Abstract: A technique is provided for efficient dose management and/or scatter reduction during imaging. The technique includes estimating attenuation level of different portions of an imaged object, and independently adjusting at least one of X-ray flux and X-ray energy spectrum from each of a plurality of emission points of a distributed X-ray source based on the attenuation level of different portions of the imaged object. The technique also includes acquiring two or more projection images of different portions of an entire field of view via the distributed X-ray source, removing respective scatter components from each of the two or more projection images, and combining the projection images less scatter components to generate a final projection image of the entire field of view.

Abstract: Briefly, in accordance with one or more embodiments, a detector panel of an imaging system may be produced from a photodiode array integrated with a thin-film transistor array. The thin film transistor array may have one or more vias formed for increasing the adhesion of the photodiode array to the thin-film transistor array. The vias may comprise sidewalls having stepped structures. The thin-film transistor array may comprise a first metallization layer and a second metallization layer. A third metallization layer may be added to the thin film transistor array wherein diodes of the photodiode array may contact the third metallization layer. Diodes of the photodiode array may contact the first metallization layer and/or the second metallization layer via the third metallization layer without directly contacting the first metallization layer or the second metallization layer.

Abstract: A photodetector for X-ray applications is disclosed incorporating a photodiode design with reduced leakage at each pixel location. The photodiode is of a reduced surface area and has a peripheral edge of reduced length. The length may be minimized by making the photodiode round. The diode is surrounded by a reflective layer that may act as a contact for the diode. Photons are reflected by the reflective layer back towards the reduced area diode to maintain good sensitivity. The reflective/contact layer may form a capacitor with another contact layer by disposing a dielectric layer therebetween, thereby increasing the effective capacitance of the photodiode.

Abstract: Storage capacitor design for a solid state imager. The imager includes several pixels disposed on a substrate in an imaging array pattern. Each pixel includes a photosensor coupled to a thin film switching transistor. Several scan lines are disposed at a first level with respect to the substrate along a first axis and several data lines are disposed at a second level along a second axis of the imaging array. Several data lines disposed at a second level with respect to the substrate along a second axis of the imaging array pattern. Each pixel comprises a storage capacitor coupled parallel to the photosensor, the storage capacitor comprising a storage capacitor electrode and a capacitor common electrode.

Abstract: A system and method for collecting x-ray exposure data in an x-ray detector include scanning pixels in an x-ray detector to determine exposure levels. The scanning may progress sequentially from a first edge to an opposite edge or may progress in an alternating fashion across the detector. The detector may include a data line split, where an object may be positioned between the data line split and an x-ray source. The scanning may then progress sequentially from at least one detector edge towards the data line split. In addition, a system for collecting x-ray exposure data in an x-ray detector is described. The system includes a detector, a plurality of data lines and scan lines, and a programmable logic device. The programmable logic device communicates at least one of a scan line driver module direction signal, an enable scan line driver module signal, and a cascade signal.

Abstract: A detector comprising an electrode formed from a first layer of conductive material, a readout line formed from a second layer of conductive material, and a via electrically connecting the readout line and the electrode. In one embodiment, the detector includes a source electrode and a drain electrode formed from the first layer of conductive material, and a data line formed from the second layer of conductive material, such that the source and drain electrodes are vertically offset from the data line. Alternatively, in another embodiment, the detector includes a gate electrode formed from the first layer of conductive material, and a scan line formed from the second layer of conductive material, such that the gate electrode is vertically offset from the scan line.

Abstract: An adaptable imaging assembly is provided. The adaptable imaging assembly includes a free-standing phosphor film configured to receive incident radiation and to emit corresponding optical signals. An electronic device is coupled to the free-standing phosphor film. The electronic device is configured to receive the optical signals from the free-standing phosphor film and to generate an imaging signal. A free-standing phosphor film is also provided and includes x-ray phosphor particles dispersed in a silicone binder. A method for inspecting a component is also provided and includes exposing the component and a free-standing phosphor film to radiation, generating corresponding optical signals with the free standing phosphor film, receiving the optical signals with an electronic device coupled to the free-standing phosphor film and generating an imaging signal using the electronic device.

Abstract: Systems, methods and apparatus are provided through which a collimator has one or more varying physical characteristics that have the effect of varying the absorption of electromagnetic energy from a low extent of absorption at a leading edge to the same extent of absorption as the remainder of the collimator. In some embodiments, the collimator has a tapered knife-edge. The varying absorption of electromagnetic energy at different points along the collimator reduce abrupt transitions of projection of the electromagnetic energy onto an electromagnetic energy detector, thereby reducing erroneous artifacts in an image generated by the detector.

Abstract: Spatially patterned light-blocking layers for radiation imaging detectors are described. Embodiments comprise spatially patterned light-blocking layers for an amorphous silicon flat panel x-ray detector, wherein the spatially patterned light-blocking layer blocks light from a predetermined number of switching elements in the detector, wherein the predetermined number comprises less than all of the switching elements in the detector. These light-blocking layers may block light from each switching element in a predetermined arrangement of switching elements that are read out last, or in any other suitable pattern.

Abstract: An annular thin film transistor includes an annular source electrode disposed above the layer of the semiconductor material, a drain electrode disposed above the layer of the semiconductor material within the annular source electrode, and an active channel between the drain electrode and the annular source electrode, wherein a surface of the active channel comprises exposed semiconductor material. Further, a serpentine thin film transistor includes a serpentine source electrode disposed above the layer of the semiconductor material, a drain electrode disposed above the layer of semiconductor material and substantially within a recess formed by the serpentine source electrode, wherein the drain electrode is configured to substantially conform to the recess, and an active channel between the drain electrode and the serpentine source electrode, wherein the active channel has a substantially consistent length, and wherein a surface of the active channel comprises exposed semiconductor material.

Abstract: A technique for compensating for a retained image includes employing bimodal readout of alternating light and dark images. The bimodal readout technique results from reading either light or dark frames more rapidly, allowing additional time to be allocated to the X-ray exposures occurring prior to the light frames or to the other reading operation. The bimodal readout may be accomplished by a binning procedure by which scan lines are binned and read, typically during dark frame readout. The images acquired from reading the dark frames may then be used to compensate for a retained image artifacts present in the image derived from light frames.

Abstract: A photo-detector having a common electrode comprising a conductive material configured in a non-solid pattern in which there are gaps where there is no conductive material. In one embodiment, the distance (d) or (d?) between conductive portions of the common electrode is in a range from about 3 microns to about 5 microns. Alternatively, in one embodiment, the patterned common electrode covers between 20% to 70% of the surface of the respective photosensor element. A method for making the same is also provided.

Abstract: A solid-state imager with back-side irradiation. The present invention provides a solid-state imager that includes a substantially radiation transparent substrate adapted to receive incident radiation. The radiation travels through the substrate and a pixelated array of photosensitive elements to a scintillator material, which absorbs the radiation. The pixelated array of photosensitive elements receives light photons and measures the amount of light generated by radiation interactions with the scintillator material. With this imager, there is less spreading and blurring and thus a better quality image. In another embodiment, there is a substantially transparent material disposed between the pixelated array of photosensitive elements and the scintillator material. The substantially transparent material absorbs and substantially blocks electrons from entering the active regions of the pixelated array of photosensitive elements.

Abstract: A method for monitoring the quality of a manufacturing process for making detector panels that have a plurality of pixels in a two-dimensional array includes, in each detector panel, manufacturing a set of baseline pixels and a set of test pixels. Each test pixel has an electrical component having a geometric dimension varied by an amount sufficient to introduce a measurable variation in a test that measures parameters of pixels that are dependent upon the varied dimension. The method further includes performing the test on the set of baseline pixels and the set of varied pixels, analyzing the results of the test, and adjusting parameters of the manufacturing process in accordance with the analysis.

Abstract: A system and method for collecting x-ray exposure data in an x-ray detector include scanning pixels in an x-ray detector to determine exposure levels. The scanning may progress sequentially from a first edge to an opposite edge or may progress in an alternating fashion across the detector. The detector may include a data line split, where an object may be positioned between the data line split and an x-ray source. The scanning may then progress sequentially from at least one detector edge towards the data line split. In addition, a system for collecting x-ray exposure data in an x-ray detector is described. The system includes a detector, a plurality of data lines and scan lines, and a programmable logic device. The programmable logic device communicates at least one of a scan line driver module direction signal, an enable scan line driver module signal, and a cascade signal.

Abstract: Spatially patterned light-blocking layers for radiation imaging detectors are described. Embodiments comprise spatially patterned light-blocking layers for an amorphous silicon flat panel x-ray detector, wherein the spatially patterned light-blocking layer blocks light from a predetermined number of switching elements in the detector, wherein the predetermined number comprises less than all of the switching elements in the detector. These light-blocking layers may block light from each switching element in a predetermined arrangement of switching elements that are read out last, or in any other suitable pattern.

Abstract: A method for monitoring the quality of a manufacturing process for making detector panels that have a plurality of pixels in a two-dimensional array includes, in each detector panel, manufacturing a set of baseline pixels and a set of test pixels. Each test pixel has an electrical component having a geometric dimension varied by an amount sufficient to introduce a measurable variation in a test that measures parameters of pixels that are dependent upon the varied dimension. The method further includes performing the test on the set of baseline pixels and the set of varied pixels, analyzing the results of the test, and adjusting parameters of the manufacturing process in accordance with the analysis.

Abstract: Storage capacitor design for a solid state imager. The imager includes several pixels disposed on a substrate in an imaging array pattern. Each pixel includes a photosensor coupled to a thin film switching transistor. Several scan lines are disposed at a first level with respect to the substrate along a first axis and several data lines are disposed at a second level along a second axis of the imaging array. Several data lines disposed at a second level with respect to the substrate along a second axis of the imaging array pattern. Each pixel comprises a storage capacitor coupled parallel to the photosensor, the storage capacitor comprising a storage capacitor electrode and a capacitor common electrode.

Abstract: A technique is provided in which a gain correction map derived for a detector at one X-ray spectrum may be adapted to accommodate images acquired by the detector at a different X-ray spectrum. The technique accounts for the physical variations in the detector which may produce spectrally-sensitive artifacts as well as for the particular image acquisition conditions. A technique is also provided for correcting edge artifacts in an acquired image by measuring median signal intensity within columns or rows of the image and deriving correction factors for the respective edge columns or rows based upon the trends of the median signal intensities. A technique is also provided for storing detector attributes during a manufacturing calibration process and accessing them during system operation such that a suitable gain correction factor is employed based upon the spectrum and operating conditions.

Abstract: A solid-state imager with back-side irradiation. The present invention provides a solid-state imager that includes a substantially radiation transparent substrate adapted to receive incident radiation. The radiation travels through the substrate and a pixelated array of photosensitive elements to a scintillator material, which absorbs the radiation. The pixelated array of photosensitive elements receives light photons and measures the amount of light generated by radiation interactions with the scintillator material. With this imager, there is less spreading and blurring and thus a better quality image. In another embodiment, there is a substantially transparent material disposed between the pixelated array of photosensitive elements and the scintillator material. The substantially transparent material absorbs and substantially blocks electrons from entering the active regions of the pixelated array of photosensitive elements.