Abstract: Embodiments are provided for providing power staple avoidance during routing in a computing system by a processor. One or more transistor gates may be shifted in each row of an integrated circuit to avoid alignment of cell pins and power staples for executing a routing operation, where the circuit row is partitioned into segments based on one or more fixed objects.

Abstract: A method for enhancing routability in a cell-based design includes: obtaining a layout corresponding to a placement of cells in the cell-based design; identifying one or more areas of the layout where routability is predicted to be constrained; selectively adding white spaces to the identified one or more areas of the layout where routability is predicted to be constrained to thereby generate a modified layout; legalizing placement of the modified layout; and running a detailed routing on the modified layout.

Abstract: A global router determines edge capacity of global tiles for a first integrated circuit in a global routing operation. The global router determines a respective edge capacity of first width wire tracks for each of a plurality of global tiles in a first metal layer in the first integrated circuit in a first global routing operation. The global router determines a respective edge capacity of second width wire tracks for each of the plurality of global tiles in the first metal layer in the first integrated circuit in a second global routing operation. The edge capacities for first width and second width wire tracks are determined in separate operations by the global router as part of the operations performed for fabrication of the first integrated circuit.

Abstract: A method of generating a routing result to manufacture an integrated circuit using self-aligned double patterning includes generating an initial routing result that indicates a location and length of connections between components, and generating an initial constraint graph with trim shapes indicating gaps in the connections being represented as nodes and with arcs indicating relative position constraints between a pair of the nodes. The method also includes subdividing the initial constraint graph into two or more subgraphs, determining a final position of each of the nodes in the two or more subgraphs, and generating a routed design with the trim shapes having the final position of corresponding ones of the nodes relative to the connections and with extents filling in spaces between one or more of the trim shapes and associated connections. The routed design is provided for manufacture of the integrated circuit.

Abstract: A method of generating a routing result to manufacture an integrated circuit using self-aligned double patterning includes generating an initial routing result that indicates a location and length of connections between components, and generating an initial constraint graph with trim shapes indicating gaps in the connections being represented as nodes and with arcs indicating relative position constraints between a pair of the nodes. The method also includes subdividing the initial constraint graph into two or more subgraphs, determining a final position of each of the nodes in the two or more subgraphs, and generating a routed design with the trim shapes having the final position of corresponding ones of the nodes relative to the connections and with extents filling in spaces between one or more of the trim shapes and associated connections. The routed design is provided for manufacture of the integrated circuit.

Abstract: A router is used to produce a first integrated circuit structure according to an engineering change order. An initial detail routing topology is imported for the first integrated circuit structure. An engineering change order is received instructing the router to change a portion of the initial detail routing topology for the first integrated circuit structure. A global routing operation is performed which routes global wires for the portion of the initial detail routing topology for the first integrated circuit structure. For each global wire which is routed, a specific global wiring track is selected for the global wire within each edge of a set of global tiles in a routing topology for the first integrated circuit.

Abstract: A global router determines edge capacity of global tiles for a first integrated circuit in a global routing operation. The global router determines a respective edge capacity of first width wire tracks for each of a plurality of global tiles in a first metal layer in the first integrated circuit in a first global routing operation. The global router determines a respective edge capacity of second width wire tracks for each of the plurality of global tiles in the first metal layer in the first integrated circuit in a second global routing operation. The edge capacities for first width and second width wire tracks are determined in separate operations by the global router as part of the operations performed for fabrication of the first integrated circuit.

Abstract: Optimizing timing in a VLSI circuit by generating a set of buffer solutions and determining a most critical delay and a sum of critical delays for each solution in the set of solutions. Quantifying a relationship between the most critical delay and the sum of critical delays for each solution. Comparing each solution's quantified relationship to the quantified relationship of each other solution in the set of solutions. Identifying, based on the comparing of each solution's relationship to the relationship of each other solution in the set of solutions, at least one solution in the set of solutions to have a worse relationship between the most critical delay and the sum of critical delays than the other solutions in the set of solutions. Pruning the at least one solution from the set of solutions.

Abstract: Optimizing timing in a VLSI circuit by generating a set of buffer solutions and determining a most critical delay and a sum of critical delays for each solution in the set of solutions. Quantifying a relationship between the most critical delay and the sum of critical delays for each solution. Comparing each solution's quantified relationship to the quantified relationship of each other solution in the set of solutions. Identifying, based on the comparing of each solution's relationship to the relationship of each other solution in the set of solutions, at least one solution in the set of solutions to have a worse relationship between the most critical delay and the sum of critical delays than the other solutions in the set of solutions. Pruning the at least one solution from the set of solutions.

Abstract: Optimizing timing in a VLSI circuit by generating a set of buffer solutions and determining a most critical delay and a sum of critical delays for each solution in the set of solutions. Quantifying a relationship between the most critical delay and the sum of critical delays for each solution. Comparing each solution's quantified relationship to the quantified relationship of each other solution in the set of solutions. Identifying, based on the comparing of each solution's relationship to the relationship of each other solution in the set of solutions, at least one solution in the set of solutions to have a worse relationship between the most critical delay and the sum of critical delays than the other solutions in the set of solutions. Pruning the at least one solution from the set of solutions.

Abstract: Optimizing timing in a VLSI circuit by generating a set of buffer solutions and determining a most critical delay and a sum of critical delays for each solution in the set of solutions. Quantifying a relationship between the most critical delay and the sum of critical delays for each solution. Comparing each solution's quantified relationship to the quantified relationship of each other solution in the set of solutions. Identifying, based on the comparing of each solution's relationship to the relationship of each other solution in the set of solutions, at least one solution in the set of solutions to have a worse relationship between the most critical delay and the sum of critical delays than the other solutions in the set of solutions. Pruning the at least one solution from the set of solutions.

Abstract: Optimizing timing in a VLSI circuit by generating a set of buffer solutions and determining a most critical delay and a sum of critical delays for each solution in the set of solutions. Quantifying a relationship between the most critical delay and the sum of critical delays for each solution. Comparing each solution's quantified relationship to the quantified relationship of each other solution in the set of solutions. Identifying, based on the comparing of each solution's relationship to the relationship of each other solution in the set of solutions, at least one solution in the set of solutions to have a worse relationship between the most critical delay and the sum of critical delays than the other solutions in the set of solutions. Pruning the at least one solution from the set of solutions.

Abstract: Optimizing timing in a VLSI circuit by generating a set of buffer solutions and determining a most critical delay and a sum of critical delays for each solution in the set of solutions. Quantifying a relationship between the most critical delay and the sum of critical delays for each solution. Comparing each solution's quantified relationship to the quantified relationship of each other solution in the set of solutions. Identifying, based on the comparing of each solution's relationship to the relationship of each other solution in the set of solutions, at least one solution in the set of solutions to have a worse relationship between the most critical delay and the sum of critical delays than the other solutions in the set of solutions. Pruning the at least one solution from the set of solutions.

Abstract: Optimizing timing in a VLSI circuit by generating a set of buffer solutions and determining a most critical delay and a sum of critical delays for each solution in the set of solutions. Quantifying a relationship between the most critical delay and the sum of critical delays for each solution. Comparing each solution's quantified relationship to the quantified relationship of each other solution in the set of solutions. Identifying, based on the comparing of each solution's relationship to the relationship of each other solution in the set of solutions, at least one solution in the set of solutions to have a worse relationship between the most critical delay and the sum of critical delays than the other solutions in the set of solutions. Pruning the at least one solution from the set of solutions.

Abstract: A global router determines edge capacity of global tiles for a first integrated circuit in a global routing operation. The global router determines a respective edge capacity of minimum width wire tracks for each of a plurality of global tiles in a first metal layer in the first integrated circuit. Next, the global router determines a respective edge capacity of non-minimum width wire tracks for each of the plurality of global tiles in the first metal layer in the first integrated circuit. The edge capacities for minimum width and non-minimum width wire tracks are determined in separate operations within the global routing operation for fabrication of an integrated circuit.

Abstract: A global router determines edge capacity of global tiles for a first integrated circuit. The global router determines a respective edge capacity of minimum width wire tracks for each of a plurality of global tiles in a first metal layer in the first integrated circuit. Next, the global router determines a respective edge capacity of non-minimum width wire tracks for each of the plurality of global tiles in the first metal layer in the first integrated circuit. The edge capacities for minimum width and non-minimum width wire tracks are determined in separate operations.

Abstract: Optimizing timing in a VLSI circuit by generating a set of buffer solutions and determining a most critical delay and a sum of critical delays for each solution in the set of solutions. Quantifying a relationship between the most critical delay and the sum of critical delays for each solution. Comparing each solution's quantified relationship to the quantified relationship of each other solution in the set of solutions. Identifying, based on the comparing of each solution's relationship to the relationship of each other solution in the set of solutions, at least one solution in the set of solutions to have a worse relationship between the most critical delay and the sum of critical delays than the other solutions in the set of solutions. Pruning the at least one solution from the set of solutions.

Abstract: Optimizing timing in a VLSI circuit by generating a set of buffer solutions and determining a most critical delay and a sum of critical delays for each solution in the set of solutions. Quantifying a relationship between the most critical delay and the sum of critical delays for each solution. Comparing each solution's quantified relationship to the quantified relationship of each other solution in the set of solutions. Identifying, based on the comparing of each solution's relationship to the relationship of each other solution in the set of solutions, at least one solution in the set of solutions to have a worse relationship between the most critical delay and the sum of critical delays than the other solutions in the set of solutions. Pruning the at least one solution from the set of solutions.

Abstract: Optimizing timing in a VLSI circuit by generating a set of buffer solutions and determining a most critical delay and a sum of critical delays for each solution in the set of solutions. Quantifying a relationship between the most critical delay and the sum of critical delays for each solution. Comparing each solution's quantified relationship to the quantified relationship of each other solution in the set of solutions. Identifying, based on the comparing of each solution's relationship to the relationship of each other solution in the set of solutions, at least one solution in the set of solutions to have a worse relationship between the most critical delay and the sum of critical delays than the other solutions in the set of solutions. Pruning the at least one solution from the set of solutions.

Abstract: A router is used to produce a first integrated circuit structure according to an engineering change order. An initial detail routing topology is imported for the first integrated circuit structure. An engineering change order is received instructing the router to change a portion of the initial detail routing topology for the first integrated circuit structure. A global routing operation is performed which routes global wires for the portion of the initial detail routing topology for the first integrated circuit structure. For each global wire which is routed, a specific global wiring track is selected for the global wire within each edge of a set of global tiles in a routing topology for the first integrated circuit.