Abstract: A non-volatile memory device including: a page buffer configured to latch a plurality of page data constituting one bit page of a plurality of bit pages, and a control logic configured to compare results of a plurality of read operations performed in response to a high-priority read signal set to select one of a plurality of read signals included in the high-priority read signal set as a high-priority read signal, and determine a low-priority read signal corresponding to the high-priority read signal, wherein the high-priority read signal set is for reading high-priority page data, and the low-priority read signal is for reading low-priority page data.

Abstract: Provided is a bit error rate equalizing method of a memory device. The memory device selectively performs an error correction code (ECC) interleaving operation according to resistance distribution characteristics of memory cells, when writing a codeword including information data and a parity bit of the information data to a memory cell array. In the ECC interleaving operation according to one example, an ECC sector including information data is divided into a first ECC sub-sector and a second ECC sub-sector, the first ECC sub-sector is written to memory cells of a first memory area having a high bit error rate (BER), and the second ECC sub-sector is written to memory cells of a second memory area having a low BER.

Abstract: A memory system includes a memory device including a plurality of memory cells, and a memory controller configured to control the memory device. The memory controller includes a random number generator configured to generate a random number based on read data from the memory device, and an address translation module configured to generate a key based on the random number and to translate a first address into a second address by performing a calculation on the first address and the key.

Abstract: A non-volatile memory device including: a page buffer configured to latch a plurality of page data constituting one bit page of a plurality of bit pages, and a control logic configured to compare results of a plurality of read operations performed in response to a high-priority read signal set to select one of a plurality of read signals included in the high-priority read signal set as a high-priority read signal, and determine a low-priority read signal corresponding to the high-priority read signal, wherein the high-priority read signal set is for reading high-priority page data, and the low-priority read signal is for reading low-priority page data.

Abstract: A memory controller configured to control a memory device including a plurality of banks. The memory controller may determine whether a number of write commands enqueued in a command queue of the memory controller exceeds a reference value, calculate a level of write power to be consumed by the memory device in response to at least some of the write commands from among the enqueued write commands when the number of enqueued write commands exceeds the reference value, and schedule, based on the calculated level of write power, interleaving commands executing an interleaving operation of the memory device, from among the enqueued write commands.

Abstract: Provided are a memory controller determining degradation in endurance, a memory system including the memory controller, and a method of operating the memory controller. The memory controller includes: an error correction code (ECC) circuit configured to detect an error from data read from a memory device; and an endurance determination circuit configured to check a first counting value indicating a number of writing operations on the memory device and a second counting value indicating, based on the data read from the memory device, at least one of: a number of first memory cells of the memory device, each of the first memory cells having an error and a number of second memory cells of the memory device in a certain logic state, and configured to perform a first determination operation for determining whether endurance of the memory device has degraded based on a checking result.

Abstract: A memory controller is provided. The memory controller includes an error correction code (ECC) circuit configured to correct an error of a read codeword provided from a memory device, the ECC circuit including: a codeword combination generator configured to receive a first read codeword including a plurality of first read codeword bit values that are read from a first region of the memory device, generate a change codeword by changing values of one or more of the plurality of first read codeword bit values, and provide a codeword combination including the change codeword; and an ECC decoder including a plurality of ECC engines, wherein the ECC decoder is configured to perform ECC decoding in parallel on a plurality of codewords included in the codeword combination.

Abstract: A non-volatile memory device including: a page buffer configured to latch a plurality of page data constituting one bit page of a plurality of bit pages, and a control logic configured to compare results of a plurality of read operations performed in response to a high-priority read signal set to select one of a plurality of read signals included in the high-priority read signal set as a high-priority read signal, and determine a low-priority read signal corresponding to the high-priority read signal, wherein the high-priority read signal set is for reading high-priority page data, and the low-priority read signal is for reading low-priority page data.

Abstract: A storage device includes a nonvolatile memory including a plurality of nonvolatile memory cells, a write buffer memory storing first data and second data received from a host, and a storage controller storing the first data and the second data that are stored in the write buffer memory into the nonvolatile memory. The storage controller performs a first program operation and a second program operation on a plurality of first memory cells connected to a first word line group to store the first data, and performs a first program operation and a second program operation on a plurality of second memory cells connected to a second word line group to store the second data. While the storage controller performs the first program operation on the plurality of second memory cells, the first data is written in the write buffer memory.

Abstract: A storage device including, a plurality of non-volatile memories configured to include a memory cell region including at least one first metal pad; and a peripheral circuit region including at least one second metal pad and vertically connected to the memory cell region by the at least one first metal pad and the at least one second metal pad, and a controller connected to the plurality of non-volatile memories through a plurality of channels and configured to control the plurality of non-volatile memories, wherein the controller selects one of a first read operation mode and a second read operation mode and transfers a read command corresponding to the selected read operation mode to the plurality of non-volatile memories, wherein one sensing operation is performed to identify one program state among program sates in the first read operation mode, and wherein at least two sensing operations are performed to identify the one program state among the program states in the second read operation mode.

Abstract: A memory device includes a memory cell array including a plurality of memory cells and a control logic to control a write operation on the memory cell array. When operating in a first data comparison write (DCW) mode, data is written to first memory cells in which data values are changed, in a first region, data is written to second memory cells in which data values are not changed, and, in a second region, data write is skipped for second memory cells in which data values are not changed.

Abstract: A memory controller to control a memory device includes an Error Checking and Correcting (ECC) engine to perform error detection on data read from the memory device and a data operation manager. The data operation manager is to control a first rewrite operation of the memory device on selected memory cells to compensate for a drift in a distribution of the selected memory cells, based on a result of a test read operation of the memory device on test cells, determine a distribution adjustment degree based on a result of a normal read operation, as an ECC decoding operation corresponding to the normal read operation of the memory device is successfully performed by using the ECC engine, and control a second rewrite operation of the memory device based on the determined distribution adjustment degree.

Abstract: A method of operating a resistive memory system including a plurality of layers may include receiving a write request and first data corresponding to a first address, converting the first address into a second address and assigning n (n is an integer equal to or larger than 2) pieces of sub-region data generated from the first data to the plurality of layers, and writing the n pieces of sub-region data to at least two layers according to the second address.

Abstract: A method of operating a memory controller includes classifying a plurality of memory cells in an erase state into a plurality of groups, based on erase state information about the plurality of memory cells in the erase state; setting at least one target program state for at least some memory cells from among memory cells included in at least one of the plurality of groups; and programming the at least some memory cells for which the at least one target program state has been set, to a program state other than the at least one target program state from among the plurality of program states.

Abstract: An method of operating a nonvolatile memory device including a plurality of memory cells comprises receiving a read command from an external device, in response to the read command, performing, based on a reference voltage, a first cell counting operation with respect to the plurality of memory cells, adjusting at least one read voltage of first through nth read voltages (where n is a natural number greater than 1) based on a first result of the first cell counting operation, and performing, based on the adjusted at least one read voltage, a read operation corresponding to the read command with respect to the plurality of memory cells.

Abstract: A memory controller to control a memory device includes an Error Checking and Correcting (ECC) engine to perform error detection on data read from the memory device and a data operation manager. The data operation manager is to control a first rewrite operation of the memory device on selected memory cells to compensate for a drift in a distribution of the selected memory cells, based on a result of a test read operation of the memory device on test cells, determine a distribution adjustment degree based on a result of a normal read operation, as an ECC decoding operation corresponding to the normal read operation of the memory device is successfully performed by using the ECC engine, and control a second rewrite operation of the memory device based on the determined distribution adjustment degree.

Abstract: A memory device includes a memory cell array including a plurality of memory cells and a control logic to control a write operation on the memory cell array. When operating in a first data comparison write (DCW) mode, data is written to first memory cells in which data values are changed, in a first region, data is written to second memory cells in which data values are not changed, and, in a second region, data write is skipped for second memory cells in which data values are not changed.

Abstract: A memory system includes a memory device including a plurality of memory cells, and a memory controller configured to control the memory device. The memory controller includes a random number generator configured to generate a random number based on read data from the memory device, and an address translation module configured to generate a key based on the random number and to translate a first address into a second address by performing a calculation on the first address and the key.

Abstract: A memory controller is provided. The memory controller includes an error correction code (ECC) circuit configured to correct an error of a read codeword provided from a memory device, the ECC circuit including: a codeword combination generator configured to receive a first read codeword including a plurality of first read codeword bit values that are read from a first region of the memory device, generate a change codeword by changing values of one or more of the plurality of first read codeword bit values, and provide a codeword combination including the change codeword; and an ECC decoder including a plurality of ECC engines, wherein the ECC decoder is configured to perform ECC decoding in parallel on a plurality of codewords included in the codeword combination.

Abstract: A memory system for performing a recovery operation is provided. A memory system includes a memory device including a plurality of memory cells constituting a plurality of sub-sets, and a memory controller for controlling the memory device. The memory controller controls the memory device to manage a read count indicating a number of read operations performed by the memory device for each of the plurality of sub-sets, and to perform a recovery operation on a sub-set, among the plurality of sub-sets, based on the read count corresponding to the read count. Each of a plurality of sub-sets includes a plurality of pages. Each of the plurality of pages is a unit in which a read operation is performed in the plurality of memory cells.