Abstract: An interface element connected to a device and a security die-chip are fabricated in a single package. The security die-chip may provide a security authentication function to the interface element that does not have the security authentication function. The security die-chip may include a physically unclonable function (PUF) to provide a private key, and a hardware security module to perform encryption and decryption using the private key.

Abstract: Provided is an apparatus for testing randomness of a digital value and processing the digital value. The digital value may include first bit sequences generated by a physically unclonable function (PUF). A grouping unit may generate a plurality of groups by segmenting the first bit sequence, and a processing unit may calculate a second bit sequence from the plurality of groups by performing a logical operation.

Abstract: Provided is an apparatus for generating digital values to provide a random digital value. The apparatus may generate the digital value based on a semiconductor process variation. The apparatus may include a generating unit to generate a plurality of digital values, based on the semiconductor process variation, and a processing unit to process the digital values and to provide a first digital value. The generating unit may include a plurality of physically unclonable functions (PUFs). A parameter may be differently applied to the PUFs, and the PUFs may generate the digital values.

Abstract: Provided are a security device and a method for operating same. The security device may conceal an encryption key used for an encryption algorithm in an encryption module in correspondence to security attacks such as reading information on where the encryption key is stored in a memory by disassembling an IC chip, or extracting said information through microprobing. The encryption key may be included as a physical encryption key module in an encryption module, and a certain storage medium for storing the encryption key may be included in the encryption module. Accordingly, the encryption key is not transmitted via a bus in a security device for encryption.

Abstract: An IC chip for preventing an authentication key from leaking, and an authentication key setting and authentication key verifying method are provided. A part performing connection or disconnection between an external terminal and a smartcard chip may be configured by a separate chip or may be incorporated into the smartcard chip to configure a single chip. When the part is configured by the separate chip, the disconnection between the external terminal and the smart card chip can be performed according to whether an authentication key is verified. When the part is configured by the one chip, the disconnection between the external terminal and the smart card chip can be performed under a control of the smartcard chip according to whether the authentication key is verified.

Abstract: A security system capable of preventing a security attack/threat on a vehicle network is provided. At least one security zone is set by using a risk level which is evaluated for a plurality of vehicle functional elements. In addition, a security countermeasure corresponding to the risk level of the security zone can be provided to a conduit of the security zone so as to perform gate keeping.

Abstract: An apparatus for generating an identification key is provided. The apparatus may include a first conductive layer formed on a semiconductor chip, a second conductive layer formed on the semiconductor chip, wherein a spacing between the first conductive layer and the second conductive layer is equal to or greater than a first threshold and equal to or less than a second threshold, and a reader configured to determine whether a first node associated with the first conductive layer and a second node associated with the second conductive layer are shorted, and to provide an identification key.

Abstract: Provided is an apparatus for generating an identification key by using process variation in a conductive layer manufacturing process. The apparatus may include a first contact connected to a first conductive layer included in a semiconductor chip, wherein a first node is formed by an electrical connection between the first conductive layer and the first contact, a second contact connected to a second conductive layer included in the semiconductor chip, wherein a second node is formed by an electrical connection between the second conductive layer and the second contact, and wherein a value of a spacing between the first contact and the second contact is smaller than a minimum spacing value that guarantees that the first node and the second node are not shorted on a patterning layout, and a reader configured to determine whether the first node and the second node are electrically shorted and to provide the identification key.

Abstract: Provided are a device and a method for generating an identification key by using a process variation in a semiconductor process. A semiconductor is manufactured by adjusting a gate side edge position of a contact such that a difference between a probability that a gate of a transistor is shorted from a drain or a source by the contact and a probability that the gate is not shorted is less than or equal to a predetermined threshold. When the manufactured semiconductor does not have a separate process, whether there is a short circuit between the gate and the drain or the source is stochastically generated by the process variation, whether there is a short circuit is detected through a reader, and an identification key is provided.

Abstract: The present invention relates to a device and method for generating an identification key using a process variation in a via process, and specifically the device for generating an identification key may include a first node provided in a semiconductor chip, a second node which is formed in a different layer from the first node, a via which is electrically shorted to the first node, and which is formed between the first node and the second node, the overlap distance between the second node and the via, in a pattern layout of the semiconductor chip, being adjusted to a value that is less than a threshold according to a design rule that ensures that the first node and the second node are shorted by the via, and a reader which provides an identification key by identifying whether the first node and the second node are shorted due to the via.

Abstract: Provided is a device for generating an identification key using a process variation during a manufacturing process of a conductive layer. The device for generating an identification key may include a plurality of conductive layers designed so as to be formed in a first region within a semiconductor chip, the density in which the plurality of conductive layers are disposed in the first region being at least a first threshold value and not more than a second threshold value, the first and second threshold values being less than a minimum density according to the design rules for ensuring that all of the plurality of conductive layers are formed in the first region; and a reader which provides an identification key by identifying if, among the plurality of conductive layers, a previously designated first conductive layer has been formed.

Abstract: Disclosed is a method of generating a physical unclonable function (PUF) by causing unpredictable partial process failure for a semiconductor process. In a designing process, a second mask pattern may be printed by distorting a size and/or shape of at least one mask window included in a designed first mask pattern, without violating semiconductor design rules. A PUF may be generated using a photomask including the printed second mask pattern for photolithography.

Abstract: Provided are a device and method for generating an identification key using process variation during a bipolar junction transistor (BJT) process. A BJT may be produced by designing such that the effective base width of the BJT is at least a first threshold value but not more than a second threshold value, or, such that the total of the width of a second depletion region formed by connection with a collector region and the width of a first depletion region formed by connection with an emitter region, within a base region, differs from the width of the base region by a value that is at least the first threshold value but not more than the second threshold value. Whether or not there is a short circuit between the emitter region and the collector region is stochastically generated, and if ordinary turn-on voltage is not applied, whether or not there is a short circuit is identified.

Abstract: Provided is a device for generating an identification key using a process variation during a manufacturing process of a conductive layer. The device for generating an identification key may include a conductive layer, which is disposed between a first node and a second node in a semiconductor chip, and which has a width that is at least a first threshold value but not more than a second threshold value, the first threshold value and the second threshold value being less than the minimum width according to the design rules that can ensure that the conductive layer is patterned such that the first node and the second node are electrically short-circuited, and a reader which provides an identification key by identifying if there is a short circuit between the first node and the second node.

Abstract: Provided are a security device and a method for operating same. The security device may conceal an encryption key used for an encryption algorithm in an encryption module in correspondence to security attacks such as reading information on where the encryption key is stored in a memory by disassembling an IC chip, or extracting said information through microprobing. The encryption key may be included as a physical encryption key module in an encryption module, and a certain storage medium for storing the encryption key may be included in the encryption module. Accordingly, the encryption key is not transmitted via a bus in a security device for encryption.

Abstract: Provided is a security communication method of a terminal device. A first authentication unit of the terminal device identifies a first subscriber to connect a first communication network. A second authentication unit of the terminal device exclusively operates with the first authentication unit, and identifies a second subscriber to connect a second communication network which is different from the first communication network. When the second subscriber is identified, at least one external communication module of the terminal device can be inactive.

Abstract: A randomness testing apparatus is disclosed. A randomness testing apparatus according to an embodiment includes a randomness testing module to conduct a randomness test on physically unclonable function (PUF)-based hardware and a processing device to determine whether the PUF-based hardware is defective on the basis of a randomness test result.

Abstract: Provided is an apparatus for generating an identification key by a probabilistic determination of a short occurring between nodes constituting a circuit, by violating a design rule provided during a semiconductor manufacturing process. The identification key generating apparatus may include an identification key generator to generate an identification key based on whether a contact or a via used to electrically connect conductive layers in a semiconductor chip shorts the conductive layers, and an identification key reader to read the identification key by reading whether the contact or the via shorts the conductive layers.

Abstract: Provided is a security communication method of a terminal device. A first authentication unit of the terminal device identifies a first subscriber to connect a first communication network. A second authentication unit of the terminal device exclusively operates with the first authentication unit, and identifies a second subscriber to connect a second communication network which is different from the first communication network. When the second subscriber is identified, at least one external communication module of the terminal device can be inactive.

Abstract: Provided is an apparatus for generating an identification key by a probabilistic determination of a short occurring between nodes constituting a circuit, by violating a design rule provided during a semiconductor manufacturing process. The identification key generating apparatus may include an identification key generator to generate an identification key based on whether a contact or a via used to electrically connect conductive layers in a semiconductor chip shorts the conductive layers, and an identification key reader to read the identification key by reading whether the contact or the via shorts the conductive layers.