Abstract: Stronger electromagnetic coupling than in conventional devices can be provided between adjacent resonator holes in a dielectric filter or a dielectric duplexer without changing the external shape and dimensions of a dielectric block. Resonator holes pass through opposing surfaces of a dielectric block, each including a large-diameter hole section and a small-diameter hole section. The small-diameter hole sections may be formed near a short-circuit end face of the dielectric block. The large-diameter hole sections and the small-diameter hole sections are connected to each other with their axes shifted from each other. The radius R of the large-diameter hole sections, the radius r of the small-diameter hole sections, and the shift distance P between the axes of the large-diameter hole sections and those of the small-diameter hole sections satisfy the expression R-r<P<R+r.

Abstract: A scanner system includes, a tube type piezoelectric scanner having a free end displaceable in X, Y and Z directions and supporting a sample at its free end, a driven for applying voltages to the scanner for displacing the sample an optical unit for optically detecting the X, Y and Z direction displacements of the free end and for outputting corresponding displacement signals, and a scan controller for computing correction signals based on the displacement signals so as to apply voltages which correct the voltage-displacement nonlinear characteristic of the scanner to the scanner and for supplying them to the driver.

Abstract: A dielectric resonator apparatus comprising at least three quarter-wavelength dielectric coaxial resonators in a dielectric block is provided. In the dielectric resonator apparatus, an outer conductor is formed on the surfaces of the dielectric block, and a pair of input and output electrodes for capacitively coupling with the two dielectric coaxial resonators located at both ends is formed close to a first end surface of the dielectric block on a predetermined side surface of the dielectric block so as to be electrically insulated from the outer conductor.

Abstract: A scanning probe microscope having a probe for scanning a sample, a piezoelectric unit finely movable in the X, Y and Z directions, and a probe control unit for controlling a fine movement amount of the piezoelectric unit in the Z direction in accordance with a detected interaction between the sample and the probe. A driving unit applies a continuously changing voltage to the piezoelectric unit to drive the piezoelectric unit in one of an X and Y direction to scan along a scan line, a displacement detection unit detects the displacement of the piezoelectric unit along the scan line, and a matching detection unit outputs a coincidence detection signal when the detected displacement of the piezoelectric unit along the scan line coincides with target displacement values corresponding to desired measurement points.

Abstract: A scanner system includes, a tube type piezoelectric scanner having a free end displaceable in X, Y and Z directions and supporting a sample at its free end, a driver for applying voltages to the scanner for displacing the sample, an optical unit for optically detecting the X, Y and Z direction displacements of the free end and for outputting corresponding displacement signals, and a scan controller for computing correction signals based on the displacement signals so as to apply voltages which correct the voltage-displacement nonlinear characteristic of the scanner to the scanner and for supplying them to the driver.

Abstract: A sample is mounted on a piezoelectric actuator and a cantilever provided with a probe is located thereabove. A bias voltage applying circuit supplies the sample with a potential difference V.sub.T and sends out a current signal I.sub.T representing the electric current flowing between the sample and the probe to a current detecting circuit. The current signal is converted into logI.sub.T in a logarithmic amplifier and given to a differential amplifier. A displacement detecting circuit is arranged above the cantilever for detecting the displacement of the free end of the cantilever due to the atomic force appearing between the sample and the probe and for sending a displacement signal Z.sub.TIP representing the displacement to another differential amplifier. The signals from the differential amplifiers are respectively fed to terminals of an analog switch. The analog switch selects a signal to be fed to a control circuit, which control circuit generates and transmits a signal V.sub.

Abstract: A scanning tunneling microscope has an STM unit including a probe for scanning the surface of an object. The STM unit has at its outer peripheral surface a cylindrical enclosing member extending towards an object table. When the object is observed, the object table is elevated or the STM unit is lowered, so that the enclosing member is urged upon the table. The table and the STM unit constitute one body. As a result, relative movement between the object and the probe can be prevented, and also influence due to vibration can be prevented. In addition, the enclosing member isolates the object and the probe from the outside space, whereby electric noise, magnetic noise, sound noise and air flow are shielded. Thus, the influence due to external vibration can be reduced, and the stability is enhanced.

Abstract: An integrator for integrating a deviation signal and generating an integral control signal includes an operational amplifier for receiving a deviation signal through a first resistor, a capacitor connected between an inverting input terminal and an output terminal of the operational amplifier, and a series circuit constituted of a diode and a second resistor connected in parallel to the first resistor. If a probe and a sample approach each other and the deviation signal becomes is 0.7 V or more, charges are accumulated in the capacitor through the diode and second resistor as well as the first resistor. Thus, the voltage of the integral control signal is suddenly changed to the negative to separate the probe and sample from each other. If the probe and sample are separated from each other, the deviation signal becomes negative, and the charges are removed from the capacitor through the first resistor.

Abstract: An atomic force microscope comprises a probe having a sharply-pointed tip end. The probe is supported on the free end portion of a cantilever and is close to the surface of a specimen. When an interatomic force is produced, the cantilever is deformed, and the probe is displaced. The displacement of the probe is detected by an optical system. A light beam emitted from a light source is collimated by a lens, and reflected by a polarized beam-splitter, and also by a half-mirror. Then, the light beam passes through a quarter wavelength plate and an objective lens, such that the light is converged on the cantilever. The reflected light beam from the cantilever returns along the same optical path and passes through the splitter. The light beam is divided into two light beams at the splitter. These two light beams are reflected by respective prisms and are then incident on respective photodetectors. These photodetectors detect the displacement of the probe.

Abstract: A probe for scanning a sample is attached to a probe electrode supported by a cylindrical piezoelectric actuator. The actuator has four drive electrodes on its periphery, and deforms in the three axial directions in accordance with the voltage applied to the drive electrodes. A girdling electrode is provided between the actuator and the probe electrode. The girdling electrode is insulated from the probe electrode and the drive electrodes by insulator members provided on its upper and lower surfaces. A bias voltage signal S1 is input to an operational amplifier of which the output is connected to the girdling electrode. The amplifier is a voltage follower for equalizing the potential of the girdling electrode to that of the bias voltage signal S1. An operational amplifier has a non-inversion input to which the bias voltage signal S1 is input, and an inversion input connected to the probe electrode.

Abstract: A scanning tunneling microscope includes an observation optical system for optically observing the surface of an object. The optical system is fixed on an optical system fixing member. The optical system is moved in a direction (Z-direction) vertical to the surface of the object by means of a motor, whereby the focal point of the optical system is adjusted. An STM measurement probe supported by an optically transparent member is disposed between the optical system and the object. When the object is optically observed, the probe is displaced from the focal point by means of a micrometer. Thus, an optical observation image of the surface of the object, which is not affected by the shadow of the probe, can be obtained. When the STM measurement is carried out, a probe unit enables the probe to scan the surface of the object, and an STM image is obtained by a conventional method.

Abstract: A scanning tunneling microscope includes a piezoelectric driver expanding and contracting according to a voltage applied thereto to adjust the distance between a sample and a probe. A servo circuit outputs a servo voltage to control the expansion and contraction of the piezoelectric driver to keep a tunnel current flowing between the sample and the probe at a constant value. A correction voltage generating circuit generates a given correction voltage to correct a voltage to be applied to the piezoelectric driver. An adding circuit adds the servo voltage and the correction voltage together and supplies an added output to the piezoelectric driver. A control circuit controls the correction voltage according to the servo voltage to set the added output to a given reference voltage.

Abstract: A probe unit includes a disk-like substrate made of transparent material, a transparent electrode coated on all over the substrate, and a metal wire whose sharp tip is projected vertically and upwardly from the center of the substrate through the transparent electrode. The metal wire is made of Pt-Ir, which incudes a sharp tip projected from the upper surface of the substrate and a stem embedded in a hole of the electrode and fixed to the electrode and substrate by conductive adhesive.

Abstract: A method of ultrasonic flaw detection of a pipe comprises comparing ultrasonic waves passing through a test piece portion with the arithmetic means of ultrasonic waves passing through portions adjacent each side of the test portion. The comparison is made around the entire periphery of a pipe, for example, an austenic heat resisting cast steel pipe used as a hydrogen manufacturing reformer tube. This method is free from adverse influence of macrostructures unevenly distributed in the peripheral direction of the pipe, and enables a quantitative grasp of flaws in a base material and a weld of the pipe.