Abstract: A DRAM cell, including memory cells each having a first transistor, a second transistor and a third transistor. The memory cells also have a writing bit line, a writing word line, a read-out word line and a read-out bit line. The first transistor has a gate electrode and a second source/drain region. The second transistor has a gate electrode, a first source/drain region, and a second source/drain region. The gate electrode of the first transistor is connected to the first source/drain region of the second transistor. The second source/drain region of the second transistor is connected to said writing bit line. The gate electrode of the second transistor is connected to the writing word line. The third transistor has a gate electrode, a first source/drain region, and a second source/drain region. The gate electrode of the third transistor is connected to the read-out word line. The second source/drain region of the first transistor is connected to the first source/drain region of the third transistor.

Abstract: The DRAM cell arrangement has three transistors per memory cell, at least one of which transistors is designed as a vertical transistor. The transistors may be formed on sidewalls (1F1, 1F2, 2F2) of trenches (G1, G2). In order to fabricate contact regions (K) which respectively connect together three source/drain regions (1 S/D1, 3 S/D2, 2 S/D 2) of different transistors, it is advantageous to arrange the trenches (G1, G2) alternately with a larger distance and a smaller distance from one another. Gate electrodes (Ga1, Ga3) of transistors may be formed as parts of writing word lines (WS) or read-out word lines (WA) in the form of spacers on sidewalls (1F1, 1F2) of the trenches (G1). Connections between gate electrodes (Ga2) and source/drain regions (3 S/D1) may be made via conductive structures (L).

Abstract: A storage cell has a number of projections of a semiconductor substrate arranged in rows and columns, neighboring rows of the projections being translation-symmetrical in relation to a y-axis which extends parallel to the columns. Each of the projections has at least one first source/drain region of a selection transistor and one channel region arranged below the first source/drain region, which is surrounded by a gate electrode annularly. A storage capacitor is connected between the first source/drain region and a bit line. The bit line as well as the storage capacitor are arranged essentially above the semiconductor substrate. Second source/drain regions of selection transistors are buried in the semiconductor substrate and connected with each other. Word lines can be formed self-justified in the form of adjacent gate electrodes. The projections can be created by etching with only one mask. The storage cell can be produced with an area of 4F.sup.

Abstract: A terminal metallization (8) is applied onto and structured on a layer structure on the upper side of the component, the terminal metallization is applied on the upper side of an insulating layer (7) with an opening on a metallization (6) provided for electrical connection. By filling a hole produced in a covering dielectric with metal, a contact rod (12) seated on this terminal metallization (8) is formed. This contact rod is resiliently movable in a surrounding opening (14) of the component on the free part of the terminal metallization (8) anchored in the layer structure. This enables the reversible contacting of the component to a further component arranged vertically thereto, whereby the planar upper sides lying opposite one another can be brought into intimate contact because the contact rod (12) pressed against a contact (15) of the other component is pressed back into the opening (14) and an adequately firm connection of the contacts is achieved by the spring power of the terminal metallization (8).

Abstract: An MOS transistor has a gate electrode is electrically conductively connected to an exposed contact area (pad). The contact area is electrochemically corrosion-resistant and is dimensioned for connection to a living cell. The surface topology is relatively flat and the surface, with the exception of the contact area, is protected with a dielectric passivation layer.

Abstract: A process for producing components having a contact structure provides for vertical contact-making, in which, for the connection of a metal contact of a first component to a metal contact of a second component, the substrate is etched out, starting from the top, in a region provided for a vertical, conductive connection, this recess is filled with a metal so that said metal is connected to the surface of the metal contact, the rear side of the substrate is removed until the metal projects beyond the rear side, a metallization layer made of a metal having a low melting point, for example AuIn, is applied to the metal contact of the second component, the surface of the second component is provided with a planar layer, the two components are arranged vertically with respect to one another and a permanent contact is produced between the metal of the first component and the metallization layer of the second component by pressing one onto the other and heating.

Abstract: To produce a three-dimensional circuit arrangement, a first substrate (1) is thinned, stacked onto a second substrate (2) and fixedly connected to the latter. The first substrate (1) and the second substrate (2) in this case each comprise circuit structures (12, 22) and metallization planes (13, 23). At least one first contact hole (16) and one second contact hole (4) are opened, which reach the metallization plane (13, 23) in the first substrate (1) and second substrate (2), respectively, the second contact hole (4) passing through the first substrate (1). The metallization planes (13, 23) of the two substrates (1, 2) are electrically connected to one another via a conductive layer (7).

Abstract: A metal layer provided for micromechanical components such as sensors or actuators is surrounded with a protective layer of, for example, TiN for protection against the influence of an etchant that is employed for etching out a cavity in a sacrificial layer of, for example, silicon dioxide. The lower part and the upper part of this protective layer are produced as layers. A supplementary protective layer is conformally deposited into the etching holes produced for etching the cavity out and is anisotropically re-etched, so that the metal layer is also laterally covered by the protective layer.

Abstract: In a method for manufacturing tunnel-effect sensors, a tip (2) composed of the silicon of the substrate (1) is produced on a substrate (1) of silicon with electrically conductively doped regions (4) by oxidation of the silicon using a nitride mask on the surface. Using the planarized oxide layer (5) produced in the oxidation step, a beam (3) of polysilicon that is anchored on the substrate (1) is applied, for example, over the tip (2) as a cooperating electrodes for the utilization of the tunnel effect and is electrically conductively doped. Subsequently, the oxide layer (5) is removed.

Abstract: Manufacturing method for lateral bipolar transistors, wherein a highly doped emitter zone and collector zone as well as a base terminal zone are manufactured in a region in the silicon layer of a SOI substrate having a basic doping. The zones are manufactured by implantation using a mask. A base zone is then produced by implantation of dopant using the mask. The base zone is produced between the emitter zone and the collector zone.

Abstract: Method for manufacturing lateral bipolar transistors on a SOI substrate, whereby a basic doping for the conductivity type of emitter and collector is produced in the silicon layer of this SOI substrate, insulation regions are produced outside the region provided for the transistor, contact layers and dielectric layers are applied over a highly doped emitter zone and over a highly doped collector zone produced by a mask technique and are structured, so that a trench is located over a base zone to be produced and in the middle between emitter zone and collector zone, an auxiliary layer is then conformally deposited surface-wide with constant thickness, as a result whereof the trench having the width is reduced to a gap having the width of the base zone to be produced, an implantation of dopant for the operational sign of the conductivity of the base is undertaken through this gap, the regions situated laterally relative to this base zone are shielded by the vertical portions of the auxiliary layer that cover th

Abstract: A method for manufacturing lateral bipolar transistors, whereby a highly doped collector zone is produced in the silicon layer of a SOI substrate provided with a basic doping and using a mask. A structured dielectric layer covering at least this collector zone is then applied. This dielectric layer leaves the region provided for the emitter and the base free. This region left free is re-doped, and an auxiliary layer is then applied surface-wide with a uniform thickness. A doping for an emitter zone is introduced by using this auxiliary layer as shielding for the base zone to be manufactured. Subsequently, the emitter, base and collector are provided with contacts.

Abstract: A method for producing a bipolar transistor completely surrounded by an insulating trench in a substrate. Insulating regions at the surface of the substrate can be produced by depositing an SiO.sub.2 layer on the basis of thermal decomposition of TEOS and subsequent structuring of the SiO.sub.2 layer. The insulating regions can be employed as a self-aligning mask for the production of a collector terminal and of a substrate terminal.

Abstract: A method for manufacturing a bipolar transistor in which the base, emitter and collector terminals are produced from a single, planar layer of, for example, polysilicon, directly deposited onto a substrate. The planar layer is doped by a first conductivity type for the base terminal. After masking with an implantation mask, covering a region of the planar layer for the base terminal and defining regions of the planar layer for the emitter and collector terminals, the regions for the emitter and collector terminals are doped by an implantation of a second conductivity type, the second conductivity type being opposite the first conductivity type. After a self-aligned supplementation of the implantation mask, for example, with the assistance of a spacer technique, with which the regions of the planar layer for the emitter and collector terminals are also covered, the planar layer is structured by anisotropic etching by using the supplemented implantation mask as an etching mask.

Abstract: A manufacturing method for polycrystalline silicon layers with a defined particle size and texture on a substrate provides for depositing of an amorphous silicon layer on the substrate. The substrate with the amorphous silicon layer is placed into a furnace at an initial temperature lower than the crystallization temperature of amorphous silicon. After an adjustment to thermal equilibrium, the furnace is heated in a controlled fashion from the initial temperature to a target temperature which is higher than the crystallization temperature, whereby the amorphous silicon layer is completely crystallized and becomes a polycrystalline layer. The method is particularly applicable in manufacturing polycrystalline silicon resistances for integrated circuits.

Abstract: A circuit structure contains at least one bipolar transistor whose emitter is fashioned as a part of a doped silicon layer grown on a substrate. The doped silicon layer comprises a sidewall extending parallel to its surface normal, the sidewall being covered with a doped silicon structure in contact with the silicon substrate and forms the base of the bipolar transistor. The bipolar transistor comprises a self-aligned, effective emitter with a 50-500 nm.

Abstract: A bipolar transistor structure wherein the emitter zone is produced by outward diffusion from etching residues which are formed by deposition of conductive material and re-etching, with the etching residues forming part of the emitter terminal region. In addition to individual transistors, pairs of transistors having coupled emitters can also be produced and employed in hig precision differential amplifiers. Memory cells can also be produced which have low surface requirements, particularly due to the reproduceable attainment of emitter widths below one micron. Since the methods enable the production of completely self-aligned transistors, they can be implemented with straightforward steps which are largely independent of lithography. Emitter widths in the range of about 0.2 to 0.5 microns can be produced.