Abstract: An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit and a trip mechanism having a switch device. In one embodiment, the apparatus a ground fault simulation unit, a fault detector of the leakage current detection circuit and the trip mechanism, and a life testing detection control unit having an MCU for controlling operation of the fault detector. In operation, a first signal (pulse signal) is sent to the gate of the switching device to generate a first voltage at the cathode of the switching device, a second signal is sent to the ground fault simulation unit to generate a simulated ground fault for the leakage current detection circuit to generate a second voltage at the gate of the switching device, and the first and second voltages are measured to determine whether a fault exists in the leakage current detection circuit and the trip mechanism.

Abstract: A transport system. The transport system comprises a first interbay component, a second interbay component, a plurality of intrabay components, and a route controller. The first and second interbay components transport the vehicles between the tool bays. Each of the intrabay components, linked with the second interbay component, transports the vehicles within one of the tool bays. Additionally, the intrabay component does not link with the first interbay component directly. The route controller estimates a transport cost for transporting the vehicle via the second interbay device, and determines whether the vehicle is to be transported via the first or second interbay component according to the estimated transport cost.

Abstract: An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit. In one embodiment, the apparatus a trip mechanism state generator, a fault alarm generator, a ground fault simulation unit. In operation, the ground fault simulation unit generates a simulated ground fault signal during every positive half-wave of an AC power, the simulated ground fault signal is detected by the leakage current detection circuit, the leakage current detection circuit responsively generates a signal to turn a switching device into its conductive state so as to allow a current to pass therethrough, the passed current is converted into a DC voltage in accordance with a trip mechanism state generated by the trip mechanism state generator, the fault alarm circuit receives and analyzes the DC voltage and indicates whether a fault exists in the leakage current protection device.

Abstract: An apparatus for testing the life of a leakage current protection device, comprising a microcontroller unit, at least one of a first fault detector and a second fault detector, at least one of an audio alarm and a visual alarm, a power supply circuit. In operation, the first fault detector and/or the second fault detector receive at least one signal from the leakage current protection device, and generate at least one DC voltage corresponding to the at least one signal to be received by the MCU. The MCU compares the at least one DC voltage with a predetermined threshold value to determine whether a fault exists in the leakage current protection device, and activates the alarm circuit if at least one fault exists.

Abstract: A leakage current detection interrupter with fire protection means, comprising: (i) a leakage current protection circuit, (ii) an electrical cord with metallic fire shields, and (iii) a fire protection circuit, wherein, in operation, the leakage current protection circuit and the fire protection circuit detect a fault condition including a leakage current, a ground fault and a fire hazard, and disconnect the source of electricity from the at least one user accessible load when leakage current, ground fault or fire hazard is detected. The electrical cord with metallic fire shields, the fire protection circuit, and the indicator circuit can be combined with any ground fault circuit interrupter, arc fault circuit interrupter, immerse detection circuit interrupter, appliance leakage current interrupter and electronic leakage current interrupter.

Abstract: An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit and a trip mechanism. In one embodiment, the apparatus includes a ground fault simulation circuit for generating a simulated ground fault during every negative half-wave of an AC power, a signature signal generating circuit for generating a signature signal reflecting the characteristic of the leakage current detection circuit and the trip mechanism, when the simulated ground fault is generated, and a life testing detection control circuit having a microcontroller and an alarm circuit. In operation, the life testing detection control circuit receives the signature signal from the signature signal generating circuit, analyzes the received signature signal to determine whether at least one fault exists in the leakage current detection circuit and the trip mechanism, and activates the alarm circuit if the at least one fault exists.

Abstract: An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit and a trip mechanism having a switch device. In one embodiment, the apparatus a ground fault simulation unit, a fault detector of the leakage current detection circuit and the trip mechanism, and a life testing detection control unit having an MCU for controlling operation of the fault detector. In operation, a first signal (pulse signal) is sent to the gate of the switching device to generate a first voltage at the cathode of the switching device, a second signal is sent to the ground fault simulation unit to generate a simulated ground fault for the leakage current detection circuit to generate a second voltage at the gate of the switching device, and the first and second voltages are measured to determine whether a fault exists in the leakage current detection circuit and the trip mechanism.

Abstract: A frame structure for backlight modules is provided herein. A backlight module according to the present invention mainly contains a frame structure, a reflection plate, a light guide plate, optical films, and a light source unit. The frame structure contains a plate member and a frame member. There are a number of hook elements and clasp elements configured at corresponding locations along the edges of the plate member and the frame member respectively. Also along the edges of the plate member and frame member, there are a number of grooves and stopping blades configured at corresponding locations on the plate member and frame member respectively. When the frame member is joined to the plate member, their corresponding clasp elements and hook elements would interact to fixedly join together, and the stopping blades would stick into the corresponding grooves to prevent the frame member from deformation and escape under heavy pressure or strong impact.

Abstract: A screwdriver comprises a torque setting mechanism including a torque adjustment ring, an actuation rod threadedly secured to the upper torque adjustment ring and a lower torque adjustment nut, a spring biased sleeve with the actuation rod passed, and a clutch ring snugly put on two opposing intermediate flats of the actuation rod and having an upper surface engaged the torque adjustment ring and a lower surface formed with recesses engaged with steel balls on an upper surface of a support ring in the sleeve. Turning a rotatable handle will turn the sleeve. The clutch ring will disengage with the steel balls if the torque exceeds a set value. Thus, the torque exerted on the handle will not transmit to a shank secured to the actuation rod so as to prevent a screw from being over-driven by the shank.

Abstract: Described herein is the use of a diffusion barrier layer between metallic layers in MEMS devices. The diffusion barrier layer prevents mixing of the two metals, which can alter desired physical characteristics and complicate processing. In one example, the diffusion barrier layer may be used as part of a movable reflective structure in interferometric modulators.

Abstract: The single-poly EEPROM includes a first PMOS transistor serially connected to a second PMOS transistor. The first and second PMOS transistors are both formed on an N-well of a P type substrate. The first PMOS transistor includes a floating gate, a first P+ doped drain region and a first P+ doped source region. The second PMOS transistor includes a gate and a second P+ doped source region. The first P+ doped drain region of the first PMOS transistor serves as a drain of the second PMOS transistor. A diode is located in the P type substrate including a P-well and a N+ doped region. The floating gate overlaps with the N-well and extends to the N+ doped region. The overlapped region of the P-well and the N+ doped region junction beneath the floating gate serves as an avalanche injection point in the vicinity of the first PMOS transistor.

Abstract: A method is provided. The method includes displaying a first image pixel on a first display pixel of a plurality of display pixels of a monitor, and displaying a second image pixel following the first image pixel on a portion of sub-pixels of the first display pixel and a portion of sub-pixels of a second display pixel so as to avoid loss of image data when displaying the image pixels on a monitor of a small resolution.

Abstract: A light-conductive board and a rear light module using the light-conductive board is disclosed. The light-conductive plate having a light-emitting face, a light-reflecting face, and at least a light-entering face and the light-reflecting plate adhered onto the external of the light-reflecting face of the light-conductive board, an optical film including a divergent lens and a convergent lens mounted onto the external of light-emitting face of the light-conductive board, a lamp reflector which encloses a lamp source, and the light-entering face of the light-conductive board corresponding to the circumferential edge of the light-entering recessed region of the lamp source adjacent to the light-emitting face or one of the face of the reflection face at least forms into a protruded section.

Abstract: The present invention is to provide a wireless routing mechanism by applying a management frame defined in IEEE 802.11 standard to different access points (AP) in a wireless distribution system (WDS) and adding an information element (IE) to the management frame, enabling any AP to be capable of maintaining the integrity of IE based on its own setting and state, determining other APs' operations in WDS based on a received IE and determining whether a physical link (i.e., wireless link) between itself and any of other APs should be established to provide a channel for sending data frames therebetween and automatically establishing a stable, flexible and expansible wireless network topology in a wire network infrastructure based on information contained in a plurality of fields of the IE.

Abstract: The present invention applies management frame defined in IEEE 802.11 standard to a wireless distribution system (WDS) mode by adding an information element (IE) into the management frame, which enables any access point (AP) in WDS to maintain IE based on its own setting and state, then send IE via the management frame for providing state of the AP under WDS mode, determine whether a physical link (i.e., a wireless link between APs) should be established therewith based on received IE, and maintain the established physical link through the wireless management frame in a real time manner. Thus, the existence and necessity of the physical link between different APs in WDS can be determined correctly.

Abstract: A method for driving a dual-scan mode display is disclosed. The dual-scan mode display includes a first driver IC and a second driver IC, and the method includes: utilizing the first driver IC to output a first signal according to a gray value to drive a first pixel to generate a first luminance value; utilizing the second driver IC to output a second signal according to the gray value to drive a second pixel to generate a second luminance value; and adjusting the first signal according to the first luminance value and the second luminance value to drive the first pixel to generate a third luminance value; wherein a difference between the third luminance value and the second luminance value is less than a threshold value.

Abstract: A backlight module is suitable for use in a liquid crystal display. The backlight module includes a back plate, and a lamp, over the back plate by a distance. The back plate has a hole under the lamp. The hole can be a hole under the lamp corresponding to an electrode of a high voltage end of the lamp. The hole or a certain number of the holes can be replaced by an indentation, which can also effectively increase the separation distance between the lamp and the back plate. Actually, the hole and the indentation can be used together to form a desired pattern corresponding to the lamp. The lamp can be a plurality of lamp.

Abstract: The single-poly EEPROM includes a first PMOS transistor serially connected to a second PMOS transistor. The first and second PMOS transistors are both formed on an N-well of a P type substrate. The first PMOS transistor includes a floating gate, a first P+ doped drain region and a first P+ doped source region. The second PMOS transistor includes a gate and a second P+ doped source region. The first P+ doped drain region of the first PMOS transistor serves as a drain of the second PMOS transistor. A diode is located in the P type substrate including a P-well and a N+ doped region. The floating gate overlaps with the N-well and extends to the N+ doped region. The overlapped region of the P-well and the N+ doped region junction beneath the floating gate serves as an avalanche injection point in the vicinity of the first PMOS transistor.

Abstract: Provided are a biochip platform for biochemically analyzing a sample such as DNA or protein, including a dielectric particle layer, and an optical assay apparatus including the same. The biochip platform includes the dielectric particle layer uniformly formed on a substrate. The particle uniformity of the dielectric particle layer enables good wavelength separation of fluorescence signal, and the large surface area of the dielectric particle layer guarantees better amplification efficiency of fluorescence signal. Furthermore, the biochip platform shows good economical efficiency due to easy fabrication process, and is particularly useful in an optical assay apparatus for analyzing a biochemical sample due to good assay efficiency.