's long axis are simultaneously acquired. Multiple protocols are "pre-built" based on specific applications to determine image slice thickness, image reconstruction filter, display method, e.g., field of view, filming requirement and image archiving requirement, prospectively. Multiple image sets with different slice thickness, different reconstruction methods, different display model--axial, 3D or reformat which are pre-determined by the protocol used can then be displayed.
    Type: Grant
    Filed: August 25, 1998
    Date of Patent: October 31, 2000
    Assignee: General Electric Company
    Inventors: Hui David He, Stanley H. Fox, Sholom M. Ackelsberg
  • Patent number: 6118840
    Abstract: Scintillators having a geometric configurations that substantially prevent x-ray beams from passing entirely through a gap between adjacent scintillators are described. More particularly, if the scintillators are cut on an angle to form parallelogram or trapezoidal shapes, or if the detector module is tilted in the x-ray beam z-axis, an x-ray beam will not pass through a non-scintillating gap between adjacent scintillators over the range of focal spot positions. Such scintillators have an increased geometric efficiency compared to known scintillator constructions.
    Type: Grant
    Filed: January 20, 1998
    Date of Patent: September 12, 2000
    Assignee: General Electric Company
    Inventors: Thomas L. Toth, Hui David He, Gurmen O. Erdogan, Bing Shen
  • Patent number: 6087665
    Abstract: A multi-layer scintillator having a first and a second layer of scintillation material. In one embodiment, the scintillator first layer has fast scintillation characteristics and the second layer has a higher transparency than the first layer. The two scintillating layers are bonded together so that a light signal is transferred from the first layer to the second layer and the second layer to a photodiode adjacent the second layer. The specific scintillating materials are selected to achieve the desired characteristics of the scintillator.
    Type: Grant
    Filed: November 26, 1997
    Date of Patent: July 11, 2000
    Assignee: General Electric Company
    Inventors: David M. Hoffman, Hui David He
  • Patent number: 5828719
    Abstract: The present invention, in one form, is a system which, in one embodiment, varies DAS gain to better accommodate different scanning parameters between different scans, even at the same slice thickness. Specifically, in one embodiment, the DAS gain is varied, or modulated, as a function of slice thickness, x-ray tube current and voltage levels, scan time, and average detector gain. The DAS gain is modulated using a gain factor Gain.sub.-- Fac which is determined in accordance with each of the above-mentioned scanning parameters. The gain factor Gain.sub.-- Fac is then used to determine an appropriate DAS gain for such parameters. Particularly, DAS gains are stored in a look-up table in the CT system computer, and the gain factor Gain.sub.-- Fac is used to select the appropriate DAS gain from the look-up table. The determined DAS gain is then utilized to correct data acquired during a scan.
    Type: Grant
    Filed: December 23, 1996
    Date of Patent: October 27, 1998
    Assignee: General Electric Company
    Inventors: Hui David He, Gary Richard Strong, Thomas Louis Toth, George E. Seidenschnur
  • Patent number: 5734691
    Abstract: The present invention, in one form, corrects any error due to varying detector cell gains in the z-direction represented in data obtained by a scan in a CT system. The CT system includes an x-ray source which emits an x-ray beam from a focal spot, through a collimator aperture, and towards a detector having a plurality of detector cells. The geometry of the x-ray beam, the width of the collimator aperture and the focal spot size are used to determine the z-profile of the x-ray beam across the detector cells. Such z-profile is used to identify effective detector cell gains. The identified effective detector cell gains, rather than actual detector cell gains, are used to correct errors due to varying detector cell gains. Particularly, the identified effective detector cell gains are employed in a known correction algorithm to correct errors. A local average in an x-direction of actual detector cell gain z-profiles is used to determine a non-rectangular norm detector gain z-profile.
    Type: Grant
    Filed: December 23, 1996
    Date of Patent: March 31, 1998
    Assignee: General Electric Company
    Inventors: Hui Hu, Guy M. Besson, Hui David He
  • Patent number: 5691173
    Abstract: A novel microorganism, Penicillium adametzioides and a process of using the microorganism to produce compactin, the process consisting of fermentation in a nutrient medium.
    Type: Grant
    Filed: September 19, 1996
    Date of Patent: November 25, 1997
    Assignee: Apotex, Inc.
    Inventors: Scott Primrose, David King, Ed Yaworski, Jayaramaiyer Radhakrishnan, David He, Xinfa Xiao