Abstract: A multipole assembly configured to be disposed in a mass spectrometer includes a plurality of elongate electrodes arranged about an axis extending along a longitudinal trajectory of the plurality of elongate electrodes and configured to confine ions radially about the axis, and a piezoelectric actuator configured to adjust a position of a first electrode included in the plurality of elongate electrodes.

Abstract: A multipole assembly configured to be disposed in a mass spectrometer includes a plurality of elongate electrodes arranged about an axis extending along a longitudinal trajectory of the plurality of elongate electrodes and configured to confine ions radially about the axis, and a piezoelectric actuator configured to adjust a position of a first electrode included in the plurality of elongate electrodes.

Abstract: An ion detector includes a first stage dynode configured to receive an ion beam and generate electrons, a photon source arranged to provide photons to the first stage dynode, the photons of sufficient energy to cause the first stage dynode to emit photoelectrons, an electron multiplier configured to receive the electrons or the photoelectrons from the first stage dynode and generate an output proportional to the number of electrons or photoelectrons, and a controller. The controller is configured to receive the output generated in response to the photoelectrons; calculate a gain curve of the detector based on the output; and set a voltage of the electron multiplier or the first stage dynode to achieve a target gain for the ion beam.

Abstract: A multipole assembly configured to be disposed in a mass spectrometer includes a plurality of elongate electrodes arranged about an axis extending along a longitudinal trajectory of the plurality of elongate electrodes and configured to confine ions radially about the axis, and a piezoelectric actuator configured to adjust a position of a first electrode included in the plurality of elongate electrodes.

Abstract: A magnet assembly for an ion source comprising a first magnet of a first magnet type; a second magnet of a second magnet type; a heat shield located between the first magnet and the second magnet; and a heat sink coupled to the heat shield; wherein the first magnet type having a higher Curie temperature than the second magnet type.

Abstract: A method of assessing the linearity and dynamic range of a mass spectrometer is described comprising analyzing two or more test standards containing positional isomers, for example, using a series of N isomeric analytes with or without an internal standard where N is an integer from 2 to 6 inclusive. The concentrations of the N isomeric analytes may or may not be interleaved between two or more standards. The method allows for repeated instrument characterization without having many of the problems associated with using only a single standard such as octafluoronaphthalene (OFN), for example, persistence, and it may lessen sample carryover issues between adjacent samples. Methods are described using positional isomers of dibromodifluorobenzene in various configurations that show an improved means for qualitative and quantitative analysis of one or more analytes by GC-MS.

Abstract: A capillary column includes a fused silica tubing and a polyimide coating over the fusing silica tubing. Additionally, the capillary column further includes a first plurality of integrated ferrules positioned along at least a first portion of the fused silica tubing and spaced apart from one another by a first fixed interval.

Abstract: A mass spectrometer system can include an ion source, a vacuum chamber; a mass analyzer within the vacuum chamber, a transfer tube between the ion source and the vacuum chamber, a transfer tube heater, and a vacuum pump. The mass spectrometer system can be configured to reduce the pump speed of the vacuum pump in response to receiving a transfer tube swap instruction; lower the temperature of the transfer tube to below a first threshold; operating the vacuum pump at the reduced pump speed while the transfer tube is replaced with a second transfer tube; heating the second transfer tube to a temperature above a pump down temperature; and increasing the pump speed of the vacuum pump after the temperature of the second transfer tube exceeds a second threshold.

Abstract: A capillary column includes a fused silica tubing and a polyimide coating over the fusing silica tubing. Additionally, the capillary column further includes a first plurality of integrated ferrules positioned along at least a first portion of the fused silica tubing and spaced apart from one another by a first fixed interval.

Abstract: A capillary column includes a fused silica tubing, a polyimide coating over the fusing silica tubing, and a first plurality of integrated ferrules positioned along at least a first portion of the fused silica tubing and spaced apart from one another by a first fixed interval. Each of the first plurality of integrated ferrules includes a first deformable surface and a second deformable surface. The first plurality of integrated ferrules are secured to the column through deformation of the first deformable surface and the second deformable surface is configured to form a seal with a junction when secured with a nut.

Abstract: A mass spectrometer system can include an ion source, a vacuum chamber; a mass analyzer within the vacuum chamber, a transfer tube between the ion source and the vacuum chamber, a transfer tube heater, and a vacuum pump. The mass spectrometer system can be configured to reduce the pump speed of the vacuum pump in response to receiving a transfer tube swap instruction; lower the temperature of the transfer tube to below a first threshold; operating the vacuum pump at the reduced pump speed while the transfer tube is replaced with a second transfer tube; heating the second transfer tube to a temperature above a pump down temperature; and increasing the pump speed of the vacuum pump after the temperature of the second transfer tube exceeds a second threshold.

Abstract: A mass spectrometer system includes an ion source and a controller. The ion source includes a body having a length along a source axis from the first end to the second end; an electron source positioned at the first end and configured for accelerating an electron beam through the ionization chamber along the source axis. The controller is configured to operate the ion source in a high robustness mode by setting a second lens voltage and a filament voltage to minimize electron reflection back along the source axis towards the electron source; and operate the ion source in a high sensitivity mode by setting second lens voltage and a filament voltage to cause electron reflection back along the source axis towards the electron source.

Abstract: A mass spectrometer system can include an ion source, a vacuum chamber; a mass analyzer within the vacuum chamber, a transfer tube between the ion source and the vacuum chamber, a transfer tube heater, and a vacuum pump. The mass spectrometer system can be configured to reduce the pump speed of the vacuum pump in response to receiving a transfer tube swap instruction; lower the temperature of the transfer tube to below a first threshold; operating the vacuum pump at the reduced pump speed while the transfer tube is replaced with a second transfer tube; heating the second transfer tube to a temperature above a pump down temperature; and increasing the pump speed of the vacuum pump after the temperature of the second transfer tube exceeds a second threshold.

Abstract: A device for a gas chromatograph system includes an injector, a conduit assembly, a flow restrictor, and a pressure controller. The injector is connected to a carrier gas source and an auxiliary gas source. The conduit assembly surrounds the input end of an analytical column. A carrier gas is supplied at a constant pressure through a flow restrictor to the injector. A pressure controller is configured to control the pressure of an auxiliary gas supplied to the injector from the auxiliary source. The pressure controller is configured to operate in a first mode to provide a first auxiliary gas pressure sufficient to force a flow of the auxiliary gas and a sample onto the analytical column during an inject phase and to operate in a second mode to provide a second auxiliary gas pressure below a threshold necessary to flow auxiliary gas into the analytical column during a resolving phase.

Abstract: A mass spectrometer system can include an ion source, a vacuum chamber; a mass analyzer within the vacuum chamber, a transfer tube between the ion source and the vacuum chamber, a transfer tube heater, and a vacuum pump. The mass spectrometer system can be configured to reduce the pump speed of the vacuum pump in response to receiving a transfer tube swap instruction; lower the temperature of the transfer tube to below a first threshold; operating the vacuum pump at the reduced pump speed while the transfer tube is replaced with a second transfer tube; heating the second transfer tube to a temperature above a pump down temperature; and increasing the pump speed of the vacuum pump after the temperature of the second transfer tube exceeds a second threshold.

Abstract: A capillary column includes a fused silica tubing and a polyimide coating over the fusing silica tubing. Additionally, the capillary column further includes a first plurality of integrated ferrules positioned along at least a first portion of the fused silica tubing and spaced apart from one another by a first fixed interval.

Abstract: A mass spectrometer system can include an ion source, a vacuum chamber; a mass analyzer within the vacuum chamber, a transfer tube between the ion source and the vacuum chamber, a transfer tube heater, and a vacuum pump. The mass spectrometer system can be configured to reduce the pump speed of the vacuum pump in response to receiving a transfer tube swap instruction; lower the temperature of the transfer tube to below a first threshold; operating the vacuum pump at the reduced pump speed while the transfer tube is replaced with a second transfer tube; heating the second transfer tube to a temperature above a pump down temperature; and increasing the pump speed of the vacuum pump after the temperature of the second transfer tube exceeds a second threshold.

Abstract: A mass spectrometer system can include an ion source, a vacuum chamber; a mass analyzer within the vacuum chamber, a transfer tube between the ion source and the vacuum chamber, a transfer tube heater, and a vacuum pump. The mass spectrometer system can be configured to reduce the pump speed of the vacuum pump in response to receiving a transfer tube swap instruction; lower the temperature of the transfer tube to below a first threshold; operating the vacuum pump at the reduced pump speed while the transfer tube is replaced with a second transfer tube; heating the second transfer tube to a temperature above a pump down temperature; and increasing the pump speed of the vacuum pump after the temperature of the second transfer tube exceeds a second threshold.

Abstract: An injection port for a gas chromatograph (GC) is operated such that, during an injection sequence, an inert gas is used for sample transfer to the analytical column while hydrogen is subsequently utilized for the majority of the analytical separation. This allows for a high degree of chromatographic efficiency, while also reducing unwanted chemical reactions involving hydrogen and/or reactive solvents in a hot injection port. Certain embodiments also provide an increased margin of safety when using hydrogen, since the total flow may be limited such that the concentration of hydrogen in the GC oven never exceeds a safety limit, such as the lower explosive limit.

Abstract: A device for a gas chromatograph system includes an injector, a conduit assembly, a flow restrictor, and a pressure controller. The injector is connected to a carrier gas source and an auxiliary gas source. The conduit assembly surrounds the input end of an analytical column. A carrier gas is supplied at a constant pressure through a flow restrictor to the injector. A pressure controller is configured to control the pressure of an auxiliary gas supplied to the injector from the auxiliary source. The pressure controller is configured to operate in a first mode to provide a first auxiliary gas pressure sufficient to force a flow of the auxiliary gas and a sample onto the analytical column during an inject phase and to operate in a second mode to provide a second auxiliary gas pressure below a threshold necessary to flow auxiliary gas into the analytical column during a resolving phase.