Probe for a scanning tunneling microscope
- Olympus
Latest Olympus Patents:
Description
FIG. 1 is a top, front and side perspective view of a probe for a scanning tunneling microscope showing our new design;
FIG. 2 is a front elevational view thereof, a rear elevational view, a right side elevational view and a left side elevational view being identical to the front;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a cross-sectional view thereof taken on line 5--5 in FIG. 2; and,
FIG. 6 is a cross-sectional view thereof taken on line 6--6 in FIG. 2.
Referenced Cited
Patent History
Patent number: D335888
Type: Grant
Filed: Dec 3, 1990
Date of Patent: May 25, 1993
Assignee: Olympus Optical Co., Ltd. (Tokyo)
Inventors: Takao Okada (Hachioji), Tsugiko Takase (Hachioji), Shuzo Mishima (Hachioji), Hisanari Shimazu (Akishima), Akira Yagi (Sagamihara), Hiroko Ota (Hachioji), Hirofumi Miyamoto (Hachioji), Takaaki Takenobu (Hachioji)
Primary Examiner: A. Hugo Word
Assistant Examiner: Paula A. Mortimer
Law Firm: Frishauf, Holtz, Goodman & Woodward
Application Number: 7/621,550
Type: Grant
Filed: Dec 3, 1990
Date of Patent: May 25, 1993
Assignee: Olympus Optical Co., Ltd. (Tokyo)
Inventors: Takao Okada (Hachioji), Tsugiko Takase (Hachioji), Shuzo Mishima (Hachioji), Hisanari Shimazu (Akishima), Akira Yagi (Sagamihara), Hiroko Ota (Hachioji), Hirofumi Miyamoto (Hachioji), Takaaki Takenobu (Hachioji)
Primary Examiner: A. Hugo Word
Assistant Examiner: Paula A. Mortimer
Law Firm: Frishauf, Holtz, Goodman & Woodward
Application Number: 7/621,550
Classifications
Current U.S. Class:
Element Or Attachment (D16/136)