Abstract: A semiconductor device package includes a die pad having a die attach surface, a first lead that is spaced apart and extends away from a first side of the die pad, and a semiconductor die mounted on the die attach surface. The semiconductor die includes a first bond pad disposed on an upper side of the semiconductor die that is opposite the die attach surface. A first clip electrically connects the first lead to the first bond pad. The first bond pad is elongated with first and second longer edge sides that are opposite one another and extend along a length of the first bond pad. The semiconductor die is oriented such that the first and second longer edge sides of the first bond pad are non-parallel to a first current flow direction of the first clip that extends between the first bond pad and the first lead.

Abstract: In some examples, a circuit package further includes an insulating layer and a first transistor extending through the insulating layer, where the first transistor includes a first control terminal on a top side of the insulating layer, a first source terminal on the top side of the insulating layer, and a first drain terminal on a bottom side of the insulating layer. The circuit package includes a second transistor extending through the insulating layer, where the second transistor includes a second control terminal on the top side of the insulating layer, a second source terminal on the bottom side of the insulating layer, and a second drain terminal on the top side of the insulating layer.

Abstract: In one implementation, a semiconductor package includes an integrated circuit (IC) flip chip mounted on a first patterned conductive carrier, a second patterned conductive carrier situated over the IC, and a magnetic material situated over the second patterned conductive carrier. The semiconductor package also includes a third patterned conductive carrier situated over the magnetic material. The second patterned conductive carrier and the third patterned conductive carrier are electrically coupled so as to form windings of an integrated inductor in the semiconductor package.

Abstract: In some examples, a device includes a semiconductor element, a layer element, and a single connector element electrically connecting the semiconductor element and the layer element. In some examples, the single connector element includes two or more discrete connector elements, and each discrete connector element of the two or more discrete connector elements electrically connects the semiconductor element and the layer element. In some examples, the single connector element also includes conductive material attached to the two or more discrete connector elements.

Abstract: In one example, a method includes drilling a cavity into each contact pad of one or more contact pads of a first printed circuit board to form one or more cavities. The first printed circuit board includes an embedded integrated circuit and one or more metal layers. The method further includes forming one or more first metal layers for a second printed circuit board below a bottom surface of the first printed circuit board. The method further includes forming an electrically conductive material in the one or more cavities. The electrically conductive material electrically couples the one or more contact pads of the first printed circuit board to the second printed circuit board. The method further includes forming one or more second metal layers for the second printed circuit board above a top surface of the first printed circuit board.

Abstract: The disclosure is directed to a circuit on a substrate, such as a leadframe package, that includes shunt to measure current. The shunt is an arched conductor positioned to bridge over a die mounted on the package with voltage measurement terminals of the die electrically connected to the shunt. The techniques of this disclosure determine the shunt material, shunt size and shape to accurately control the value of the resistance of the shunt. The arrangement of the die and the shunt may include advantages of maintaining a small package size and allow accurate temperature compensation. The shunt may be long enough to have a measurable resistance that may be used to determine the current through the shunt. In some examples, the arrangement of the die and the shunt may provide additional structural support to the circuit.

Abstract: In some examples, a device includes a first leadframe segment and a second leadframe segment, wherein the second leadframe segment is electrically isolated from the first leadframe segment. The device further includes at least four transistors comprising at least two high-side transistors electrically connected to the first leadframe segment and at least two low-side transistors electrically connected to the second leadframe segment. The device further includes at least two conductive output elements, wherein each conductive output element of the at least two conductive output elements is electrically connected to a respective high-side transistor of the at least two high-side transistors and a respective low-side transistor of the at least two low-side transistors. The device further includes an integrated circuit electrically connected to a control terminal of each transistor of the at least four transistors.

Abstract: In one example, a method includes drilling a cavity into each contact pad of one or more contact pads of a first printed circuit board to form one or more cavities. The first printed circuit board includes an embedded integrated circuit and one or more metal layers. The method further includes forming one or more first metal layers for a second printed circuit board below a bottom surface of the first printed circuit board. The method further includes forming an electrically conductive material in the one or more cavities. The electrically conductive material electrically couples the one or more contact pads of the first printed circuit board to the second printed circuit board. The method further includes forming one or more second metal layers for the second printed circuit board above a top surface of the first printed circuit board.

Abstract: In some examples, a device includes a substrate and a conductive pad extending through the substrate, wherein the substrate is coupled to the conductive pad at an interface and the substrate extends laterally from the interface to define a substrate extension. In some examples, the device also includes a semiconductor die mounted on the first side of the substrate. In some examples, the device includes a breakpoint that defines a torque tolerance that is less than a torque tolerance of the device at other points. In some examples, the device is configured to break at the breakpoint in response to force being applied to the substrate extension on the first side of the substrate.

Abstract: In one example, a method includes drilling a cavity into each contact pad of one or more contact pads of a first printed circuit board to form one or more cavities. The first printed circuit board includes an embedded integrated circuit and one or more metal layers. The method further includes forming one or more first metal layers for a second printed circuit board below a bottom surface of the first printed circuit board. The method further includes forming an electrically conductive material in the one or more cavities. The electrically conductive material electrically couples the one or more contact pads of the first printed circuit board to the second printed circuit board. The method further includes forming one or more second metal layers for the second printed circuit board above a top surface of the first printed circuit board.

Abstract: In some examples, a device comprises at least two semiconductor die, wherein each respective semiconductor die of the at least two semiconductor die comprises at least two power transistors, an input node on a first side of the respective semiconductor die, a reference node on the first side of the respective semiconductor die, and a switch node on a second side of the respective semiconductor die. The device further comprises a first conductive element electrically connected to the respective input nodes of the at least two semiconductor die. The device further comprises a second conductive element electrically connected to the respective reference nodes of the at least two semiconductor die.

Abstract: The disclosure is directed to a circuit on a substrate, such as a leadframe package, that includes shunt to measure current. The shunt is an arched conductor positioned to bridge over a die mounted on the package with voltage measurement terminals of the die electrically connected to the shunt. The techniques of this disclosure determine the shunt material, shunt size and shape to accurately control the value of the resistance of the shunt. The arrangement of the die and the shunt may include advantages of maintaining a small package size and allow accurate temperature compensation. The shunt may be long enough to have a measurable resistance that may be used to determine the current through the shunt. In some examples, the arrangement of the die and the shunt may provide additional structural support to the circuit.

Abstract: In some examples, a device comprises an inductor and a package comprising at least one power device. The package is attached to the inductor by an adhesion layer, and the inductor comprises one or more leads. A first lead of the one or more leads is configured to conduct electricity between the at least one power device and the inductor, and a surface of the first lead and a surface of the package are substantially co-planar.

Abstract: In some examples, a device includes an input leadframe segment and a reference leadframe segment that is electrically isolated from the input leadframe segment. The device further includes at least four transistors comprising at least two high-side transistors that are electrically connected to the input leadframe segment and at least two low-side transistors that are electrically connected to the reference leadframe segment. The device further includes at least two switching elements, wherein each switching element of the at least two switching elements is electrically connected to a respective high-side transistor of the at least two high-side transistors, each switching element of the at least two switching elements is electrically connected to a respective low-side transistor of the at least two low-side transistors, and the at least four transistors include at least one discrete transistor.

Abstract: In some examples, a device includes a substrate and a conductive pad extending through the substrate, wherein the substrate is coupled to the conductive pad at an interface and the substrate extends laterally from the interface to define a substrate extension. In some examples, the device also includes a semiconductor die mounted on the first side of the substrate. In some examples, the device includes a breakpoint that defines a torque tolerance that is less than a torque tolerance of the device at other points. In some examples, the device is configured to break at the breakpoint in response to force being applied to the substrate extension on the first side of the substrate.

Abstract: There are disclosed herein various implementations of a compact high-voltage semiconductor package. In one exemplary implementation, such a semiconductor package includes a power transistor, as well as a drain contact, a source contact, and a gate contact to provide external connections to the power transistor. The semiconductor package also includes a contour element formed between the drain contact and the source contact in the semiconductor package. The contour element increases a creepage distance between the drain contact and the source contact in the semiconductor package so as to increase a breakdown voltage of the semiconductor package.

Abstract: A semiconductor package includes a semiconductor die having a control transistor and a sync transistor, an integrated output inductor having a winding around a core, and coupled to the semiconductor die, where the winding includes a plurality of top conductive clips connected to a plurality of bottom conductive clips. The control transistor and the sync transistor are configured as a half-bridge. The integrated output inductor is coupled to a switched node of the half-bridge. At least one of the plurality of top conductive clips and the plurality of bottom conductive clips includes a partially etched portion and a non-etched portion. The semiconductor die is attached to the integrated output inductor by a die attach material. The semiconductor die and the integrated output inductor are encapsulated in a molding compound.

Abstract: The disclosure is directed to techniques to evenly distribute current in interdigited leadframes by decoupling current between interdigited pads. The leadframe may use a perpendicular structure between the leadframe conductive pads and the lead traces. The perpendicular structure provides a short path for the current to travel from electrode pad openings on a device to the lead traces carrying current to other portions of a circuit. The conductive pad may be parallel to the electrode pad opening to lower spreading resistance. In an example of a transistor, the transistor may have two or more electrode pads for every current carrying node. Therefore, several electrode pads may have the same node, such as the source or drain of the device. For example, two or more source pads may be connected though the leadframe to evenly distribute the current and decouple the current from a single transistor.

Abstract: In some examples, a device comprises at least two semiconductor die, wherein each respective semiconductor die of the at least two semiconductor die comprises at least two power transistors, an input node on a first side of the respective semiconductor die, a reference node on the first side of the respective semiconductor die, and a switch node on a second side of the respective semiconductor die. The device further comprises a first conductive element electrically connected to the respective input nodes of the at least two semiconductor die. The device further comprises a second conductive element electrically connected to the respective reference nodes of the at least two semiconductor die.

Abstract: Input/output pins for a chip-embedded substrate may be fabricated by applying a contact-distinct volume of solder to at least two contacts that are recessed within the chip-embedded substrate, temperature-cycling the chip-embedded substrate to induce solder reflow and define an input/output pin for each one of the at least two contacts, and machining the input/output pin for each one of the at least two contacts to extend exposed from the chip-embedded substrate to a common height within specification tolerance. Such a technique represents a paradigm shift in that the manufacturer of the chip-embedded substrate, as opposed to the immediate customer of the manufacturer, may assume the burden of quality control with respect to minimizing unintended solder void trapping under the input/output pins, thereby reinforcing existing customer loyalty and potentially attracting new customers.