Abstract: A photodiode array circuit includes a plurality of photodiode circuits, binning circuitry, and a plurality of output circuits. Each of the plurality of photodiode circuits is coupled to receive a different one of the plurality of transfer control signals as a proximate photodiode circuit, proximate in a first direction. The binning circuitry is coupled to electrically connect the plurality of photodiode circuits into groups of photodiode circuit sense nodes in response to a binning control signal. Each of the plurality of output circuits is coupled to one of the groups of photodiode circuit sense nodes. Each of the plurality of output circuits are coupled to receive the output charge from the photodiode circuits in the one of the groups of photodiode circuit sense nodes and output an output signal to a bitline in response to the output charge and an row select signal.

Abstract: A column amplifier with a comparator for use in an image sensor includes an amplifier coupled to receive an input signal representative of an image charge from a pixel cell of the image sensor. An amplifier auto-zero switch is coupled between an input of the amplifier and an output of the amplifier. A feedback capacitor coupled to an input of the amplifier. An amplifier output switch coupled between the output of the amplifier and the feedback capacitor. A comparator includes a first input coupled the amplifier output switch. A comparator auto-zero switch is coupled between the first input of the comparator and an output of the comparator.

Abstract: A column amplifier with a comparator for use in an image sensor includes an amplifier coupled to receive an input signal representative of an image charge from a pixel cell of the image sensor. An amplifier auto-zero switch is coupled between an input of the amplifier and an output of the amplifier. A feedback capacitor coupled to an input of the amplifier. An amplifier output switch coupled between the output of the amplifier and the feedback capacitor. A comparator includes a first input coupled the amplifier output switch. A comparator auto-zero switch is coupled between the first input of the comparator and an output of the comparator.

Abstract: An amplifier circuit for use in an image sensor includes a common source amplifier coupled to receive an input signal representative of an image charge from a pixel cell of the image sensor. An auto-zero switch is coupled between an input of the common source amplifier and an output of the common source amplifier. A feedback capacitor is coupled to the input of the common source amplifier. An offset switch is coupled to the feedback capacitor and is further coupled to a reset voltage and an output of the amplifier circuit. The auto-zero switch and the offset switch are configured to couple the feedback capacitor to the reset voltage during a reset of the amplifier circuit. The offset switch is configured to couple the feedback capacitor to the output of the amplifier circuit after the reset of the amplifier circuit.

Abstract: An image sensor includes a pixel array including a plurality of pixels. A bit line is coupled to a column of pixels of the pixel array. The bit line is separated in to a plurality of portions coupled to the column of pixels. The portions of the bit line are electrically isolated from one another. A readout circuit is coupled to a first portion of the bit line coupled to a first portion of rows of pixels from the column of pixels to read image data from the first portion of rows of pixels from the column of pixels. The readout circuit is further coupled to a second portion of the bit line coupled to a second portion of rows of pixels from the column of pixels to read image data from the second portion of rows of pixels from the column of pixels.

Abstract: A ramp generator includes an integrator including a first stage having first and second inputs and first and second outputs, and a second stage including first and second transistors coupled between a power supply rail and ground. A node between the first and second transistors is coupled to the output of the integrator amplifier. A control terminal of the first transistor is coupled to the first output of the first stage, and a control terminal of the second transistor is coupled to the second output of the first stage. A first current flows from the output to ground during a ramp event in the ramp signal generated from the output. Trimming circuitry is coupled to the output of the integrator amplifier to provide a second current to the output of the integrator amplifier in response to trimming inputs. The second current substantially matches the first current.

Abstract: An image sensor includes a pixel array including a plurality of pixels. Each pixel is coupled to generate image data in response to incident light. A bit line is coupled to a column of pixels of the pixel array and is separated into first and second portions. Each portion is coupled to a corresponding portion of rows of pixels of the pixel array. A readout circuit coupled to the bit line to read out the image data from the pixel array. The readout circuit includes a cascode device coupled between the first and second portions of the bit line. The cascode device is coupled to be biased to electrically separate the first and second portions of the bit line from one another such that a capacitance of each portion of the bit line does not affect a settling time of an other portion of the bit line.

Abstract: A ramp generator includes an integrator including a first stage having first and second inputs and first and second outputs, and a second stage including first and second transistors coupled between a power supply rail and ground. A node between the first and second transistors is coupled to the output of the integrator amplifier. A control terminal of the first transistor is coupled to the first output of the first stage, and a control terminal of the second transistor is coupled to the second output of the first stage. A first current flows from the output to ground during a ramp event in the ramp signal generated from the output. Trimming circuitry is coupled to the output of the integrator amplifier to provide a second current to the output of the integrator amplifier in response to trimming inputs. The second current substantially matches the first current.

Abstract: An image sensor includes a pixel array including a plurality of pixels. A bit line coupled to a column of pixels is separated in to a plurality of electrically portions that are coupled to corresponding portions of rows of the pixel array. A first switching circuit of a readout circuit is coupled to the bit line. A first switching circuit is configured to couple a bit line current source to the bit line to provide a DC current coupled to flow through the bit line and through the first switching circuit during a readout operation of a pixel coupled to the bit line. A second switching circuit is configured to couple and ADC to the bit line during the readout operation of the pixel. Substantially none of the DC current provided by the bit line current source flows through the second switching circuit during the readout operation of the pixel.

Abstract: An image sensor includes a pixel array including a plurality of pixels. Each pixel is coupled to generate image data in response to incident light. A bit line is coupled to a column of pixels of the pixel array and is separated into first and second portions. Each portion is coupled to a corresponding portion of rows of pixels of the pixel array. A readout circuit coupled to the bit line to read out the image data from the pixel array. The readout circuit includes a cascode device coupled between the first and second portions of the bit line. The cascode device is coupled to be biased to electrically separate the first and second portions of the bit line from one another such that a capacitance of each portion of the bit line does not affect a settling time of an other portion of the bit line.

Abstract: A counter distribution system includes an N bit counter to receive a first counting clock to generate a plurality of data bits including lower data bits on lower data bit lines and upper data bits on upper data bit lines. The upper data bits include at least one redundant bit to provide error correction for the counter distribution system. A plurality of latches is coupled to the N bit counter. Each one of the lower data bit lines and each one of the upper data bit lines is coupled to at least one of the latches. The latches are arranged into a plurality of groupings of latches. Each grouping of latches is coupled to a respective latch enable signal. Each latch in each grouping of latches is coupled to latch a respective one of the plurality of data bits in response to the respective latch enable signal.

Abstract: An N bit counter includes a lower counter having a first output having M bits that operates a first counting frequency. An upper counter having a second output having N?M+L bits operates a second counting frequency. The second counting frequency is equal to the first counting frequency divided by 2(M-L). An error correction controller is coupled to receive the first and second outputs and perform operations that include comparing the L least significant bits (LSBs) of the second output and at least one most significant bit (MSB) of the first output, and correcting the N?M MSBs of the second output in response to the comparison. The lower bits of the N bit counter are the M bits of the first output, and the upper bits of the N bit counter are the corrected N?M MSBs of the second output.

Abstract: An N bit counter includes a lower counter having a first output having M bits that operates a first counting frequency. An upper counter having a second output having N?M+L bits operates a second counting frequency. The second counting frequency is equal to the first counting frequency divided by 2(M?L). An error correction controller is coupled to receive the first and second outputs and perform operations that include comparing the L least significant bits (LSBs) of the second output and at least one most significant bit (MSB) of the first output, and correcting the N?M MSBs of the second output in response to the comparison. The lower bits of the N bit counter are the M bits of the first output, and the upper bits of the N bit counter are the corrected N?M MSBs of the second output.

Abstract: A method includes coupling a low gain input of a dual stage comparator to establish a low conversion gain mode. An analog-to-digital (ADC) operation is performed to determine a low gain reset voltage. A low gain input is decoupled in response to a DCG control signal. A high gain input is coupled to establish a high conversion gain mode in response to the DCG control signal. The ADC operation is performed with the high gain input to determine a high gain reset voltage. The ADC operation is performed with the high gain input to determine a high gain signal voltage. The high gain input is decoupled in response to a DCG control signal transition. The low gain input is recoupled in response to the DCG control signal, and the ADC operation is performed with the low gain input to determine a low gain signal voltage.

Abstract: A group of shared pixels comprises: a first shared pixel comprising a first photodiode and a first transfer gate; a second shared pixel comprising a second photodiode and a second transfer gate; a third shared pixel comprising a third photodiode and a third transfer gate; a fourth shared pixel comprising a fourth photodiode and a first transfer gate; a first floating diffusion shared by the first shared pixel and the second shared pixel; a second floating diffusion shared by the third shared pixel and the fourth shared pixel; a capacitor coupled to the first floating diffusion through a first dual conversion gain transistor, and the second floating diffusion through a second dual conversion gain transistor; wherein the capacitor is formed in an area covering most of the first shared pixel, the second shared pixel, the third shared pixel, and the fourth shared pixel.

Abstract: A group of shared pixels comprises: a first shared pixel comprising a first photodiode and a first transfer gate; a second shared pixel comprising a second photodiode and a second transfer gate; a third shared pixel comprising a third photodiode and a third transfer gate; a fourth shared pixel comprising a fourth photodiode and a first transfer gate; a first floating diffusion shared by the first shared pixel and the second shared pixel; a second floating diffusion shared by the third shared pixel and the fourth shared pixel; a capacitor coupled to the first floating diffusion through a first dual conversion gain transistor, and the second floating diffusion through a second dual conversion gain transistor; wherein the capacitor is formed in an area covering most of the first shared pixel, the second shared pixel, the third shared pixel, and the fourth shared pixel.

Abstract: A method includes coupling a low gain input of a dual stage comparator to establish a low conversion gain mode. An analog-to-digital (ADC) operation is performed to determine a low gain reset voltage. A low gain input is decoupled in response to a DCG control signal. A high gain input is coupled to establish a high conversion gain mode in response to the DCG control signal. The ADC operation is performed with the high gain input to determine a high gain reset voltage. The ADC operation is performed with the high gain input to determine a high gain signal voltage. The high gain input is decoupled in response to a DCG control signal transition. The low gain input is recoupled in response to the DCG control signal, and the ADC operation is performed with the low gain input to determine a low gain signal voltage.

Abstract: An output circuit for use with a comparator includes a first transistor having a control terminal coupled to receive an output signal from a first stage of the comparator. A second transistor is coupled between the first transistor and a reference voltage. The second transistor has a control terminal coupled to receive a first reset signal. The second transistor is coupled to precharge a first output node of the first transistor between the first and second transistors to the reference voltage prior to a comparison operation of the comparator. An output stage has an input node coupled to the first output node. The output stage is coupled to generate an output voltage of the output circuit at an output node of the output stage in response to the first output node.

Abstract: A comparator includes a first stage coupled to compare a reference voltage to an image charge voltage signal. The first stage includes first and second NMOS input transistors coupled between an enabling transistor and respective first and second cascode devices to receive the reference voltage and the image charge voltage signal. A first auto-zero switch is between a gate of the first NMOS input transistor and a first node. The first node is between the first NMOS input transistor and the first cascode device. A second auto-zero switch is between a gate of the second NMOS input transistor and a second node. The second node is between the second cascode device and a second PMOS transistor. A voltage difference between the first and second nodes during an auto-zero period reduces an amount of kickback that occurs during an ADC period.

Abstract: Comparison circuitry includes a comparator having a first input configured to receive a pixel signal. A switch is coupled to a second input of the comparator, a reference generator, and a ramp generator. A first capacitance is coupled to the switch. The switch is configured to couple the first capacitance to the reference generator to charge the first capacitance to a reference voltage from the reference generator prior to a ramp event in a ramp signal, and to couple the first capacitance to the ramp signal from the ramp generator at an onset of the ramp event in the ramp signal. The first capacitance is coupled to provide positive current injection into the ramp signal at the onset of the ramp event in the ramp signal to reduce a ramp settling time in the ramp signal, which is provided to the second input of the comparator.