Abstract: A data processing device is configured to deploy, in response to an intermittent source of power, opportunistic power management strategies to manage harvested energy based on an expected amount of energy available to the data processing device and on expected energy expenditures defined by data processing and memory content control writing performed by the data processing device.

Abstract: Systems, apparatuses and methods may provide for detecting a read-write condition in which a read operation from a location in magnetoresistive memory such as spin transfer torque (STT) memory is to be followed by a write operation to the location. Additionally, a current level associated with the read operation may be increased, wherein the read operation is conducted from the location at the increased current level. In one example, the increased current level causes a reset of all bits in the location.

Abstract: A first request to evict a first cache line that is stored in a cache memory may be received. The first cache line may be evicted based on a replacement policy. A second request to evict a second cache line from the cache memory may be received. Following the receipt of the second request, it is determined whether a condition associated with the replacement policy has been satisfied. If the condition associated with replacement policy has been satisfied, then the second cache line may be evicted based on a random replacement policy.

Abstract: Some embodiments include apparatuses and methods having an interface to receive information from memory cells, the memory cells configured to have a plurality of states to indicate values of information stored in the memory cells, and a control unit to monitor errors in information retrieved from the memory cells. Based on the errors in the information, the control unit generates control information to cause the memory cell to change to from a state among the plurality of states to an additional state. The additional state is different from the plurality of states.

Abstract: Apparatus, systems, and methods for write operations in spin transfer torque (STT) memory are described. In one embodiment, a memory comprises at least one spin-transfer torque (STT) memory device, temperature sensor proximate the STT memory device and a controller comprising logic, at least partially including hardware logic, to monitor an output of the temperature sensor, implement a first write operation protocol when the output of the temperature sensor fails to exceed a threshold temperature, and implement a second write operation protocol when the output of the temperature sensor exceeds the threshold temperature. Other embodiments are also disclosed and claimed.

Abstract: Systems, apparatuses and methods may provide for detecting a read-write condition in which a read operation from a location in magnetoresistive memory such as spin transfer torque (STT) memory is to be followed by a write operation to the location. Additionally, a current level associated with the read operation may be increased, wherein the read operation is conducted from the location at the increased current level. In one example, the increased current level causes a reset of all bits in the location.

Abstract: In one embodiment, a magnetoresistance random access memory (MRAM) such as a spin transfer torque (STT) random access memory (RAM), for example, has a subarray of bitcells and an electro-magnet positioned adjacent the subarray. A magnetic field is directed through a ferromagnetic device of bitcells of the first subarray to assist in the changing of states of bitcells of the subarray from a first state to a second state in which the ferromagnetic device of the bitcell is changed from one of parallel and anti-parallel polarization to the other of parallel and anti-parallel polarization. Accordingly, the content of the subarray may be readily preset or erased to one of the parallel or anti-parallel state with assistance from an electro-magnet. During a normal write operation, the bits to the other state are written. Other aspects are described herein.

Abstract: Embodiments include apparatuses and systems including a circuit which increases a speed of removal of data stored in a memory cell. In embodiments, the circuit includes a first discharge device coupled to an access transistor of a memory cell and coupled to an output terminal of a charge pump circuit to pull up a first voltage level at the output terminal to ground in response to a signal to accelerate leakage of a first leakage current; and a second discharge device coupled to a voltage generator circuit to pull down a second voltage level at a cell plate node of the memory cell to ground in response to the signal to accelerate leakage of a second leakage current, wherein the cell plate node is coupled to a storage node of the memory cell by a capacitor. Other embodiments may also be described and claimed.

Abstract: In one embodiment, a magnetoresistance random access memory (MRAM) such as a spin transfer torque (STT) random access memory (RAM), for example, has a subarray of bitcells and an electro-magnet positioned adjacent the subarray. A magnetic field is directed through a ferromagnetic device of bitcells of the first subarray to assist in the changing of states of bitcells of the subarray from a first state to a second state in which the ferromagnetic device of the bitcell is changed from one of parallel and anti-parallel polarization to the other of parallel and anti-parallel polarization. Accordingly, the content of the subarray may be readily preset or erased to one of the parallel or anti-parallel state with assistance from an electro-magnet. During a normal write operation, the bits to the other state are written. Other aspects are described herein.

Abstract: Systems, apparatuses and methods may provide for detecting a read-write condition in which a read operation from a location in magnetoresistive memory such as spin transfer torque (STT) memory is to be followed by a write operation to the location. Additionally, a current level associated with the read operation may be increased, wherein the read operation is conducted from the location at the increased current level. In one example, the increased current level causes a reset of all bits in the location.

Abstract: A mechanism for recycling error bits in a floating point unit is disclosed. A system of the disclosure includes a memory and a processing device communicably coupled to the memory. In one embodiment, the processing device comprising a floating point unit (FPU) to generate a result value from applying an operation on floating point number inputs to the FPU and generate an error value using the result value. The FPU also writes the result value to a first register of the processing device dedicated to storing results from the operation of the FPU and writes the error value to a second register of the processing device dedicated to storing errors from the operation of the FPU. The second register is separate from the first register.

Abstract: An apparatus is described that includes a semiconductor chip memory array having resistive storage cells. The apparatus also includes a comparator to compare a first word to be written into the array against a second word stored in the array at the location targeted by a write operation that will write the first word into the array. The apparatus also includes circuitry to iteratively write to one or more bit locations where a difference exists between the first word and the second word with increasing write current intensity with each successive iteration.

Abstract: Embodiments include apparatuses, methods, and systems including a circuit which may increase a speed of removal of data stored in a memory cell. In embodiments, the circuit may include a control logic to detect a signal and a boost circuit coupled to the control logic to allow the control logic to disable an operation of the boost circuit in response to detection of the signal. A discharge device may be coupled to the boost circuit to accelerate leakage of a leakage current in response to the detection of the signal. In the embodiment, the leakage current is a leakage current of a memory cell coupled to the discharge device and acceleration of the leakage of the leakage current and the disablement of the operation of the boost circuit may increase a speed of erasure of data in the memory cell. Other embodiments may also be described and claimed.

Abstract: Systems, apparatuses and methods may provide for detecting a read-write condition in which a read operation from a location in magnetoresistive memory such as spin transfer torque (STT) memory is to be followed by a write operation to the location. Additionally, a current level associated with the read operation may be increased, wherein the read operation is conducted from the location at the increased current level. In one example, the increased current level causes a reset of all bits in the location.

Abstract: Systems, apparatuses and methods may provide for detecting a read-write condition in which a read operation from a location in magnetoresistive memory such as spin transfer torque (STT) memory is to be followed by a write operation to the location. Additionally, a current level associated with the read operation may be increased, wherein the read operation is conducted from the location at the increased current level. In one example, the increased current level causes a reset of all bits in the location.

Abstract: Embodiments include apparatuses, methods, and systems including a circuit which may increase a speed of removal of data stored in a memory cell. In embodiments, the circuit may include a control logic to detect a signal and a boost circuit coupled to the control logic to allow the control logic to disable an operation of the boost circuit in response to detection of the signal. A discharge device may be coupled to the boost circuit to accelerate leakage of a leakage current in response to the detection of the signal. In the embodiment, the leakage current is a leakage current of a memory cell coupled to the discharge device and acceleration of the leakage of the leakage current and the disablement of the operation of the boost circuit may increase a speed of erasure of data in the memory cell. Other embodiments may also be described and claimed.

Abstract: Some embodiments include apparatuses and methods having an interface to receive information from memory cells, the memory cells configured to have a plurality of states to indicate values of information stored in the memory cells, and a control unit to monitor errors in information retrieved from the memory cells. Based on the errors in the information, the control unit generates control information to cause the memory cell to change to from a state among the plurality of states to an additional state. The additional state is different from the plurality of states.

Abstract: An apparatus is described that includes a semiconductor chip memory array having resistive storage cells. The apparatus also includes a comparator to compare a first word to be written into the array against a second word stored in the array at the location targeted by a write operation that will write the first word into the array. The apparatus also includes circuitry to iteratively write to one or more bit locations where a difference exists between the first word and the second word with increasing write current intensity with each successive iteration.

Abstract: Embodiments include apparatuses, methods, and systems including a circuit which may increase a speed of removal of data stored in a memory cell. In embodiments, the circuit may include a control logic to detect a signal and a boost circuit coupled to the control logic to allow the control logic to disable an operation of the boost circuit in response to detection of the signal. A discharge device may be coupled to the boost circuit to accelerate leakage of a leakage current in response to the detection of the signal. In the embodiment, the leakage current is a leakage current of a memory cell coupled to the discharge device and acceleration of the leakage of the leakage current and the disablement of the operation of the boost circuit may increase a speed of erasure of data in the memory cell. Other embodiments may also be described and claimed.

Abstract: A data processing device is configured to deploy, in response to an intermittent source of power, opportunistic power management strategies to manage harvested energy based on an expected amount of energy available to the data processing device and on expected energy expenditures defined by data processing and memory content control writing performed by the data processing device.