Abstract: A digital thermometer includes a first oscillator to generate a first clock signal, wherein a period of the first clock signal remains constant in view of changes in a temperature of the apparatus and a first counter coupled to the first oscillator, the first counter to count a fixed number of cycles of the first clock signal associated with a measurement period. The digital thermometer further includes a second oscillator to generate a second clock signal, wherein a period of the second clock signal varies with changes in the temperature and a second counter coupled to the second oscillator, the second counter to generate an output representing a count of a number of cycles of the second clock signal that occur during the measurement period. In addition, the digital thermometer includes calibration circuitry coupled to the second counter, the calibration circuitry to calibrate the output of the second counter to generate a value representing the temperature of the apparatus.

Abstract: Methods, systems, and devices for suspending operations of a memory system are described. A memory system may be configured to perform a write operation to store data in a nonvolatile memory device, where the write operation includes storing information in one or more latches associated with the nonvolatile memory device; receive a suspend command to suspend performance of the write operation based on a request to perform a read operation associated with a higher-priority than the write operation; suspend the performance of the write operation based on receiving the suspend command; transmit the information stored in the one or more latches associated with the nonvolatile memory device to a host system based on suspending the performance of the write operation; and perform the read operation based at least in part on transmitting the information to the host system.

Abstract: Methods, systems, and devices for suspend operations are described. A memory device may perform a write operation including one or more programming phases and one or more verify phases. The memory device may receive a read command while performing the write operation and determine whether the verify phase of the write operation is complete. The memory device may suspend a performance of the write operation in response to determining that the verify phase of the write operation is complete. The memory device may transmit first information for the write operation from a first latch to a volatile memory device in response to suspending the performance of the write operation. The memory device may perform a read operation associated with the read command in response to suspending the performance of the write operation and transferring the first information.

Abstract: Apparatus and methods are disclosed, including receiving an indication to selectively erase first data stored on a first page of a first subset of a group of multi-level memory cells of the storage system, each multi-level memory cell comprising multiple pages and providing, in response the indication to selectively erase the first data, at least one soft erase pulse to the first page of memory cells associated with the first data to induce distribution overlap across different bit levels of the first page of the group of multi-level memory cell.

Abstract: A variety of applications can include a memory device designed to perform sensing of a memory cell of a string of memory cells using a modified shielded bit line sensing operation. The modified shielded bit line sensing operation includes pre-charging a data line corresponding to the string with the string enabled to couple to the data line. The modified shielded bit line sensing operation can be implemented in a hybrid initialization routine for the memory device. The hybrid initialization routine can include a sensing read routine corresponding to an all data line configuration of data lines of the memory device and a modified sensing read routine corresponding to a shielded data line configuration of the data lines with selected strings enabled during pre-charging. A read retry routine associated with the modified sensing read routine can be added to the hybrid initialization routine. Additional devices, systems, and methods are discussed.

Abstract: Methods, systems, and devices for programming multi-level memory cells are described. After a first pass, an offset in the form of one or more offset pulses, may be applied to MLCs that are in a state of a higher level. The offset may be applied before or during a first part of a second pass. The offset may move the signals of the cells before the cells are finally programmed so as to avoid potential overlaps between the unprogrammed cells and cells that are programmed to the lower half of the final levels during the second pass. The offset cells may then be further moved to the other levels in the higher half of the final levels.

Abstract: Memory systems with flexible erase suspend-resume operations are described herein. In one embodiment, a memory device is configured to receive an erase suspend command while a first erase pulse of an erase operation is at a flattop voltage. In response, the memory device suspends the erase operation. The memory device further resumes the erase operation such that a second erase pulse of the erase operation is ramped to the flattop voltage. Absent intervening erase suspend operations, erase operations of the memory device can include a single erase pulse that remains at the flattop voltage for a total duration. A first total duration plus a second total duration the first and second erase pulses, respectively, remain at the flattop voltage remains less than or equal to the total duration the single erase pulse remains at the flattop voltage.

Abstract: A programmable memory device includes a ROM block to store instructions associated with functionality of the programmable memory device, a memory array having reserved pages to store updates to be performed on the ROM block, and a controller coupled to the ROM block and the memory array. The controller is to, in response to receipt of a remote command from a vendor server via a host system, execute the instructions to perform operations including: executing a set features command to access the set of reserved pages, as an extension to one time programmable mode; programming a set of sub-feature parameters to a specified feature address of the reserved pages, where the set of sub-feature parameters are to trigger operation within a ROM-emulated memory (REM) profile mode; and programming a REM-profiled page of the reserved pages with REM data received from the vendor server via the host system.

Abstract: Various embodiments of the present disclosure relate to monitoring the integrity of power signals within memory systems. A method can include receiving a power signal at a memory component, and monitoring, via a power signal monitoring component of the memory component, an integrity characteristic of the power signal. Responsive to the integrity characteristic meeting a particular criteria, the method can include providing a status indication to a control component external to the memory component.

Abstract: A portion of a memory management operation associated with a first current level that satisfies a condition pertaining to a threshold current level and a second current level that satisfies the condition pertaining to the threshold current level is identified. Mask data associated with the portion of the memory management operation is identified. Based on the mask data, a current management action is performed during execution of a requested memory management operation received from a host system.

Abstract: Various embodiments provide for adjusting (or adapting) a program voltage step used to program a memory cell by a program algorithm after the program algorithm resumes from a suspension, where the program voltage step is adjusted (or adapted) based on one or more factors.

Abstract: Devices and techniques for performing copy-back operations in a memory device are disclosed herein. A trigger to perform a copy-back operation in relation to a section of data stored on the memory device can be detected. Circuitry of the memory device can then read the section of data at two voltage levels within a read window to obtain a first set of bits and a second set of bits respectively. The first and second sets of bits—which should be the same under normal circumstances—are compared to determine whether a difference between the sets of bits is beyond a threshold. If the difference is beyond a threshold, error correction is invoked prior to completion of the copy-back operation.

Abstract: Various embodiments provide for adjusting (or adapting) a program voltage step used to program a memory cell by a program algorithm after the program algorithm resumes from a suspension, where the program voltage step is adjusted (or adapted) based on one or more factors.

Abstract: Described are systems and methods for providing power loss immunity in memory programming operations. An example memory device comprises: a memory array comprising a plurality of memory cells electrically coupled to a plurality of wordlines and a plurality of bitlines; and a controller coupled to the memory array, the controller to perform operations comprising: causing a programming pulse to be applied to to one or more wordlines of the memory array; responsive to determining that a threshold voltage of one or more memory cells of the memory array has reached a pre-program verify level, causing a first bias voltage level to be applied to a first subset of bitlines of the memory array and causing a second bias voltage level to be applied to a second subset of bitlines of the memory array.

Abstract: A variety of applications can include memory systems that have one or more memory devices capable of performing memory operations on multiple blocks of memory in response to a command from a host. For example, improvement in erase performance can be attained by erasing multiple blocks of memory by one of a number of approaches. Such approaches can include parallel erasure followed by serial verification in response to a single command. Other approaches can include sequential erase and verify operations of the multiple blocks in response to a single command. Additional apparatus, systems, and methods are disclosed.

Abstract: The disclosure describes a programmable power management system for NAND Flash devices. In one embodiment, dedicated match logic is provided to store program counters responsible for peak power consumption of one or more NAND Flash dies. Upon detecting that a current program counter equals a stored program counter, a high current enable signal is toggled causing at least one NAND Flash die to suspend operations, thereby reducing peak power consumption of the NAND Flash device.

Abstract: A variety of applications can include apparatus or methods that provide a well ring for resistive ground power domain segregation. The well ring can be implemented as a n-well in a p-type substrate. Resistive separation between ground domains can be generated by biasing a n-well ring to an external supply voltage. This approach can provide a procedure, from a process standpoint, that provides relatively high flexibility to design for chip floor planning and simulation, while providing sufficient noise rejection between independent ground power domains when correctly sized. Significant noise rejection between ground power domains can be attained.

Abstract: Described are systems and methods for providing power loss immunity in memory programming operations. An example memory device comprises: a memory array comprising a plurality of memory cells electrically coupled to a plurality of wordlines and a plurality of bitlines; and a controller coupled to the memory array, the controller to perform operations comprising: causing a programming pulse to be applied to to one or more wordlines of the memory array; responsive to determining that a threshold voltage of one or more memory cells of the memory array has reached a pre-program verify level, causing a first bias voltage level to be applied to a first subset of bitlines of the memory array and causing a second bias voltage level to be applied to a second subset of bitlines of the memory array.

Abstract: A variety of applications can include a memory device designed to perform sensing of a memory cell of a string of memory cells using a modified shielded bit line sensing operation. The modified shielded bit line sensing operation includes pre-charging a data line corresponding to the string with the string enabled to couple to the data line. The modified shielded bit line sensing operation can be implemented in a hybrid initialization routine for the memory device. The hybrid initialization routine can include a sensing read routine corresponding to an all data line configuration of data lines of the memory device and a modified sensing read routine corresponding to a shielded data line configuration of the data lines with selected strings enabled during pre-charging. A read retry routine associated with the modified sensing read routine can be added to the hybrid initialization routine. Additional devices, systems, and methods are discussed.

Abstract: Methods, systems, and devices for programming multi-level memory cells are described. After a first pass, an offset in the form of one or more offset pulses, may be applied to MLCs that are in a state of a higher level. The offset may be applied before or during a first part of a second pass. The offset may move the signals of the cells before the cells are finally programmed so as to avoid potential overlaps between the unprogrammed cells and cells that are programmed to the lower half of the final levels during the second pass. The offset cells may then be further moved to the other levels in the higher half of the final levels.