Probe for a scanning tunneling microscope

- Olympus
Description

FIG. 1 is a top, front and side perspective view of a probe for a scanning tunneling microscope showing our new design;

FIG. 2 is a front elevational view thereof, a rear elevational view, a right side elevational view and a left side elevational view being identical to the front;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a cross-sectional view thereof taken on line 5--5 in FIG. 2; and,

FIG. 6 is a cross-sectional view thereof taken on line 6--6 in FIG. 2.

Referenced Cited
U.S. Patent Documents
3100263 August 1963 Verba et al.
3486020 December 1969 Hren
4134638 January 16, 1979 Drauglis
4727859 March 1, 1988 Lia
4841148 June 20, 1989 Lyding
4945235 July 31, 1990 Nishioka et al.
Patent History
Patent number: D335888
Type: Grant
Filed: Dec 3, 1990
Date of Patent: May 25, 1993
Assignee: Olympus Optical Co., Ltd. (Tokyo)
Inventors: Takao Okada (Hachioji), Tsugiko Takase (Hachioji), Shuzo Mishima (Hachioji), Hisanari Shimazu (Akishima), Akira Yagi (Sagamihara), Hiroko Ota (Hachioji), Hirofumi Miyamoto (Hachioji), Takaaki Takenobu (Hachioji)
Primary Examiner: A. Hugo Word
Assistant Examiner: Paula A. Mortimer
Law Firm: Frishauf, Holtz, Goodman & Woodward
Application Number: 7/621,550
Classifications
Current U.S. Class: Element Or Attachment (D16/136)