Patents by Inventor Haim Feldman

Haim Feldman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7518718
    Abstract: Inspection system and method for high-throughput inspection, the system and method is capable to generate and sense transmitted and/or reflected short duration beams. According to one embodiment of the invention the transmitted and reflected short duration beams are generated and sensed simultaneously thus provide a reflected image and a transmitted image simultaneously. The reflected and transmitted short duration radiation beams are manipulated either in the frequency domain or are distinctly polarized such that they are directed to the appropriate area sensors. According to another aspect of the invention the system changes the manipulation of a short duration beam of radiation to selectively direct the short duration beam to distinct area sensors.
    Type: Grant
    Filed: June 19, 2006
    Date of Patent: April 14, 2009
    Assignee: Applied Materials, Israel, Ltd.
    Inventors: Emanuel Elyasaf, Haim Feldman, Simon Yalov, Eitan Lahat
  • Publication number: 20080231845
    Abstract: A method for inspecting a region, including irradiating the region via an optical system with a pump beam at a pump wavelength. A probe beam at a probe wavelength irradiates the region so as to generate returning probe beam radiation from the region. The beams are scanned across the region at a scan rate. A detector receives the returning probe radiation, and forms an image of the region that corresponds to a resolution better than pump and probe Abbe limits of the optical system. Roles of the pump and probe beams may be alternated, and a modulation frequency of the pump beam may be changed, to produce more information.
    Type: Application
    Filed: December 6, 2007
    Publication date: September 25, 2008
    Inventors: Dan Grossman, Moshe Langer, Roman Kris, Silviu Reinhorn, Ron Naftali, Haim Feldman
  • Publication number: 20080152234
    Abstract: A method for generating a simulated aerial image of a mask projected by an optical system includes determining a coherence characteristic of the optical system. A coherent decomposition of the optical system is computed based on the coherence characteristic. The decomposition includes a series of expansion functions having angular and radial components that are expressed as explicit functions. The expansion functions are convolved with a transmission function of the mask in order to generate the simulated aerial image.
    Type: Application
    Filed: December 31, 2007
    Publication date: June 26, 2008
    Inventor: Haim Feldman
  • Publication number: 20080152212
    Abstract: A method for generating a simulated aerial image of a mask projected by an optical system includes determining a coherence characteristic of the optical system. A coherent decomposition of the optical system is computed based on the coherence characteristic. The decomposition includes a series of expansion functions having angular and radial components that are expressed as explicit functions. The expansion functions are convolved with a transmission function of the mask in order to generate the simulated aerial image.
    Type: Application
    Filed: December 28, 2007
    Publication date: June 26, 2008
    Inventor: Haim Feldman
  • Patent number: 7379161
    Abstract: A printer and method for recording a predefined multiple intensity level image on a substrate, the method includes the steps of: converting the predetermined image to multiple intensity level associated images; converting a light beam to multiple light beam arrays; modulating each light beam array to provide modulated light beam arrays, in response to a corresponding intensity level associated image to be recorded on the substrate; directing each modulated light beam array to impinge on the substrate; and repeating the steps of converting, modulating and directing while moving the substrate until the predefined image is imaged on the substrate.
    Type: Grant
    Filed: February 24, 2006
    Date of Patent: May 27, 2008
    Assignee: Applied Materials, Israel, Ltd.
    Inventors: Gilad Almogy, Haim Feldman, Meir Aloni
  • Publication number: 20080116362
    Abstract: A method for imaging a surface includes generating a traveling lens in an acousto-optic material and incorporating a traveling mask into a portion of the traveling lens so as to produce a composite traveling lens. The method further includes irradiating the composite traveling lens so as to produce a composite focused beam having a spatial variation across the composite focused beam. The composite focused beam is directed onto a region of the surface so as to generate radiation characteristic of the region from the region. The radiation is imaged onto a detector so as to generate a signal characteristic of the region, responsively to the spatial variation.
    Type: Application
    Filed: September 11, 2007
    Publication date: May 22, 2008
    Inventors: Haim Feldman, Doron Meshulach, Eyal Angel
  • Patent number: 7342218
    Abstract: A method for imaging and an imaging system, the system includes the steps of: (i) scanning a beam of coherent radiation over a surface along a scan axis; (ii) focusing the beam to a spot on the surface, so that the spot has a predetermined dimension along the scan axis; (iii) spreading the beam laterally while scanning the beam, so that the beam covers an area substantially wider than the predetermined dimension in a direction transverse to the scan axis; and (iii) capturing the radiation scattered from the surface while scanning the beam, so as to form an image of the surface.
    Type: Grant
    Filed: December 19, 2002
    Date of Patent: March 11, 2008
    Assignee: Applied Materials, Israel, Ltd.
    Inventors: Gilad Almogy, Haim Feldman
  • Patent number: 7339661
    Abstract: Apparatus for inspection of a sample includes a radiation source, which is adapted to direct optical radiation onto an area of a surface of the sample, and a plurality of image sensors. Each of the image sensors is configured to receive the radiation scattered from the area into a different, respective angular range, so as to form respective images of the area. An image processor is adapted to process at least one of the respective images so as to detect a defect on the surface.
    Type: Grant
    Filed: September 8, 2003
    Date of Patent: March 4, 2008
    Inventors: Doron Korngut, Erez Admoni, Ofer Kadar, Lev Haikoviz, Haim Feldman, Avishay Guetta
  • Patent number: 7331033
    Abstract: A method for generating a simulated aerial image of a mask projected by an optical system includes determining a coherence characteristic of the optical system. A coherent decomposition of the optical system is computed based on the coherence characteristic. The decomposition includes a series of expansion functions having angular and radial components that are expressed as explicit functions. The expansion functions are convolved with a transmission function of the mask in order to generate the simulated aerial image.
    Type: Grant
    Filed: August 27, 2004
    Date of Patent: February 12, 2008
    Assignee: Applied Materials, Israel, Ltd.
    Inventor: Haim Feldman
  • Patent number: 7286239
    Abstract: A method for optical evaluation of a sample includes scanning a beam of coherent radiation over the sample, whereby the radiation is scattered from the sample, while directing a portion of the scanning beam toward a diffraction grating so that the portion of the beam is scanned over the grating, whereby a frequency-shifted reference beam is diffracted from the grating. The scattered radiation and the frequency-shifted reference beam are combined at a detector to generate an optical heterodyne signal.
    Type: Grant
    Filed: December 1, 2004
    Date of Patent: October 23, 2007
    Assignee: Applied Materials, Israel, Ltd.
    Inventor: Haim Feldman
  • Publication number: 20070109546
    Abstract: Apparatus for imaging a surface, including scanning optics, which are configured to scan and focus one or more traveling beams onto the surface so as to form one or more traveling spots thereon. The apparatus also includes collection optics, which are arranged to collect radiation scattered from the one or more traveling spots and to focus the radiation to form one or more image spots traveling along a line. The apparatus also has a detecting assembly, which consists of a detector which is configured to generate a signal in response to the one or more traveling image spots, and a detector entry port interposed between the collection optics and the detector, which is coincident with the line. The apparatus also includes phase and/or polarization altering elements for the traveling beams.
    Type: Application
    Filed: November 14, 2006
    Publication date: May 17, 2007
    Inventors: Doron Meshulach, Haim Feldman
  • Patent number: 7187439
    Abstract: Inspection system and method for high-throughput inspection, the system and method is capable to generate and sense transmitted and/or reflected short duration beams. According to one embodiment of the invention the transmitted and reflected short duration beams are generated and sensed simultaneously thus provide a reflected image and a transmitted image simultaneously. The reflected and transmitted short duration radiation beams are manipulated either in the frequency domain or are distinctly polarized such that they are directed to the appropriate area sensors. According to another aspect of the invention the system changes the manipulation of a short duration beam of radiation to selectively direct the short duration beam to distinct area sensors.
    Type: Grant
    Filed: May 11, 2005
    Date of Patent: March 6, 2007
    Assignee: Applied Materials, Israel, Ltd.
    Inventors: Emanuel Elyasaf, Haim Feldman, Simon Yalov, Eitan Lahat
  • Publication number: 20070008519
    Abstract: Apparatus for generating optical radiation includes a laser, which is configured to operate in multiple transverse modes simultaneously so as to generate an input beam, which is characterized by a first speckle contrast. The transverse modes of the input beam are optically mixed so as to generate an output beam have a second speckle contrast, which is substantially less than the first speckle contrast.
    Type: Application
    Filed: January 23, 2006
    Publication date: January 11, 2007
    Inventors: Ron Naftali, Avishay Guetta, Haim Feldman, Doron Shoham
  • Publication number: 20060221331
    Abstract: Inspection system and method for high-throughput inspection, the system and method is capable to generate and sense transmitted and/or reflected short duration beams. According to one embodiment of the invention the transmitted and reflected short duration beams are generated and sensed simultaneously thus provide a reflected image and a transmitted image simultaneously. The reflected and transmitted short duration radiation beams are manipulated either in the frequency domain or are distinctly polarized such that they are directed to the appropriate area sensors. According to another aspect of the invention the system changes the manipulation of a short duration beam of radiation to selectively direct the short duration beam to distinct area sensors.
    Type: Application
    Filed: June 19, 2006
    Publication date: October 5, 2006
    Inventors: Emanuel Elyasaf, Haim Feldman, Simon Yalov, Eitan Lahat
  • Publication number: 20060197931
    Abstract: A printer and method for recording a predefined multiple intensity level image on a substrate, the method includes the steps of: converting the predetermined image to multiple intensity level associated images; converting a light beam to multiple light beam arrays; modulating each light beam array to provide modulated light beam arrays, in response to a corresponding intensity level associated image to be recorded on the substrate; directing each modulated light beam array to impinge on the substrate; and repeating the steps of converting, modulating and directing while moving the substrate until the predefined image is imaged on the substrate.
    Type: Application
    Filed: February 24, 2006
    Publication date: September 7, 2006
    Inventors: Gilad Almogy, Haim Feldman, Meir Aloni
  • Patent number: 7053395
    Abstract: A system for inspecting a specimen, such as a semiconductor wafer that uses a laser light source for providing a beam of light. The beam is applied to a traveling lens acousto-optic device having an active region and responsive to an RF input signal to selectively generate plural traveling lenses in the active region. The traveling lens acousto-optic device is operative to receive the light beam and generate plural flying spot beams, at the respective focus of each of the generated traveling lenses. A light detector unit, having a plurality of detector sections, each detector section having a plurality of light detectors and at least one multi-stage storage device operative to receive in parallel an input from the plurality of light detectors, is used to generate useable scan data. Information stored in each of the storage devices is serially read out concurrently from the multiple stages.
    Type: Grant
    Filed: July 11, 2003
    Date of Patent: May 30, 2006
    Assignee: Applied Materials, Inc.
    Inventors: Haim Feldman, Emanuel Elyasaf, Nissim Elmaliach, Ron Naftali, Boris Golberg, Silviu Reinhorn
  • Patent number: 7053985
    Abstract: A printer and method for recording a predefined multiple intensity level image on a substrate, the method includes the steps of: converting the predetermined image to multiple intensity level associated images; converting a light beam to multiple light beam arrays; modulating each light beam array to provide modulated light beam arrays, in response to a corresponding intensity level associated image to be recorded on the substrate; directing each modulated light beam array to impinge on the substrate; and repeating the steps of converting, modulating and directing while moving the substrate until the predefined image is imaged on the substrate.
    Type: Grant
    Filed: July 7, 2003
    Date of Patent: May 30, 2006
    Assignee: Applied Materials, Isreal, Ltd.
    Inventors: Gilad Almogy, Haim Feldman, Meir Aloni
  • Patent number: 7030978
    Abstract: A system and method for inspection of a substrate having a first refractive index, the method including the steps of: (i) defining an apodization scheme in response to a characteristic of the layer; (ii) applying an apodizer to apodize a beam of radiation in response to the apodization scheme; (iii) directing the apodized beam of radiation to impinge on the substrate, whereby a plurality of rays are reflected from the substrate; whereas the apodized beam of radiation propagates through an at least partially transparent medium having a third refractive index and an at least partially transparent layer having a second refractive index and is subsequently reflected from the substrate; whereas the second refractive index differs from the first refractive index and from the third refractive index; and (iv) detecting at least some of the plurality of reflected rays.
    Type: Grant
    Filed: April 25, 2003
    Date of Patent: April 18, 2006
    Assignee: Applied Materials, Israel, LTD
    Inventors: Avishay Guetta, Haim Feldman, Ron Naftali, Doron Shoham
  • Publication number: 20060048090
    Abstract: A method for generating a simulated aerial image of a mask projected by an optical system includes determining a coherence characteristic of the optical system. A coherent decomposition of the optical system is computed based on the coherence characteristic. The decomposition includes a series of expansion functions having angular and radial components that are expressed as explicit functions. The expansion functions are convolved with a transmission function of the mask in order to generate the simulated aerial image.
    Type: Application
    Filed: August 27, 2004
    Publication date: March 2, 2006
    Inventor: Haim Feldman
  • Patent number: 7002695
    Abstract: Apparatus for optical assessment of a sample includes a radiation source, adapted to generate a beam of coherent radiation, and traveling lens optics, adapted to focus the beam so as to generate first and second spots on a surface of the sample and to scan the spots together over the surface. Collection optics are positioned to collect the radiation scattered from the first and second spots and to focus the collected radiation so as to generate a pattern of interference fringes. A detector detects a change in the pattern of the interference fringes as the spots are scanned over the surface.
    Type: Grant
    Filed: May 7, 2002
    Date of Patent: February 21, 2006
    Assignee: Applied Materials Inc.
    Inventor: Haim Feldman