Patents by Inventor Hirohito Fujiwara

Hirohito Fujiwara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240125724
    Abstract: The apparatus is attached to a thermal analyzer including a pair of sample containers and a heating furnace having a window or an opening through which at least the measurement sample can be observed, and includes an attachment unit, a light source, a polarizer constituting a polarizing filter that polarizes irradiation light emitted from the light source, a camera, a half mirror, a rotation mechanism and an analyzer constituting a polarizing filter configured to polarize reflected light through the half mirror and to introduce the resulting polarized light of the reflected light into the camera, in which the polarized light irradiates the sample after passing through the window or opening and then reflects from the sample wherein the analyzer, the half mirror, and the light source are fixed to a fixing member and the rotation mechanism rotates the fixing member in a polarization direction of the analyzer.
    Type: Application
    Filed: September 19, 2023
    Publication date: April 18, 2024
    Inventors: Hirohito FUJIWARA, Ryokuhei Yamazaki
  • Publication number: 20230296497
    Abstract: Disclosed is an apparatus for acquiring polarized images attached to a thermal analysis apparatus including a pair of sample containers housing a measurement sample and a reference sample, respectively, and a heating furnace, configured to observe at least the measurement sample through a window or an opening of the heating furnace, and including an attachment section attached to the thermal analysis apparatus, a light source, a polarizer configured to polarize light emitted from the light source, a camera and an analyzer polarize light reflected from the measurement sample or the reference sample to enter the camera after the measurement sample or the reference sample is irradiated via the window or the opening with polarized light transmitted through the polarizer. A first optical path of the polarizer and a second optical path of the analyzer are not parallel, and both the polarizer and the analyzer are rotatable.
    Type: Application
    Filed: January 6, 2023
    Publication date: September 21, 2023
    Inventors: Hirohito FUJIWARA, Ryokuhei YAMAZAKI
  • Patent number: 11460425
    Abstract: Provided is a thermal analyzer, with which a sample can be observed even under a state in which a heat sink is cooled to a room temperature or lower. The thermal analyzer includes: the heat sink, in which a measurement sample container and a reference sample container are placed; a heat sink cover configured to cover the heat sink; a heat sink window provided in the heat sink; a heat sink cover window provided in the heat sink cover; an imaging device configured to image the sample in the heat sink through the heat sink window and the heat sink cover window; a purge gas introduction portion, through which a purge gas is introduced into the heat sink; and a discharge port, through which the purge gas is allowed to flow from one of the heat sink window and the heat sink to a space inside the heat sink cover.
    Type: Grant
    Filed: December 22, 2020
    Date of Patent: October 4, 2022
    Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Kengo Kobayashi, Shinya Nishimura, Hirohito Fujiwara
  • Publication number: 20210285904
    Abstract: Provided is a thermal analyzer, with which a sample can be observed even under a state in which a heat sink is cooled to a room temperature or lower. The thermal analyzer includes: the heat sink, in which a measurement sample container and a reference sample container are placed; a heat sink cover configured to cover the heat sink; a heat sink window provided in the heat sink; a heat sink cover window provided in the heat sink cover; an imaging device configured to image the sample in the heat sink through the heat sink window and the heat sink cover window; a purge gas introduction portion, through which a purge gas is introduced into the heat sink; and a discharge port, through which the purge gas is allowed to flow from one of the heat sink window and the heat sink to a space inside the heat sink cover.
    Type: Application
    Filed: December 22, 2020
    Publication date: September 16, 2021
    Inventors: Kengo KOBAYASHI, Shinya Nishimura, Hirohito Fujiwara
  • Patent number: 9885645
    Abstract: A thermal analyzer is provided with: a furnace tube; a sample holder; a heating furnace; a measurement chamber; and a measurement unit. The heating furnace comprises a fixing section to be fixed to the furnace tube. The furnace tube is configured to be attachable to and detachable from the heating furnace and provided with an engagement portion that is configured to be engaged with the fixing section at a variable position in the radial direction. A gap jig is configured to be detachable from the heating furnace and the furnace tube after inserting the furnace tube into the heating furnace and engaging the engagement portion of the furnace tube with the fixing section while the gap jig is interposed between the heating furnace and the furnace tube to maintain the gap between the heating furnace and the furnace tube in the radial direction to be in the predetermined distance.
    Type: Grant
    Filed: March 13, 2015
    Date of Patent: February 6, 2018
    Assignee: Hitachi High-Tech Science Corporation
    Inventors: Shinya Nishimura, Hirohito Fujiwara
  • Patent number: 9753509
    Abstract: An imaging apparatus for a thermal analyzer is configured to image a heated sample inside a thermal analyzer main body section from an observation window provided in the thermal analyzer main body section. The imaging apparatus is provided with: an imaging device that is provided with a lens housing and a main body section; a holding section configured to hold the imaging device to have an orientation in which the lens housing is oriented toward the observation window, and the main body section is positioned on the opposite side of the observation window across the lens housing; and a cooling fan configured to provide airflow inside the holding section. The holding section is provided with a cooling air passage having an intake portion and an exhaust portion. At least a portion of the lens housing is arranged in the cooling air passage to be cooled by the airflow provided by the cooling fan.
    Type: Grant
    Filed: January 27, 2015
    Date of Patent: September 5, 2017
    Assignee: Hitachi High-Tech Science Corporation
    Inventors: Shinya Nishimura, Hirohito Fujiwara, Kentaro Yamada
  • Publication number: 20150260665
    Abstract: A thermal analyzer is provided with: a furnace tube; a sample holder; a heating furnace; a measurement chamber; and a measurement unit. The heating furnace comprises a fixing section to be fixed to the furnace tube. The furnace tube is configured to be attachable to and detachable from the heating furnace and provided with an engagement portion that is configured to be engaged with the fixing section at a variable position in the radial direction. A is configured to be detachable from the heating furnace and the furnace tube after inserting the furnace tube into the heating furnace and engaging the engagement portion of the furnace tube with the fixing section while the gap jig is interposed between the heating furnace and the furnace tube to maintain the gap between the heating furnace and the furnace tube in the radial direction to be in the predetermined distance.
    Type: Application
    Filed: March 13, 2015
    Publication date: September 17, 2015
    Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Shinya Nishimura, Hirohito Fujiwara
  • Publication number: 20150264277
    Abstract: An imaging apparatus for a thermal analyzer is configured to image a heated sample inside a thermal analyzer main body section from an observation window provided in the thermal analyzer main body section. The imaging apparatus is provided with: an imaging device that is provided with a lens housing and a main body section; a holding section configured to hold the imaging device to have an orientation in which the lens housing is oriented toward the observation window, and the main body section is positioned on the opposite side of the observation window across the lens housing; and a cooling fan configured to provide airflow inside the holding section. The holding section is provided with a cooling air passage having an intake portion and an exhaust portion. At least a portion of the lens housing is arranged in the cooling air passage to be cooled by the airflow provided by the cooling fan.
    Type: Application
    Filed: January 27, 2015
    Publication date: September 17, 2015
    Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Shinya Nishimura, Hirohito Fujiwara, Kentaro Yamada
  • Patent number: 8978479
    Abstract: Provided is a viscoelasticity measuring apparatus in which an undesirable sample shape change such as a buckle caused as a result of thermal expansion of a sample is eliminated so as to prevent a deformation in a displacement detector direction due to the thermal expansion and a bending of the sample between a sample grasping member and a chuck, to thereby improve accuracy of measurement. In the viscoelasticity measuring apparatus, a thin part is provided in a part of an elastic arm for holding the sample so as to be easily deformed by a thermal expansion force of the sample. Thus, an undesirable shape change such as the buckle generated when the sample is expanded thermally is effectively eliminated, and necessary stiffness is maintained with respect to a load of the sample and hence accuracy of measurement is improved.
    Type: Grant
    Filed: February 22, 2012
    Date of Patent: March 17, 2015
    Assignee: Hitachi High-Tech Science Corporation
    Inventors: Nobuaki Okubo, Kengo Kobayashi, Toshihiko Nakamura, Hirohito Fujiwara
  • Patent number: 8708556
    Abstract: A thermal analyzer heats and cools a sample placed inside a furnace for measuring a thermal characteristic of the sample during heating and cooling. The thermal analyzer has a multilayer structure for covering the furnace and its surroundings so as to isolate the furnace and its surroundings from an external environment. The multilayer structure includes a multilayer wall with two layers formed of a material having high thermal conductivity and heat dissipation property. The two layers are spaced apart from one another to provide therebetween an interlayer that contains a substance having a heat capacity substantially equal to a gas contained in the furnace so that heat transfer between the two layers is minimized.
    Type: Grant
    Filed: March 28, 2011
    Date of Patent: April 29, 2014
    Assignee: SII NanoTechnology
    Inventors: Kentaro Yamada, Shinya Nishimura, Hirohito Fujiwara
  • Patent number: 8342744
    Abstract: The differential scanning calorimeter includes: a heat sink, which stores a measuring sample and a reference material; a heater, which heats the heat sink; a cooling block, which is separated away from the heat sink, and positioned below the heat sink; a thermal resistor, which is connected between the heat sink and the cooling block, and forms a heat flow path therebetween; a cooling head, which is detachably fitted to the cooling block, and is cooled by an external cooling device; and differential heat flow detectors, which output a temperature difference between the measuring sample and the reference material as a heat-flow-difference signal, in which: the cooling block forms a side wall to fit the bore of the cooling head outward from the joint of the thermal resistance body; the top surface of the cooling head is lower than the joint.
    Type: Grant
    Filed: February 16, 2010
    Date of Patent: January 1, 2013
    Assignee: SII NanoTechnology Inc.
    Inventors: Shinya Nishimura, Kentaro Yamada, Hirohito Fujiwara
  • Publication number: 20120216624
    Abstract: Provided is a viscoelasticity measuring apparatus in which an undesirable sample shape change such as a buckle caused as a result of thermal expansion of a sample is eliminated so as to prevent a deformation in a displacement detector direction due to the thermal expansion and a bending of the sample between a sample grasping member and a chuck, to thereby improve accuracy of measurement. In the viscoelasticity measuring apparatus, a thin part is provided in a part of an elastic arm for holding the sample so as to be easily deformed by a thermal expansion force of the sample. Thus, an undesirable shape change such as the buckle generated when the sample is expanded thermally is effectively eliminated, and necessary stiffness is maintained with respect to a load of the sample and hence accuracy of measurement is improved.
    Type: Application
    Filed: February 22, 2012
    Publication date: August 30, 2012
    Inventors: Nobuaki Okubo, Kengo Kobayashi, Toshihiko Nakamura, Hirohito Fujiwara
  • Patent number: 8156853
    Abstract: A manufacturing system for producing thin sections of a biological sample embedded in a block. The system includes, a blade holder disposed at a rake angle relative to the block, a mounting plane on which a plurality of cutting blades are mounted, an adsorptive member on the mounting plane that maintains the posture of the cutting blades, a pressing member that presses a selected cutting blade against the mounting plane, a conveyor unit that slides out the cutting blades by sequentially conveying the plurality of cutting blades to feed them one by one on the mounting plane, a transportation unit that moves the block relative to the holder, such that the cutting blade cuts out a thin section from the sample, and a control unit that operates the conveyor unit to exchange the selected cutting blade.
    Type: Grant
    Filed: February 19, 2008
    Date of Patent: April 17, 2012
    Assignee: Seiko Instruments, Inc.
    Inventors: Hirohito Fujiwara, Tetsumasa Ito, Koji Fujimoto, Tatsuya Miyatani
  • Patent number: 8087334
    Abstract: A sectioning instrument fabricates a section having an accurate and uniform thickness to be carried to a next step automatically without deforming a surface of an embedded block and while observing the surface of the embedded block. The sectioning instrument includes a sample base for fixing an embedded block, a cutter for fabricating a section by sectioning the embedded block, a carrier for carrying the section, and a feed mechanism for moving the sample base in a predetermined feed direction. The carrier includes a belt, a direction switching portion provided on an upper side of the cutter, and a rear roller. The belt is inserted to between the cutter and the direction switching portion from a rear side of the cutter, folded back to an upper side by the direction switching portion and is reeled back to the rear side of the cutter by the rear roller substantially in parallel with the feed direction of the feed mechanism in a plane view.
    Type: Grant
    Filed: December 20, 2006
    Date of Patent: January 3, 2012
    Assignee: Seiko Instruments Inc.
    Inventors: Tatsuya Miyatani, Tetsumasa Ito, Hirohito Fujiwara, Koji Fujimoto
  • Publication number: 20110235671
    Abstract: To improve measurement accuracy by eliminating influence of a change of a temperature environment around a furnace of a thermal analyzer, the thermal analyzer includes a multilayer structure of at least two sealed layers for covering the furnace and its surroundings so as to isolate the furnace and its surroundings from an outside. An interlayer of the multilayer structure is loaded with a substance having a heat capacity equal to the heat capacity of a gas inside the furnace.
    Type: Application
    Filed: March 28, 2011
    Publication date: September 29, 2011
    Inventors: Kentaro Yamada, Shinya Nishimura, Hirohito Fujiwara
  • Publication number: 20100220764
    Abstract: The differential scanning calorimeter includes: a heat sink, which stores a measuring sample and a reference material; a heater, which heats the heat sink; a cooling block, which is separated away from the heat sink, and positioned below the heat sink; a thermal resistor, which is connected between the heat sink and the cooling block, and forms a heat flow path therebetween; a cooling head, which is detachably fitted to the cooling block, and is cooled by an external cooling device; and differential heat flow detectors, which output a temperature difference between the measuring sample and the reference material as a heat-flow-difference signal, in which: the cooling block forms a side wall to fit the bore of the cooling head outward from the joint of the thermal resistance body; the top surface of the cooling head is lower than the joint.
    Type: Application
    Filed: February 16, 2010
    Publication date: September 2, 2010
    Inventors: Shinya Nishimura, Kentaro Yamada, Hirohito Fujiwara
  • Publication number: 20080202308
    Abstract: An automatic thin-section manufacturing system for manufacturing thin sections by thinly cutting out an embedded block having embedded therein a biological sample while setting said embedded block at a predetermined rake angle, and said system comprising: a long cutting blade having a cutting edge on one end; a holder disposed in such a manner that it makes the rake angle with respect to the surface of the embedded block; a mounting plane which is provided to the front end of the holder, on which plural cutting blades are mounted and aligned with their cutting edges exposed to the outer side; an adsorptive member provided along the mounting plane, which maintains the posture of the cutting blades by adsorbing the base end side of the cutting blades mounted on the mounting plane; a first pressing member provided to the holder, which presses, among the plural cutting blades that are mounted and aligned on the mounting plane, the cutting blade allocated to the predetermined position against the mounting plane; a
    Type: Application
    Filed: February 19, 2008
    Publication date: August 28, 2008
    Inventors: Hirohito Fujiwara, Tetsumasa Ito, Koji Fujimoto, Tatsuya Miyatani
  • Publication number: 20070204740
    Abstract: To be able to alleviate burden on an operator and automatically fabricate a necessary number of sheets of prepared slides from respective embedded blocks while pertinently interchanging the respective embedded blocks, there is provided an automatic instrument for fabricating prepared slide of tissue section including a store house for storing a plurality of embedded blocks embedded with a living body sample by an embedding medium, cutting means for cutting out a section by cutting the embedded block by a predetermined thickness, first carrying means for putting in and out a selected one of the embedded block to and from the store house and carrying the selected one of the embedded block to a position of being cut by the cutting means, second carrying means for carrying the section to a storage tank stored with a liquid to be floated on a liquid surface, transcribing means for fabricating a prepared slide by transcribing the section floated on the liquid surface onto a base plate, and a control portion for con
    Type: Application
    Filed: December 20, 2006
    Publication date: September 6, 2007
    Inventors: Tatsuya Miyatani, Tetsumasa Ito, Koji Fujimoto, Eiji Nakano, Hirohito Fujiwara
  • Patent number: D747227
    Type: Grant
    Filed: August 26, 2014
    Date of Patent: January 12, 2016
    Assignee: Hitachi High-Tech Science Corporation
    Inventor: Hirohito Fujiwara
  • Patent number: D758221
    Type: Grant
    Filed: August 26, 2014
    Date of Patent: June 7, 2016
    Assignee: Hitachi High-Tech Science Corporation
    Inventor: Hirohito Fujiwara