Patents by Inventor Fu An Wu

Fu An Wu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250149073
    Abstract: A semiconductor device includes anti-fuse cells. The anti-fuse cells include a first active area, a first gate, a second gate, at least one first gate via, and at least one second gate via. The first gate and the second gate are separate from each other. The first gate and the second gate extend to cross over the first active area. The at least one first gate via is coupled to the first gate and disposed directly above the first active area. The at least one second gate via is coupled to the second gate. The first gate is coupled through the at least one first gate via to a first word line for receiving a first programming voltage, and the second gate is coupled through the at least one second gate via to a second word line for receiving a first reading voltage.
    Type: Application
    Filed: January 9, 2025
    Publication date: May 8, 2025
    Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Meng-Sheng CHANG, Yao-Jen YANG, Yih WANG, Fu-An WU
  • Patent number: 12243618
    Abstract: A method includes: coupling a first gate to a first word line through a first gate via, wherein the first gate extends along a first direction; coupling the first gate to a second word line through a second gate via, wherein each of the first gate, a second gate, the first gate via and the second gate via is disposed on a first active area which extends along the second direction, wherein the second gate extends along the first direction and is separated from the first gate along a second direction; coupling the first active area to a first bit line through a first conductive via; and aligning the first gate via, the second gate via and the a first conductive via with each other along the second direction.
    Type: Grant
    Filed: February 3, 2023
    Date of Patent: March 4, 2025
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Meng-Sheng Chang, Yao-Jen Yang, Yih Wang, Fu-An Wu
  • Patent number: 12237050
    Abstract: An integrated circuit includes a memory cell array, a row decoder configured to generate a first decoder signal, a column decoder configured to generate a second decoder signal, and an array of write assist circuits coupled to the row and column decoder and the memory cell array. Each write assist circuit is configured to set an operating voltage of a corresponding memory cell, and generate the output signal in response to a first control signal. The operating voltage corresponds to an output signal. Each write assist circuit includes an AND gate coupled to a programmable voltage tuner. The programmable voltage tuner includes a set of P-type transistors coupled to a first P-type transistor. The set of P-type transistors is coupled together in parallel, and receives a set of select control signals. A first terminal of the first P-type transistor is configured to receive an AND signal from the AND gate.
    Type: Grant
    Filed: July 7, 2022
    Date of Patent: February 25, 2025
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Chih-Chieh Chiu, Chia-En Huang, Fu-An Wu, I-Han Huang, Jung-Ping Yang
  • Patent number: 12230359
    Abstract: A semiconductor device includes anti-fuse cells. The anti-fuse cells include a first active area, a first gate, a second gate, at least one first gate via, and at least one second gate via. The first gate and the second gate are separate from each other. The first gate and the second gate extend to cross over the first active area. The at least one first gate via is coupled to the first gate and disposed directly above the first active area. The at least one second gate via is coupled to the second gate. The first gate is coupled through the at least one first gate via to a first word line for receiving a first programming voltage, and the second gate is coupled through the at least one second gate via to a second word line for receiving a first reading voltage.
    Type: Grant
    Filed: February 3, 2023
    Date of Patent: February 18, 2025
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Meng-Sheng Chang, Yao-Jen Yang, Yih Wang, Fu-An Wu
  • Patent number: 12183428
    Abstract: A memory circuit includes a NAND logic gate configured to receive a first bit line signal and a second bit line signal, and to generate a first signal. The memory circuit further includes a first P-type transistor coupled to the NAND logic gate, and configured to receive a first clock signal. The memory circuit further includes a first N-type transistor coupled to the NAND logic gate, and configured to receive a first pre-charge signal. The memory circuit further includes a first latch coupled to the NAND logic gate, and configured to latch the first signal in response to at least the first clock signal or the first pre-charge signal.
    Type: Grant
    Filed: July 25, 2023
    Date of Patent: December 31, 2024
    Assignees: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD., TSMC CHINA COMPANY, LIMITED
    Inventors: Yi-Tzu Chen, Ching-Wei Wu, Hau-Tai Shieh, Hung-Jen Liao, Fu-An Wu, He-Zhou Wan, XiuLi Yang
  • Publication number: 20240296887
    Abstract: Disclosed herein is an integrated circuit including multiple magnetic tunneling junction (MTJ) cells coupled to a static random access memory (SRAM). In one aspect, the integrated circuit includes a SRAM having a first port and a second port, and a set of pass transistors coupled to the first port of the SRAM. In one aspect, the integrated circuit includes a set of MTJ cells, where each of the set of MTJ cells is coupled between a select line and a corresponding one of the set of pass transistors.
    Type: Application
    Filed: May 13, 2024
    Publication date: September 5, 2024
    Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Perng-Fei Yuh, Yih Wang, Ku-Feng Lin, Jui-Che Tsai, Hiroki Noguchi, Fu-An Wu
  • Patent number: 11984164
    Abstract: Disclosed herein is an integrated circuit including multiple magnetic tunneling junction (MTJ) cells coupled to a static random access memory (SRAM). In one aspect, the integrated circuit includes a SRAM having a first port and a second port, and a set of pass transistors coupled to the first port of the SRAM. In one aspect, the integrated circuit includes a set of MTJ cells, where each of the set of MTJ cells is coupled between a select line and a corresponding one of the set of pass transistors.
    Type: Grant
    Filed: April 14, 2023
    Date of Patent: May 14, 2024
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Perng-Fei Yuh, Yih Wang, Ku-Feng Lin, Jui-Che Tsai, Hiroki Noguchi, Fu-An Wu
  • Publication number: 20230368826
    Abstract: A memory circuit includes a NAND logic gate configured to receive a first bit line signal and a second bit line signal, and to generate a first signal. The memory circuit further includes a first P-type transistor coupled to the NAND logic gate, and configured to receive a first clock signal. The memory circuit further includes a first N-type transistor coupled to the NAND logic gate, and configured to receive a first pre-charge signal. The memory circuit further includes a first latch coupled to the NAND logic gate, and configured to latch the first signal in response to at least the first clock signal or the first pre-charge signal.
    Type: Application
    Filed: July 25, 2023
    Publication date: November 16, 2023
    Inventors: Yi-Tzu CHEN, Ching-Wei WU, Hau-Tai SHIEH, Hung-Jen LIAO, Fu-An WU, He-Zhou WAN, XiuLi YANG
  • Publication number: 20230298665
    Abstract: Disclosed herein is an integrated circuit including multiple magnetic tunneling junction (MTJ) cells coupled to a static random access memory (SRAM). In one aspect, the integrated circuit includes a SRAM having a first port and a second port, and a set of pass transistors coupled to the first port of the SRAM. In one aspect, the integrated circuit includes a set of MTJ cells, where each of the set of MTJ cells is coupled between a select line and a corresponding one of the set of pass transistors.
    Type: Application
    Filed: April 14, 2023
    Publication date: September 21, 2023
    Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Perng-Fei Yuh, Yih Wang, Ku-Feng Lin, Jui-Che Tsai, Hiroki Noguchi, Fu-An Wu
  • Patent number: 11715505
    Abstract: A memory circuit includes a NAND logic gate configured to receive a first bit line signal and a second bit line signal, and to generate a first signal. The memory circuit further includes a first N-type transistor coupled to the NAND logic gate, and configured to receive a first pre-charge signal. The memory circuit further includes a second N-type transistor coupled to the first N-type transistor and a reference voltage supply, and configured to receive a first clock signal. The memory circuit further includes a first latch coupled to the NAND logic gate, and configured to latch the first signal in response to at least the first clock signal or the first pre-charge signal.
    Type: Grant
    Filed: July 29, 2022
    Date of Patent: August 1, 2023
    Assignees: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD., TSMC CHINA COMPANY, LIMITED
    Inventors: Yi-Tzu Chen, Ching-Wei Wu, Hau-Tai Shieh, Hung-Jen Liao, Fu-An Wu, He-Zhou Wan, XiuLi Yang
  • Publication number: 20230189513
    Abstract: A semiconductor device includes anti-fuse cells. The anti-fuse cells include a first active area, a first gate, a second gate, at least one first gate via, and at least one second gate via. The first gate and the second gate are separate from each other. The first gate and the second gate extend to cross over the first active area. The at least one first gate via is coupled to the first gate and disposed directly above the first active area. The at least one second gate via is coupled to the second gate. The first gate is coupled through the at least one first gate via to a first word line for receiving a first programming voltage, and the second gate is coupled through the at least one second gate via to a second word line for receiving a first reading voltage.
    Type: Application
    Filed: February 3, 2023
    Publication date: June 15, 2023
    Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Meng-Sheng CHANG, Yao-Jen YANG, Yih WANG, Fu-An WU
  • Publication number: 20230189512
    Abstract: A method includes: coupling a first gate to a first word line through a first gate via, wherein the first gate extends along a first direction; coupling the first gate to a second word line through a second gate via, wherein each of the first gate, a second gate, the first gate via and the second gate via is disposed on a first active area which extends along the second direction, wherein the second gate extends along the first direction and is separated from the first gate along a second direction; coupling the first active area to a first bit line through a first conductive via; and aligning the first gate via, the second gate via and the a first conductive via with each other along the second direction.
    Type: Application
    Filed: February 3, 2023
    Publication date: June 15, 2023
    Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Meng-Sheng CHANG, Yao-Jen YANG, Yih WANG, Fu-An WU
  • Patent number: 11677387
    Abstract: A clock circuit includes a latch circuit, a memory state latch circuit, a first inverter, a memory state trigger circuit and a second inverter. The latch circuit is configured to latch an enable signal, and to generate a latch output signal based on a first clock signal and a first output clock signal. The memory state latch circuit is configured to latch a second output clock signal responsive to a third output clock signal. The first inverter is configured to generate the first output clock signal responsive to the third output clock signal. The memory state trigger circuit is configured to generate the second output clock signal responsive to the latch output signal. The second inverter is configured to generate the first clock signal responsive to a second clock signal, and configured to control the latch circuit and the memory state trigger circuit based on the first clock signal.
    Type: Grant
    Filed: April 29, 2022
    Date of Patent: June 13, 2023
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Hao-I Yang, Cheng Hung Lee, Chen-Lin Yang, Chiting Cheng, Fu-An Wu, Yangsyu Lin
  • Patent number: 11675505
    Abstract: Various embodiments for configurable memory storage systems are disclosed. The configurable memory storages selectively choose an operational voltage signal from among multiple voltage signals to dynamically control various operational parameters. For example, the configurable memory storages selectively choose a maximum voltage signal from among the multiple voltage signals to maximize read/write speed. As another example, the configurable memory storages selectively choose a minimum voltage signal from among the multiple voltage signals to minimize power consumption.
    Type: Grant
    Filed: April 11, 2022
    Date of Patent: June 13, 2023
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Yu-Hao Hsu, Cheng Hung Lee, Chen-Lin Yang, Chiting Cheng, Fu-An Wu, Hung-Jen Liao, Jung-Ping Yang, Jonathan Tsung-Yung Chang, Wei Min Chan, Yen-Huei Chen, Yangsyu Lin, Chien-Chen Lin
  • Patent number: 11657873
    Abstract: Disclosed herein is an integrated circuit including multiple magnetic tunneling junction (MTJ) cells coupled to a static random access memory (SRAM). In one aspect, the integrated circuit includes a SRAM having a first port and a second port, and a set of pass transistors coupled to the first port of the SRAM. In one aspect, the integrated circuit includes a set of MTJ cells, where each of the set of MTJ cells is coupled between a select line and a corresponding one of the set of pass transistors.
    Type: Grant
    Filed: August 23, 2021
    Date of Patent: May 23, 2023
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Perng-Fei Yuh, Yih Wang, Ku-Feng Lin, Jui-Che Tsai, Hiroki Noguchi, Fu-An Wu
  • Patent number: 11600626
    Abstract: A structure includes anti-fuse cells. The anti-fuse cells include a first active area, a first gate, a second gate, at least one first gate via, and at least one second gate via. The first gate and the second gate are separate from each other. The first gate and the second gate extend to cross over the first active area. The at least one first gate via is coupled to the first gate and disposed directly above the first active area. The at least one second gate via is coupled to the second gate. The first gate is coupled through the at least one first gate via to a first word line for receiving a first programming voltage, and the second gate is coupled through the at least one second gate via to a second word line for receiving a first reading voltage.
    Type: Grant
    Filed: December 13, 2019
    Date of Patent: March 7, 2023
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Meng-Sheng Chang, Yao-Jen Yang, Yih Wang, Fu-An Wu
  • Publication number: 20220366950
    Abstract: A memory circuit includes a NAND logic gate configured to receive a first bit line signal and a second bit line signal, and to generate a first signal. The memory circuit further includes a first N-type transistor coupled to the NAND logic gate, and configured to receive a first pre-charge signal. The memory circuit further includes a second N-type transistor coupled to the first N-type transistor and a reference voltage supply, and configured to receive a first clock signal. The memory circuit further includes a first latch coupled to the NAND logic gate, and configured to latch the first signal in response to at least the first clock signal or the first pre-charge signal.
    Type: Application
    Filed: July 29, 2022
    Publication date: November 17, 2022
    Inventors: Yi-Tzu CHEN, Ching-Wei WU, Hau-Tai SHIEH, Hung-Jen LIAO, Fu-An WU, He-Zhou WAN, XiuLi YANG
  • Publication number: 20220343958
    Abstract: An integrated circuit includes a memory cell array, a row decoder configured to generate a first decoder signal, a column decoder configured to generate a second decoder signal, and an array of write assist circuits coupled to the row and column decoder and the memory cell array. Each write assist circuit is configured to set an operating voltage of a corresponding memory cell, and generate the output signal in response to a first control signal. The operating voltage corresponds to an output signal. Each write assist circuit includes an AND gate coupled to a programmable voltage tuner. The programmable voltage tuner includes a set of P-type transistors coupled to a first P-type transistor. The set of P-type transistors is coupled together in parallel, and receives a set of select control signals. A first terminal of the first P-type transistor is configured to receive an AND signal from the AND gate.
    Type: Application
    Filed: July 7, 2022
    Publication date: October 27, 2022
    Inventors: Chih-Chieh CHIU, Chia-En HUANG, Fu-An WU, I-Han HUANG, Jung-Ping YANG
  • Patent number: 11468929
    Abstract: A memory circuit includes a NAND logic gate, a first N-type transistor, a second N-type transistor, a first inverter and a first latch. The NAND logic gate is configured to receive a first bit line signal and a second bit line signal, and to generate a first signal. The first N-type transistor is coupled to the NAND logic gate, and configured to receive a first pre-charge signal. The second N-type transistor is coupled to the first N-type transistor and a reference voltage supply, and configured to receive a first clock signal. The first inverter is coupled to the NAND logic gate, and configured to output a data signal inverted from the first signal. The first latch is coupled to the NAND logic gate, and configured to latch the first signal in response to at least the first clock signal or the first pre-charge signal.
    Type: Grant
    Filed: April 20, 2021
    Date of Patent: October 11, 2022
    Assignees: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD., TSMC CHINA COMPANY, LIMITED
    Inventors: Yi-Tzu Chen, Ching-Wei Wu, Hau-Tai Shieh, Hung-Jen Liao, Fu-An Wu, He-Zhou Wan, XiuLi Yang
  • Publication number: 20220277781
    Abstract: A memory circuit includes a NAND logic gate, a first N-type transistor, a second N-type transistor, a first inverter and a first latch. The NAND logic gate is configured to receive a first bit line signal and a second bit line signal, and to generate a first signal. The first N-type transistor is coupled to the NAND logic gate, and configured to receive a first pre-charge signal. The second N-type transistor is coupled to the first N-type transistor and a reference voltage supply, and configured to receive a first clock signal. The first inverter is coupled to the NAND logic gate, and configured to output a data signal inverted from the first signal. The first latch is coupled to the NAND logic gate, and configured to latch the first signal in response to at least the first clock signal or the first pre-charge signal.
    Type: Application
    Filed: April 20, 2021
    Publication date: September 1, 2022
    Inventors: Yi-Tzu CHEN, Ching-Wei WU, Hau-Tai SHIEH, Hung-Jen LIAO, Fu-An WU, He-Zhou WAN, XiuLi YANG